JPH05108356A - Fault analysis back-up device - Google Patents

Abstract

PURPOSE:To select an analyzing procedure in accordance with the expertness of an analyzing person, the number of samples usable for the analysis of a fault, the confidence set to the factor of the fault, etc., by providing a function which infers the analyzing procedure corresponding to the factor group designated by the analyzing person among those estimated fault factor groups. CONSTITUTION:A fault factor inference part 104 infers a fault factor and its confidence based on the initial analyzing result and gives an instruction to an analyzing person through an information output part 103. The analyzing person designates a due fault factor range out of those inferred fault factors based on the number of usable samples, the confidence, the necessary manhour, etc. Then an analyzing procedure inference part 105 infers an analyzing procedure corresponding to a fault factor group included in a fault factor range and gives an instruction to the analyzing person through the part 103. Then the analyzing person inputs the analyzing result of each analyzing process and registers it into an analysis data base 107 through a data input part 102. Thus the part 104 infers the factor of the fault based on the initial information, the initial analyzing result, and the analyzing result of each analyzing process.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a failure analysis support device, and more particularly to an electronic part for instructing an analysis procedure, an analysis method in each analysis step, and estimating a cause of failure in analysis of a cause of failure of an electronic part. The present invention relates to a failure analysis support device.

[0002]

2. Description of the Related Art In the prior art, a failure analysis support device for not only a device but also a general device infers a specific cause of failure from the result of initial analysis, instructs an analysis procedure for verifying it, and As a result, if the prediction is wrong, the cause of failure is inferred again and the analysis procedure is instructed again.

[0003]

In the conventional technique described above, since the analysis procedure is fixed depending on the result of the initial analysis, after the analysis step of destroying the target device in the analysis procedure in the middle, There was a defect that the cause of failure could not be confirmed. Further, in order to compensate for the above-mentioned drawbacks, there has been a drawback that an analysis time is required excessively when an analysis procedure is created for a large number of failure causes at the same time.

[0004]

A failure analysis support apparatus of the present invention is provided with an analysis database for storing initial information such as product name, contents of failure, sample data such as analysis result and inference result, and the initial information and analysis result. And a data input unit that stores inference results and the like in the analysis database, a knowledge base that stores knowledge for inferring failure causes and analysis procedures, and infers failure causes based on the knowledge base and the sampled data A failure cause inference unit and an analysis for inferring an analysis procedure corresponding to the expected failure cause group designated by the operator among the expected failure cause groups inferred by the failure cause inference unit based on the knowledge base and the sampled data A procedure inference unit, an information output unit that outputs inference results of failure causes, analysis procedures, etc. on a screen or a form, and adds or modifies knowledge to the knowledge base. Processing configured to include a knowledge base maintenance unit for performing equal.

[0005]

The present invention will be described in detail with reference to the drawings.

FIG. 1 is a block diagram showing an embodiment of the present invention. The overall control unit 101 includes a data input unit 102,
It controls each functional block of the information output unit 103, the failure cause inference unit 104, the analysis procedure inference unit 105, and the knowledge base maintenance unit 106. The data input unit 102 stores sample-specific data input by the operator and data such as output contents of other functional blocks in the analysis database 107 for each analysis sample. The information output unit 103 outputs the inference result of the failure cause executed by the failure cause inference unit 104, the inference result of the analysis procedure executed by the analysis procedure inference unit 105, and the like on a screen or a form. The failure cause inferring unit 104 infers the failure cause based on the knowledge base 108 and the sample data, and sends the result to the information output unit 103.

The analysis procedure inference unit 105 uses the knowledge base 10
Based on 8 and the sample data, the analysis procedure corresponding to the expected failure cause group designated by the operator among the expected failure cause groups inferred by the failure cause inference unit is inferred. The knowledge base maintenance unit 106 performs processing such as addition and correction of knowledge on the knowledge base 108. Analysis database 107
Stores product name, initial information such as defect contents, and sample data such as analysis results and inference results. The knowledge base 108 stores knowledge for inferring a failure cause and an analysis procedure, for example, a structure between knowledge components and a rule group.

Next, the failure cause inference and analysis procedure inference processing will be described based on the flow chart of the failure analysis shown in FIG.
First, in step 201, the analyst inputs initial information such as the device product name, the content of failure, and the use environment, and the data input unit 10
2 is registered in the analysis database 107. Next, in step 202, the analysis procedure inference unit 105 infers the analysis procedure based on the initial information, and the information output unit 103 instructs the analyst. In step 203, the analyst inputs the result of initial analysis, and the data input unit 102 registers it in the analysis database 107. In step 204, the failure cause inference unit 105 infers the failure cause and the certainty factor based on the initial analysis result, and the information output unit 103 instructs the analyst.

In step 205, the failure cause range targeted by the analyst is specified after taking into consideration the number of usable samples, the certainty factor, the required man-hours, etc. from the failure causes inferred in step 204. In step 206, the failure cause inference unit infers the analysis procedure corresponding to the failure cause group included in the failure cause range, and the information output unit 103 instructs the analyst. In step 207, the analyst inputs the analysis result in each analysis step and is registered in the analysis database 107 by the data input unit 102. In step 208, the failure cause inference unit infers the failure cause based on the initial information, the initial analysis result, and the analysis result in each analysis step. Step 209
Then, the analyst determines whether or not to proceed with the analysis, and if the analysis is to be continued, the procedure returns to step 205.

[0010]

Since the failure analysis support apparatus of the present invention has a function of inferring an analysis procedure corresponding to the predicted failure cause group designated by the analyst among the predicted failure cause groups, The effect is that the analysis procedure can be selected according to the skill level, the number of samples that can be used for analysis, the certainty factor for the cause of failure, and the like.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment of the present invention.

FIG. 2 is a flow chart showing the operation of the present invention.

[Explanation of symbols]

 Reference numeral 101 overall control unit 102 data input unit 103 information output unit 104 failure cause inference unit 105 analysis procedure inference unit 106 knowledge base maintenance unit 107 analysis database 108 knowledge base

Claims (1)

[Claims] 1. An analysis database for storing initial information such as product name and contents of failure, sample data such as analysis results and inference results, and data input for storing the initial information, analysis results and inference results in the analysis database. Department,
A knowledge base that stores knowledge for inferring a failure cause and an analysis procedure, a failure cause inference unit that infers a failure cause based on the knowledge base and the sample-specific data, and a knowledge base and the sample-specific data The analysis procedure inference unit that infers the analysis procedure corresponding to the expected failure cause group designated by the operator out of the expected failure cause group inferred by the failure cause inference unit, the reasoning result of the failure cause, the analysis procedure, etc. are displayed. Alternatively, the electronic component failure analysis support device includes an information output unit for outputting to a form and the like, and a knowledge base maintenance unit for performing processing such as addition and correction of knowledge to the knowledge base.