JPH05247659A - Etching liquid for pretreatment of aluminum substrate for magnetic disk and pretreatment of this substrate by using this etching liquid - Google Patents

Etching liquid for pretreatment of aluminum substrate for magnetic disk and pretreatment of this substrate by using this etching liquid

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Publication number
JPH05247659A
JPH05247659A JP7875592A JP7875592A JPH05247659A JP H05247659 A JPH05247659 A JP H05247659A JP 7875592 A JP7875592 A JP 7875592A JP 7875592 A JP7875592 A JP 7875592A JP H05247659 A JPH05247659 A JP H05247659A
Authority
JP
Japan
Prior art keywords
substrate
pretreatment
acid
plating
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7875592A
Other languages
Japanese (ja)
Inventor
Kazuhide Saito
一秀 斉藤
Kenji Watanabe
賢治 渡辺
Shizuo Toyoda
静雄 豊田
Mitsuo Masuda
光男 増田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Kanigen Co Ltd
Original Assignee
Japan Kanigen Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Kanigen Co Ltd filed Critical Japan Kanigen Co Ltd
Priority to JP7875592A priority Critical patent/JPH05247659A/en
Publication of JPH05247659A publication Critical patent/JPH05247659A/en
Pending legal-status Critical Current

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  • Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
  • ing And Chemical Polishing (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Chemically Coating (AREA)

Abstract

PURPOSE:To omit a polishing stage after plating and to stably produce magnetic disks having excellent quality without having defects, such as micropits, by improving acidic etching soln. as a pretreatment for electroless plating of an Ni-P alloy on the surface of an Al substrate. CONSTITUTION:The surface of the Al substrate as a ground surface substrate for the magnetic disks is subjected to the pretreatment etching by the etching liquid prepd. by incorporating a fluoride, such as acidic ammonium fluoride, at 10 to 40g/l concn. into a sulfuric acid liquid of 600 to 1350g/l concn. contg. phosphoric acid at 15 to 60g/l concn. and incorporating nitrate, such as sodium vitrate at 10 to 100g/l prior to electroless plating of the N-P alloy on the surface of the above-mentioned substrate. The Ni-P alloy is then electroless plated and an Ni-P alloy plating layer free from the defects, such as micropits and nodule is formed on the surface and, therefore, the need for the subsequent polishing target is eliminated. The Al substrate for the magnetic disks having the excellent surface is thus obtd. easily at low cost.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、磁気ディスク用の下地
基板として使用されるアルミニウム基板の無電解Ni−
Pめっき処理方法に関し、より詳しく言えば、その前処
理方法とそれに用いるエッチング液に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electroless Ni-based aluminum substrate used as a base substrate for a magnetic disk.
More specifically, it relates to a pretreatment method and an etching solution used therefor.

【0002】[0002]

【従来の技術】近年、磁気ディスクドライブの小型化、
高容量化と同時に低価格化が急速に進んでおり、主要部
品である磁気ディスクの品質の向上及びコスト低減の要
求は厳しくなっている。この金属薄膜磁気ディスクの製
造工程は図1に示される。この中でポリッシング工程は
無電解Ni−Pめっき処理後の基板表面のめっき欠陥
(ノジュール、マイクロピットなど)を修正するための
工程であるが自動化が困難でコスト低減の最も大きなネ
ックとなっており、この工程を省略することが最大の課
題となっている。
2. Description of the Related Art In recent years, miniaturization of magnetic disk drives,
The demand for higher quality and lower cost of magnetic disks, which are the main components, is becoming strict as the price is rapidly increasing at the same time as the capacity is increased. The manufacturing process of this metal thin film magnetic disk is shown in FIG. Among them, the polishing process is a process for correcting plating defects (nodules, micropits, etc.) on the surface of the substrate after the electroless Ni-P plating process, but automation is difficult and is the biggest cost reduction. The biggest challenge is to omit this step.

【0003】ところで磁気ディスク製造工程において、
無電解Ni−Pめっき工程についてさらに詳細に述べる
と、この工程はアルカリ脱脂、酸性エッチング、
硝酸浸漬、第1亜鉛置換、硝酸亜鉛剥離、第2亜
鉛置換、無電解Ni−Pめっきの順に処理を行うもの
で、各工程間には純水による水洗工程が行われる。しか
しの酸性エッチングにおいては従来特開平2−101
170号に見られる過硫酸ナトリウムを主成分とした処
理液を用いる方法、特開昭62−177191号に見ら
れるリン酸にホウ酸を含有させた処理液を用いる方法、
同62−192931号に見られる硝酸とフッ化水素ア
ンモニウムを含有する処理液を用いる方法、あるいは硝
酸とフッ酸の混酸、硫酸とリン酸の混酸等からなる処理
液を用いる方法が提案されている。しかし、これらの処
理液の組成では、濃度、処理温度処理時間を種々変えて
も根本的な問題は解決されず、ポリッシング工程を省略
するために必要な条件であるめっき表面のノジュール、
マイクロピット等の欠陥を0.1μm以下に押えること
は不可能であった。したがって上述のように、めっき工
程後この欠陥を除去するポリッシング工程が不可欠であ
り、省力化とコスト低減の大きな障害となっている。
In the magnetic disk manufacturing process,
To describe the electroless Ni-P plating process in more detail, this process includes alkali degreasing, acid etching,
Treatments are carried out in the order of nitric acid dipping, first zinc substitution, zinc nitrate stripping, second zinc substitution, and electroless Ni-P plating, and a washing step with pure water is performed between each step. However, in the case of acid etching, the conventional method has been used.
170, a method using a treatment liquid containing sodium persulfate as a main component, and a method using a treatment liquid containing boric acid in phosphoric acid as disclosed in JP-A-62-177191.
A method using a treatment liquid containing nitric acid and ammonium hydrogen fluoride as disclosed in JP-A-62-192331, or a treatment liquid containing a mixed acid of nitric acid and hydrofluoric acid, a mixed acid of sulfuric acid and phosphoric acid, and the like has been proposed. .. However, the composition of these treatment liquids does not solve the fundamental problem even if the concentration and treatment temperature treatment time are variously changed, and the plating surface nodules, which is a condition necessary for omitting the polishing step,
It was impossible to suppress defects such as micropits to 0.1 μm or less. Therefore, as described above, a polishing process for removing this defect after the plating process is indispensable, which is a major obstacle to labor saving and cost reduction.

【0004】[0004]

【発明が解決しようとする課題】本発明の目的は、無電
解Ni−Pめっきの前処理方法、特には酸性エッチング
を改善することにより、磁気ディスク製造工程の中のポ
リッシング工程の省力可能なノジュール、マイクロピッ
トの欠陥のない平滑なめっき基板を提供することにあ
る。
SUMMARY OF THE INVENTION An object of the present invention is to improve the pretreatment method for electroless Ni-P plating, in particular, to improve the acid etching so as to save labor in the polishing step of the magnetic disk manufacturing process. , To provide a smooth plated substrate having no micropit defects.

【0005】[0005]

【課題を解決するための手段】本発明者らは上記の従来
の無電解Ni−Pめっき工程におけるめっき表面のめっ
き欠陥であるノジュール、マイクロピットの発生メカニ
ズムについて研究を重ねた結果、(イ)エッチング処理
液中での反応時に発生する金属間化合物、晶出物の脱落
及び生成される不溶解性異物(スマット)が核となるこ
と、(ロ)酸性エッチング液を特定の組成とすることに
より金属間化合物、晶出物が選択的に溶解せず、均一な
エッチングが行われ、マイクロピットの原因である微少
凹を作らないと同時に発生するスマット(不溶性異物)
は溶解し、めっき表面にノジュールを発生させないよう
にしうることを見い出し、この知見に基づき本発明をな
すに至った。
Means for Solving the Problems The present inventors have conducted extensive research on the mechanism of generation of nodules and micropits, which are plating defects on the plating surface in the above-mentioned conventional electroless Ni-P plating process. The intermetallic compound generated during the reaction in the etching treatment solution, the insoluble foreign matter (smut) that is generated and the crystallized product is the core, and (b) the acidic etching solution has a specific composition. Smut (insoluble foreign substance) that is generated at the same time as intermetallic compounds and crystallized substances do not selectively dissolve, uniform etching is performed, and microscopic depressions that cause micropits are not created
It has been found that the metal can be dissolved to prevent nodules from being generated on the plating surface, and the present invention has been completed based on this finding.

【0006】すなわち本発明は、硫酸又は硫酸及びリン
酸を有してなる酸、フッ化物及び硝酸塩を含有すること
を特徴とする磁気ディスク用アルミニウム基板の前処理
用エッチング液を提供するものである。本発明のエッチ
ング液において、硫酸又は硫酸とリン酸の混酸から選ば
れた酸に含有させるフッ化物としては、酸性フッ化アン
モニウム、酸性フッ化ナトリウム又は酸性フッ化カリウ
ムなどがあげられる。また硝酸塩としては、硝酸アンモ
ニウム、硝酸ナトリウム又は硝酸カリウムなどがあげら
れる。
That is, the present invention provides an etching solution for pretreatment of an aluminum substrate for a magnetic disk, which contains sulfuric acid or an acid containing sulfuric acid and phosphoric acid, a fluoride and a nitrate. .. In the etching solution of the present invention, examples of the fluoride contained in an acid selected from sulfuric acid or a mixed acid of sulfuric acid and phosphoric acid include ammonium acid fluoride, sodium acid fluoride, and potassium acid fluoride. Examples of nitrates include ammonium nitrate, sodium nitrate, potassium nitrate and the like.

【0007】本発明のエッチング液において、硫酸又は
硫酸とリン酸の合計濃度は特に制限はないが好ましくは
600〜1350g/リットル、より好ましくは100
0〜1250g/リットルである。これが少なすぎると
めっき後の表面粗さが大きくなりマイクロピットの深さ
も深くなり、ポリッシング工程の省略が困難となる。ま
た、この酸が多すぎるとノジュールが発生するようにな
る。
In the etching solution of the present invention, the total concentration of sulfuric acid or sulfuric acid and phosphoric acid is not particularly limited, but preferably 600 to 1350 g / liter, more preferably 100.
It is 0 to 1250 g / liter. If this amount is too small, the surface roughness after plating becomes large and the depth of the micropits becomes deep, making it difficult to omit the polishing step. Also, if this acid is too much, nodules will be generated.

【0008】また硫酸は単独でもよいが、リン酸を添加
することによりマイクロピットの発生が押えられる傾向
にあるのでこれを適宜加えたことが好ましい。この場合
のリン酸の濃度は、好ましくは15〜60g/リットル
である。また本発明のこのエッチング液を用いて行う磁
気ディスク用アルミニウム基板の前処理方法は前記のエ
ッチング工程を行う以外は通常の方法であるが、これは
次のような工程を順に含んでなる。
Sulfuric acid may be used alone, but it is preferable to add it appropriately because the addition of phosphoric acid tends to suppress the generation of micropits. The concentration of phosphoric acid in this case is preferably 15 to 60 g / liter. The pretreatment method for an aluminum substrate for a magnetic disk using the etching solution of the present invention is a usual method except that the above etching step is carried out, which comprises the following steps in order.

【0009】脱脂工程は、通常アルミニウム用非エッチ
ングタイプの処理液(アルカリ脱脂剤として、好ましく
は10〜50g/リットル)で処理する。エッチング工
程は、前記の通りである。第一亜鉛置換工程は、苛性ソ
ーダ200g/リットル、ロッセル塩40g/リット
ル、酸化亜鉛20g/リットル、塩化第一鉄2g/リッ
トルを含む処理液で処理する。硝酸亜鉛剥離工程は、硝
酸50g/リットルを含む処理液で処理する。第二亜鉛
置換工程は、第一亜鉛置換工程と同一の処理液で処理す
る。これらの前処理工程における各処理の時間及び温度
は通常の方法と特に異ならない。
The degreasing step is usually performed with a non-etching type treatment liquid for aluminum (as an alkali degreasing agent, preferably 10 to 50 g / liter). The etching process is as described above. The first zinc substitution step is performed with a treatment liquid containing 200 g / liter of caustic soda, 40 g / liter of Roussel salt, 20 g / liter of zinc oxide, and 2 g / liter of ferrous chloride. The zinc nitrate stripping step is performed with a treatment liquid containing 50 g / liter of nitric acid. In the second zinc replacement step, the same treatment liquid as in the first zinc replacement step is used. The time and temperature of each treatment in these pretreatment steps are not particularly different from those of the usual method.

【0010】[0010]

【実施例】次に本発明を実施例に基づきさらに詳細に説
明する。
EXAMPLES The present invention will be described in more detail based on examples.

【0011】実施例1 アルミサブストレート基板(古河電気工業株式会社製
3.5インチFP−3材)を用い、下記表1に示す組成
からなる酸性エッチング液を使用し、脱脂処理(50℃
×5分)、酸性エッチング処理(20℃×1分)、硝酸
処理(25℃×1分)、第1亜鉛置換処理(22℃×1
分)、硝酸剥離処理(25℃×1分)、第2亜鉛置換処
理(22℃×30秒)の各条件で前処理を行った後無電
解Ni−Pめっきにより厚さ約12μmの膜を成膜し
た。
Example 1 An aluminum substrate substrate (3.5 inch FP-3 material manufactured by Furukawa Electric Co., Ltd.) was used, and an acid etching solution having the composition shown in Table 1 below was used.
X 5 minutes), acidic etching treatment (20 ° C x 1 minute), nitric acid treatment (25 ° C x 1 minute), first zinc substitution treatment (22 ° C x 1 minute)
Min), nitric acid stripping treatment (25 ° C. × 1 minute), and second zinc substitution treatment (22 ° C. × 30 seconds), and then a film having a thickness of about 12 μm is formed by electroless Ni-P plating. A film was formed.

【0012】めっき後光学顕微鏡により、ノジュール、
マイクロピットの発生状況を観察し、次に述べる基準で
評価した。すなわち、倍率300倍にて顕微鏡視野内に
あるノジュール数及びマイクロピット数をカウントし、
面内5ヶ所×5枚のめっき基板の最大、最小値を測定
し、さらに平均値を求めたその結果を下記表2に示す。
また、このめっき基板をポリッシングを行うことなく、
所定の条件でテクスチャーリングし顕微鏡観察を行った
ところ、表面欠陥は一切残存せず、ポリッシング工程を
省略できることが明瞭となった。
After plating, using an optical microscope,
The occurrence of micropits was observed and evaluated according to the criteria described below. That is, the number of nodules and the number of micropits in the field of view of the microscope are counted at a magnification of 300 times,
The maximum and minimum values of 5 in-plane × 5 plated substrates were measured, and the average value was determined. The results are shown in Table 2 below.
Also, without polishing this plated substrate,
As a result of texturing under a predetermined condition and observing under a microscope, it became clear that no surface defect remained and the polishing step could be omitted.

【0013】実施例2〜7 エッチング液の硫酸、酸性フッ化アンモニウム及び硝酸
アンモニウムの濃度を表1のように設定した以外は実施
例1と全く同様にして前処理を行った後、実施例1と同
様にして無電解Ni−Pめっきを行った。このようにし
て得られためっき基板試料について実施例1と同様にし
てノジュール、マイクロピットの発生状況を観察した。
この結果を表2に示した。また、このめっき基板は実施
例1と同様ポリッシング工程を省略できるものであっ
た。
Examples 2 to 7 After pretreatment was performed in exactly the same manner as in Example 1 except that the concentrations of sulfuric acid, ammonium acid fluoride and ammonium nitrate in the etching solution were set as shown in Table 1, Similarly, electroless Ni-P plating was performed. With respect to the plated substrate sample thus obtained, the occurrence of nodules and micropits was observed in the same manner as in Example 1.
The results are shown in Table 2. Further, this plating substrate was capable of omitting the polishing step as in Example 1.

【0014】比較例1 実施例と同様にアルミサブストレート基板(古河電気工
業株式会社製3.5インチFP−3材)を用い、硫酸1
00g/リットル、リン酸50g/リットルからなる酸
性エッチング液を使用し、脱脂処理(50℃×5分)、
酸性エッチング処理(70℃×1分)、硝酸処理(25
℃×1分)、第1亜鉛置換処理(22℃×1分)、硝酸
剥離処理(25℃×1分)、第2亜鉛置換処理(22℃
×30秒)の前処理を行った。実施例と同一条件にて、
無電解Ni−Pめっき約12μmを成膜した。
Comparative Example 1 An aluminum substrate substrate (3.5 inch FP-3 material manufactured by Furukawa Electric Co., Ltd.) was used as in Example 1 and sulfuric acid 1 was used.
Degreasing treatment (50 ° C. × 5 minutes) using an acidic etching solution consisting of 00 g / liter and phosphoric acid 50 g / liter
Acid etching treatment (70 ° C x 1 minute), nitric acid treatment (25
℃ × 1 minute), first zinc replacement treatment (22 ℃ × 1 minute), nitric acid stripping treatment (25 ℃ × 1 minute), second zinc replacement treatment (22 ℃
× 30 seconds) was pretreated. Under the same conditions as the example,
About 12 μm of electroless Ni-P plating was deposited.

【0015】めっき後実施例と同一方法で観察し、評価
した。結果は表2に示すがノジュール、マイクロピット
が多発しており、かつ面荒れもはげしく平滑性に乏し
い。また、このめっき基板を実施例と同じくポリッシン
グを行うことなく、テクスチャーリング処理し、顕微鏡
観察を行ったところマイクロピット及び面荒れが残存
し、ポリッシングを省略することができないとこが確認
できた。
After plating, the film was observed and evaluated in the same manner as in the example. The results are shown in Table 2, but nodules and micropits frequently occur, and the surface is rough and the smoothness is poor. Further, when the plated substrate was subjected to texturing and microscopic observation without polishing as in the example, it was confirmed that micropits and surface roughness remained and polishing could not be omitted.

【0016】比較例2 実施例と同様にアルミサブストレート基板(古河電気工
業株式会社製3.5インチFR−3材)をリン酸30g
/リットル、ホウ酸30g/リットルからなる酸性エッ
チング液を使用し、脱脂処理(50℃×5分)、酸性エ
ッチング処理(30℃×2分)、硝酸処理(25℃×1
分)、第1亜鉛置換処理(22℃×30秒)、硝酸剥離
処理(25℃×1分)、第2亜鉛置換処理(22℃×3
0秒)の前処理を行った。実施例1と同一条件にて無電
解Ni−Pめっき約12μmを成膜した。結果は表2に
示すが比較例1と同じく面荒れがはげしく、平滑性に乏
しく、ポリッシングを省略することができないことが確
認できた。
Comparative Example 2 An aluminum substrate substrate (3.5 inch FR-3 material manufactured by Furukawa Electric Co., Ltd.) was added with 30 g of phosphoric acid in the same manner as in Example.
/ L, 30 g / L boric acid, an acid etching solution is used. Degreasing treatment (50 ° C. × 5 minutes), acidic etching treatment (30 ° C. × 2 minutes), nitric acid treatment (25 ° C. × 1)
Min), first zinc substitution treatment (22 ° C x 30 seconds), nitric acid stripping treatment (25 ° C x 1 minute), second zinc substitution treatment (22 ° C x 3)
0 second) pretreatment was performed. Under the same conditions as in Example 1, electroless Ni-P plating of about 12 μm was formed. The results are shown in Table 2, but as in Comparative Example 1, it was confirmed that the surface was rough and the smoothness was poor, and polishing could not be omitted.

【0017】[0017]

【表1】 [Table 1]

【0018】[0018]

【表2】 [Table 2]

【0019】[0019]

【発明の効果】本発明の前処理工程によりノジュール及
びマイクロピットの核となる金属的欠陥部の脱落、不溶
解性異物の生成が酸性エッチング工程で防止出来、無欠
陥でありかつ平滑性のよいめっき表面が得られる。その
結果磁気ディスク製造工程の中のポリッシング工程が省
略可能となり、製造コストを大幅に低減することができ
た。また、ポリッシング工程で発生する面ダレ等も解消
できることから高容量化への技術的な進歩にもつなが
る。
As a result of the pretreatment process of the present invention, it is possible to prevent the metallic defects, which are the cores of nodules and micropits, and the formation of insoluble foreign matter from being prevented in the acid etching process, which is defect-free and has good smoothness. A plated surface is obtained. As a result, the polishing process in the magnetic disk manufacturing process can be omitted, and the manufacturing cost can be significantly reduced. Further, since the surface sagging and the like that occurs in the polishing process can be eliminated, it leads to a technological advance toward higher capacity.

【図面の簡単な説明】[Brief description of drawings]

【図1】磁気ディスク製造工程の説明図である。FIG. 1 is an explanatory diagram of a magnetic disk manufacturing process.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 増田 光男 東京都千代田区丸の内2丁目6番1号 古 河電気工業株式会社内 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Mitsuo Masuda 2-6-1, Marunouchi, Chiyoda-ku, Tokyo Furukawa Electric Co., Ltd.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 硫酸又は硫酸及びリン酸を有してなる
酸、フッ化物及び硝酸塩を含有することを特徴とする磁
気ディスク用アルミニウム基板の前処理用エッチング
液。
1. An etching solution for pretreatment of an aluminum substrate for a magnetic disk, which contains sulfuric acid or an acid containing sulfuric acid and phosphoric acid, a fluoride and a nitrate.
【請求項2】 硫酸又は硫酸とリン酸を合わせて600
〜1350g/リットル、フッ化物を10〜40g/リ
ットル、硝酸塩を10〜100g/リットル含有するこ
とを特徴とする請求項1記載のエッチング液。
2. Sulfuric acid or a combination of sulfuric acid and phosphoric acid is 600.
The etching solution according to claim 1, which contains ˜1350 g / liter, 10 to 40 g / liter of fluoride and 10 to 100 g / liter of nitrate.
【請求項3】 前処理工程においてエッチング工程を有
し、エッチング液として請求項1又は2項記載のエッチ
ング液を使用することを特徴とする磁気ディスク用アル
ミニウム基板の前処理方法。
3. A pretreatment method for an aluminum substrate for a magnetic disk, which comprises an etching step in the pretreatment step and uses the etching solution according to claim 1 or 2 as an etching solution.
JP7875592A 1992-03-02 1992-03-02 Etching liquid for pretreatment of aluminum substrate for magnetic disk and pretreatment of this substrate by using this etching liquid Pending JPH05247659A (en)

Priority Applications (1)

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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7875592A JPH05247659A (en) 1992-03-02 1992-03-02 Etching liquid for pretreatment of aluminum substrate for magnetic disk and pretreatment of this substrate by using this etching liquid

Publications (1)

Publication Number Publication Date
JPH05247659A true JPH05247659A (en) 1993-09-24

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