JPH0526543Y2 - - Google Patents

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Publication number
JPH0526543Y2
JPH0526543Y2 JP1987063678U JP6367887U JPH0526543Y2 JP H0526543 Y2 JPH0526543 Y2 JP H0526543Y2 JP 1987063678 U JP1987063678 U JP 1987063678U JP 6367887 U JP6367887 U JP 6367887U JP H0526543 Y2 JPH0526543 Y2 JP H0526543Y2
Authority
JP
Japan
Prior art keywords
semiconductor
base
outer diameter
semiconductors
socket
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987063678U
Other languages
Japanese (ja)
Other versions
JPS63170779U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987063678U priority Critical patent/JPH0526543Y2/ja
Publication of JPS63170779U publication Critical patent/JPS63170779U/ja
Application granted granted Critical
Publication of JPH0526543Y2 publication Critical patent/JPH0526543Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Description

【考案の詳細な説明】 [産業上の利用分野] この考案は、半導体を試験する場合に、試験装
置に半導体を順次送り込むために使用する半導体
キヤリアについてのものである。
[Detailed Description of the Invention] [Industrial Field of Application] This invention relates to a semiconductor carrier used to sequentially feed semiconductors into a testing device when testing semiconductors.

[従来の技術] 次に、半導体キヤリアの使用状態を第2図によ
り説明する。第2図の1はソケツト、5は半導
体、7はベース、9aはマガジン、9bは試験装
置である。ソケツト1とベース7で半導体キヤリ
アを構成する。
[Prior Art] Next, the state of use of a semiconductor carrier will be explained with reference to FIG. In FIG. 2, 1 is a socket, 5 is a semiconductor, 7 is a base, 9a is a magazine, and 9b is a test device. Socket 1 and base 7 constitute a semiconductor carrier.

マガジン9aは試験装置9bに接続されてお
り、マガジン9aの端部9cには半導体キヤリア
が順次搬入され、半導体5を試験装置9b側に送
り出していく。
The magazine 9a is connected to the test device 9b, and semiconductor carriers are sequentially carried into the end portion 9c of the magazine 9a, and the semiconductors 5 are sent out to the test device 9b side.

次に、半導体キヤリアに半導体を装着した状態
の断面図を第3図と第4図により説明する。半導
体5を半導体キヤリアに装着するときは、半導体
5のリード5aをソケツト1の穴1aに入れる。
半導体5が位置ずれしないようにするためには、
ベース7の凹部に半導体5のつば5bがぴつたり
入るようにする。
Next, a cross-sectional view of a state in which a semiconductor is mounted on a semiconductor carrier will be explained with reference to FIGS. 3 and 4. When mounting the semiconductor 5 on the semiconductor carrier, the lead 5a of the semiconductor 5 is inserted into the hole 1a of the socket 1.
In order to prevent the semiconductor 5 from shifting,
The collar 5b of the semiconductor 5 is made to fit tightly into the recessed part of the base 7.

[考案が解決しようとする課題] 第3図の半導体4の外径のほうが第4図の半導
体6の外径よりも大きい。このように、半導体の
外径が異なる場合、その半導体に合う凹部をもつ
たベースが必要になる。この考案は、外径が異な
る半導体ごとにアダプタを用意し、ベースを共用
する半導体キヤリアの提供を目的とする。
[Problem to be solved by the invention] The outer diameter of the semiconductor 4 shown in FIG. 3 is larger than the outer diameter of the semiconductor 6 shown in FIG. In this way, when semiconductors have different outer diameters, a base with a recess that fits the semiconductors is required. The purpose of this invention is to provide a semiconductor carrier that uses a common base by preparing adapters for semiconductors with different outer diameters.

[課題を解決するための手段] この目的を達成するため、この考案では、外径
の異なる複数の半導体のリード用の穴1aをもつ
ソケツト1と、前記半導体のうち、最も外径の大
きい半導体の外径L1よりも大きい内径L2の凹
部2aをもつベース2と、前記外径の異なる半導
体の外径にそれぞれ合う穴をもち、外径はL2で
あり、前記凹部2aに装着される複数のアダプタ
3とを備え、ソケツト1にベース2を固定し、ソ
ケツト1の穴1aに前記半導体のリードを挿入
し、前記半導体の外径に合う穴をもつアダプタ3
を前記半導体にかぶせる。
[Means for Solving the Problem] In order to achieve this object, this invention includes a socket 1 having holes 1a for leads of a plurality of semiconductors having different outer diameters, and a semiconductor having the largest outer diameter among the semiconductors. a base 2 having a recess 2a with an inner diameter L2 larger than the outer diameter L1 of the base 2; The base 2 is fixed to the socket 1, the semiconductor lead is inserted into the hole 1a of the socket 1, and the adapter 3 has a hole that matches the outer diameter of the semiconductor.
covering the semiconductor.

[作用] 次に、この考案による半導体キヤリアの構成を
第1図により説明する。第1図の1はソケツト、
2はベース、3はアダプタ、4は半導体である。
ソケツト1とベース2で半導体キヤリアを構成す
る。
[Function] Next, the structure of the semiconductor carrier according to this invention will be explained with reference to FIG. 1 in Figure 1 is a socket,
2 is a base, 3 is an adapter, and 4 is a semiconductor.
Socket 1 and base 2 constitute a semiconductor carrier.

ソケツト1には、外径の異なる複数の半導体の
リード用の穴1aをもち、ベース2には、半導体
のうち、最も外径の大きい半導体の外径L1より
も大きい内径L2の凹部2aを設ける。また、外
径の異なる半導体の外径にそれぞれ合う穴をも
ち、外径はL2であり、ベース2の凹部2aに装
着される複数のアダプタ3を用意する。
The socket 1 has holes 1a for leads of a plurality of semiconductors having different outer diameters, and the base 2 is provided with a recess 2a having an inner diameter L2 larger than the outer diameter L1 of the semiconductor having the largest outer diameter among the semiconductors. . In addition, a plurality of adapters 3 having holes that respectively match the outer diameters of semiconductors having different outer diameters, each having an outer diameter of L2, and which are attached to the recess 2a of the base 2 are prepared.

次に、半導体とアダプタの関係を第5図により
説明する。第5図には、半導体5の外径に合う穴
をもつアダプタ3aと、半導体6の外径に合う穴
をもつアダプタ3bが示されている。
Next, the relationship between the semiconductor and the adapter will be explained with reference to FIG. FIG. 5 shows an adapter 3a having a hole matching the outer diameter of the semiconductor 5 and an adapter 3b having a hole matching the outer diameter of the semiconductor 6.

次に、第1図の組立断面図を第6図により説明
する。第6図では、ソケツト1にベース2を固定
し、ソケツト1の穴1aに半導体4のリードを挿
入する。そして、半導体4の外径に合う穴をもつ
アダプタ3をかぶせることにより、半導体4をベ
ース2に固定する。
Next, the assembled sectional view of FIG. 1 will be explained with reference to FIG. 6. In FIG. 6, the base 2 is fixed to the socket 1, and the leads of the semiconductor 4 are inserted into the hole 1a of the socket 1. Then, the semiconductor 4 is fixed to the base 2 by covering it with an adapter 3 having a hole that matches the outer diameter of the semiconductor 4.

第7図は第6図の半導体キヤリアの実装構成図
の一例である。第7図では、アダプタ3を半導体
4にかぶせ、半導体4を押え板11で押え、押え
板固定用つまみ12で押え板11を固定する。
FIG. 7 is an example of a mounting configuration diagram of the semiconductor carrier shown in FIG. 6. In FIG. 7, the adapter 3 is placed over the semiconductor 4, the semiconductor 4 is held down by the holding plate 11, and the holding plate 11 is fixed with the holding plate fixing knob 12.

[考案の効果] この考案によれば、半導体の外径が異なる場合
でも、半導体の外径に合う穴をもつ複数のアダプ
タを用意するので、共通のベースに半導体を装着
することができる。
[Effects of the invention] According to this invention, even if the semiconductors have different outside diameters, a plurality of adapters having holes that match the outside diameters of the semiconductors are prepared, so that the semiconductors can be mounted on a common base.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案による半導体キヤリアの構成
図、第2図は半導体キヤリアの使用状態説明図、
第3図と第4図は従来技術による半導体キヤリア
の構成図、第5図は半導体とアダプタの関係説明
図、第6図は第1図の組立断面図、第7図は第6
図の半導体キヤリアの実装構成図の一例を示す図
である。 1……ソケツト、2……ベース、3……アダプ
タ、4〜6……半導体、7……ベース、8……ベ
ース、9a……マガジン、9b……試験装置、9
c……端部。
Figure 1 is a configuration diagram of the semiconductor carrier according to this invention, Figure 2 is an explanatory diagram of the usage state of the semiconductor carrier,
3 and 4 are configuration diagrams of a semiconductor carrier according to the prior art, FIG. 5 is an explanatory diagram of the relationship between the semiconductor and the adapter, FIG. 6 is an assembled sectional view of FIG. 1, and FIG.
FIG. 2 is a diagram showing an example of a mounting configuration diagram of the semiconductor carrier shown in the figure. 1...Socket, 2...Base, 3...Adapter, 4-6...Semiconductor, 7...Base, 8...Base, 9a...Magazine, 9b...Testing device, 9
c... end.

Claims (1)

【実用新案登録請求の範囲】 外径の異なる複数の半導体のリード用の第1の
穴1aをもつソケツト1と、 前記半導体のうち、最も外径の大きい半導体の
外径L1よりも大きい内径L2の凹部2aをもつ
ベース2と、 前記外径の異なる半導体の外径にそれぞれ合う
第2の穴をもち、外径のL2であり、前記凹部2
aに装着される複数のアダプタ3とを備え、 ソケツト1にベース2を固定し、ソケツト1の
穴1aに前記半導体のリードを挿入し、前記半導
体の外径に合う第2の穴をもつアダプタ3を前記
半導体にかぶせることを特徴とする半導体キヤリ
ア。
[Claims for Utility Model Registration] A socket 1 having a first hole 1a for leads of a plurality of semiconductors having different outer diameters, and an inner diameter L2 larger than the outer diameter L1 of the semiconductor having the largest outer diameter among the semiconductors. a base 2 having a recess 2a; and a second hole that matches the outer diameter of the semiconductor having different outer diameters, the outer diameter being L2, and the recess 2a having an outer diameter L2;
a, the base 2 is fixed to the socket 1, the semiconductor lead is inserted into the hole 1a of the socket 1, and the adapter has a second hole that matches the outer diameter of the semiconductor. 3 over the semiconductor.
JP1987063678U 1987-04-27 1987-04-27 Expired - Lifetime JPH0526543Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987063678U JPH0526543Y2 (en) 1987-04-27 1987-04-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987063678U JPH0526543Y2 (en) 1987-04-27 1987-04-27

Publications (2)

Publication Number Publication Date
JPS63170779U JPS63170779U (en) 1988-11-07
JPH0526543Y2 true JPH0526543Y2 (en) 1993-07-05

Family

ID=30899128

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987063678U Expired - Lifetime JPH0526543Y2 (en) 1987-04-27 1987-04-27

Country Status (1)

Country Link
JP (1) JPH0526543Y2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4822592U (en) * 1971-07-21 1973-03-14
JPS57560A (en) * 1980-05-31 1982-01-05 Nippon Denpa Kk Tester for electric apparatus having connecting pin
JPS6276274A (en) * 1985-09-30 1987-04-08 日本電気株式会社 Ic socket

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4822592U (en) * 1971-07-21 1973-03-14
JPS57560A (en) * 1980-05-31 1982-01-05 Nippon Denpa Kk Tester for electric apparatus having connecting pin
JPS6276274A (en) * 1985-09-30 1987-04-08 日本電気株式会社 Ic socket

Also Published As

Publication number Publication date
JPS63170779U (en) 1988-11-07

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