JPH05172899A - Determination of upper position of circuit board inspecting device - Google Patents

Determination of upper position of circuit board inspecting device

Info

Publication number
JPH05172899A
JPH05172899A JP3293749A JP29374991A JPH05172899A JP H05172899 A JPH05172899 A JP H05172899A JP 3293749 A JP3293749 A JP 3293749A JP 29374991 A JP29374991 A JP 29374991A JP H05172899 A JPH05172899 A JP H05172899A
Authority
JP
Japan
Prior art keywords
circuit board
movable guide
board
connector
guide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3293749A
Other languages
Japanese (ja)
Inventor
Masato Masuda
正登 増田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Niigata Fuji Xerox Manufacturing Co Ltd
Original Assignee
Niigata Fuji Xerox Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Niigata Fuji Xerox Manufacturing Co Ltd filed Critical Niigata Fuji Xerox Manufacturing Co Ltd
Priority to JP3293749A priority Critical patent/JPH05172899A/en
Publication of JPH05172899A publication Critical patent/JPH05172899A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To improve the positioning precision in the electric contact between the connector of an inspected circuit board set on a substrate and a probe installed on a press board, in a circuit board inspecting device. CONSTITUTION:A movable guide unit 2 is installed so as to be movable for a press board, and a movable guide 4 which is applied with an urging force by a spring 3 in the downward direction and has a tapered shaped top edge is installed on the movable guide unit 2. while, a guide board 6 having a tapered hole 5 is installed on a glass epoxy plate 8 as base board. The position adjustment in the electric contact between the connector 9 circuit board 7 and a probe pin 10 is carried out by fitting the movable guide 4 into the tapered hole 5 by lowering the press board.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は回路基板検査装置の上部
位置決め方法、さらに詳しくいえば、両面実装回路基板
の機能検査において、基部にセットした両面実装回路基
板上のコネクタと検査用のプローブピンを電気的に接触
するためにそれらの位置決めを行う方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of locating an upper portion of a circuit board inspection device, and more specifically, in a function inspection of a double-sided mounting circuit board, a connector on the double-sided mounting circuit board set at a base and a probe pin for the inspection. To position them to make electrical contact.

【0002】[0002]

【従来の技術】図3に従来の回路基板検査装置の上部位
置決め部分の側面拡大図を示す。基台となるガラスエポ
キシ板16の上に検査を行う回路基板17がセットされ
ている。プレスボード15に取り付けられている固定ユ
ニット15の端部にプローブピン19が固定されてお
り、プレスボード15を下降させることにより回路基板
17上のコネクタ18とプローブピン19を電気的に結
合させる。プローブピン19は例えばメモリカードが接
続されており、上記コネクタ18とプローブピン19の
結合により回路基板17の検査を行うことができる。
2. Description of the Related Art FIG. 3 is an enlarged side view of an upper positioning portion of a conventional circuit board inspection apparatus. A circuit board 17 to be inspected is set on a glass epoxy plate 16 serving as a base. The probe pin 19 is fixed to the end of the fixing unit 15 attached to the press board 15, and the connector 18 on the circuit board 17 and the probe pin 19 are electrically coupled by lowering the press board 15. A memory card, for example, is connected to the probe pin 19, and the circuit board 17 can be inspected by connecting the connector 18 and the probe pin 19.

【0003】上記コネクタ18とプローブピン19の結
合の際に位置を合わせて嵌合させるために固定ユニット
15にガイド棒12を設け、一方、ベアリング13を内
部に取り付けた円筒孔14aを有するガイド受け14を
ガラスエポキシ板16に設けている。プレスボード15
の下降により、ガイド棒12をガイド受け14の円筒孔
14aに嵌合させることにより、プローブピン19とコ
ネクタ18の位置合わせを行っている。
A guide rod 12 is provided on the fixed unit 15 for aligning and fitting the connector 18 and the probe pin 19 when the probe pin 19 is coupled, while a guide receiver having a cylindrical hole 14a in which a bearing 13 is mounted is provided. 14 is provided on the glass epoxy plate 16. Press board 15
The guide pin 12 and the connector 18 are aligned by fitting the guide rod 12 into the cylindrical hole 14a of the guide receiver 14 by descending.

【0004】[0004]

【発明が解決しようとする課題】さて、従来の回路基板
検査装置の上部位置決め方法は上記説明から明らかなよ
うにガイド棒12が固定されているため、下部のガイド
受け14との正確な位置合わせが困難であった。また、
プレスボードとガラスエポキシ板の平行度が保たれてい
ない場合には、ガイド棒がガイド受けの円筒孔に引っ掛
かることがあるという問題点があった。本発明の目的
は、上記問題を解決するもので、プレスボードに取り付
けられたプローブピンと回路基板上のコネクタの電気的
接触の位置決めを正確にでき、位置合わせのためのガイ
ドがガイド受けに引っ掛かるような事故が生じることの
ない回路基板検査装置の上部位置決め方法を提供するこ
とにある。
In the conventional method of positioning the upper part of the circuit board inspecting apparatus, since the guide rod 12 is fixed as is apparent from the above description, accurate alignment with the lower guide receiver 14 is performed. Was difficult. Also,
If the parallelism between the press board and the glass epoxy plate is not maintained, there is a problem that the guide bar may be caught in the cylindrical hole of the guide receiver. An object of the present invention is to solve the above problems, and to accurately position the electrical contact between a probe pin attached to a press board and a connector on a circuit board so that a guide for alignment can be caught in a guide receiver. It is an object of the present invention to provide a method of locating an upper portion of a circuit board inspection device without causing a serious accident.

【0005】[0005]

【課題を解決するための手段】前記目的を達成するため
に本発明による回路基板検査装置の上部位置決め方法は
プレスボードに対し僅かに水平方向にずれることが可能
なように可動ガイドユニットを取り付け、前記可動ガイ
ドユニットに、下方に付勢力が与えられている先端がテ
ーパ状の可動ガイドを設けるとともに基台に前記可動ガ
イドの先端形状と相補的な形状の凹部を有するガイド台
を設け、前記プレスボードを下降させ、前記可動ガイド
を前記凹部に嵌合させることにより、前記可動ガイドユ
ニットに前記可動ガイドと一定の位置関係に固定されて
いるプローブピンと前記基台にセットした被検査回路基
板のコネクタの電気的接触の位置決めを行うようにして
いる。また、前記回路基板検査装置のプローブピンには
メモリカードを接続して検査することができる。
In order to achieve the above object, the method for positioning the upper part of the circuit board inspecting apparatus according to the present invention is such that a movable guide unit is attached to the press board so that it can be slightly displaced horizontally. The movable guide unit is provided with a movable guide having a tapered tip end to which a biasing force is applied downward, and a base is provided with a guide base having a recessed shape complementary to the distal end shape of the movable guide. By lowering the board and fitting the movable guide into the recess, the probe pin fixed to the movable guide unit in a fixed positional relationship with the movable guide and the connector of the circuit board to be inspected set on the base. The electrical contacts are positioned. Also, a memory card can be connected to the probe pins of the circuit board inspection device for inspection.

【0006】[0006]

【作用】上記方法によれば、ガイド台のテーパ孔に対し
可動ガイドが少しずれていても、可動ガイドとテーパ孔
の嵌合に際し、可動ガイドユニットが上記ずれ量だけ平
行に移動するので、正確な位置決めができる。また、ガ
イドが引っ掛かるようなこともなくなる。
According to the above method, even if the movable guide is slightly deviated from the tapered hole of the guide base, the movable guide unit moves in parallel by the above-mentioned amount of deviation when the movable guide and the tapered hole are fitted together. Can be positioned easily. Also, the guide is not caught.

【0007】[0007]

【実施例】以下、図面を参照して本発明をさらに詳しく
説明する。図1は本発明による方法を採用した回路基板
検査装置(以下「カードテスタ」という)の実施例を示
す概略図である。上下に可動するプレスボード1を下降
させプローブピンおよび付加回路を内蔵したガラスエポ
キシ板8の上にセットされた検査用の回路基板7を押さ
えつけることによりガラスエポキシ板8内の付加回路と
回路基板7がプローブピンを介して電気的に接続され
る。これにより装置として稼働する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in more detail below with reference to the drawings. FIG. 1 is a schematic diagram showing an embodiment of a circuit board inspection apparatus (hereinafter referred to as “card tester”) adopting the method according to the present invention. By pressing down the press board 1 which moves up and down and pressing down the circuit board 7 for inspection set on the glass epoxy plate 8 containing the probe pin and the additional circuit, the additional circuit and the circuit board 7 in the glass epoxy plate 8 are pressed. Are electrically connected via probe pins. As a result, it operates as a device.

【0008】図2は図1の上部位置決め部分の側面拡大
図である。プレスボード1が下降すると、プローブピン
10が回路基板7上のコネクタ9に接触する前に2つの
可動ガイド4のテーパ状の先端とガイド台6に設けられ
たテーパ孔5とが嵌合する。プレスボード1の下降にし
たがって可動ガイド4の周囲に設けられたスプリング3
が圧縮し、可動ガイド4が上方向に押し上げられる。可
動ガイド4はスプリング3の圧縮により押さえつけら
れ、可動ガイドユニット2はプレスボード1に対し、僅
かのクリアランスをもって取り付けられているので,ス
プリング3の反発力により水平方向に移動可能である。
プローブピン10とコネクタ9のリードとは正確に接触
するようにガイド台6の位置を決めてあるので、繰り返
し回路基板7の検査を行う際に可動ガイド4の位置が多
少ずれてもプローブピン10と回路基板7上のコネクタ
9のリードとの接触を正確に、かつ、安定に行うことが
でき、メモリカード11と回路基板7が電気的に接続さ
れる。
FIG. 2 is an enlarged side view of the upper positioning portion of FIG. When the press board 1 descends, the tapered tips of the two movable guides 4 and the tapered holes 5 provided in the guide base 6 are fitted to each other before the probe pins 10 come into contact with the connectors 9 on the circuit board 7. Spring 3 provided around movable guide 4 as press board 1 descends.
Is compressed, and the movable guide 4 is pushed upward. Since the movable guide 4 is pressed by the compression of the spring 3 and the movable guide unit 2 is attached to the press board 1 with a slight clearance, the movable guide unit 2 can move in the horizontal direction by the repulsive force of the spring 3.
Since the position of the guide base 6 is determined so that the probe pin 10 and the lead of the connector 9 are accurately contacted with each other, even if the position of the movable guide 4 is slightly displaced when repeatedly inspecting the circuit board 7, the probe pin 10 Can be accurately and stably contacted with the lead of the connector 9 on the circuit board 7, and the memory card 11 and the circuit board 7 are electrically connected.

【0009】このようにして回路基板7とメモリカード
11の電気的接続を行なうので、回路基板7をカードテ
スタで検査する度にメモリカード11を回路基板7に取
り付けたり、取り外したりする必要がない。したがっ
て、メモリカード自体のコネクタ磨耗を回避でき、メモ
リカードを定期的に交換する必要がなくなり、メンテナ
ンスフリーとなる。また、位置決めが可動ガイド4とテ
ーパ孔5で決定されるので、プレスボード1とガラスエ
ポキシ板8の平行度が多少保たれていなくても可動ガイ
ド4がガイド台6に引っ掛かることはなくなり、プレス
ボード1の位置決めも比較的容易に行うことができる。
本実施例は回路基板上のコネクタにプローブピンで接続
する対象としてメモリカードの例を示したが、表面実装
基板の各種周波数,電圧等の信号計測をする場合や他の
付属回路等を接続する際にも適用できる。
Since the circuit board 7 and the memory card 11 are electrically connected in this manner, it is not necessary to attach or detach the memory card 11 to or from the circuit board 7 every time the circuit board 7 is inspected by the card tester. . Therefore, the wear of the connector of the memory card itself can be avoided, it is not necessary to replace the memory card periodically, and the maintenance becomes free. Further, since the positioning is determined by the movable guide 4 and the tapered hole 5, the movable guide 4 will not be caught on the guide base 6 even if the parallelism between the press board 1 and the glass epoxy plate 8 is not maintained to some extent. Positioning of the board 1 can also be performed relatively easily.
In the present embodiment, the example of the memory card is shown as an object to be connected to the connector on the circuit board by the probe pin. However, in the case of measuring signals such as various frequencies and voltages of the surface mounting board, and connecting other accessory circuits and the like. It can also be applied when

【0010】[0010]

【発明の効果】以上,説明したように本発明方法はプレ
スボードに対し僅かに水平方向にずれることが可能なよ
うに可動ガイドユニットを取り付け、前記可動ガイドユ
ニットに、下方に付勢力が与えられている先端がテーパ
状の可動ガイドを設けるとともに基台に前記可動ガイド
の先端形状と相補的な形状の凹部を有するガイド台を設
け、前記プレスボードを下降させ、前記可動ガイドを前
記凹部に嵌合させることにより回路基板のコネクタとプ
ローブピンの電気的接触の位置決めを行っている。した
がって、プレスボードとガラスエポキシ板の平行度が多
少保たれていなくてもガイドが引っ掛かってしまうとい
う問題は生じない。また、プレスガードの位置決めが容
易になるので、治具交換などの段取り替え時間を削減で
きるという効果がある。実施例で説明したように本発明
方法を回路基板とメモリカードの電気的接触の位置決め
に利用した場合には、基板を検査する際のメモリカード
挿抜時間が不要となり、メモリカード自体のコネクタ磨
耗が回避できメモリカードを定期交換する必要がないと
いう効果が得られる。
As described above, according to the method of the present invention, the movable guide unit is attached to the press board so that the movable guide unit can be slightly displaced in the horizontal direction, and the downward biasing force is applied to the movable guide unit. The movable guide having a tapered tip is provided, and the base is provided with a guide base having a recess having a shape complementary to the front end of the movable guide, and the press board is lowered to fit the movable guide into the recess. The electrical contact between the connector on the circuit board and the probe pin is determined by the matching. Therefore, even if the parallelism between the press board and the glass epoxy plate is not maintained to some extent, the problem that the guide is caught does not occur. Further, since positioning of the press guard becomes easy, there is an effect that setup change time such as jig change can be reduced. When the method of the present invention is used to position the electrical contact between the circuit board and the memory card as described in the embodiment, the time for inserting and removing the memory card when inspecting the board is unnecessary, and the connector wear of the memory card itself does not occur. The effect is that it can be avoided and there is no need to regularly replace the memory card.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による上部位置決め方法により構成した
回路基板検査装置の実施例を示す斜視図である。
FIG. 1 is a perspective view showing an embodiment of a circuit board inspection device configured by an upper positioning method according to the present invention.

【図2】図1の位置決め部の部分拡大図である。FIG. 2 is a partially enlarged view of a positioning unit in FIG.

【図3】従来の回路基板検査装置の一例を示す部分拡大
図である。 1…プレスボード 2…可動ガイドユニット 3…スプリング 4…可動ガイド 5…テーパ孔 6…ガイド台 7…回路基板 8…ガラスエポキシ板 9…コネクタ 9a…リード 10…プローブピン 11…メモリカード 12…ガイド棒 13…ベアリング 14…ガイド受け 14a…円筒孔 15…固定ユニット
FIG. 3 is a partially enlarged view showing an example of a conventional circuit board inspection device. 1 ... Press board 2 ... movable guide unit 3 ... spring 4 ... movable guide 5 ... taper hole 6 ... guide stand 7 ... circuit board 8 ... glass epoxy plate 9 ... connector 9a ... lead 10 ... probe pin 11 ... memory card 12 ... guide Rod 13 ... Bearing 14 ... Guide receiver 14a ... Cylindrical hole 15 ... Fixed unit

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 プレスボードに対し僅かに水平方向にず
れることが可能なように可動ガイドユニットを取り付
け、前記可動ガイドユニットに、下方に付勢力が与えら
れている先端がテーパ状の可動ガイドを設けるとともに
基台に前記可動ガイドの先端形状と相補的な形状の凹部
を有するガイド台を設け、前記プレスボードを下降さ
せ、前記可動ガイドを前記凹部に嵌合させることによ
り、前記可動ガイドユニットに前記可動ガイドと一定の
位置関係に固定されているプローブピンと前記基台にセ
ットした被検査回路基板のコネクタの電気的接触の位置
決めを行うことを特徴とする回路基板検査装置の上部位
置決め方法。
1. A movable guide unit is attached so as to be able to be slightly displaced in the horizontal direction with respect to a press board, and the movable guide unit is provided with a movable guide having a tapered tip end which is biased downward. By providing a guide stand having a recessed portion having a shape complementary to the tip shape of the movable guide on the base and lowering the press board and fitting the movable guide into the recessed portion, the movable guide unit is provided. An upper positioning method for a circuit board inspecting apparatus, comprising: positioning electrical contact between a probe pin fixed in a fixed positional relationship with the movable guide and a connector of a circuit board to be inspected set on the base.
【請求項2】 前記回路基板検査装置のプローブピンに
接続される回路はメモリカードであることを特徴とする
請求項1記載の回路基板検査装置の上部位置決め方法。
2. The upper positioning method for a circuit board inspection device according to claim 1, wherein the circuit connected to the probe pin of the circuit board inspection device is a memory card.
JP3293749A 1991-10-14 1991-10-14 Determination of upper position of circuit board inspecting device Pending JPH05172899A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3293749A JPH05172899A (en) 1991-10-14 1991-10-14 Determination of upper position of circuit board inspecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3293749A JPH05172899A (en) 1991-10-14 1991-10-14 Determination of upper position of circuit board inspecting device

Publications (1)

Publication Number Publication Date
JPH05172899A true JPH05172899A (en) 1993-07-13

Family

ID=17798740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3293749A Pending JPH05172899A (en) 1991-10-14 1991-10-14 Determination of upper position of circuit board inspecting device

Country Status (1)

Country Link
JP (1) JPH05172899A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100641899B1 (en) * 2005-04-14 2006-11-03 서승환 Jig Apparatus For Testing PCB
JP2008123796A (en) * 2006-11-10 2008-05-29 Yokowo Co Ltd Relay connector
JP2013170933A (en) * 2012-02-21 2013-09-02 Mitsubishi Electric Corp Semiconductor testing apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100641899B1 (en) * 2005-04-14 2006-11-03 서승환 Jig Apparatus For Testing PCB
JP2008123796A (en) * 2006-11-10 2008-05-29 Yokowo Co Ltd Relay connector
JP2013170933A (en) * 2012-02-21 2013-09-02 Mitsubishi Electric Corp Semiconductor testing apparatus

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