JPH0512325A - Circuit analytic simulation system - Google Patents

Circuit analytic simulation system

Info

Publication number
JPH0512325A
JPH0512325A JP16482791A JP16482791A JPH0512325A JP H0512325 A JPH0512325 A JP H0512325A JP 16482791 A JP16482791 A JP 16482791A JP 16482791 A JP16482791 A JP 16482791A JP H0512325 A JPH0512325 A JP H0512325A
Authority
JP
Japan
Prior art keywords
area
polynomial
circuit
coefficient
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16482791A
Other languages
Japanese (ja)
Inventor
Yoshinori Endo
喜則 遠藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP16482791A priority Critical patent/JPH0512325A/en
Publication of JPH0512325A publication Critical patent/JPH0512325A/en
Pending legal-status Critical Current

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  • Complex Calculations (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)

Abstract

PURPOSE:To shorten a computation time to half and evade the divergence of computation by dividing electric characteristics into areas, performing polynomial approximation, section by section, and distinctively using the polynomial according to an area at the time of circuit analytic simulation. CONSTITUTION:The electric characteristics and the number of area divisions are inputted from an electric characteristic file 4 and an area division number file 5, the electric characteristics are divided into the area by using the number of area divisions, and the border points of the respective areas are found. Then data in the area-divided sections are stored and used to find the coefficient of the polynomial by a method of the least squares, and the coefficient is stored. Further, an area to be calculated is retrieved according to data to be simulated and the coefficient is substituted in the polynomial corresponding to the retrieved area to calculate the characteristics of an element. Then the calculated element characteristics are used to set the circuit equation of the whole circuit, which is solved to obtain a solution.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は回路解折シミュレーショ
ン方式に関し、特に能動素子を扱う電子回路の回路解折
シミュレーション方式に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit breakage simulation method, and more particularly to a circuit breakage simulation method for an electronic circuit that handles active elements.

【0002】[0002]

【従来の技術】従来、この種の回路解折シミュレーショ
ン方式は、能動素子の特性を物理的な方程式を用いて計
算している。
2. Description of the Related Art Conventionally, in this type of circuit analysis simulation method, the characteristics of active elements are calculated using physical equations.

【0003】図3はかかる従来の一例を説明するための
回路解析シミュレーションのフロー図である。図3に示
すように、従来のシミュレーション方式は電気的特性フ
ァイル4に基づき電気的特性を入力する。この入力され
たデータは物理的方程式を用い、最小自乗法により方程
式の全パタメータが求められる。。このパラメータは格
納される。尚、ここまでのプログラムは以下に述べるプ
ログラムと別にすることもできる。
FIG. 3 is a flow chart of a circuit analysis simulation for explaining such a conventional example. As shown in FIG. 3, the conventional simulation method inputs the electric characteristics based on the electric characteristics file 4. This input data uses a physical equation, and all parameters of the equation are obtained by the method of least squares. . This parameter is stored. The program up to this point may be different from the program described below.

【0004】次に、上述の計算が収束するまで繰り返
し、物理方程式の解を求める。すなわち、ここでは素子
特性を計算を行う。更に、回路方程式の計算を行って、
収束したか否かを判定する。収束していれば、次にのス
テップへ進むが、収束していないときは、前述の繰り返
しステップ迄戻って同様の動作を繰り返す。
Next, the solution of the physical equation is obtained by repeating the above calculation until it converges. That is, here, element characteristics are calculated. Furthermore, by calculating the circuit equation,
It is determined whether or not it has converged. If it has converged, the process proceeds to the next step, but if it has not converged, it returns to the above-mentioned repeating step and repeats the same operation.

【0005】図4は図3に示すフローを用いたバイポー
ラトランジスタの電圧・電流特性図である。図4に示す
ように、この特性はトランジスタのベース・エミッタ間
電圧VB E とコレクタ電流ICおよびベース電流IBと
の関係を対数表示したものであり、そのコレクタ電流I
Cとベース電流IBは、次の(1)式および(2)式の
ように表わされる。
FIG. 4 is a voltage / current characteristic diagram of the bipolar transistor using the flow shown in FIG. As shown in FIG. 4, the characteristic transistor base-emitter voltage V B E Is a logarithmic display of the relationship between the collector current IC and the base current IB.
C and the base current IB are expressed by the following equations (1) and (2).

【0006】 [0006]

【0007】このように、回路解析にあたっては、物理
的な手法で求めた方程式を用いている。その方程式はパ
ラメータが多く、非線形関数を用いている。
As described above, the equation obtained by the physical method is used in the circuit analysis. The equation has many parameters and uses a non-linear function.

【0008】[0008]

【発明が解決しようとする課題】上述した従来の回路解
析シミュレーション方式は、物理的な手法で求めた方程
式を用いている。その方程式はパラメータが多く、しか
も非線形関数を用いるため、計算時に発散や発振が生じ
易く、収束(計算上の解が求まる)するまでに多くの時
間を費やすという欠点がある。
The conventional circuit analysis simulation method described above uses the equation obtained by the physical method. Since the equation has many parameters and uses a non-linear function, divergence and oscillation are likely to occur at the time of calculation, and there is a drawback that it takes a lot of time to converge (calculate a solution).

【0009】本発明の目的は、かかる計算時間を短縮
し、計算の発散等を防止する回路解析シミュレーション
方式を提供することにある。
An object of the present invention is to provide a circuit analysis simulation method which shortens the calculation time and prevents the calculation from diverging.

【0010】[0010]

【課題を解決するための手段】本発明の回路解析シミュ
レーション方式は、電気的特性を複数の領域に分割する
ステップと、前記複数の領域に分割された各区間のデー
タを多項式に近似するステップと、前記多項式を前記各
区間で使い分けて計算するステップとを有して構成され
る。
A circuit analysis simulation method according to the present invention comprises a step of dividing electric characteristics into a plurality of areas, and a step of approximating data of each section divided into the plurality of areas to a polynomial. , And using the polynomial for each of the sections.

【0011】[0011]

【実施例】次に、本発明の実施例について図面を参照し
て説明する。
Embodiments of the present invention will now be described with reference to the drawings.

【0012】図1は本発明の一実施例を説明するための
回路解析シミュレーションのフロー図である。図1に示
すように、本実施例は入力された電気的特性をn個の領
域に分割する領域分割ステップ(第1ステップ)1と、
分割された各区間のデータを多項式に近似する近似ステ
ップ(第2ステップ)2と、各区間で収束するまで使い
分けて計算する計算ステップ(第3ステップ)3とを含
んでいる。まず、第1ステップ1においては、電気的特
性ファイル4,領域分割数ファイル5よりそれぞれ電気
的特性,領域分割数を入力する。ここでは、前記領域分
割数を用いて前記電気的特性を領域分割し、各領域の境
界点を対策により求める。次に、第2ステップ2におい
ては、領域分割した各区間のデータを格納する。これら
各区間のデータを用い、最小事乗法により多項式の係数
を求め、その係数を格納する。これらの作業を領域分割
数だけ繰り返す。尚、ここまでの作業(多項式の係数を
求めるところまで)を1つのプログラムとし、後述の第
3ステップである計算ステップ3多項式の係数を受け渡
す形式をとることも可能である。更に、第3のステップ
においては、シミュレーションの対象となるデータから
計算する領域を検索する。しかも、検索された領域に対
応する多項式に上述した係数をあてはめ素子の特性を計
算する。ついで、計算された素子特性を用い回路全体の
回路方程式を立て、それを計算することにより解を求め
る。最後に、この計算した解が誤差範囲にあるか否かを
判断し、誤差範囲外にある場合は収束していないとみな
して上述した処理を繰り返し、誤差範囲内にある場合に
は収束したとみなして処理を終了する。
FIG. 1 is a flow chart of a circuit analysis simulation for explaining an embodiment of the present invention. As shown in FIG. 1, in the present embodiment, an area dividing step (first step) 1 for dividing an inputted electric characteristic into n areas,
It includes an approximation step (second step) 2 for approximating the divided data of each section into a polynomial, and a calculation step (third step) 3 for selectively calculating the data until convergence in each section. First, in the first step 1, the electric characteristic and the area division number are input from the electric characteristic file 4 and the area division number file 5, respectively. Here, the electrical characteristic is divided into regions using the number of divided regions, and the boundary points of the respective regions are obtained by a countermeasure. Next, in the second step 2, the data of each section divided into areas is stored. The data of each of these sections is used to find the coefficient of the polynomial by the least-squares method, and the coefficient is stored. These operations are repeated for the number of area divisions. It should be noted that the work up to this point (up to the point where polynomial coefficients are obtained) can be set as one program, and the coefficient of the polynomial in the calculation step 3 which is the third step described later can be transferred. Further, in the third step, the area to be calculated is searched from the data to be simulated. Moreover, the above-mentioned coefficient is applied to the polynomial corresponding to the searched area to calculate the characteristic of the element. Then, a circuit equation for the entire circuit is established using the calculated element characteristics, and the solution is obtained by calculating it. Finally, it is judged whether or not the calculated solution is within the error range. If it is outside the error range, it is considered that the solution has not converged, and the above process is repeated. If it is within the error range, it is determined that the solution has converged. The processing is ended with regard to this.

【0013】図2は図1に示すフローを用いたバイポー
ラトランジスタの電圧・電流特性図である。図2に示す
ように、この特性もトランジスタのベース・エミッタ間
電圧VB E とコレクタ電流ICおよびベース電流IBと
の関係を対数表示したものであるが、従来との相違点は
電圧VB E をn分割しそれぞれの区間nを次の(3)式
および(4)式のように計算するものである。
FIG. 2 is a voltage / current characteristic diagram of the bipolar transistor using the flow shown in FIG. As shown in FIG. 2, this characteristic is also a logarithmic representation of the relationship between the base-emitter voltage V BE of the transistor and the collector current IC and the base current IB. The difference from the conventional one is that the voltage V BE is n. It is divided and each section n is calculated as in the following equations (3) and (4).

【0014】 [0014]

【0015】このように、n分割した各区間毎に使用す
る多項式を使い分けて計算するので、方程式を単純化で
き、計算時間も約半分に減少する。また、計算が発散し
て収束しないということもなくなる。
As described above, since the polynomial used for each of the n-divided sections is used for the calculation, the equation can be simplified and the calculation time can be reduced to about half. Moreover, the calculation does not diverge and does not converge.

【0016】[0016]

【発明の効果】以上説明したように、本発明は電気的特
性を領域分割し、しかも各区間で多項式近似し、回路解
析シミュレーションの際の領域によってその多項式を使
いわけることにより、計算する方程式を単純化できるの
で、計算時間が半減し、計算が発散して収束しないとい
うことを回避できるという効果がある。
As described above, the present invention divides the electrical characteristics into regions, approximates polynomials in each section, and uses the polynomials differently depending on the regions in the circuit analysis simulation to calculate the equations to be calculated. Since it can be simplified, the calculation time is halved, and it is possible to prevent the calculation from diverging and not converging.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を説明するための回路解析シ
ミュレーションのフロー図である。
FIG. 1 is a flow diagram of a circuit analysis simulation for explaining an embodiment of the present invention.

【図2】図1に示すフローを用いたバイポーラトランジ
スタの電圧・電流特性図である。
FIG. 2 is a voltage / current characteristic diagram of a bipolar transistor using the flow shown in FIG.

【図3】従来の一例を説明するための回路解析シミュレ
ーションのフロー図である。
FIG. 3 is a flow chart of a circuit analysis simulation for explaining an example of the related art.

【図4】図3に示すフローを用いたバイポーラトランジ
スタの電圧・電流特性図である。
FIG. 4 is a voltage / current characteristic diagram of a bipolar transistor using the flow shown in FIG.

【符号の説明】[Explanation of symbols]

1 電気的特性の領域分割ステップ 2 データの多項式近似ステップ 3 計算ステップ 4 電気的特性ファイル 5 領域分割数ファイル 1 Electrical characteristic region division step 2 Data polynomial approximation step 3 Calculation step 4 Electrical characteristic file 5 Region division number file

Claims (1)

【特許請求の範囲】 【請求項1】 電気的特性を複数の領域に分割するステ
ップと、前記複数の領域に分割された各区間のデータを
多項式に近似するステップと、前記多項式を前記各区間
で使い分けて計算するステップとを有することを特徴と
する回路解折シミュレーション方式。
Claim: What is claimed is: 1. Dividing an electrical characteristic into a plurality of areas, approximating data of each section divided into the plurality of areas to a polynomial, and setting the polynomial to each of the sections. And a step of performing a calculation according to the method used in step S1.
JP16482791A 1991-07-05 1991-07-05 Circuit analytic simulation system Pending JPH0512325A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16482791A JPH0512325A (en) 1991-07-05 1991-07-05 Circuit analytic simulation system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16482791A JPH0512325A (en) 1991-07-05 1991-07-05 Circuit analytic simulation system

Publications (1)

Publication Number Publication Date
JPH0512325A true JPH0512325A (en) 1993-01-22

Family

ID=15800678

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16482791A Pending JPH0512325A (en) 1991-07-05 1991-07-05 Circuit analytic simulation system

Country Status (1)

Country Link
JP (1) JPH0512325A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7296250B2 (en) 2003-12-01 2007-11-13 Infineon Technologies Ag Method and system for characterizing electronic circuitry
US7516429B2 (en) * 2005-05-30 2009-04-07 Infineon Technologies Ag System for analyzing an electronic circuit described by characterization data
US11648008B2 (en) 2006-01-31 2023-05-16 Cilag Gmbh International Surgical instrument having force feedback capabilities
US11793516B2 (en) 2021-03-24 2023-10-24 Cilag Gmbh International Surgical staple cartridge comprising longitudinal support beam

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7296250B2 (en) 2003-12-01 2007-11-13 Infineon Technologies Ag Method and system for characterizing electronic circuitry
US7516429B2 (en) * 2005-05-30 2009-04-07 Infineon Technologies Ag System for analyzing an electronic circuit described by characterization data
US11648008B2 (en) 2006-01-31 2023-05-16 Cilag Gmbh International Surgical instrument having force feedback capabilities
US11793516B2 (en) 2021-03-24 2023-10-24 Cilag Gmbh International Surgical staple cartridge comprising longitudinal support beam

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