JPH05149816A - Detecting device of pressure - Google Patents
Detecting device of pressureInfo
- Publication number
- JPH05149816A JPH05149816A JP3339498A JP33949891A JPH05149816A JP H05149816 A JPH05149816 A JP H05149816A JP 3339498 A JP3339498 A JP 3339498A JP 33949891 A JP33949891 A JP 33949891A JP H05149816 A JPH05149816 A JP H05149816A
- Authority
- JP
- Japan
- Prior art keywords
- current
- light
- pressure
- change
- distance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は小型、軽量の圧力検出装
置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a compact and lightweight pressure detecting device.
【0002】[0002]
【従来の技術】圧力の検出、測定には、古くから様々な
方式の装置が使用されているが、小型、軽量のものとし
ては、近年、シリコン半導体を用いそのピエゾ抵抗効果
を利用した圧力センサが広く使用されるようになってき
た。さらに、LSI製造の微細加工技術を適用した種々
の超小型構造の圧力センサも提案されてきた。図5は従
来のシリコン半導体のピエゾ抵抗効果を利用した圧力セ
ンサの一例を示す断面図である。シリコン半導体10を
加工して薄いダイヤフラム部11を作り、ダイヤフラム
部11表面に拡散またはイオン打込みにより拡散抵抗部
12を形成したものである。2. Description of the Related Art Although various types of devices have been used for a long time for detecting and measuring pressure, as a small and lightweight device, a pressure sensor using a piezoresistive effect using a silicon semiconductor has recently been used. Has become widely used. Further, various ultra-compact pressure sensors to which microfabrication technology for LSI manufacturing is applied have also been proposed. FIG. 5 is a sectional view showing an example of a conventional pressure sensor utilizing the piezoresistive effect of a silicon semiconductor. The silicon semiconductor 10 is processed to form a thin diaphragm portion 11, and a diffusion resistance portion 12 is formed on the surface of the diaphragm portion 11 by diffusion or ion implantation.
【0003】[0003]
【発明が解決しようとする課題】従来、小型、軽量の圧
力検出装置として広く使用されているシリコン半導体の
ピエゾ抵抗効果を利用した圧力センサでは、圧力に応じ
て変形するダイヤフラムはシリコン半導体の薄い膜で、
この膜の膜厚の制御が難しく、製造歩留りが悪く、高価
になるという問題があった。また、LSI製造の微細加
工技術を適用するものは、高価な設備と特殊な作業環境
を要し、工程が複雑になるという問題があった。また、
これらの圧力センサでは、構成要素の材料は、加工技術
上の制限から、選択の巾がせまく、従って、使用する環
境あるいはダイヤフラムに接する流体が制限され、使用
できない場合があるという問題があった。本発明は上記
の問題を解決することを目的とする。In a pressure sensor utilizing the piezoresistive effect of a silicon semiconductor, which has been widely used as a small and light pressure detecting device in the past, a diaphragm which deforms in response to a pressure is a thin film of the silicon semiconductor. so,
There is a problem that it is difficult to control the film thickness of this film, the manufacturing yield is poor, and the film becomes expensive. Further, the one to which the microfabrication technique of LSI manufacturing is applied requires expensive equipment and a special working environment, and there is a problem that the process becomes complicated. Also,
In these pressure sensors, there is a problem in that the material of the constituent elements is limited due to processing technology limitations, and therefore the environment in which the pressure sensor is used or the fluid in contact with the diaphragm is limited, so that the pressure sensor cannot be used. The present invention aims to solve the above problems.
【0004】[0004]
【課題を解決するための手段】本発明の圧力検出装置
は、発光素子と、該発光素子の光を反射する反射板と、
該反射板により反射した光を受光し電流を出力する受光
素子と、上記反射板と結合し圧力の変化に伴い上記受光
素子との距離が変化する受圧部とから構成され、上記反
射板は上記発光素子或いは受光素子との距離が変化する
と、上記受光素子の出力電流が変化する位置に配置し、
上記受光素子の出力電流の変化を圧力の変化として検出
することを特徴とするものである。A pressure detecting device of the present invention comprises a light emitting element, a reflector for reflecting the light of the light emitting element,
The light receiving element receives the light reflected by the reflecting plate and outputs an electric current, and the pressure receiving part which is coupled to the reflecting plate and whose distance from the light receiving element changes with the change in pressure. When the distance to the light emitting element or the light receiving element changes, the output current of the light receiving element changes,
It is characterized in that a change in the output current of the light receiving element is detected as a change in pressure.
【0005】[0005]
【実施例】図1は本発明の一実施例を示す正面図、図2
は本発明の一実施例の構成を模式的に示す説明図であ
る。図において、1は反射型光センサ本体、2は反射型
光センサの発光素子及び受光素子のリード、3は透明で
可撓性のあるポリエチレン膜、4はポリエチレン膜3の
表面に蒸着により形成した金、銀、アルミニウムなどの
金属層からなる反射板、5は発光ダイオード、6はホト
トランジスタである。FIG. 1 is a front view showing an embodiment of the present invention, and FIG.
FIG. 3 is an explanatory diagram schematically showing the configuration of an embodiment of the present invention. In the figure, 1 is a reflection type optical sensor body, 2 is leads of a light emitting element and a light receiving element of the reflection type optical sensor, 3 is a transparent and flexible polyethylene film, and 4 is formed on the surface of the polyethylene film 3 by vapor deposition. A reflector made of a metal layer of gold, silver, aluminum or the like, 5 is a light emitting diode, and 6 is a phototransistor.
【0006】図3は反射型光センサと反射板との距離d
をパラメータとする出力電流IO 特性(反射光の検出感
度)の一例を示すグラフ図である。発光ダイオード5が
発光すると、その光が反射板4で反射してホトトランジ
スタ6に入射し、ホトトランジスタ6に出力電流IO が
流れる。この時、出力電流IO は、発光ダイオード5の
光量、即ち発光ダイオード5の電流IF が一定であって
も、図3に示すように、この反射型光センサと対向する
反射板4の距離dによって変化する。距離dの小さい領
域では、dが大きくなるにつれてIO が大きくなり、d
がある大きさを超えると、dが大きくなるにつれてIO
が次第に小さくなっていく。反射型光センサと反射板4
との距離が大きくなるにつれて出力電流IO が大きくな
る位置に反射板4を設けると、距離dの小さい変化に対
し、出力電流IO の大きな変化が得られる。従って、反
射板4への圧力による微小な変形も出力電流IO の変化
によって捉えることができる。この出力電流Io の変化
量と圧力の相関をあらかじめ測定しておけば、出力電流
IOから直接圧力の絶対値を知ることができる。FIG. 3 shows the distance d between the reflection type optical sensor and the reflection plate.
FIG. 6 is a graph showing an example of an output current I O characteristic (detection sensitivity of reflected light) with the parameter as a parameter. When the light emitting diode 5 emits light, the light is reflected by the reflector 4 is incident on the phototransistor 6, flows an output current I O to phototransistor 6. At this time, the output current I O is the distance between the reflection plate 4 and the reflection plate 4 facing the reflection type photosensor, as shown in FIG. 3, even if the light amount of the light emitting diode 5, that is, the current I F of the light emitting diode 5 is constant. It changes with d. In a region where the distance d is small, I o increases as d increases, and
I O As it exceeds the certain size, d is greater
Is getting smaller and smaller. Reflective optical sensor and reflector 4
If the reflection plate 4 is provided at a position where the output current I O increases as the distance between and increases, a large change in the output current I O can be obtained for a small change in the distance d. Therefore, even a slight deformation due to the pressure on the reflection plate 4 can be captured by the change in the output current I O. If the correlation between the change amount of the output current I o and the pressure is measured in advance, the absolute value of the pressure can be known directly from the output current I o .
【0007】ホトトランジスタ6の出力電流IO は、発
光ダイオード5の電流IF およびホトトランジスタ6の
バイアス電圧VCEにて変化する。距離dの小さい領域で
は、dが大きくなるにつれてIO が大きくなり、dがあ
る大きさを超えると、dが大きくなるにつれてIO が次
第に小さくなっていく。この反射型光センサと反射板4
との距離が大きくなるにつれて出力電流Io が大きくな
る位置に反射板4を設けると距離dの小さい変化に対
し、出力電流IO の大きな変化が得られる。従って、反
射板4への圧力による微小な変形も出力電流IO の変化
によって捉えることができる。この出力電流IO の変化
量と圧力の相関をあらかじめ測定しておけば、出力電流
IO から直接圧力の絶対値を知ることができる。The output current I O of the phototransistor 6 changes depending on the current I F of the light emitting diode 5 and the bias voltage V CE of the phototransistor 6. In a region where the distance d is small, I o increases as d increases, and when d exceeds a certain size, I o gradually decreases as d increases. This reflective optical sensor and reflector 4
If the reflection plate 4 is provided at a position where the output current I o increases as the distance between and increases, a large change in the output current I o can be obtained for a small change in the distance d. Therefore, even a slight deformation due to the pressure on the reflection plate 4 can be captured by the change in the output current I O. If the correlation between the change amount of the output current I O and the pressure is measured in advance, the absolute value of the pressure can be known directly from the output current I O.
【0008】ホトトランジスタ6の出力電流IO は、発
光ダイオード5の電流IF およびホトトランジスタ6の
バイアス電圧VCEによっても変化するので、ホトトラン
ジスタ6の出力電流IO が発光ダイオード5の電流IF
およびホトトランジスタ6自体のバイアス電圧VCEによ
って変化することを利用すると、感度を容易に調整する
ことができる。また、発光量が一定の周期または一定の
規則の波形で変化するように、発光ダイオードの電流I
F をコントロールし、その周期または規則に応じて出力
電流IO を処理することによって、雑音を低減すること
ができ、または特定の信号を検出することができるシス
テムの構築が可能になる。Since the output current I O of the phototransistor 6 also changes depending on the current I F of the light emitting diode 5 and the bias voltage V CE of the phototransistor 6, the output current I O of the phototransistor 6 is the current I O of the light emitting diode 5. F
The sensitivity can be easily adjusted by using the fact that the bias voltage V CE of the phototransistor 6 itself changes. In addition, the current I of the light emitting diode is changed so that the light emission amount changes in a constant cycle or a constant regular waveform.
By controlling F and processing the output current I O according to its cycle or rule, it is possible to construct a system that can reduce noise or detect a specific signal.
【0009】また、装置の構成において、圧力により変
位する反射板の条件は、圧力対変位の関係が主で、材質
及び材料に関する制限が殆んどないので、使用する環境
と検出する圧力の大きさに応じて、自由度の大きな選択
ができる。図4は圧力対出力電流の高リニヤリティ化を
図った本発明の他の実施例の構成を示す説明図で、1,
4は図1の同一符号と同一または相当するものを示し、
7は筐体、8は反射型光センサ取付台、9は受圧コーン
である。このような構成にすると圧力に対する感度が向
上する。Further, in the construction of the apparatus, the condition of the reflecting plate which is displaced by pressure is mainly pressure-displacement relationship, and there are almost no restrictions on materials and materials. Therefore, the environment to be used and the magnitude of pressure to be detected are large. The degree of freedom can be selected according to the degree. FIG. 4 is an explanatory diagram showing the configuration of another embodiment of the present invention for achieving high linearity of pressure vs. output current.
4 is the same or corresponding to the same reference numeral in FIG.
Reference numeral 7 is a housing, 8 is a reflection type optical sensor mount, and 9 is a pressure receiving cone. With such a structure, the sensitivity to pressure is improved.
【0010】[0010]
【発明の効果】以上説明したように、本発明によると反
射板の条件は圧力対変位の関係が主で使用する環境と検
出する圧力の大きさに応じて、自由度の大きな選択がで
き、使用する環境やダイヤフラムに接する流体の種類等
に制限されることなく使用でき、かつ小型で軽量な圧力
検出装置を容易に製造することができるという効果があ
る。As described above, according to the present invention, the condition of the reflector is mainly pressure-displacement relationship, and the degree of freedom can be selected depending on the environment used and the magnitude of pressure to be detected. There is an effect that the pressure detecting device can be used without being restricted by the environment in which it is used and the kind of fluid in contact with the diaphragm, and that a small and lightweight pressure detecting device can be easily manufactured.
【図1】本発明の一実施例を示す正面図である。FIG. 1 is a front view showing an embodiment of the present invention.
【図2】本発明の一実施例の構成を模式的に示す説明図
である。FIG. 2 is an explanatory diagram schematically showing the configuration of an embodiment of the present invention.
【図3】反射型光センサと反射板との距離dをパラメー
タとする出力電流IO 特性(反射光の検出感度)の一例
を示すグラフ図である。FIG. 3 is a graph showing an example of an output current I O characteristic (reflection light detection sensitivity) with a distance d between a reflection type optical sensor and a reflection plate as a parameter.
【図4】圧力対出力電流の高リニアリティ化を計った本
発明の他の実施例の構成を示す説明図である。FIG. 4 is an explanatory diagram showing the configuration of another embodiment of the present invention in which the linearity of pressure vs. output current is measured.
【図5】従来のシリコン半導体のピエゾ抵抗効果を利用
した圧力センサの一例を示す断面図である。FIG. 5 is a sectional view showing an example of a conventional pressure sensor utilizing the piezoresistive effect of a silicon semiconductor.
1 反射型光センサ本体 2 リード 3 ポリエチレン膜 4 反射板 5 発光ダイオード 6 ホトトランジスタ 1 Reflective Optical Sensor Main Body 2 Lead 3 Polyethylene Film 4 Reflector 5 Light Emitting Diode 6 Phototransistor
Claims (1)
反射板と、該反射板により反射した光を受光し電流を出
力する受光素子と、上記反射板と結合し圧力の変化に伴
い上記受光素子との距離が変化する受圧部とから構成さ
れ、上記反射板は上記発光素子或いは受光素子との距離
が変化すると、上記受光素子の出力電流が変化する位置
に配置し、上記受光素子の出力電流の変化を圧力の変化
として検出することを特徴とする圧力検出装置。1. A light emitting device, a reflector for reflecting the light of the light emitting device, a light receiving device for receiving the light reflected by the reflector and outputting an electric current, and a light receiving device coupled with the reflector for changing the pressure. The reflector is arranged at a position where the output current of the light receiving element changes when the distance to the light emitting element or the light receiving element changes, and the light receiving element A pressure detection device, which detects a change in output current of the device as a change in pressure.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3339498A JPH05149816A (en) | 1991-11-29 | 1991-11-29 | Detecting device of pressure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3339498A JPH05149816A (en) | 1991-11-29 | 1991-11-29 | Detecting device of pressure |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05149816A true JPH05149816A (en) | 1993-06-15 |
Family
ID=18328044
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3339498A Pending JPH05149816A (en) | 1991-11-29 | 1991-11-29 | Detecting device of pressure |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05149816A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010185710A (en) * | 2009-02-10 | 2010-08-26 | Kenek Co Ltd | Optical displacement meter |
KR102059593B1 (en) * | 2018-06-19 | 2020-02-11 | 한국생산기술연구원 | Detecting sensor based on light intensity and detecting method thereof |
-
1991
- 1991-11-29 JP JP3339498A patent/JPH05149816A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010185710A (en) * | 2009-02-10 | 2010-08-26 | Kenek Co Ltd | Optical displacement meter |
KR102059593B1 (en) * | 2018-06-19 | 2020-02-11 | 한국생산기술연구원 | Detecting sensor based on light intensity and detecting method thereof |
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