JPH05281053A - Temperature detecting device - Google Patents
Temperature detecting deviceInfo
- Publication number
- JPH05281053A JPH05281053A JP7650192A JP7650192A JPH05281053A JP H05281053 A JPH05281053 A JP H05281053A JP 7650192 A JP7650192 A JP 7650192A JP 7650192 A JP7650192 A JP 7650192A JP H05281053 A JPH05281053 A JP H05281053A
- Authority
- JP
- Japan
- Prior art keywords
- value
- temperature
- voltage
- divided
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、液体の温度、密閉容器
内の温度、部品の温度等のある程度広い範囲で連続して
温度変化を必要とする一般民生機器(たとえば湯沸し
器、炊飯器、電気カーペット、各室)等に関するもので
ある。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to general consumer appliances (for example, water heaters, rice cookers, rice cookers, etc.) that require continuous temperature changes within a relatively wide range such as the temperature of liquids, the temperature in closed containers, and the temperature of parts. Electric carpet, each room) etc.
【0002】[0002]
【従来の技術】従来、一般民生用機器における温度測定
は、その製品に一番重要となる温度では、負特性サーミ
スタと分圧抵抗で分圧された電圧の感度が一番よくなる
ようにして、他の温度では精度を無視して、温度検出装
置を使用していた。また、温度検出装置を連続して使用
したいときは、あらかじめその温度範囲の測定電圧変化
をマイクロコンピュータ等のROMに記憶させていた。2. Description of the Related Art Conventionally, for temperature measurement in general consumer equipment, at the temperature that is most important for the product, the sensitivity of the voltage divided by the negative characteristic thermistor and the voltage dividing resistor becomes the best, At other temperatures, the temperature detector was used, ignoring accuracy. Further, when it is desired to continuously use the temperature detecting device, the measured voltage change in the temperature range is stored in advance in the ROM of the microcomputer or the like.
【0003】[0003]
【発明が解決しようとする課題】本発明は、安価で温度
測定のし易い負特性サーミスタを使用し、広い範囲で連
続して正確な温度を測定できるようにした温度検出装置
を提供するものである。DISCLOSURE OF THE INVENTION The present invention provides a temperature detecting device using a negative characteristic thermistor which is inexpensive and easy to measure temperature, and is capable of continuously and accurately measuring temperature in a wide range. is there.
【0004】[0004]
【実施例】以下に本発明の実施例について図面を参照し
て説明する。Embodiments of the present invention will be described below with reference to the drawings.
【0005】まず、図6は、従来の温度検出装置であ
り、1は負特性サーミスタ、2は分圧抵抗、V1 は分圧
抵抗2の分圧電圧値、VCCは両端電圧値である。First, FIG. 6 shows a conventional temperature detecting device, 1 is a negative characteristic thermistor, 2 is a voltage dividing resistor, V 1 is a divided voltage value of the voltage dividing resistor 2, and V CC is a voltage value across both ends. .
【0006】図7は、負特性サーミスタ1の周辺温度と
分圧抵抗2の分圧電圧値V1 の特性を示したものであ
る。この特性曲線から知ることができるように、電圧V
1 は、サーミスタ1の周辺温度To のときのVCC/2の
前後において感度が最もよくなり、サーミスタ1の周辺
温度がTo より高くなっても低くなっても感度が悪くな
ることが明らかである。また、To より少し低い温度
で、V1 は変曲点をもつため、その変曲点の前後におい
て、サーミスタ1の周辺温度に対するV1 の立上がり電
圧は、ほぼ一定値となっている。FIG. 7 shows the characteristics of the ambient temperature of the negative characteristic thermistor 1 and the divided voltage value V 1 of the voltage dividing resistor 2. As can be seen from this characteristic curve, the voltage V
1, clear that the sensitivity is best before and after the V CC / 2 when the ambient temperature T o of the thermistor 1, the sensitivity becomes worse also become lower higher than the ambient temperature T o of the thermistor 1 Is. Further, since V 1 has an inflection point at a temperature slightly lower than T o , the rising voltage of V 1 with respect to the ambient temperature of the thermistor 1 has a substantially constant value before and after the inflection point.
【0007】次に、図1は、本発明(請求項2記載)の
一実施例である。3は負特性サーミスタ、4は3と同特
性の負特性サーミスタ、5は該サーミスタの高温におけ
る抵抗値をもつ分圧抵抗である。6、7は分圧抵抗であ
るが、6の抵抗値と7の抵抗値の加算値が該サーミスタ
の低温における抵抗値をもつもので、6の抵抗値と7の
抵抗値の割合が、7の抵抗間の電圧と5の抵抗間の電圧
の加算値又は平均値が高温における傾きと低温における
傾きとほぼ近似となるような割合に設定されている。負
特性サーミスタ3と分圧抵抗5との間と、抵抗6と抵抗
7との間に、電圧加算若しくは平均化回路又は演算器8
を接続する。Next, FIG. 1 shows an embodiment of the present invention (claim 2). Reference numeral 3 is a negative characteristic thermistor, 4 is a negative characteristic thermistor having the same characteristic as 3, and 5 is a voltage dividing resistor having a resistance value at a high temperature of the thermistor. Reference numerals 6 and 7 are voltage dividing resistors, and the sum of the resistance value of 6 and the resistance value of 7 has the resistance value of the thermistor at a low temperature, and the ratio of the resistance value of 6 and the resistance value of 7 is 7 Is set to a ratio such that the added value or the average value of the voltage between the resistors and the voltage between the resistors is approximately similar to the slope at high temperature and the slope at low temperature. Between the negative characteristic thermistor 3 and the voltage dividing resistor 5, and between the resistor 6 and the resistor 7, a voltage adding or averaging circuit or a calculator 8 is provided.
Connect.
【0008】図2は、抵抗5間の電圧をV[1]、抵抗
6+抵抗7間の電圧をV[2]、抵抗7間の電圧をV
[3]として、サーミスタの周辺温度と各分圧抵抗の分
圧電圧の特性曲線を示したものである。各電圧V
[1]、V[2]、V[3]は、傾斜扁平S字形の特性
を示しており、それぞれ変曲点をもつ。電圧V[1]と
V[3]の加算値又は平均値も傾斜扁平S字形の特性を
示すが、低温側での温度に対する傾きと高温側での温度
に対する傾きを同じくしているため、変曲点は測定温度
範囲内で1ないし3もつこととなるが、その測定温度範
囲内の傾きの変化量は、電圧V[1]とV[3]に比較
すると、非常に少ない変化量でおさえることができる。
実験の結果、測定温度範囲内の傾きの変化量は、各抵抗
5、6、7の値を適当に選択することにより2割以下に
おさえることができることが判明した。電圧加算若しく
は平均化回路又は演算器8を用いて、電圧V[1]とV
[3]の加算値又は平均値により測定温度範囲におい
て、連続して正確な温度を測定することができる。ま
た、分圧電圧をA/Dコンバータ等で変換してマイクロ
コンピュータ等で処理するものにおいては、V[1]と
V[2]を入力して、V[2]を一定割合に除算して、
その値とV[1]の値を加算又は平均したものも同じ結
果になる。In FIG. 2, the voltage between the resistors 5 is V [1], the voltage between the resistors 6 + 7 is V [2], and the voltage between the resistors 7 is V [1].
As [3], a characteristic curve of the ambient temperature of the thermistor and the divided voltage of each voltage dividing resistor is shown. Each voltage V
[1], V [2], and V [3] show the characteristics of the inclined flat S-shape, and each has an inflection point. The added value or the average value of the voltages V [1] and V [3] also shows the characteristics of the inclined flat S shape, but since the inclination with respect to the temperature on the low temperature side and the inclination with respect to the temperature on the high temperature side are the same, Although there are 1 to 3 inflection points within the measurement temperature range, the amount of change in the slope within the measurement temperature range is very small compared to the voltages V [1] and V [3]. be able to.
As a result of the experiment, it was found that the amount of change in the slope within the measurement temperature range can be suppressed to 20% or less by appropriately selecting the values of the resistors 5, 6, and 7. Using the voltage addition or averaging circuit or the calculator 8, the voltages V [1] and V
With the added value or the average value of [3], it is possible to continuously and accurately measure the temperature in the measurement temperature range. Further, in the case where the divided voltage is converted by an A / D converter or the like and processed by a microcomputer or the like, V [1] and V [2] are input and V [2] is divided by a fixed ratio. ,
The same result is obtained by adding or averaging the value and the value of V [1].
【0009】図3は、本発明(請求項1記載)の一実施
例であって、図1の実施例と同様な理論に基づいてお
り、図1の実施例においては同特性のサーミスタを2個
使用しているが、完全に同じ特性のサーミスタを得るこ
とは不可能であり、また、高価なサーミスタを使用した
とき、コストアップの原因となる。FIG. 3 shows an embodiment of the present invention (claim 1), which is based on the same theory as that of the embodiment of FIG. 1. In the embodiment of FIG. Although the individual thermistors are used, it is impossible to obtain the thermistors having the same characteristics, and when an expensive thermistor is used, the cost increases.
【0010】このため、サーミスタを1個使用し、測定
に誤差を生じない範囲の周期で分圧抵抗を切換えること
により、前記V[1]、V[3]の電圧を得て、その周
期内で前記V[1]、V[3]の電圧を加算又は平均化
したものをその測定温度の値として使用できるものとし
た。Therefore, by using one thermistor and switching the voltage dividing resistors in a cycle within a range that does not cause an error in measurement, the voltages of V [1] and V [3] are obtained and within the cycle. Then, the value obtained by adding or averaging the voltages of V [1] and V [3] can be used as the value of the measured temperature.
【0011】9、10はトランジスタ、11は切換信号
発生器であり、電圧加算若しくは平均化回路又は演算器
8と切換信号発生器11とは、マイクロコンピュータに
よって制御することもできる。Reference numerals 9 and 10 denote transistors, 11 denotes a switching signal generator, and the voltage adding or averaging circuit or the arithmetic unit 8 and the switching signal generator 11 can be controlled by a microcomputer.
【0012】図4は、本発明(請求項3記載)の一実施
例である。FIG. 4 shows an embodiment of the present invention (claim 3).
【0013】1は負特性サーミスタ、12〜18は抵
抗、19〜22はトランジスタ、23は電圧測定器、2
4は切換器である。測定温度範囲を4分割し、切換器2
4によりトランジスタ22をONにし、他のトランジス
タ19〜21をOFFにすると、A点の電圧は図5のa
のような曲線の電圧が得られる。このの範囲の電圧の
傾きを約BV/degになるものとする。次に、トラン
ジスタ21をONにし、他のトランジスタ19,20,
22をOFFにすると、抵抗13〜17の値により、A
点電圧は図5のbのような曲線の電圧が得られる。図5
のの範囲のように電圧の傾きがBV/degになるよ
うに抵抗の値を適当に選択することにより、の範囲で
約BV/degの電圧の傾きを得ることができる。同様
にして、図5のc曲線のの範囲、d曲線のの範囲の
ようにA点電圧を約BV/degの傾きにすることがで
き、測定範囲において、トランジスタ19〜22を切換
えることにより、約BV/degの一定の傾きを得るこ
とができ、この値を測定温度の値として使用できるよう
にしたものである。1 is a negative characteristic thermistor, 12 to 18 are resistors, 19 to 22 are transistors, 23 is a voltage measuring device, 2
Reference numeral 4 is a switch. Divide measurement temperature range into 4 and switch 2
4 turns on the transistor 22 and turns off the other transistors 19 to 21, the voltage at the point A becomes a in FIG.
The voltage of the curve like is obtained. The slope of the voltage in this range is about BV / deg. Next, the transistor 21 is turned on, and the other transistors 19, 20,
When 22 is turned off, A
As the point voltage, a voltage having a curve as shown in b of FIG. 5 is obtained. Figure 5
By appropriately selecting the resistance value so that the voltage gradient becomes BV / deg in the range of, the voltage gradient of approximately BV / deg can be obtained in the range of. Similarly, the voltage at the point A can be made to have a slope of about BV / deg as in the range of the c curve and the range of the d curve in FIG. 5, and by switching the transistors 19 to 22 in the measurement range, A constant slope of about BV / deg can be obtained, and this value can be used as the measured temperature value.
【0014】電圧測定器23と切換器24とは、マイク
ロコンピュータによって制御することもできる。The voltage measuring device 23 and the switching device 24 can also be controlled by a microcomputer.
【0015】[0015]
【発明の効果】以上のように本発明によれば、ある程度
広い範囲の測定温度(一例として50〜150deg)
において、連続して温度変化量や温度を誤差が少なく
(10%程度以下)測定することができ、一般民生用機
器等の温度検出に使用したとき、安全で使い勝手がよい
ものである。As described above, according to the present invention, the measured temperature in a somewhat wide range (50 to 150 deg as an example).
In, the temperature change amount and the temperature can be continuously measured with a small error (about 10% or less), and it is safe and convenient when used for temperature detection of general consumer equipment.
【図1】本発明(請求項2記載)の一実施例である。FIG. 1 is an embodiment of the present invention (claim 2).
【図2】図1の実施例におけるサーミスタの周辺温度と
各分圧抵抗の分圧電圧との特性曲線を示す。FIG. 2 shows characteristic curves of ambient temperature of the thermistor and divided voltage of each voltage dividing resistor in the embodiment of FIG.
【図3】本発明(請求項1記載)の一実施例である。FIG. 3 is an example of the present invention (claim 1).
【図4】本発明(請求項3記載)の一実施例である。FIG. 4 is an embodiment of the present invention (described in claim 3).
【図5】図4の実施例におけるサーミスタの周辺温度と
各分圧抵抗の分圧電圧との特性曲線を示す。5 shows characteristic curves of the ambient temperature of the thermistor and the divided voltage of each voltage dividing resistor in the embodiment of FIG.
【図6】従来の温度検出装置である。FIG. 6 is a conventional temperature detecting device.
【図7】従来の温度検出装置におけるサーミスタの周辺
温度と分圧抵抗の分圧電圧との特性曲線を示す。FIG. 7 shows characteristic curves of the ambient temperature of the thermistor and the divided voltage of the voltage dividing resistor in the conventional temperature detecting device.
1,3,4 負特性サーミスタ 2,5〜7、12〜18 分圧抵抗 8 電圧加算若しくは平均化回路又は演算器 9,10,19〜22 トランジスタ 23 電圧測定器 24 切換器 1, 3, 4 Negative characteristic thermistor 2, 5-7, 12-18 Voltage dividing resistor 8 Voltage addition or averaging circuit or calculator 9, 10, 19-22 Transistor 23 Voltage measuring device 24 Switcher
Claims (4)
し、該サーミスタと抵抗で定電圧を分圧し、その分圧電
圧値で該サーミスタの周辺温度を測定するものにおい
て、負特性サーミスタの高温側の該サーミスタ抵抗値を
分圧抵抗値として分圧電圧値V[1]を得る抵抗と、低
温側の該サーミスタ抵抗値を分圧抵抗値として得た分圧
電圧値V[2]をある割合で分圧した電圧値V[3]を
得るようにした抵抗を、測定に誤差を生じない程度の周
期で切り換えて得た分圧電圧値V[1]と分圧電圧値V
[3]を上記1周期で加算又は平均した値を、上記周期
内の測定温度として少なくとも測定使用範囲で傾きが一
定になるようにした温度検出装置。1. A negative characteristic thermistor is used as a heat-sensitive element, a constant voltage is divided by the thermistor and a resistor, and the ambient temperature of the thermistor is measured by the divided voltage value. The resistance that obtains the divided voltage value V [1] with the thermistor resistance value as the divided resistance value and the divided voltage value V [2] obtained with the low temperature side thermistor resistance value as the divided resistance value are at a certain ratio. The divided voltage value V [1] and the divided voltage value V obtained by switching the resistance for obtaining the divided voltage value V [3] in a cycle that does not cause an error in measurement.
A temperature detecting device in which a value obtained by adding or averaging [3] in one cycle is set as a measurement temperature in the cycle so that the inclination becomes constant at least in a measurement use range.
使用し、一方を測定使用範囲の高温側の該サーミスタ抵
抗値を分圧抵抗値として使用して得た分圧電圧値V
[1]と、他方を測定使用範囲の低温側の該サーミスタ
抵抗値を分圧抵抗値として使用した分圧電圧値V[2]
をある割合で分圧した電圧値V[3]を、加算又は平均
した値を、測定温度としてなる請求項1記載の温度検出
装置。2. A divided voltage value V obtained by using two negative characteristic thermistors having the same characteristic and using one of them as the voltage dividing resistance value of the thermistor resistance value on the high temperature side of the measurement use range.
[1] and the divided voltage value V [2] in which the other one uses the resistance value of the thermistor on the low temperature side of the measurement use range as the dividing resistance value.
The temperature detection device according to claim 1, wherein the measured temperature is a value obtained by adding or averaging the voltage value V [3] obtained by dividing the voltage at a certain ratio.
範囲内の温度におけるサーミスタ抵抗値を分圧抵抗値と
し、それぞれの分割温度範囲内の温度における電圧値の
傾きが各分割温度範囲においてもほぼ一定になるよう
に、電圧値をある割合で分圧した値を測定温度としてな
る請求項1記載の温度検出装置。3. The measurement temperature range is divided, the thermistor resistance value at each temperature within the divided range is set as a voltage dividing resistance value, and the slope of the voltage value at each temperature within each divided temperature range is also in each divided temperature range. The temperature detecting device according to claim 1, wherein a value obtained by dividing the voltage value at a certain ratio so as to be substantially constant is used as the measurement temperature.
を測定温度としての値の傾きをほぼ一定になる電圧にす
る手段として、その電圧を電圧増幅又は除算して求める
請求項1ないし3のいずれかに記載の温度検出装置。4. The voltage obtained by amplifying or dividing the voltage of the negative characteristic thermistor and the voltage dividing resistor to obtain a voltage having a substantially constant slope as measured temperature. The temperature detection device according to any one of 1.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP07650192A JP3184941B2 (en) | 1992-03-31 | 1992-03-31 | Temperature detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP07650192A JP3184941B2 (en) | 1992-03-31 | 1992-03-31 | Temperature detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH05281053A true JPH05281053A (en) | 1993-10-29 |
JP3184941B2 JP3184941B2 (en) | 2001-07-09 |
Family
ID=13606984
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP07650192A Expired - Fee Related JP3184941B2 (en) | 1992-03-31 | 1992-03-31 | Temperature detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3184941B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7984626B2 (en) | 2006-01-30 | 2011-07-26 | Toshiba Kikai Kabushiki Kaisha | Die assembly for molding of glass element |
JP2011247780A (en) * | 2010-05-27 | 2011-12-08 | Lapis Semiconductor Co Ltd | Detection device |
JP2015049248A (en) * | 2013-09-02 | 2015-03-16 | エルエス産電株式会社Lsis Co., Ltd. | Temperature measurement device using negative temperature coefficient thermistor |
CN114576610A (en) * | 2022-03-09 | 2022-06-03 | 上海松下微波炉有限公司 | Steam temperature measuring method and steam generator |
-
1992
- 1992-03-31 JP JP07650192A patent/JP3184941B2/en not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7984626B2 (en) | 2006-01-30 | 2011-07-26 | Toshiba Kikai Kabushiki Kaisha | Die assembly for molding of glass element |
JP2011247780A (en) * | 2010-05-27 | 2011-12-08 | Lapis Semiconductor Co Ltd | Detection device |
JP2015049248A (en) * | 2013-09-02 | 2015-03-16 | エルエス産電株式会社Lsis Co., Ltd. | Temperature measurement device using negative temperature coefficient thermistor |
CN114576610A (en) * | 2022-03-09 | 2022-06-03 | 上海松下微波炉有限公司 | Steam temperature measuring method and steam generator |
Also Published As
Publication number | Publication date |
---|---|
JP3184941B2 (en) | 2001-07-09 |
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