JPH0513736A - Color solid-state image pickup device - Google Patents

Color solid-state image pickup device

Info

Publication number
JPH0513736A
JPH0513736A JP3160724A JP16072491A JPH0513736A JP H0513736 A JPH0513736 A JP H0513736A JP 3160724 A JP3160724 A JP 3160724A JP 16072491 A JP16072491 A JP 16072491A JP H0513736 A JPH0513736 A JP H0513736A
Authority
JP
Japan
Prior art keywords
light receiving
state image
image pickup
pickup device
resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3160724A
Other languages
Japanese (ja)
Other versions
JP3050646B2 (en
Inventor
Junichi Nakai
淳一 仲井
Mitsuaki Omori
光明 大森
Tetsuo Aoki
徹郎 青木
Hiroshi Higashide
啓 東出
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP3160724A priority Critical patent/JP3050646B2/en
Publication of JPH0513736A publication Critical patent/JPH0513736A/en
Application granted granted Critical
Publication of JP3050646B2 publication Critical patent/JP3050646B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a high quality color solid-state image pickup device having a required spectral characteristic by installing a colored resin layer to a light receiving section in a color solid-state image pickup device having a light receiving section which is provided with a photoelectric transfer function on a semiconductor board and a color filter which meets said light receiving section. CONSTITUTION:There are formed a light receiving section 2, first and second polysilicon electrodes 3 and 4, an oxide silicon insulation layer 5, a metal light shielding film 6 and a flattened film 7 on the surface of a semiconductor board 1. After their formation, a precolored resin layer 11 is formed on the flattened layer 7 based can a spin coat method. The colored resin 11 is obtained by mixing a pigment with acrylic resin, epoxy resin or polyimide resin. Then, there are installed color filters 8R, 8G and 8B where a protection film 9 and a micro lens 10 are installed on the top. It is, therefore, possible to obtain a required spectral characteristic by changing the film thickness of pre-colered resin or a pigment material.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、カラー固体撮像素子に
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a color solid-state image pickup device.

【0002】[0002]

【従来の技術】一般に、カラー固体撮像素子は、カメラ
の光学系を介して入射された光を、赤、緑、青、又はこ
れらの補色等に分解し、光電変換機能を有する受光部に
おいて、光信号を電気信号に変換して取り出すものであ
る。
2. Description of the Related Art In general, a color solid-state image pickup device decomposes light incident through an optical system of a camera into red, green, blue, or their complementary colors, and in a light receiving portion having a photoelectric conversion function, The optical signal is converted into an electrical signal and taken out.

【0003】図2は、従来のカラー固体撮像素子の断面
図を示す。1は半導体基板、2は受光部、3は第1ポリ
シリコン電極、4は第2ポリシリコン電極、5は酸化シ
リコン絶縁層、6はメタル遮光膜、7は平坦化膜、8
R,8G,8Bはそれぞれ赤、緑、青のカラーフィルタ
ー、9は保護膜、10はマイクロレンズを示す。
FIG. 2 is a sectional view of a conventional color solid-state image pickup device. 1 is a semiconductor substrate, 2 is a light receiving portion, 3 is a first polysilicon electrode, 4 is a second polysilicon electrode, 5 is a silicon oxide insulating layer, 6 is a metal light-shielding film, 7 is a flattening film, 8
R, 8G, and 8B are red, green, and blue color filters, 9 is a protective film, and 10 is a microlens.

【0004】受光部2は、前記半導体基板1の表面に設
けられており、また、第1層及び第2層ポリシリコン電
極3,4は、受光部2で光電変換された電気信号を転送
クロックパルスにより転送するためのものである。ま
た、メタル遮光膜6上に、カラーフィルター8R,8
G,8Bを形成するための下地を平坦化するために、平
坦化膜7を形成し、該平坦化膜7上に各受光部2に対応
してカラーフィルター8R,8G,8Bを形成する。前
記カラーフィルター8R,8G,8Bの材料としては、
例えば、ゼラチンやカゼイン等のタンパク質に重クロム
酸塩を添加した水溶性レジストが用いられる。該レジス
トを所望の形状にパターニングし、赤の染料で染色した
ものが、カラーフィルター8R,緑の染料で染色したも
のが、カラーフィルター8G,青の染料で染色したもの
が、カラーフィルター8Bとなる。そして、前記カラー
フィルター8R,8G,8B上に保護膜9を形成し、受
光部2への入射光量を増やし、固体撮像素子の感度を上
げるために、前記保護膜9上に、マイクロレンズ10を
形成する。該マイクロレンズの製法としては、例えば、
感光性を有する透明レジストを塗布し、パターニング
後、加熱し、熔融することにより、半球状のマイクロレ
ンズ10を形成する。
The light receiving portion 2 is provided on the surface of the semiconductor substrate 1, and the first and second layer polysilicon electrodes 3 and 4 transfer clocks of electric signals photoelectrically converted by the light receiving portion 2. It is for transfer by pulse. In addition, color filters 8R and 8R are formed on the metal light-shielding film 6.
In order to flatten the base for forming G and 8B, the flattening film 7 is formed, and the color filters 8R, 8G, and 8B are formed on the flattening film 7 so as to correspond to the respective light receiving portions 2. As the material of the color filters 8R, 8G, 8B,
For example, a water-soluble resist obtained by adding a dichromate to a protein such as gelatin or casein is used. The resist is patterned into a desired shape and dyed with a red dye, a color filter 8R, a dye dyed with a green dye, a color filter 8G, and a dye dyed with a blue dye, a color filter 8B. .. Then, a protective film 9 is formed on the color filters 8R, 8G, and 8B to increase the amount of light incident on the light receiving section 2 and to increase the sensitivity of the solid-state image sensor, and a microlens 10 is provided on the protective film 9. Form. The method for producing the microlens includes, for example,
A semi-spherical microlens 10 is formed by applying a transparent resist having photosensitivity, heating after patterning, and melting.

【0005】[0005]

【発明が解決しようとする課題】上述した従来のカラー
固体撮像素子は、各受光部上に形成された色分解用カラ
ーフィルターのみで分光特性を制御している。ところ
が、本来、カラー固体撮像素子の分光特性は、図3に示
す前記カラーフィルターのない白黒固体撮像素子の有す
る出力感度特性と、図4に示す前記カラーフィルターの
分光特性の両者によって決定される。図5は、従来のカ
ラー固体撮像素子の出力感度特性を示す。例えば所望の
分光特性を得るために、ある波長領域の光を低減する又
はある波長領域の光を強調する場合、これまでは染色に
よる場合なら適当な染料、つまり、赤、緑、青とも同一
の波長領域を同一の量だけ光を低減できる染料がなかっ
た。本発明は、所望の分光特性を有した高品質のカラー
固体撮像素子を提供することを目的とする。
In the above-mentioned conventional color solid-state image pickup device, the spectral characteristic is controlled only by the color separation color filter formed on each light receiving portion. However, originally, the spectral characteristic of the color solid-state image pickup device is determined by both the output sensitivity characteristic of the monochrome solid-state image pickup device without the color filter shown in FIG. 3 and the spectral characteristic of the color filter shown in FIG. FIG. 5 shows the output sensitivity characteristics of a conventional color solid-state image sensor. For example, when light in a certain wavelength region is reduced or light in a certain wavelength region is emphasized in order to obtain a desired spectral characteristic, until now, when dyeing, an appropriate dye, that is, red, green, and blue are the same. There was no dye that could reduce light by the same amount in the wavelength range. An object of the present invention is to provide a high quality color solid-state image pickup device having desired spectral characteristics.

【0006】[0006]

【課題を解決するための手段】本発明のカラー固体撮像
素子は、半導体基板上に光電変換機能を有する受光部
と、該受光部に対応したカラーフィルターとを有するカ
ラー固体撮像素子において、上記受光部上に着色樹脂層
を設けたことを特徴とする。
A color solid-state image pickup device of the present invention is a color solid-state image pickup device having a light receiving portion having a photoelectric conversion function on a semiconductor substrate and a color filter corresponding to the light receiving portion. A colored resin layer is provided on the part.

【0007】[0007]

【作用】上記本発明を用いて、例えば、400nmの光
を吸収するように着色したアクリル樹脂層を膜厚0.5
μm形成した場合、図6のカラー固体撮像素子の入射光
の波長に対する出力感度特性が示す通り、400nmの
光を15%吸収し、400〜450nmの領域の光を低
減することができた。
Using the present invention, for example, an acrylic resin layer colored so as to absorb light of 400 nm has a film thickness of 0.5.
In the case of forming the film having a thickness of .mu.m, as shown in the output sensitivity characteristic of the color solid-state image sensor of FIG.

【0008】[0008]

【実施例】以下、一実施例に基づいて本発明を詳細に説
明する。
The present invention will be described in detail below based on an example.

【0009】図1に本発明の一実施例の構造断面図を示
す。1は半導体基板、2は受光部、3は第1ポリシリコ
ン電極、4は第2ポリシリコン電極、5は酸化シリコン
絶縁層、6はメタル遮光膜、7は平坦化膜、8R,8
G,8Bは、それぞれ赤、緑、青のカラーフィルター、
9は保護膜、10はマイクロレンズ、11は着色樹脂層
を示す。着色樹脂層11は、平坦化膜7とカラーフィル
ター8R,8G,8Bとの間に設けられている。
FIG. 1 is a structural sectional view of an embodiment of the present invention. 1 is a semiconductor substrate, 2 is a light receiving portion, 3 is a first polysilicon electrode, 4 is a second polysilicon electrode, 5 is a silicon oxide insulating layer, 6 is a metal light-shielding film, 7 is a flattening film, 8R, 8
G and 8B are red, green and blue color filters,
9 is a protective film, 10 is a microlens, and 11 is a colored resin layer. The colored resin layer 11 is provided between the flattening film 7 and the color filters 8R, 8G, 8B.

【0010】次に、製造工程について説明する。Next, the manufacturing process will be described.

【0011】従来の技術により、半導体基板1表面に、
受光部2、第1及び第2ポリシリコン電極3,4、酸化
シリコン絶縁層5、メタル遮光膜6、平坦化膜7を形成
する。その後、着色樹脂層11を、スピンコート法を用
いて、平坦化膜7上に形成する。着色樹脂は、アクリル
樹脂又はエポキシ樹脂又はポリイミド樹脂に顔料をまぜ
て着色する。その後、従来の技術により、カラーフィル
ター8R,8G,8Bを設け、その上部に保護膜9及び
マイクロレンズ10を設ける。
According to the conventional technique, on the surface of the semiconductor substrate 1,
The light receiving portion 2, the first and second polysilicon electrodes 3 and 4, the silicon oxide insulating layer 5, the metal light shielding film 6, and the flattening film 7 are formed. Then, the colored resin layer 11 is formed on the flattening film 7 by using a spin coating method. The coloring resin is colored by mixing a pigment with an acrylic resin, an epoxy resin, or a polyimide resin. Then, the color filters 8R, 8G, and 8B are provided by the conventional technique, and the protective film 9 and the microlens 10 are provided on the color filters 8R, 8G, and 8B.

【0012】上記実施例においては、着色樹脂層11
を、平坦化膜7とカラーフィルター8R,8G,8Bと
の間に設けたが、着色樹脂層11は、受光部2の上部に
設けられていればよく、カラーフィルター8R,8G,
8Bと保護膜9との間等に設けても実施可能である。ま
た、所望の分光特性は、着色樹脂の膜厚又は着色材料を
変えることによって得られる。
In the above embodiment, the colored resin layer 11
Is provided between the flattening film 7 and the color filters 8R, 8G, 8B, the colored resin layer 11 may be provided on the light receiving portion 2, and the color filters 8R, 8G,
It is also possible to provide it between 8B and the protective film 9 or the like. The desired spectral characteristics can be obtained by changing the film thickness of the colored resin or the colored material.

【0013】[0013]

【発明の効果】以上、詳細に説明した様に、本発明を用
いることにより、所望の分光特性を有した高品質のカラ
ー固体撮像素子を得ることができる。
As described above in detail, by using the present invention, it is possible to obtain a high quality color solid-state image pickup device having desired spectral characteristics.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例のカラー固体撮像素子の構造
断面図である。
FIG. 1 is a structural cross-sectional view of a color solid-state image sensor according to an embodiment of the present invention.

【図2】従来のカラー固体撮像素子の構造断面図であ
る。
FIG. 2 is a structural cross-sectional view of a conventional color solid-state image sensor.

【図3】白黒固体撮像素子における出力感度特性を示す
図である。
FIG. 3 is a diagram showing output sensitivity characteristics in a monochrome solid-state image sensor.

【図4】カラーフィルターの分光特性を示す図である。FIG. 4 is a diagram showing spectral characteristics of a color filter.

【図5】従来のカラー固体撮像素子の出力感度特性を示
す図である。
FIG. 5 is a diagram showing an output sensitivity characteristic of a conventional color solid-state image sensor.

【図6】本発明のカラー固体撮像素子の出力感度特性を
示す図である。
FIG. 6 is a diagram showing the output sensitivity characteristics of the color solid-state imaging device of the present invention.

【符号の説明】[Explanation of symbols]

1 半導体基板 2 受光部 3 第1ポリシリコン電極 4 第2ポリシリコン電極 5 酸化シリコン絶縁層 6 メタル遮光膜 7 平坦化膜 8R 赤色カラーフィルター 8G 緑色カラーフィルター 8B 青色カラーフィルター 9 保護膜 10 マイクロレンズ 11 着色樹脂層 1 semiconductor substrate 2 light receiving part 3 first polysilicon electrode 4 second polysilicon electrode 5 silicon oxide insulating layer 6 metal light-shielding film 7 planarizing film 8R red color filter 8G green color filter 8B blue color filter 9 protective film 10 microlens 11 Colored resin layer

───────────────────────────────────────────────────── フロントページの続き (72)発明者 東出 啓 大阪市阿倍野区長池町22番22号 シヤープ 株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Kei Higashi, 22-22 Nagaike-cho, Abeno-ku, Osaka

Claims (1)

【特許請求の範囲】 【請求項1】 半導体基板上に、光電変換機能を有する
受光部と、該受光部に対応したカラーフィルターとを有
するカラー固体撮像素子において、上記受光部上に着色
樹脂層を設けたことを特徴とするカラー固体撮像素子。
Claim: What is claimed is: 1. A color solid-state imaging device having a light receiving portion having a photoelectric conversion function and a color filter corresponding to the light receiving portion on a semiconductor substrate, wherein a colored resin layer is provided on the light receiving portion. A color solid-state image pickup device comprising:
JP3160724A 1991-07-02 1991-07-02 Color solid-state imaging device Expired - Fee Related JP3050646B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3160724A JP3050646B2 (en) 1991-07-02 1991-07-02 Color solid-state imaging device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3160724A JP3050646B2 (en) 1991-07-02 1991-07-02 Color solid-state imaging device

Publications (2)

Publication Number Publication Date
JPH0513736A true JPH0513736A (en) 1993-01-22
JP3050646B2 JP3050646B2 (en) 2000-06-12

Family

ID=15721097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3160724A Expired - Fee Related JP3050646B2 (en) 1991-07-02 1991-07-02 Color solid-state imaging device

Country Status (1)

Country Link
JP (1) JP3050646B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100379541B1 (en) * 2000-11-20 2003-04-10 주식회사 하이닉스반도체 color image senor and method for manufacturing the same
KR100455656B1 (en) * 2001-09-25 2004-11-12 동부전자 주식회사 Method for providing a stabilized color filter in a semiconductor device for image sensor
JP2006157004A (en) * 2004-11-29 2006-06-15 Samsung Electronics Co Ltd Micro lens of image sensor and its forming method
JP2008544571A (en) * 2005-06-28 2008-12-04 シリコンファイル・テクノロジーズ・インコーポレイテッド Separable unit pixel of image sensor having three-dimensional structure and manufacturing method thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01149459A (en) * 1987-12-04 1989-06-12 Nec Corp Solid-state color image pickup element
JPH04343470A (en) * 1991-05-21 1992-11-30 Nec Corp Solid-state image pickup device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01149459A (en) * 1987-12-04 1989-06-12 Nec Corp Solid-state color image pickup element
JPH04343470A (en) * 1991-05-21 1992-11-30 Nec Corp Solid-state image pickup device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100379541B1 (en) * 2000-11-20 2003-04-10 주식회사 하이닉스반도체 color image senor and method for manufacturing the same
KR100455656B1 (en) * 2001-09-25 2004-11-12 동부전자 주식회사 Method for providing a stabilized color filter in a semiconductor device for image sensor
JP2006157004A (en) * 2004-11-29 2006-06-15 Samsung Electronics Co Ltd Micro lens of image sensor and its forming method
JP2008544571A (en) * 2005-06-28 2008-12-04 シリコンファイル・テクノロジーズ・インコーポレイテッド Separable unit pixel of image sensor having three-dimensional structure and manufacturing method thereof
US8325221B2 (en) 2005-06-28 2012-12-04 Siliconfile Technologies Inc. Separation type unit pixel of 3-dimensional image sensor and manufacturing method thereof

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