JPH05264681A - Current-carrying test device for power source device - Google Patents

Abstract

PURPOSE:To provide a current-carrying test device for power source which requires no auxiliary power source device for current-carrying test. CONSTITUTION:A transistor 43 is periodically ON/OFF by the output voltage Vcon of a timer circuit 44 to generate a control signal B, and the operating/non- operating state of the main power source part 11 of a power source device 10 which is a test target is periodically switched. Further, when the main power source part 11 is in operating state, the power outputted from the power source device 10 is consumed by a load 41 and also supplied to a capacitor 47 and the timer circuit 44 to charge the capacitor 47. When the main power source part 11 is in non-operating state, the power is supplied to the timer circuit 44 by the discharge of the capacitor 47. Since the timer circuit 44 can be regularly operated without using an auxiliary power source device, power source devices more than in the past can be tested in a test room, and the test cost can be reduced.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a power-on test device for a power supply device, and more particularly to a power-on test device that does not require an auxiliary power supply device.

[0002]

2. Description of the Related Art Conventionally, there has been known a power supply device capable of controlling the operating / non-operating state of a main power supply unit by a control signal from the outside. When conducting an energization test of such a power supply device, a dedicated energization test device is used. FIG. 2 is a configuration diagram showing an example of this type of energization test device. In the figure,
Reference numeral 10 is a power supply device to be tested, 20 is a main body of the power supply test device of the power supply device 10, and 30 is an auxiliary power supply device for a power supply test, which comprises a stabilized DC power supply.

The power supply device 10 includes a main power supply unit 11, a main transformer 12, a rectifying / filtering unit 13, an auxiliary power supply unit 14,
The sub transformer 15, the control unit 16, and the signal transmission unit 17 are included. The main power supply unit 11 is controlled in its operating / non-operating state and output voltage value based on the control signal A input from the control unit 16 via the signal transmission unit 17, and the output AC voltage is output from the main transformer 12. It is input to the rectification / filter unit 13 via the. Furthermore, the rectification / filter unit 1
3 is converted from alternating current to direct current, smoothed, and output to the outside through the positive electrode output terminal 18a and the negative electrode output terminal 18b. Further, the AC voltage output from the auxiliary power supply unit 14 is input to the control unit 16 via the sub-transformer 15, and the control unit 16 is supplied with electric power.

The control unit 16 operates by the power supplied from the auxiliary power supply unit 14, and based on the feedback voltage from the rectification / filter unit 13 and the control signal B input from the outside through the control signal input terminal 19. , The operation of the main power supply unit 11
A control signal A for controlling the non-operating state and its output voltage value is output. The control signal A is input to the main power supply unit 11 via the signal transmission unit 17.

The signal transfer section 17 is composed of an insulative signal transfer element, such as a photocoupler, and has a main power supply section 1.
The control signal A is transmitted between 1 and the control unit 16 in an electrically insulated state.

The main body 20 of the current-carrying test equipment comprises a load 2 for testing.
1, a diode 22, an NPN type transistor 23, and a timer circuit 24. The cathode of the diode 22 is connected to the collector of the transistor 23, the emitter of the transistor 23 is grounded, and the voltage Vcon output from the timer circuit 24 is applied to the base.

During the energization test of the power supply device 10, the load 2
1 is connected between the output terminal 18a and the ground terminal 18b of the power supply device 10, and the anode of the diode 22 is connected to the input terminal 19 of the power supply device 10. Further, the timer circuit 24 is supplied with electric power from the auxiliary power supply device 30, and the electric power causes the timer circuit 24 to operate. Timer circuit 24
Outputs a positive voltage Vcon having a pulse width t in a predetermined cycle T.

According to the above configuration, when a positive voltage Vcon is applied to the base of the transistor 23 during the energization test of the power supply device 10, the transistor 23 is turned on and the power supply device 10 receives a low-level control signal. B is input. As a result, the control unit 16 outputs the control signal A for operating the main power supply unit 11, and the power supply device 10 applies a predetermined voltage to the load 21. Also, the transistor 23
When the positive voltage Vcon is not applied to the base of the transistor, the transistor 23 is turned off and the high-level control signal B is input to the power supply device 10. As a result, the control unit 16 outputs the control signal A for deactivating the main power supply unit 11, and the power output from the power supply device 10 is stopped.

In this way, by repeating the operation / non-operation of the power supply device 10 for a predetermined time at the time of shipment as a product,
The stress applied to the power supply device 10 is tested to improve the reliability of the power supply device 10.

[0010]

However, in the above-described conventional energization test device, it is necessary to supply the electric power for operating the timer circuit 24 by the auxiliary power supply device 30. Further, the energization test at the time of product shipment of the power supply device 10 must be carried out for a long time in a test room capable of controlling the room temperature, for example, 50 units or more.

Therefore, the use of the auxiliary power supply device 30 occupies an extra space in the test chamber, which reduces the number of tests and increases the test cost.

In view of the above problems, it is an object of the present invention to provide a power-on test apparatus for a power supply device that does not require an auxiliary power supply device for a power-on test.

[0013]

In order to achieve the above-mentioned object, the present invention provides a power supply device energization test device including a control unit for switching between the operating and non-operating states of a main power supply unit in response to an external control signal. , A load that consumes power output from the power supply device, a control signal generation circuit that periodically outputs the control signal to the control unit, and input and output power of the power supply device to repeat charging and discharging A power supply device energization test device including a charge / discharge circuit for supplying power to the control signal generation circuit is proposed.

[0014]

According to the present invention, during the energization test of the power supply device,
The power output from the power supply device is consumed in the load, and the output power is input to the charge / discharge circuit. When the main power supply unit of the power supply device is in an operating state, the charging and discharging circuit charges electric power,
Power is supplied to the control signal generation circuit. Further, when the main power supply unit is in a non-operating state, the electric power discharged by the charging / discharging circuit is supplied to the control signal generating circuit. As a result, power is constantly supplied to the control signal generation circuit, and the control signal generation circuit periodically outputs a control signal to the control unit of the power supply device to operate or not operate the power supply device. The state is repeated corresponding to the control signal.

[0015]

1 is a block diagram showing an embodiment of the present invention. In the figure, the same components as those in the conventional example described above are designated by the same reference numerals, and the description thereof will be omitted. Further, the difference between the conventional example and the present embodiment lies in the electrification test device 40 having the function of the auxiliary power supply device 30 in the conventional example.

That is, the energization test device 40 includes a test load 41, a diode 42, an NPN type transistor 43,
It is composed of a timer circuit 44, a momentary switch 45, a diode 46 and a capacitor 47. The cathode of the diode 42 is connected to the collector of the transistor 43 and the contact of the switch 45, the emitter of the transistor 43 is grounded, and the timer circuit 4 is connected to the base.
The voltage Vcon output from 4 is applied. Further, the contact piece of the switch 45 is grounded. Further, one end 41a of the load 41 is connected to the anode of the diode 46, and the other end 41b is grounded. The cathode of the diode 46 is connected to one end of the capacitor 47 and the power input terminal 44a of the timer circuit 44, and the other end of the capacitor 47 and the ground end 44b of the timer circuit 44 are grounded.

Here, as the capacitor 47, for example, an electric double layer capacitor which can obtain a high electrostatic capacity is used. Further, the timer circuit 44 is a CM that consumes less power.
It is configured by using an IC (integrated circuit) of OS, and its current consumption is about 300 μA in this embodiment.

Next, the operation of this embodiment having the above-mentioned structure will be described. During the power-on test of the power supply device 10, the load 4
One end 41a of the positive electrode 1 is the positive electrode output terminal 18a of the power supply device 10.
, The other end 41b of the load 41 is connected to the negative output terminal 18b, and the anode of the diode 42 is connected to the control signal input terminal 19 of the power supply device 10.

After the connection is made in this way, the operator operates the switch 4
5 is turned on for a predetermined time. As a result, the cathode of the diode 42 is grounded, and the low-level control signal B is output to the power supply device 10. Therefore, the control unit 16 outputs the control signal A for operating the main power supply unit 11, and the power supply device 10 applies the predetermined voltage Vo to the load 41. Further, the voltage Vo is input to the timer circuit 44 via the diode 46, power is supplied to the timer circuit 44, the voltage Vo is applied to the capacitor 47, and the capacitor 47 is charged.

When power is supplied to the timer circuit 47, the timer circuit 47 starts its operation and outputs a positive voltage Vcon having a pulse width t at a predetermined cycle T. For example, the positive voltage Vcon is output for 50 minutes at a cycle T of 60 minutes. When the positive voltage Vcon is applied to the base of the transistor 43, the transistor 43 is turned on and the low-level control signal B is input to the power supply device 10. As a result, the control unit 16 outputs the control signal A for operating the main power supply unit 11, and the power supply device 10 applies the predetermined voltage Vo to the load 41.

When the positive voltage Vcon is not applied to the base of the transistor 43, the transistor 43 is turned off and the high-level control signal B is input to the power supply device 10. As a result, the control unit 16 causes the main power supply unit 1
1 outputs a control signal A for deactivating the power supply device 1
Power output from 0 is stopped. While power output from the power supply device 10 is stopped, the capacitor 47 is discharged and power is supplied to the timer circuit 44. At this time, the diode 46 blocks energization from the capacitor 47 to the load 41 and the power supply device 10.

As described above, according to the present embodiment, the power supply to the timer circuit 44 is always performed from the power supply device 10 to be tested through the capacitor 47, so that the auxiliary power supply device for the energization test is required as in the conventional case. There is no need to use 30. As a result, the auxiliary power supply device 3 has been conventionally used in the test room.
The power supply device 10 and the conduction test device 40 to be tested can be installed in the space occupied by 0, the number of power supply devices 10 that can be tested at one time in the test chamber can be increased, and the test cost can be reduced. can do.

[0023]

As described above, according to the present invention, the electric power supplied from the power supply device to be tested is supplied to the control signal generating circuit through the charging / discharging circuit. Since the auxiliary power supply device for operating the signal generating circuit is not required, the power supply device and the conduction test device to be tested can be installed in the space conventionally occupied by the auxiliary power supply device in the test room. As a result, the number of power supply devices that can be tested at one time in the test chamber can be increased, and the test cost can be reduced, which is a very excellent effect.

[Brief description of drawings]

FIG. 1 is a configuration diagram showing an embodiment of the present invention.

FIG. 2 is a configuration diagram showing a conventional example.

[Explanation of symbols]

10 ... Power supply device, 11 ... Main power supply unit, 12 ... Main transformer, 13 ... Rectification / filter unit, 14 ... Auxiliary power supply unit, 15
... sub-transformer, 16 control unit, 17 ... signal transmission unit, 18
a: output terminal, 18b: ground terminal, 19: input terminal, 4
0 ... Electricity test device, 41 ... Load, 42, 46 ... Diode, 43 ... Transistor, 44 ... Timer circuit, 45 ... Switch, 47 ... Capacitor.

Claims (1)

[Claims] 1. A conduction test apparatus for a power supply device comprising a control unit for switching between operating and non-operating states of a main power supply unit in response to a control signal from the outside, wherein a load consuming power output from the power supply unit, A control signal generation circuit that periodically outputs a control signal to the control unit, and repeats charging and discharging by inputting the output power of the power supply device,
A charging / discharging circuit that supplies electric power to the control signal generating circuit, and a conduction test apparatus for a power supply device.