JPH05191100A - Component insertion check device - Google Patents
Component insertion check deviceInfo
- Publication number
- JPH05191100A JPH05191100A JP4005441A JP544192A JPH05191100A JP H05191100 A JPH05191100 A JP H05191100A JP 4005441 A JP4005441 A JP 4005441A JP 544192 A JP544192 A JP 544192A JP H05191100 A JPH05191100 A JP H05191100A
- Authority
- JP
- Japan
- Prior art keywords
- component insertion
- component
- image
- insertion hole
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Supply And Installment Of Electrical Components (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は電子回路基板製造におけ
る部品挿入状態の検査装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device insertion state inspection device in the manufacture of electronic circuit boards.
【0002】[0002]
【従来の技術】従来、電子回路基板における部品挿入状
態の検査は、(1)部品挿入穴位置に位置決めされたコ
ンタクトプローブを挿入された電子部品のリード部に接
触させて抵抗値或いは静電容量等の定数を計測する、も
しくは(2)基板の外観を目視することにより挿入され
た部品の判定をして行われていた。2. Description of the Related Art Conventionally, an inspection of a component insertion state in an electronic circuit board is conducted by (1) contacting a lead portion of an inserted electronic component with a contact probe positioned at a component insertion hole position to obtain a resistance value or an electrostatic capacitance. It has been performed by determining the inserted components by measuring a constant such as (2) or visually observing the appearance of the board.
【0003】上記の(1)の方式の検査装置は以下に示
す2方式に大別できる。一方の方式は検査対象となる基
板の部品挿入位置に合わせてコンタクトプローブを配置
した専用治具(図1(a))を用いてコンタクトプロー
ブの選択を行いながら、順次もしくは並列に検査を行う
ピンボード方式である。もう一方の方式は数組の三次元
テーブルにコンタクトプローブを設置し(図1
(b))、各部品挿入位置へ順次コンタクトプローブを
移動させながら検査を行う方式である。上記の(2)の
方式の検査装置は、撮像カメラ、画像メモリおよびその
処理ユニットを用いて基板上の部品の形状,大きさ,
色,刻印された文字等を検出認識することにより行うも
のであった。The inspection device of the above method (1) can be roughly classified into the following two methods. One method is a pin that performs inspection in sequence or in parallel while selecting a contact probe using a dedicated jig (FIG. 1A) in which the contact probe is arranged according to the component insertion position of the board to be inspected. It is a board system. In the other method, contact probes are installed on several sets of three-dimensional tables (Fig. 1).
(B)), the inspection is performed while sequentially moving the contact probe to each component insertion position. The inspection device of the above method (2) uses the image pickup camera, the image memory and the processing unit for the shape, size, and
This was done by detecting and recognizing colors, imprinted characters, etc.
【0004】[0004]
【発明が解決しようとする課題】上記従来技術はそれぞ
れの方式に以下に記す問題があった。The above-mentioned conventional techniques have the following problems in each system.
【0005】ピンボード方式は、検査対象となる基板1
品種ごとに専用治具を作成する必要があるため、小ロッ
ト生産品や、設計変更による専用治具再作成が、その生
産費用および製作期間を増大させるという問題があっ
た。The pinboard system is a substrate 1 to be inspected.
Since it is necessary to create a dedicated jig for each product type, there is a problem in that production of small lots and recreating a dedicated jig due to design changes increase the production cost and the manufacturing period.
【0006】三次元テーブルを用いる方式は、検査箇所
を切り替える際に移動動作を行うため、検査箇所が多い
ものでは多大な時間を要するという問題があった。The method using the three-dimensional table has a problem that it takes a lot of time when there are many inspection points because the moving operation is performed when the inspection points are switched.
【0007】外観検査方式では、電子部品の多くが類似
形状であり、またその配置が立体的であるため、検査判
定が難しく処理が複雑なものとなり、結果的にその検査
時間を増大させるという問題があった。In the appearance inspection method, since many electronic components have similar shapes and their arrangement is three-dimensional, the inspection determination is difficult and the processing becomes complicated, resulting in an increase in the inspection time. was there.
【0008】本発明の目的は、小ロット生産品や設計変
更の生じ易い試作品においても安価に対応でき、且つ高
速に行うことのできる検査方式を提供することにある。An object of the present invention is to provide an inspection method which can be performed at a low cost and can be performed at high speed even for a small lot product or a prototype whose design is likely to be changed.
【0009】[0009]
【課題を解決するための手段】上記目的を達成するため
に、本発明は基板に対して片面より照明を行い、逆面側
よりその表面を撮像し、通過光による部品挿入穴の画像
形状より部品の挿入状態を検出するようにしたものであ
る。In order to achieve the above object, the present invention illuminates a substrate from one side, images the surface from the opposite side, and determines the image shape of a component insertion hole by passing light. The insertion state of the component is detected.
【0010】さらに、上記検査を行うには、予め挿入穴
の位置,形状,大きさの情報が必要となるが、これを得
るために部品が挿入されていない基板に対して片面より
照明を行い、逆面側よりその表面を撮像し、通過光によ
る部品挿入穴の画像形状よりこの情報を得ることができ
る。Further, in order to carry out the above-mentioned inspection, information on the position, shape and size of the insertion hole is required in advance. To obtain this, the board on which no component is inserted is illuminated from one side. The information can be obtained from the image shape of the component insertion hole by passing light by imaging the surface from the opposite surface side.
【0011】また、自動部品挿入装置の部品挿入情報か
ら前述の検査に必要な情報を得ることができる。Further, the information necessary for the above-mentioned inspection can be obtained from the component insertion information of the automatic component insertion device.
【0012】[0012]
【作用】図2において、(a)の照明6により基板1を
照らした状態で、その逆側より挿入穴の通過光を撮像す
ると同図(b)の様な画像が得られる。この画像内で
は、正常に部品のリードが挿入された箇所7では、挿入
穴の形状はくずれ、正常に挿入されなかった箇所7’で
は挿入穴の形状はくずれない。挿入穴は通常円またはだ
円形状であるので、画像処理の認識手法を用いれば、そ
の判定は容易である。したがって、それぞれの挿入穴位
置から予め8,8’の範囲内にて挿入穴と同一形状、同
一大のものを探し出し、それが発見された場合に挿入不
良であり発見されなかった場合には挿入良好であると判
定することができる。In FIG. 2, when the substrate 1 is illuminated by the illumination 6 shown in FIG. 2A, the light passing through the insertion hole is imaged from the opposite side to obtain an image as shown in FIG. In this image, the shape of the insertion hole collapses at the place 7 where the lead of the component is normally inserted, and the shape of the insertion hole does not collapse at the place 7 ′ where the lead of the component is not normally inserted. Since the insertion hole is usually in the shape of a circle or an ellipse, the determination can be easily made by using a recognition method of image processing. Therefore, from the position of each insertion hole, the same shape and the same size as the insertion hole are searched in advance in the range of 8 and 8 ', and if it is found, the insertion is defective and if it is not found, the insertion is performed. It can be determined to be good.
【0013】また、この検索判定処理を部品が挿入され
ていない基板全面に対して行なうことにより、任意の大
きさの挿入穴位置を検出することも可能となる。Further, by performing this search determination processing on the entire surface of the board in which no component is inserted, it is possible to detect the insertion hole position of any size.
【0014】[0014]
【実施例】以下、本発明の一実施例を図3により説明す
る。照明6は、位置決めガイド10により固定された基
板1に投光する。これをカメラ11により撮像し、得ら
れた映像信号11'は画像メモリ12上の二次元配列データ
へと展開される。画像メモリ12上のデータはCPU13に
より処理をなされ、処理結果は、モニター15、フロッピ
ーディスク14へ出力可能である。撮像対称はФ1.0mm程
度の挿入穴であるため、その検出精度を維持するため
に、カメラ11は、約50mmの視野を撮像する様にすれば、
一般的な画像メモリサイズ512×480画素に展開したとき
に0.1m/画素の分解能が得られる。視野の小ささは、I/O
インターフェイス16を介してX-Yテーブル17を用いて
カメラ11を順次走査することにより解決される。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIG. The illumination 6 projects onto the substrate 1 fixed by the positioning guide 10. An image of this is picked up by the camera 11, and the obtained video signal 11 'is developed into two-dimensional array data on the image memory 12. The data on the image memory 12 is processed by the CPU 13, and the processing result can be output to the monitor 15 and the floppy disk 14. Since the imaging symmetry is an insertion hole of about Ф1.0 mm, in order to maintain the detection accuracy, the camera 11 should capture a field of view of about 50 mm,
A resolution of 0.1 m / pixel can be obtained when expanded to a general image memory size of 512 × 480 pixels. The small field of view is I / O
This is solved by progressively scanning the camera 11 using the XY table 17 via the interface 16.
【0015】検査箇所、判定規準等は前述した様に未挿
入の基板を用いて得るか、NCテープリーダ18より部品
挿入データをCPU13を用いて編集することにより得
て、これをフロッピーディスク14に保存読み出しするこ
とにより高速に機種の変更が可能である。The inspection location, judgment criteria, etc. are obtained by using the uninserted board as described above or by editing the component insertion data from the NC tape reader 18 by using the CPU 13 and storing the data on the floppy disk 14. The model can be changed at high speed by saving and reading.
【0016】[0016]
【発明の効果】本発明によれば、コンタクトプローブを
使用せずに、電子基板の部品挿入検査を行なうことがで
きるので、小ロットの基板や試作基板に対して、安価で
高速な検査が行なえるという効果がある。According to the present invention, it is possible to perform a component insertion inspection of an electronic board without using a contact probe. Therefore, it is possible to perform an inexpensive and high-speed inspection for a small lot of boards and prototype boards. Has the effect of
【図1】コンタクトプローブを用いて行なう2つの検査
方式を示す説明図である。FIG. 1 is an explanatory diagram showing two inspection methods performed using a contact probe.
【図2】照明によって部品挿入状態がどのような画像に
表れてくるかを示す説明図である。FIG. 2 is an explanatory diagram showing what kind of image the component insertion state appears due to illumination.
【図3】本発明の一実施例を実現する装置の構成を示す
ブロック図である。FIG. 3 is a block diagram showing a configuration of an apparatus that realizes an exemplary embodiment of the present invention.
1…回路基板、2…電子部品、3……コンタクトプロー
ブ、4…ピンボード治具、5…三次元テーブル(アクチ
ュエータ)、6…照明装置、7,7'…部品挿入穴、
8,8'…部品挿入穴検索領減、9…基板裏面(暗部
分)、10…基板位置決めガイド、11…カメラ、11'…映
像信号、12…画像メモリ、13…CPU、14…フロッピー
ディスク、15…モニターディスプレイ、16…I/Oインタ
ーフェイス、17…X−Yテーブル(アクチュエータ)、18
…NCテープリーダ。1 ... Circuit board, 2 ... Electronic component, 3 ... Contact probe, 4 ... Pinboard jig, 5 ... Three-dimensional table (actuator), 6 ... Illumination device, 7, 7 '... Component insertion hole,
8,8 '... Reduced part insertion hole search, 9 ... Board backside (dark part), 10 ... Board positioning guide, 11 ... Camera, 11' ... Video signal, 12 ... Image memory, 13 ... CPU, 14 ... Floppy disk , 15 ... Monitor display, 16 ... I / O interface, 17 ... XY table (actuator), 18
... NC tape reader.
Claims (3)
とその処理ユニットを具備し、電子部品が挿入された後
で且つはんだ付け前の状態のプリント基板に対して、そ
の片面側より照明した光が他方面側へ部品挿入穴を通過
してくる様子をカメラにて撮像し、得られた画像メモリ
上の画像において、あらかじめ指定した部品挿入穴位置
を中心とした一定範囲内の画像形状より、電子部品の挿
入の状態が良好か不良かを検査することを特徴とする部
品挿入検査装置。1. Light emitted from one side of a printed circuit board having an image pickup camera, an illuminating means, an image memory and a processing unit therefor and after insertion of electronic components and before soldering. Is captured by the camera as it passes through the component insertion hole to the other side, and in the image on the obtained image memory, from the image shape within a certain range centered on the component insertion hole position specified in advance, A component insertion inspection device, which inspects whether an electronic component is inserted properly or not.
て、その片面側より照明した光が他方面側へ部品挿入穴
を通過してくる様子をカメラにて撮像し、得られた画像
メモリ上の画像において、部品挿入穴の位置、形状、お
よび大きさを検出し、その結果を元にして、検査する位
置、範囲、および部品挿入状態判定条件を作成する機能
を有することを特徴とする請求項1記載の部品挿入検査
装置。2. An image obtained by photographing with a camera a state in which light illuminated from one side of the circuit board before insertion of electronic components passes through the component insertion hole to the other side. It has a function to detect the position, shape, and size of the component insertion hole in the image on the memory, and to create the inspection position, range, and component insertion state determination condition based on the result. The component insertion inspection device according to claim 1.
等の部品挿入情報を元にして、検査する位置、範囲、お
よび部品挿入状態判定条件を作成する機能を有すること
を特徴とする請求項1記載の部品挿入検査装置。3. The automatic electronic component inserter has a function of creating an inspection position, a range, and a component insertion state determination condition based on component insertion information such as an NC tape used by the automatic electronic component insertion machine. 1. The component insertion inspection device according to 1.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4005441A JPH05191100A (en) | 1992-01-16 | 1992-01-16 | Component insertion check device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4005441A JPH05191100A (en) | 1992-01-16 | 1992-01-16 | Component insertion check device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05191100A true JPH05191100A (en) | 1993-07-30 |
Family
ID=11611290
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4005441A Pending JPH05191100A (en) | 1992-01-16 | 1992-01-16 | Component insertion check device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05191100A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005055670A1 (en) * | 2005-11-22 | 2007-02-22 | Siemens Ag | Inspection system e.g. for testing quality of connection points of electronic modules, includes optical system for recording image of tested connection point |
CN108428329A (en) * | 2018-02-02 | 2018-08-21 | 江苏艾科半导体有限公司 | A kind of package tray portable inspectiont warning device of Integrated circuit IC |
-
1992
- 1992-01-16 JP JP4005441A patent/JPH05191100A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005055670A1 (en) * | 2005-11-22 | 2007-02-22 | Siemens Ag | Inspection system e.g. for testing quality of connection points of electronic modules, includes optical system for recording image of tested connection point |
CN108428329A (en) * | 2018-02-02 | 2018-08-21 | 江苏艾科半导体有限公司 | A kind of package tray portable inspectiont warning device of Integrated circuit IC |
CN108428329B (en) * | 2018-02-02 | 2023-05-12 | 江苏艾科半导体有限公司 | Portable detection alarm device for packaging tray of integrated circuit IC |
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