JPH0528511Y2 - - Google Patents

Info

Publication number
JPH0528511Y2
JPH0528511Y2 JP1985061136U JP6113685U JPH0528511Y2 JP H0528511 Y2 JPH0528511 Y2 JP H0528511Y2 JP 1985061136 U JP1985061136 U JP 1985061136U JP 6113685 U JP6113685 U JP 6113685U JP H0528511 Y2 JPH0528511 Y2 JP H0528511Y2
Authority
JP
Japan
Prior art keywords
test piece
fracture
fractured
stress
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1985061136U
Other languages
English (en)
Japanese (ja)
Other versions
JPS61178442U (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985061136U priority Critical patent/JPH0528511Y2/ja
Publication of JPS61178442U publication Critical patent/JPS61178442U/ja
Application granted granted Critical
Publication of JPH0528511Y2 publication Critical patent/JPH0528511Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
JP1985061136U 1985-04-25 1985-04-25 Expired - Lifetime JPH0528511Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985061136U JPH0528511Y2 (enrdf_load_stackoverflow) 1985-04-25 1985-04-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985061136U JPH0528511Y2 (enrdf_load_stackoverflow) 1985-04-25 1985-04-25

Publications (2)

Publication Number Publication Date
JPS61178442U JPS61178442U (enrdf_load_stackoverflow) 1986-11-07
JPH0528511Y2 true JPH0528511Y2 (enrdf_load_stackoverflow) 1993-07-22

Family

ID=30589132

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985061136U Expired - Lifetime JPH0528511Y2 (enrdf_load_stackoverflow) 1985-04-25 1985-04-25

Country Status (1)

Country Link
JP (1) JPH0528511Y2 (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60542U (ja) * 1983-06-16 1985-01-05 株式会社明石製作所 破断試験片保持具

Also Published As

Publication number Publication date
JPS61178442U (enrdf_load_stackoverflow) 1986-11-07

Similar Documents

Publication Publication Date Title
Denoyer et al. Laser microprobe mass spectrometry. 1. Basic principles and performance characteristics
US20070202007A1 (en) Test element analysis system with contact surfaces coated with hard material
CA2113266A1 (en) Test for the rapid evaluation of ischemic states and kit
Nicholas et al. The adhesion of metal/alumina interfaces
DE19814857C2 (de) Gassensor nach dem Prinzip der Austrittsarbeitsmessung
Kapron et al. Quantitation of midazolam in human plasma by automated chip‐based infusion nanoelectrospray tandem mass spectrometry
EP2728352A1 (de) Messsonde zur Messung in Metall- oder Schlackeschmelzen
Huber et al. Suitability of various materials for probes in scanning Kelvin probe measurements
JPH0528511Y2 (enrdf_load_stackoverflow)
DE10042623A1 (de) Verfahren zum Testen einer Verbindungszwischenfläche
US6752012B2 (en) Combined electrical test and mechanical test system for thin film characterization
Bengtson et al. Development of a standard method for quantitative depth profile analysis of zinc‐based metallic coatings by direct current glow discharge optical emission spectroscopy
JPH0532750Y2 (enrdf_load_stackoverflow)
Wilk et al. Organic and elemental ion mapping using laser mass spectrometry
Hall X-ray microanalysis in biology: Quantitation
Hockett A review of standardization issues for total reflection X-ray fluorescence and vapor phase decomposition/total reflection X-ray fluorescence
KR100203749B1 (ko) 폴리실리콘막의 금속오염측정방법
DE4035952C1 (en) Method of measuring temperature of electrical conductors - has electrode forming condenser with capacitance compared to calibration graph
Kristiansen 2.8 A statistical approach to the analysis of dielectric breakdown strength of thin insulating films
Wandelt et al. Appearance potential spectroscopy and magnetism in 3d-metals
JPH08145862A (ja) 金属材の遅れ破壊評価方法
Craus Magnetic properties of nanocrystalline materials for high frequency applications
JPS62136038A (ja) 不純物濃度測定方法
SU1635080A1 (ru) Образец дл определени когезионной прочности газотермических покрытий
Kamiya et al. A new method for measurement of the toughness of brittle thin films