JPH0541365Y2 - - Google Patents
Info
- Publication number
- JPH0541365Y2 JPH0541365Y2 JP16592287U JP16592287U JPH0541365Y2 JP H0541365 Y2 JPH0541365 Y2 JP H0541365Y2 JP 16592287 U JP16592287 U JP 16592287U JP 16592287 U JP16592287 U JP 16592287U JP H0541365 Y2 JPH0541365 Y2 JP H0541365Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- dimensional position
- position detection
- shutter
- receiving surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 claims description 53
- 230000003287 optical effect Effects 0.000 claims description 26
- 230000035945 sensitivity Effects 0.000 claims description 17
- 230000003595 spectral effect Effects 0.000 claims description 12
- 230000005540 biological transmission Effects 0.000 claims description 6
- 230000000903 blocking effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000000295 emission spectrum Methods 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
Description
【考案の詳細な説明】
産業上の利用分野
本考案は光学式位置センサに関するものであ
る。[Detailed Description of the Invention] Industrial Application Field The present invention relates to an optical position sensor.
従来の技術
車輪支持部材とその上方の車体部材間に油圧ラ
ムよりなる車高調整機構を設けると共に、該車輪
支持部材の上下動に連動して上下スライドする可
動接点と車体部材に固定された上下2個の固定接
点とからなる車高検出スイツチの信号によつて上
記油圧ラムへの油の供給および排出を行わせ、車
高を一定に保つようにした自動車の車高調整装置
は既に開発され公開されている(例えば特公昭47
−13327号公報参照)。BACKGROUND ART A vehicle height adjustment mechanism consisting of a hydraulic ram is provided between a wheel support member and a vehicle body member above the wheel support member, and a movable contact that slides up and down in conjunction with the vertical movement of the wheel support member and an upper and lower contact point fixed to the vehicle body member are provided. An automobile vehicle height adjustment device has already been developed that maintains a constant vehicle height by supplying and discharging oil to and from the hydraulic ram in response to signals from a vehicle height detection switch consisting of two fixed contacts. Published (for example, Tokuko Sho 47)
-Refer to Publication No. 13327).
又発光素子と受光素子とを対向させた所謂フオ
トカプラを用い、その間にシヤツタを設け、該シ
ヤツタを車体部材に対する車輪支持部材の上下方
向変位に連動して移動させるよう構成し、光の透
過、遮断から車体部材に対する車輪支持部材の上
下方向変位即ち車高を検出するようにした光学式
車高センサも既に開発されている。 Furthermore, a so-called photocoupler in which a light emitting element and a light receiving element are opposed to each other is used, a shutter is provided between them, and the shutter is configured to move in conjunction with vertical displacement of the wheel support member relative to the vehicle body member, thereby transmitting and blocking light. An optical vehicle height sensor that detects the vertical displacement of a wheel support member relative to a vehicle body member, that is, the vehicle height, has already been developed.
考案が解決しようとする問題点
上記のように車輪支持部材の上下動に連動して
上下スライドする可動接点と車体部材に固定され
た上下2個の固定接点とからなる所謂接触式の車
高検出スイツチでは塵、埃等の影響を受けやすく
耐久性に問題があり、又このような問題を回避す
るために考えられたフオトカプラを用いた光学式
車高センサにあつては非接触式のため前記の接触
式のような耐久性上の問題はないにしてもフオト
カプラの数に相当する特定の位置しか検出できず
連続的に車高を計測することができないと言う問
題を有する。Problems to be solved by the invention As mentioned above, the so-called contact-type vehicle height detection consists of a movable contact that slides up and down in conjunction with the up and down movement of the wheel support member, and two fixed contacts, upper and lower, fixed to the vehicle body member. Switches are susceptible to the effects of dirt and dust, and have durability problems.In addition, optical vehicle height sensors using photocouplers, which were devised to avoid such problems, are non-contact, so the above-mentioned Although this method does not have the durability problem of the contact type, it does have the problem that it can only detect specific positions corresponding to the number of photocouplers and cannot continuously measure the vehicle height.
又、所定長さの受光面を有し該受光面に入射さ
れる入射光位置を検出できる1次元位置検出素子
の該入射光位置を、上記1次元位置検出素子に対
し相対移動するスリツト付きシヤツタのスリツト
を透過する光線によつて変化させ、位置の変化を
連続的に検出し得るようにした光学式位置センサ
において、検出し得る位置の変化量を1次元位置
検出素子の長さより大にするために上記スリツト
を、スリツト付きシヤツタの相対的移動方向に対
しほぼ直交するよう配置された1次元位置検出素
子の受光面に対し、上記スリツト付きシヤツタの
相対的移動に伴ない該受光面の一端部から他端部
にかけて繰り返し対向位置するよう上記移動方向
に対し斜めに複数個設け、該複数個のスリツトの
うちいずれが1次元位置検出素子の受光面に対向
位置しているかを上記スリツトに近接してスリツ
ト付きシヤツタに設けられた帯域検出用スリツト
によるフオトインタラプタの発光素子からの光線
の透過或は遮断により検出するようにしたものに
おいては上記フオトインタラプタの発光素子から
の漏れ光により1次元位置検出素子が検出する位
置に誤差を生ずると言う問題を有する。 Also, a shutter with a slit that moves the position of the incident light of a one-dimensional position detection element having a light-receiving surface of a predetermined length and capable of detecting the position of incident light incident on the light-receiving surface relative to the one-dimensional position detection element. In an optical position sensor that can continuously detect changes in position by changing the position using a light beam that passes through a slit, the amount of change in position that can be detected is greater than the length of the one-dimensional position detection element. Therefore, as the slit-equipped shutter moves relative to the light-receiving surface of the one-dimensional position detecting element, which is arranged to be substantially perpendicular to the direction of relative movement of the slit-equipped shutter, one end of the light-receiving surface A plurality of slits are provided obliquely with respect to the moving direction so as to be repeatedly positioned opposite to each other from one end to the other end, and which of the plurality of slits is located opposite to the light-receiving surface of the one-dimensional position detection element is determined in the vicinity of the slit. In the case where detection is performed by transmitting or blocking the light beam from the light emitting element of the photo interrupter using a band detecting slit provided in the shutter with a slit, the one-dimensional position is determined by the leakage light from the light emitting element of the photo interrupter. There is a problem in that an error occurs in the position detected by the detection element.
本考案はこのような問題に対処することを目的
とするものである。 The present invention aims to address such problems.
問題点を解決するための手段
本考案は、所定長さの受光面を有し該受光面に
入射される入射光位置を検出できる1次元位置検
出素子と、該1次元位置検出素子の所定長さの受
光面の全面にわたりほぼ平行な光線を照射できる
光源と、発光素子と受光素子とを対向させて一体
に形成したフオトインタラプタと、上記光源と1
次元位置検出素子の受光面との間に位置し光源か
らの光線のうち一部を透過させるスリツトおよび
フオトインタラプタの発光素子と受光素子との間
に位置し該発光素子からの光線を透過させる透過
穴を設けたシヤツタとからなり、上記光源と1次
元位置検出素子とフオトインタラプタとを組合わ
せたものおよびシヤツタを相対移動する2部材に
それぞれ取付けた光学式位置センサにおいて、上
記1次元位置検出素子の受光波長感度帯域とフオ
トインタラプタの発光素子の発光波長帯域との重
なり部をなくする手段を設けたことを特徴とする
ものである。Means for Solving the Problems The present invention provides a one-dimensional position detection element having a light-receiving surface of a predetermined length and capable of detecting the position of incident light incident on the light-receiving surface, and a one-dimensional position detection element having a predetermined length of the one-dimensional position detection element. A light source capable of emitting substantially parallel light beams over the entire surface of the light receiving surface; a photo interrupter integrally formed with a light emitting element and a light receiving element facing each other;
A slit that is located between the light-receiving surface of the dimensional position detection element and transmits a portion of the light ray from the light source, and a slit that is located between the light-emitting element and the light-receiving element of the photointerrupter and transmits the light ray from the light-emitting element. A shutter with a hole provided therein, and an optical position sensor that is a combination of the light source, a one-dimensional position detecting element, and a photo interrupter, and an optical position sensor that is attached to two members that move the shutter relative to each other, the one-dimensional position detecting element The invention is characterized in that a means is provided for eliminating the overlap between the light receiving wavelength sensitivity band of the photointerrupter and the light emission wavelength band of the light emitting element of the photointerrupter.
作 用
上記により、フオトインタラプタの発光素子等
の他光源からの漏れ光の影響をなくすことができ
るので1次元位置検出素子の位置検出誤差を低減
できる。Effect: As described above, it is possible to eliminate the influence of leakage light from other light sources such as the light emitting element of the photointerrupter, thereby reducing the position detection error of the one-dimensional position detection element.
実施例 以下本考案の実施例を附図を用いて説明する。Example Embodiments of the present invention will be described below with reference to the accompanying drawings.
第1図および第2図イ,ロは本考案に用いられ
る光学的位置センサの基本的な一構成例を示すも
ので、1が発光ダイオード素子LEDのような発
光素子1aおよび該発光素子1aから発せられる
発散光線を平行光線とするコリメータレンズ1b
とからなる光源、2は角形のスリツト付きシヤツ
タ、3はシリコンフオトダイオードを応用した光
の入射位置を検出する1次元位置検出素子で、上
記光源1から発せられスリツト付きシヤツタ2の
角形のスリツト2aを通過した平行光線1が1次
元位置検出素子3に入射するよう構成されてい
る。 1 and 2A and 2B show a basic configuration example of an optical position sensor used in the present invention, in which 1 is a light-emitting element 1a such as a light-emitting diode element LED, and a light-emitting element 1a is connected to the light-emitting element 1a. Collimator lens 1b that converts emitted diverging light into parallel light
2 is a rectangular shutter with a slit; 3 is a one-dimensional position detection element that detects the incident position of light using a silicon photodiode; The configuration is such that the parallel light beam 1 that has passed through is incident on the one-dimensional position detection element 3.
上記1次元位置検出素子3は、入射光により発
生した光電流が該入射光位置と該1次元位置検出
素子3の両端部に設けられた電極までの距離に反
比例して分割されるよう構成されているので、演
算回路4を用いて各電極から取り出される光電流
I1,I2の和と差およびそれらの比を取ることによ
り上記入射光位置を求めることができる。 The one-dimensional position detecting element 3 is configured such that the photocurrent generated by the incident light is divided in inverse proportion to the distance between the incident light position and the electrodes provided at both ends of the one-dimensional position detecting element 3. Therefore, the photocurrent extracted from each electrode using the arithmetic circuit 4
The above incident light position can be determined by taking the sum and difference of I 1 and I 2 and their ratio.
上記により、スリツト付きシヤツタ2が第2図
イに示す位置から第2図ロに示す位置まで移動し
それにつれて角型のスリツト2aが1次元位置検
出素子3の中央を越えて下側に対向する位置に到
達すると、該1次元位置検出素子3への入射光位
置の移動により両電極から取り出される光電流I1
およびI2の大小関係は逆転するが上記光電流I1お
よびI2の演算回路4による演算により入射光位置
の移動量即ち光源1および1次元位置検出素子3
の位置に対するスリツト付きシヤツタ2の移動量
を連続的に求めることができる。 As a result of the above, the shutter 2 with a slit moves from the position shown in FIG. 2A to the position shown in FIG. When the position is reached, the photocurrent I 1 is extracted from both electrodes due to the movement of the position of the incident light on the one-dimensional position detection element 3.
Although the magnitude relationship of I 2 and I 2 is reversed, the amount of movement of the position of the incident light, that is, the amount of movement of the position of the incident light, that is, the amount of movement of the light source 1 and the one-dimensional position detection element 3
The amount of movement of the slit shutter 2 relative to the position can be continuously determined.
上記のような光学式位置センサにおいては、検
出し得る位置の変化量は1次元位置検出素子2の
受光面の長さ以上にはできないが、これを大とす
るために第3図イ,ロに示すように発光素子1a
およびレンズ1bよりなる光源1と1次元位置検
出素子3との間に位置し該光源1からの光線のう
ち一部を透過させるスリツトをもつたシヤツタ5
のスリツトを、シヤツタ5の相対的移動方向に対
しほぼ直交するよう配置された1次元位置検出素
子3の受光面に対し、上記シヤツタ5の相対的移
動に伴ない該受光面の一端部から他端部にかけて
繰り返し対向位置するよう上記移動方向に対し斜
めに配置された複数個のスリツト5a,5b,
(例えばくの字状)としたものが考えられている。 In the optical position sensor as described above, the amount of change in position that can be detected cannot exceed the length of the light receiving surface of the one-dimensional position detection element 2, but in order to increase this, As shown in FIG.
and a shutter 5, which is located between the light source 1 consisting of a lens 1b and the one-dimensional position detection element 3, and has a slit that transmits a part of the light beam from the light source 1.
With respect to the light-receiving surface of the one-dimensional position detection element 3, which is arranged to be substantially orthogonal to the direction of relative movement of the shutter 5, the slit is inserted from one end of the light-receiving surface to the other as the shutter 5 moves relative to the light-receiving surface. A plurality of slits 5a, 5b are arranged diagonally with respect to the moving direction so as to repeatedly face each other toward the end.
(For example, a dogleg shape) is considered.
この場合には上記複数個のスリツト5a,5b
のどちらの部分が1次元位置検出素子3の受光面
に対向位置しているかを示す帯域検出機構が必要
となるが、このような帯域検出機構として上記シ
ヤツタ5を挟んで対向位置するよう配置された発
光素子6aおよび受光素子6bとからなるフオト
インタラプタ6と、上記シヤツタ5に設けられた
複数個のスリツト5a,5bのうち一方のスリツ
ト例えばスリツト5bが1次元位置検出素子3の
受光面に対向位置しているときだけフオトインタ
ラプタ6の発光素子6aからの光線を透過させる
直線状の帯域検出用スリツト5cとから構成され
る所謂光学式検出機構を用いたものにおいては、
シヤツタ5の大きさからくる制約上から1次元位
置検出素子3とフオトインタラプタ6との間隔は
あまり大きくできないので、シヤツタ5が第3図
イに示すような位置にあるときは第3図ロに示す
ようにフオトインタラプタ6の発光素子6aから
の光線が1次元位置検出素子3の受光面に入射し
該1次元位置検出素子3への光源1からの入射光
位置による位置検出に誤差をもたらすことがあ
る。 In this case, the plurality of slits 5a, 5b
A band detection mechanism is required to indicate which part of the shutter 5 is located opposite to the light receiving surface of the one-dimensional position detection element 3. A photo interrupter 6 includes a light emitting element 6a and a light receiving element 6b, and one of the plurality of slits 5a and 5b provided in the shutter 5, such as the slit 5b, faces the light receiving surface of the one-dimensional position detecting element 3. In a device using a so-called optical detection mechanism composed of a linear band detection slit 5c that transmits the light beam from the light emitting element 6a of the photointerrupter 6 only when the photointerrupter 6 is located,
Due to constraints imposed by the size of the shutter 5, the distance between the one-dimensional position detection element 3 and the photo interrupter 6 cannot be made too large, so when the shutter 5 is in the position shown in FIG. 3A, the distance shown in FIG. As shown, the light beam from the light emitting element 6a of the photo interrupter 6 enters the light receiving surface of the one-dimensional position detecting element 3, causing an error in position detection based on the position of the incident light from the light source 1 to the one-dimensional position detecting element 3. There is.
そこで本考案では例えば第3図ロに示すように
1次元位置検出素子3の受光面に、該1次元位置
検出素子3の受光波長感度帯域とフオトインタラ
プタ6の発光素子6aの発光波長帯域との重なり
部を除去する光学フイルタ7を設け、該フオトイ
ンタラプタ6の発光素子6aからスリツト5b或
は帯域検出用スリツト5cを透過し1次元位置検
出素子3の受光面に入射される漏れ光による該1
次元位置検出素子3の位置検出精度の劣化を防ぐ
ようにしたものである。 Therefore, in the present invention, for example, as shown in FIG. An optical filter 7 is provided to remove the overlapping portion, and the leakage light from the light emitting element 6a of the photointerrupter 6 passes through the slit 5b or the band detection slit 5c and enters the light receiving surface of the one-dimensional position detection element 3.
This is to prevent deterioration of the position detection accuracy of the dimensional position detection element 3.
上記光源1の発光ダイオード1aおよびフオト
インタラプタ6の発光素子6a等に一般的に基い
られるGaAs赤外発光ダイオードおよびGaAlAs
発光ダイオードのピーク発光波長はそれぞれλ1=
940nm、λ2=660nmとかなり離れている上にスペ
クトル半値幅はいずれも50nm程度に狭いので第
4図イに示す発光スペクトル図上では重なること
はないのに対し、1次元位置検出素子3およびフ
オトインタラプタ6の受光素子6b等に一般的に
用いられるSi形の受光素子の分光感度特性は第4
図ロに示すように赤外域から可視域を超えて紫外
域に至る広範囲なので、入射光位置を連続的に検
出する1次元位置検出素子3が第4図ロにおいて
3と表示したような分光感度特性を持つている場
合には第4図イにおいてピーク発光波長λ2を有す
る光源即ちフオトインタラプタ6の発光素子6a
からの漏れ光があれば該漏れ光によつて1次元位
置検出素子3から光電流が出力されることになる
ので、本来の光源1の発光ダイオード素子1aか
らの入射光による位置検出に誤差を発生させるこ
とになる。 GaAs infrared light emitting diodes and GaAlAs which are generally based on the light emitting diode 1a of the light source 1 and the light emitting element 6a of the photointerrupter 6, etc.
The peak emission wavelength of each light emitting diode is λ 1 =
940nm and λ 2 =660nm, which are quite far apart, and the half-width of the spectrum is narrow at about 50nm, so they do not overlap on the emission spectrum diagram shown in Figure 4A, whereas the one-dimensional position detection element 3 and The spectral sensitivity characteristics of the Si-type light receiving element, which is generally used as the light receiving element 6b of the photo interrupter 6, are as follows.
As shown in Figure B, the spectral sensitivity is wide ranging from the infrared region to the visible region to the ultraviolet region, so the one-dimensional position detection element 3 that continuously detects the position of the incident light has a spectral sensitivity as shown as 3 in Figure 4 B. If the light source has a peak emission wavelength λ 2 in FIG. 4A, that is, the light emitting element 6a of the photo interrupter
If there is light leakage from the light emitting diode element 1a, the leakage light will cause the one-dimensional position detection element 3 to output a photocurrent. It will occur.
第4図ハは1次元位置検出素子3の受光波長帯
域とフオトインタラプタ6の発光素子6aの受光
波長帯域との重なり部を除去するため該1次元位
置検出素子3の受光面に装着される光学フイルタ
7と1次元位置検出素子3とを組合わせたものも
分光感度特性を示すもので、該分光感度特性によ
ればフオトインタラプタ6の発光素子6aのピー
ク発光波長λ2にスペクトル半値幅を加えた波長範
囲内では出力を生じないので、たとえ該フオトイ
ンタラプタ6の発光素子6aからの漏れ光があつ
たにせよ該漏れ光による1次元位置検出素子3の
位置検出精度への影響を無くすことができる。 FIG. 4C shows an optical system attached to the light receiving surface of the one-dimensional position detecting element 3 in order to eliminate the overlap between the light receiving wavelength band of the one-dimensional position detecting element 3 and the light receiving wavelength band of the light emitting element 6a of the photointerrupter 6. The combination of the filter 7 and the one-dimensional position detection element 3 also exhibits spectral sensitivity characteristics, and according to the spectral sensitivity characteristics, the spectral half-width is added to the peak emission wavelength λ 2 of the light emitting element 6a of the photo interrupter 6. Since no output is generated within the wavelength range, even if there is light leakage from the light emitting element 6a of the photo interrupter 6, it is possible to eliminate the influence of the leakage light on the position detection accuracy of the one-dimensional position detection element 3. can.
尚フオトインタラプタ6の受光素子6bの分光
感度特性が1次元位置検出素子3の分光感度特性
より広く、光源1の発光ダイオード素子1aのピ
ーク発光波長λ1を含んでしまうような場合には、
上記とは逆に発光ダイオード素子1aからの漏れ
光によるフオトインタラプタ6の誤作動の発生も
考えられるが、該フオトインタラプタ6はON−
OFF作動型式であるため電気的なスレツシヨル
ド値を設定することによる対策が可能であり、本
考案のような光学フイルタは一般的には不要とな
る。 If the spectral sensitivity characteristic of the light receiving element 6b of the photointerrupter 6 is wider than the spectral sensitivity characteristic of the one-dimensional position detection element 3 and includes the peak emission wavelength λ 1 of the light emitting diode element 1a of the light source 1,
Contrary to the above, it is also possible that the photo interrupter 6 malfunctions due to light leaking from the light emitting diode element 1a, but the photo interrupter 6 is ON-
Since it is an OFF operation type, countermeasures can be taken by setting an electrical threshold value, and an optical filter like the one in the present invention is generally unnecessary.
上記実施例では1次元位置検出素子の受光波長
感度帯域とフオトインタラプタの発光素子の発光
波長帯域との重なり部をなくする手段として光学
フイルタを1次元位置検出素子の表面に設けた例
を示したが、光学フイルタを使わずに、1次元位
置検出素子としてフオトインタラプタの発光素子
の発光波長帯域を検出しない分光感度特性をもつ
受光素子を用いても同じ作用効果をもたらすこと
は言うまでもない。 In the above embodiment, an example is shown in which an optical filter is provided on the surface of the one-dimensional position detecting element as a means to eliminate the overlap between the light receiving wavelength sensitivity band of the one-dimensional position detecting element and the emission wavelength band of the light emitting element of the photointerrupter. However, it goes without saying that the same effect can be obtained by using a light receiving element having a spectral sensitivity characteristic that does not detect the emission wavelength band of the light emitting element of the photointerrupter as a one-dimensional position detecting element without using an optical filter.
又、上記実施例では光源1と1次元位置検出素
子3を組合わせたものおよびシヤツタ5間の相対
的移動が直線運動である場合を述べたが回転運動
の場合にも適用し得ることは勿論であり、又透過
穴が、シヤツタに設けられたスリツトが1次元位
置検出素子3の受光面の所定点(例えば中央部)
と対向位置しているときフオトインタラプタ6の
発光素子6aからの光線を透過させて光源1と1
次元位置検出素子3を組合わせたものとシヤツタ
5間の相対位置決めする参照穴である場合にも適
用し得ることは言うまでもない。 Further, in the above embodiment, the case where the relative movement between the combination of the light source 1 and the one-dimensional position detection element 3 and the shutter 5 is a linear movement is described, but it is of course applicable to the case where the relative movement is a rotational movement. In addition, the transmission hole and the slit provided in the shutter are located at a predetermined point (for example, in the center) of the light receiving surface of the one-dimensional position detection element 3.
When the light emitting element 6a of the photointerrupter 6 is located opposite to the light source 1 and
Needless to say, the present invention can also be applied to a reference hole for relative positioning between a combination of dimensional position detection elements 3 and shutter 5.
考案の効果
上記のように本考案によれば、複数のスリツト
或は透過穴を有するシヤツタと、該シヤツタのス
リツト或は透過穴を挟んで対向位置する発光素子
と受光素子の複数の組合わせとからなる多チヤン
ネル式の光学式位置センサにおいて、あるチヤン
ネルに属する受光素子に、該発光素子の受光波長
感度帯域とその他のチヤンネルに属する受光素子
の発光波長帯域との重なり部をなくする手段を設
けたことにより、他チヤンネルの発光素子からス
リツト或は透過穴を透過して受光素子へ入射され
る漏れ光による誤作動の発生を防ぐことができる
もので、各チヤンネルに属する発光素子および受
光素子を近接して配置できると言うレイアウト上
の利点とも相俟つて実用上多大なる効果をもたら
し得るものである。Effects of the Invention As described above, according to the present invention, a shutter having a plurality of slits or transmission holes, and a plurality of combinations of light emitting elements and light receiving elements located opposite to each other across the slits or transmission holes of the shutter, In a multi-channel optical position sensor, a light-receiving element belonging to a certain channel is provided with means for eliminating an overlap between the light-receiving wavelength sensitivity band of the light-emitting element and the emission wavelength band of the light-receiving element belonging to other channels. By doing so, it is possible to prevent malfunctions caused by leakage light that passes through the slit or transmission hole from the light-emitting elements of other channels and enters the light-receiving element. Coupled with the layout advantage of being able to arrange them close together, this can bring about great practical effects.
附図は本考案の実施例を示すもので、第1図お
よび第2図イ,ロは本考案に用いられる光学式位
置センサの基本的な一構成例図、第3図イ,ロは
シヤツタと1次元位置検出素子およびフオトイン
タラプタとの相対的位置関係を示す平面図と側面
図、第4図イ,ロ,ハはそれぞれ発光スペクトル
図、分光感度特性図および光学フイルタと1次元
位置検出素子とを組合わせたものの分光感度特性
図である。
1……光源、2……スリツト付きシヤツタ、3
……1次元位置検出素子、4……演算回路、5…
…シヤツタ、5a,5b……スリツト、5c……
帯域検出用スリツト、6……フオトインタラプ
タ、7……光学フイルタ。
The attached figures show examples of the present invention. Figures 1 and 2 (a) and (b) are diagrams showing an example of the basic configuration of the optical position sensor used in the present invention, and Figures (3) and (b) are illustrations of the shutter and A plan view and a side view showing the relative positional relationship between the one-dimensional position detecting element and the photointerrupter, and Figure 4 A, B, and C respectively show an emission spectrum diagram, a spectral sensitivity characteristic diagram, and the relationship between the optical filter and the one-dimensional position detecting element. It is a spectral sensitivity characteristic diagram of a combination of. 1...Light source, 2...Shutter with slit, 3
...One-dimensional position detection element, 4... Arithmetic circuit, 5...
...Shutter, 5a, 5b...Slit, 5c...
Band detection slit, 6...photo interrupter, 7...optical filter.
Claims (1)
る入射光位置を検出できる1次元位置検出素子
と、該1次元位置検出素子の所定長さの受光面
の全面にわたりほぼ平行な光線を照射できる光
源と、発光素子と受光素子とを対向させて一体
に形成したフオトインタラプタと、上記光源と
1次元位置検出素子の受光面との間に位置し光
源からの光線のうち一部を透過させるスリツト
およびフオトインタラプタの発光素子と受光素
子との間に位置し該発光素子からの光線を透過
させる透過穴を設けたシヤツタとからなり、上
記光源と1次元位置検出素子とフオトインタラ
プタとを組合わせたものおよびシヤツタを相対
移動する2部材にそれぞれ取付けた光学式位置
センサにおいて、上記1次元位置検出素子の受
光波長感度帯域とフオトインタラプタの発光素
子の発光波長帯域との重なり部をなくする手段
を設けたことを特徴とする光学式位置センサ。 (2) 1次元位置検出素子の受光波長感度帯域とフ
オトインタラプタの発光素子の発光波長帯域と
の重なり部をなくする手段は、1次元位置検出
素子の表面に設けられた光学フイルタである実
用新案登録請求の範囲第1項に記載に記載の光
学式位置センサ。 (3) 1次元位置検出素子の受光波長感度帯域とフ
オトインタラプタの発光素子の発光波長帯域と
の重なり部をなくする手段は、フオトインタラ
プタの発光素子の発光波長帯域を検出しない分
光感度特性の受光素子にて構成した1次元位置
検出素子である実用新案登録請求の範囲第1項
に記載の光学式位置センサ。 (4) シヤツタに設けられたスリツトは、該シヤツ
タの相対的移動方向に対しほぼ直交するよう配
置された1次元位置検出素子の受光面に対し、
上記シヤツタの相対的移動に伴ない該受光面の
一端部から他端部にかけて繰り返し対向位置す
るよう上記移動方向に対し斜めに配置された複
数の帯域を有し、シヤツタに設けられた透過穴
は、上記1次元位置検出素子の受光面がシヤツ
タに設けられているスリツトの複数の帯域のう
ちいずれの帯域に対向位置しているかをフオト
インタラプタの発光素子からの光線の透過或は
遮断により検出する帯域検出用スリツトである
実用新案登録請求の範囲第1項乃至第3項のい
ずれかに記載の光学式位置センサ。 (5) 透過穴は、シヤツタに設けられたスリツトが
1次元位置検出素子の受光面の所定点と対向位
置しているときフオトインタラプタの発光素子
からの光線を透過させる参照穴である実用新案
登録請求の範囲第1項乃至第3項のいずれかに
記載の光学式位置センサ。[Claims for Utility Model Registration] (1) A one-dimensional position detection element having a light-receiving surface of a predetermined length and capable of detecting the position of incident light incident on the light-receiving surface, and a predetermined length of the one-dimensional position detection element. a light source capable of emitting substantially parallel light beams over the entire surface of the light-receiving surface; a photo interrupter integrally formed with a light-emitting element and a light-receiving element facing each other; and a photo-interrupter located between the light source and the light-receiving surface of the one-dimensional position detection element. a shutter that is located between the light emitting element and the light receiving element of the photointerrupter and has a transmission hole that allows the light ray from the light emitting element to pass through; In an optical position sensor that is a combination of a one-dimensional position detecting element and a photointerrupter, and an optical position sensor that is attached to two members that move the shutter relative to each other, the light receiving wavelength sensitivity band of the one-dimensional position detecting element and that of the light emitting element of the photo interrupter are An optical position sensor characterized by having a means for eliminating an overlapping portion with a light emission wavelength band. (2) The means for eliminating the overlap between the light reception wavelength sensitivity band of the one-dimensional position detection element and the emission wavelength band of the light emitting element of the photointerrupter is a utility model in which an optical filter is provided on the surface of the one-dimensional position detection element. An optical position sensor according to claim 1. (3) The means to eliminate the overlap between the light reception wavelength sensitivity band of the one-dimensional position detection element and the light emission wavelength band of the light emitting element of the photointerrupter is to detect light with spectral sensitivity characteristics that do not detect the light emission wavelength band of the light emitting element of the photointerrupter. The optical position sensor according to claim 1, which is a one-dimensional position detection element composed of elements. (4) The slit provided in the shutter is placed on the light-receiving surface of the one-dimensional position detection element, which is arranged almost orthogonally to the direction of relative movement of the shutter.
The light-receiving surface has a plurality of bands arranged obliquely to the direction of movement so as to repeatedly face each other from one end to the other end of the light-receiving surface as the shutter moves relative to each other. , detecting in which band the light-receiving surface of the one-dimensional position detecting element is located facing each other among a plurality of bands of a slit provided in the shutter by transmitting or blocking the light beam from the light-emitting element of the photo interrupter. The optical position sensor according to any one of claims 1 to 3, which is a band detection slit. (5) The transmission hole is a reference hole that allows the light from the light emitting element of the photo interrupter to pass through when the slit provided in the shutter is positioned opposite to a predetermined point on the light receiving surface of the one-dimensional position detection element.Registered as a utility model. An optical position sensor according to any one of claims 1 to 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16592287U JPH0541365Y2 (en) | 1987-10-29 | 1987-10-29 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16592287U JPH0541365Y2 (en) | 1987-10-29 | 1987-10-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0170107U JPH0170107U (en) | 1989-05-10 |
JPH0541365Y2 true JPH0541365Y2 (en) | 1993-10-20 |
Family
ID=31452845
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16592287U Expired - Lifetime JPH0541365Y2 (en) | 1987-10-29 | 1987-10-29 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0541365Y2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2978241B1 (en) | 2011-07-21 | 2014-02-28 | Bertrand Arnold | DIGITAL DISPLACEMENT MEASURING DEVICE |
-
1987
- 1987-10-29 JP JP16592287U patent/JPH0541365Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0170107U (en) | 1989-05-10 |
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