JPH05108356A - Fault analysis back-up device - Google Patents
Fault analysis back-up deviceInfo
- Publication number
- JPH05108356A JPH05108356A JP26575891A JP26575891A JPH05108356A JP H05108356 A JPH05108356 A JP H05108356A JP 26575891 A JP26575891 A JP 26575891A JP 26575891 A JP26575891 A JP 26575891A JP H05108356 A JPH05108356 A JP H05108356A
- Authority
- JP
- Japan
- Prior art keywords
- analyzing
- analysis
- fault
- failure cause
- failure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は故障解析支援装置、特
に、電子部品の故障原因の解析において、解析手順の指
示,各解析工程での解析方法の指示および故障原因の推
定等を行う電子部品故障解析支援装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a failure analysis support device, and more particularly to an electronic part for instructing an analysis procedure, an analysis method in each analysis step, and estimating a cause of failure in analysis of a cause of failure of an electronic part. The present invention relates to a failure analysis support device.
【0002】[0002]
【従来の技術】従来の技術は、デバイスだけでなく一般
の装置に関する故障解析支援装置は初期解析の結果から
特定の故障原因を推論し、それを検証するための解析手
順を指示し、解析の結果、その予想がはずれた場合は改
めて故障原因を推論し、再度解析手順を指示する方式を
とっている。2. Description of the Related Art In the prior art, a failure analysis support device for not only a device but also a general device infers a specific cause of failure from the result of initial analysis, instructs an analysis procedure for verifying it, and As a result, if the prediction is wrong, the cause of failure is inferred again and the analysis procedure is instructed again.
【0003】[0003]
【発明が解決しようとする課題】上述した従来の技術
は、初期解析の結果により解析手順が固定化されてしま
うため、途中の解析手順の中に対象デバイスを破壊する
解析工程があった場合以降の故障原因の確認ができなく
なってしまう等の欠点があった。また、前記の欠点を補
うため同時に多数の故障原因を対象に解析手順を作成す
ると解析時間が過度に必要になる等の欠点があった。In the conventional technique described above, since the analysis procedure is fixed depending on the result of the initial analysis, after the analysis step of destroying the target device in the analysis procedure in the middle, There was a defect that the cause of failure could not be confirmed. Further, in order to compensate for the above-mentioned drawbacks, there has been a drawback that an analysis time is required excessively when an analysis procedure is created for a large number of failure causes at the same time.
【0004】[0004]
【課題を解決するための手段】本発明の故障解析支援装
置は、品名,不具合内容等の初期情報,解析結果および
推論結果等のサンプル別データを格納する解析データベ
ースと、前記初期情報,解析結果および推論結果等を前
記解析データベースに格納するデータ入力部と、故障原
因および解析手順を推論するための知識を格納する知識
ベースと、前記知識ベースと前記サンプル別データを基
に故障原因を推論する故障原因推論部と、前記知識ベー
スおよび前記サンプル別データを基に故障原因推論部で
推論された予想故障原因群のうち操作者に指定された予
想故障原因群に対応した解析手順を推論する解析手順推
論部と、故障原因の推論結果,解析手順等を画面または
帳票等に出力する情報出力部と、前記知識ベースに対し
て知識の追加,修正等の処理を行う知識ベースメンテナ
ンス部とを含んで構成される。A failure analysis support apparatus of the present invention is provided with an analysis database for storing initial information such as product name, contents of failure, sample data such as analysis result and inference result, and the initial information and analysis result. And a data input unit that stores inference results and the like in the analysis database, a knowledge base that stores knowledge for inferring failure causes and analysis procedures, and infers failure causes based on the knowledge base and the sampled data A failure cause inference unit and an analysis for inferring an analysis procedure corresponding to the expected failure cause group designated by the operator among the expected failure cause groups inferred by the failure cause inference unit based on the knowledge base and the sampled data A procedure inference unit, an information output unit that outputs inference results of failure causes, analysis procedures, etc. on a screen or a form, and adds or modifies knowledge to the knowledge base. Processing configured to include a knowledge base maintenance unit for performing equal.
【0005】[0005]
【実施例】次に、本発明について図面を参照して詳細に
説明する。The present invention will be described in detail with reference to the drawings.
【0006】図1は、本発明の一実施例を示すブロック
図である。全体制御部101は、データ入力部102,
情報出力部103,故障原因推論部104,解析手順推
論部105,知識ベースメンテナンス部106の各機能
ブロックを制御する。データ入力部102は、操作者か
ら入力されたサンプル別データおよび他の機能ブロック
の出力内容等のデータを解析サンプル毎に解析データベ
ース107に格納する。情報出力部103は、故障原因
推論部104が実行した故障原因の推論結果,解析手順
推論部105が実行した解析手順の推論結果等を画面ま
たは帳票等に出力する。故障原因推論部104は、知識
ベース108と前記サンプル別データを基に故障原因を
推論し、結果を情報出力部103へ送る。FIG. 1 is a block diagram showing an embodiment of the present invention. The overall control unit 101 includes a data input unit 102,
It controls each functional block of the information output unit 103, the failure cause inference unit 104, the analysis procedure inference unit 105, and the knowledge base maintenance unit 106. The data input unit 102 stores sample-specific data input by the operator and data such as output contents of other functional blocks in the analysis database 107 for each analysis sample. The information output unit 103 outputs the inference result of the failure cause executed by the failure cause inference unit 104, the inference result of the analysis procedure executed by the analysis procedure inference unit 105, and the like on a screen or a form. The failure cause inferring unit 104 infers the failure cause based on the knowledge base 108 and the sample data, and sends the result to the information output unit 103.
【0007】解析手順推論部105は、知識ベース10
8と前記サンプル別データを基に故障原因推論部で推論
された予想故障原因群のうち操作者に指定された予想故
障原因群に対応した解析手順を推論する。知識ベースメ
ンテナンス部106は、知識ベース108に対して知識
の追加,修正等の処理を行う。解析データベース107
には、品名,不具合内容等の初期情報,解析結果および
推論結果等のサンプル別データを格納する。知識ベース
108には、故障原因および解析手順を推論するための
知識,例えば知識構成要素間の構造およびルール群等を
格納する。The analysis procedure inference unit 105 uses the knowledge base 10
Based on 8 and the sample data, the analysis procedure corresponding to the expected failure cause group designated by the operator among the expected failure cause groups inferred by the failure cause inference unit is inferred. The knowledge base maintenance unit 106 performs processing such as addition and correction of knowledge on the knowledge base 108. Analysis database 107
Stores product name, initial information such as defect contents, and sample data such as analysis results and inference results. The knowledge base 108 stores knowledge for inferring a failure cause and an analysis procedure, for example, a structure between knowledge components and a rule group.
【0008】次に、図2に示す故障解析の流れ図に基づ
いて故障原因推論および解析手順推論処理を説明する。
まずステップ201でデバイス品名,不具合内容,使用
環境等の初期情報を解析者が入力し、データ入力部10
2により解析データベース107に登録される。次にス
テップ202で前記初期情報に基づいて解析手順推論部
105が解析手順を推論し情報出力部103により解析
者に指示する。ステップ203で初期解析結果を解析者
が入力し、データ入力部102により解析データベース
107に登録される。ステップ204で前記初期解析結
果に基づいて故障原因推論部105が故障原因と確信度
を推論し情報出力部103により解析者に指示する。Next, the failure cause inference and analysis procedure inference processing will be described based on the flow chart of the failure analysis shown in FIG.
First, in step 201, the analyst inputs initial information such as the device product name, the content of failure, and the use environment, and the data input unit 10
2 is registered in the analysis database 107. Next, in step 202, the analysis procedure inference unit 105 infers the analysis procedure based on the initial information, and the information output unit 103 instructs the analyst. In step 203, the analyst inputs the result of initial analysis, and the data input unit 102 registers it in the analysis database 107. In step 204, the failure cause inference unit 105 infers the failure cause and the certainty factor based on the initial analysis result, and the information output unit 103 instructs the analyst.
【0009】ステップ205では、ステップ204で推
論された故障原因の中から使用可能サンプル数,確信
度,所要工数等を勘案した上で解析者が対象とする故障
原因範囲を指定する。ステップ206でこの故障原因範
囲に含まれる故障原因群に対応した解析手順を故障原因
推論部で推論し、情報出力部103により解析者に指示
する。ステップ207で各解析工程における解析結果を
解析者が入力しデータ入力部102により解析データベ
ース107に登録される。ステップ208で故障原因推
論部が初期情報,初期解析結果および各解析工程での解
析結果に基づいて故障原因を推論する。ステップ209
で更に解析を進めるかどうかを解析者が判断し、続行す
る場合にはステップ205に戻る。In step 205, the failure cause range targeted by the analyst is specified after taking into consideration the number of usable samples, the certainty factor, the required man-hours, etc. from the failure causes inferred in step 204. In step 206, the failure cause inference unit infers the analysis procedure corresponding to the failure cause group included in the failure cause range, and the information output unit 103 instructs the analyst. In step 207, the analyst inputs the analysis result in each analysis step and is registered in the analysis database 107 by the data input unit 102. In step 208, the failure cause inference unit infers the failure cause based on the initial information, the initial analysis result, and the analysis result in each analysis step. Step 209
Then, the analyst determines whether or not to proceed with the analysis, and if the analysis is to be continued, the procedure returns to step 205.
【0010】[0010]
【発明の効果】本発明の故障解析支援装置は、予想故障
原因群のうち解析者に指定された予想故障原因群に対応
した解析手順を推論する機能をを有しているため、解析
者の熟練度,解析に使用可能なサンプル数,故障原因に
対する確信度等に応じて解析手順を選択できるという効
果がある。Since the failure analysis support apparatus of the present invention has a function of inferring an analysis procedure corresponding to the predicted failure cause group designated by the analyst among the predicted failure cause groups, The effect is that the analysis procedure can be selected according to the skill level, the number of samples that can be used for analysis, the certainty factor for the cause of failure, and the like.
【図1】本発明の一実施例を示すブロック図である。FIG. 1 is a block diagram showing an embodiment of the present invention.
【図2】本発明の動作を示す流れ図である。FIG. 2 is a flow chart showing the operation of the present invention.
101 全体制御部 102 データ入力部 103 情報出力部 104 故障原因推論部 105 解析手順推論部 106 知識ベースメンテナンス部 107 解析データベース 108 知識ベース Reference numeral 101 overall control unit 102 data input unit 103 information output unit 104 failure cause inference unit 105 analysis procedure inference unit 106 knowledge base maintenance unit 107 analysis database 108 knowledge base
Claims (1)
および推論結果等のサンプル別データを格納する解析デ
ータベースと、前記初期情報,解析結果および推論結果
等を前記解析データベースに格納するデータ入力部と、
故障原因および解析手順を推論するための知識を格納す
る知識ベースと、前記知識ベースと前記サンプル別デー
タを基に故障原因を推論する故障原因推論部と、前記知
識ベースおよび前記サンプル別データを基に故障原因推
論部で推論された予想故障原因群のうち操作者に指定さ
れた予想故障原因群に対応した解析手順を推論する解析
手順推論部と、故障原因の推論結果,解析手順等を画面
または帳票等に出力する情報出力部と、前記知識ベース
に対して知識の追加,修正等の処理を行う知識ベースメ
ンテナンス部とを含むことを特徴とする電子部品故障解
析支援装置。1. An analysis database for storing initial information such as product name and contents of failure, sample data such as analysis results and inference results, and data input for storing the initial information, analysis results and inference results in the analysis database. Department,
A knowledge base that stores knowledge for inferring a failure cause and an analysis procedure, a failure cause inference unit that infers a failure cause based on the knowledge base and the sample-specific data, and a knowledge base and the sample-specific data The analysis procedure inference unit that infers the analysis procedure corresponding to the expected failure cause group designated by the operator out of the expected failure cause group inferred by the failure cause inference unit, the reasoning result of the failure cause, the analysis procedure, etc. are displayed. Alternatively, the electronic component failure analysis support device includes an information output unit for outputting to a form and the like, and a knowledge base maintenance unit for performing processing such as addition and correction of knowledge to the knowledge base.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26575891A JPH05108356A (en) | 1991-10-15 | 1991-10-15 | Fault analysis back-up device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26575891A JPH05108356A (en) | 1991-10-15 | 1991-10-15 | Fault analysis back-up device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05108356A true JPH05108356A (en) | 1993-04-30 |
Family
ID=17421608
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26575891A Pending JPH05108356A (en) | 1991-10-15 | 1991-10-15 | Fault analysis back-up device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05108356A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006120081A (en) * | 2004-10-25 | 2006-05-11 | Toshiba Corp | Failure analysis support terminal and failure analysis support information providing device |
-
1991
- 1991-10-15 JP JP26575891A patent/JPH05108356A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006120081A (en) * | 2004-10-25 | 2006-05-11 | Toshiba Corp | Failure analysis support terminal and failure analysis support information providing device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Totterdell et al. | The evaluation of adaptive systems | |
JPH05108356A (en) | Fault analysis back-up device | |
JPH05250218A (en) | On-line program test system | |
KR920010415A (en) | Display control system to set grayscale level with popup menu | |
JPH0713809A (en) | Program evaluation system | |
Bersini et al. | A model of operator behaviour for man-machine system simulation | |
JPH04199202A (en) | Plant operation supporting device | |
JPH01177585A (en) | Operation training support device | |
JPH0527889A (en) | Active guide device | |
JPH02287628A (en) | Membership function analyzer | |
JPH0528010A (en) | Method for inferring cause of software bug and expert system | |
Miller | Effects of stimulus probability on encoding mechanisms in information processing tasks. | |
JPH09128261A (en) | Automatic test device for computer system | |
JPH04140803A (en) | Expected value data generating system | |
JPH03164785A (en) | Simulator device for training plant operation | |
JPS61251966A (en) | Image processor | |
JPH08304024A (en) | Estimation method for burning position in incinerator | |
JPH0793146A (en) | Program preparation supporting device | |
JPH05159009A (en) | Circuit simulation device | |
JPH0756746A (en) | System call function processor | |
JP2000056978A (en) | Expert system | |
KR890017918A (en) | Routine test method in all electronic exchange | |
Murphy et al. | Case Study: Developing an Operations Concept for Future Air Traffic Control | |
JPH07282033A (en) | Simulation method and simulation device | |
JPH01295303A (en) | Operating knowledge collector |