JPH054035U - Automatic test equipment - Google Patents

Abstract

(57) [Summary] [Purpose] Aiming at low cost and high operation rate by collecting general-purpose measuring instruments in one place. [Configuration] A multiplexer, a control computer, and a program for time-division processing are added so that general-purpose measuring instruments can be collected in one place and used simultaneously by a plurality of test devices. [Effects] With the above configuration, an automatic test apparatus with low cost and high operating rate can be realized.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to an automatic test device that collects and operates general-purpose measuring instruments used in a test device in one place.

[0002]

[Prior Art]

 FIG. 2 is a block diagram of a conventional automatic test apparatus. In the figure, 1 is a central computer, 2 is a computer A for controlling a measuring instrument, a multiplexer, etc., 3 is an operator, 4 is a multimeter, a frequency counter, etc. General-purpose measuring instrument, 5 is a dedicated measuring instrument, 6 is a multiplexer A connecting the DUT and the measuring instrument, 7 is the DUT, 8 is a test device D that stores 2 to 6, 9 and 10 are test devices D8. Test devices E and F for testing various types of DUTs with the same configuration.

Next, the operation will be described. The operator 3 gives a command to the computer A2 to test the DUT 7. The computer A2 operates according to the program of the central computer 1, and communicates with the general-purpose measuring instrument 4, the dedicated measuring instrument 5, and the multiplexer A6 via the data bus. The multiplexer A6 connects the device under test 7 to the general-purpose measuring instrument 4 or the dedicated measuring instrument 5 according to the instruction of the computer A2. By the series of operations described above, the computer A2 tests the device under test 7 and reports the result to the operator 3. Similarly, each of the test devices E, F9, and 10 can be tested.

[0004]

[Problems to be solved by the device]

 Since the conventional automatic test equipment is configured as described above, it is necessary to provide the general-purpose measuring instrument 4 in each of the test equipments 8, 9, 10 and, considering the entire automatic test equipment, Despite the short usage time, they had to be equipped with the same measuring instruments and required extremely expensive equipment.

The present invention has been made to solve the above problems. By collecting a general-purpose measuring instrument provided in each test device in one place and using a program capable of time-division processing, The purpose is to realize a low-cost automatic test device by connecting each test device to a general-purpose measuring instrument through a multiplexer when necessary and testing.

[0006]

[Means for Solving the Problems]

 The automatic test apparatus according to the present invention realizes a low-cost automatic test apparatus by concentrating general-purpose measuring instruments in one place and controlling a multiplexer by a computer.

[0007]

[Action]

 The automatic test equipment in this invention collects general-purpose measuring instruments in one place and uses the time-division processing program, so that only one common measuring instrument is needed and a low-cost automatic test equipment is realized.

[0008]

【Example】

 Example 1. An embodiment of the present invention will be described below with reference to the drawings. In FIG. 1, reference numerals 11, 12 and 13 are test apparatuses A, B, C and 14 obtained by removing the general-purpose measuring instruments from the conventional test apparatus, and a reference numeral 15 is a measuring instrument group in which one general-purpose measuring instrument is gathered in one place. And a multiplexer A, 16 for connecting the test equipment A, B, C11, 12, 13 to a computer for controlling the measuring instrument group 14, a multiplexer B15, and 17 for accommodating the measuring instrument group 14, a multiplexer B15, and a computer B16. It is a measurement rack that was made.

Next, the operation will be described. The operator 3 gives a command to the computer A2 to test the DUT 7. In response to this, the computer A2 is operated by the central computer 1 having a program capable of time-division processing. As a result, the dedicated measuring instrument 5, the control of the multiplexer A6 and the communication with the central computer 1 and the computer B16 in the measuring rack 17 are communicated. This is for appropriately selecting the general-purpose measuring instrument or the dedicated measuring instrument 5 in the measuring instrument group 14 and switching the multiplexers A, B6, 15 to connect the DUT and the measuring instrument to execute the test. Through these series of operations, the computer A2 acquires the data of the device under test and reports it to the operator 3 as the test result. Also, in the test devices B, C 12, and 13, it is possible to simultaneously test by the time-division processing program of the central computer 1. This is because, if the same general-purpose measuring instrument is required at the same time, it operates according to the preset priority level.

[0010]

[Effect of the device]

 As described above, according to the present invention, since the general-purpose measuring instruments are gathered in one place and the multiplexer and the like are controlled by the time-division processing by the computer, it is not necessary to prepare the general-purpose measuring instruments in duplicate, which is extremely low. The cost is increased, and the operation rate of general-purpose measuring instruments is significantly improved.

[Brief description of drawings]

FIG. 1 is a system configuration diagram of an embodiment using the automatic test apparatus of the present invention.

FIG. 2 is a system configuration diagram of an embodiment using a conventional automatic test device.

[Explanation of symbols]

 1 Central Computer 2 Computer A 3 Operator 4 General-purpose Measuring Instrument 5 Dedicated Measuring Instrument 6 Multiplexer A 7 DUT 8 Testing Device D 9 Testing Device E 10 Testing Device F 11 Testing Device A 12 Testing Device B 13 Testing Device C 14 Measuring Device Group 15 Multiplexer B 16 Computer B 17 Measuring rack

Claims (1)

[Claims for utility model registration] Claims: 1. A multiplexer A for connecting the DUT and various measuring instruments, and a dedicated measuring instrument for measuring a signal from the DUT sent through the multiplexer A. A multiplexer A, a computer A for controlling the dedicated measuring instrument, a test device A for accommodating the multiplexer A, the dedicated measuring instrument, and the computer A, test devices B, C for testing other types of DUTs, and each test device Multiplexer B for connecting A, B, and C to general-purpose measuring instruments, a group of general-purpose measuring instruments in one place, and multiplexer B and measuring-device groups are appropriately connected to signals from the DUT. For controlling the computer B, a measuring rack for accommodating the measuring instrument group, the multiplexer B, and the computer B, and various test programs and general-purpose measuring instruments between the test devices A, B, and C. To connect without competing, when automatic test equipment and a central computer with a program that has the function to split use.