JPH05106039A - Substrate treating equipment - Google Patents

Substrate treating equipment

Info

Publication number
JPH05106039A
JPH05106039A JP3292170A JP29217091A JPH05106039A JP H05106039 A JPH05106039 A JP H05106039A JP 3292170 A JP3292170 A JP 3292170A JP 29217091 A JP29217091 A JP 29217091A JP H05106039 A JPH05106039 A JP H05106039A
Authority
JP
Japan
Prior art keywords
substrate
chamber
transfer arm
flap valve
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3292170A
Other languages
Japanese (ja)
Inventor
Junichi Tatemichi
潤一 立道
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP3292170A priority Critical patent/JPH05106039A/en
Publication of JPH05106039A publication Critical patent/JPH05106039A/en
Pending legal-status Critical Current

Links

Landscapes

  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To provide substrate treating equipment, where the deflection of a conveyance arm can be prevented even in the case of conveying a large-sized substrate, by a simplified constitution. CONSTITUTION:A flap valve 30 partitioning a chamber 4 and an air lock chamber 26 is provided so that it can be opened on the downside, and further, a roller 50 supporting a conveyance arm 34 in a state capable of longitudinal motion is attached via a column 52 to the part located in the position above the flap valve 30 in an open state and on the track of the conveyance arm 34.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、例えばイオン注入装
置、薄膜形成装置、エッチング装置等のように、真空中
で基板を処理する基板処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate processing apparatus for processing a substrate in a vacuum such as an ion implantation apparatus, a thin film forming apparatus and an etching apparatus.

【0002】[0002]

【従来の技術】この種の基板処理装置の従来例を図2に
示す。この基板処理装置は、真空中で基板2を処理する
ための処理室4と、この処理室4にフラップ弁30を介
して隣接されていて、基板2をこの処理室4と大気中と
の間で出し入れするためのエアロック室26と、基板2
をこのエアロック室26と処理室4との間で搬送する搬
送アーム34とを備えている。
2. Description of the Related Art A conventional example of this type of substrate processing apparatus is shown in FIG. This substrate processing apparatus is adjacent to a processing chamber 4 for processing the substrate 2 in a vacuum and a processing chamber 4 with a flap valve 30 interposed between the processing chamber 4 and the atmosphere. The air lock chamber 26 for taking in and out by the substrate 2
Is provided between the airlock chamber 26 and the processing chamber 4.

【0003】処理室4内には、この例では、次のような
構成の基板保持装置10が設けられている。即ちこの基
板保持装置10は、基板2を載せるための基板台11
と、基板2の周縁部を基板台11に対して押さえ付ける
ための環状のクランパー12と、クランパー12を上下
動させるための複数本のクランパー軸14と、各クラン
パー軸14を弾性的に押し下げるばね(例えば圧縮コイ
ルばね)16と、各クランパー軸14間を連結する連結
板18と、この連結板18に支持されていて基板2を昇
降させる昇降ピン20と、基板台11およびそれに取り
付けられた物を支えると共に例えば矢印Aのように回転
させる回転軸22と、矢印Bのように動いて連結板18
を昇降させる昇降軸24とを備えている。図中の40〜
44は、真空シール用のOリング等のパッキンである。
In this example, a substrate holding device 10 having the following structure is provided in the processing chamber 4. That is, the substrate holding device 10 includes a substrate table 11 on which the substrate 2 is placed.
An annular clamper 12 for pressing the peripheral edge of the substrate 2 against the substrate base 11, a plurality of clamper shafts 14 for moving the clamper 12 up and down, and a spring for elastically pushing down each clamper shaft 14. (For example, a compression coil spring) 16, a connecting plate 18 for connecting the clamper shafts 14, an elevating pin 20 supported by the connecting plate 18 for elevating the substrate 2, a substrate table 11 and an object attached thereto. A rotating shaft 22 that supports the shaft and rotates as shown by arrow A, and a connecting plate 18 that moves as shown by arrow B
And an elevating shaft 24 for elevating and lowering. 40 in the figure
44 is a packing such as an O-ring for vacuum sealing.

【0004】処理室4の上部には、この例では、基板保
持装置10に保持された基板2にイオンビーム8を照射
してイオン注入等の処理を施すためのイオン源6が取り
付けられている。
In this example, an ion source 6 for irradiating the substrate 2 held by the substrate holding device 10 with an ion beam 8 to perform a process such as ion implantation is attached to the upper part of the processing chamber 4. ..

【0005】フラップ弁30は、真空弁の一種であって
処理室4とエアロック室26間を仕切るものであり、矢
印Cのように開閉される。32はその回転軸である。
The flap valve 30 is a kind of vacuum valve that partitions the processing chamber 4 from the air lock chamber 26 and is opened and closed as indicated by an arrow C. Reference numeral 32 is its rotation axis.

【0006】エアロック室26の上部には、この例で
は、大気中とエアロック室26内とで基板2を出し入れ
する際に例えば矢印Dのように開閉される蓋28が設け
られている。
In this example, a lid 28 that is opened and closed when the substrate 2 is taken in and out in the atmosphere and in the airlock chamber 26 is provided above the airlock chamber 26.

【0007】搬送アーム34は、この例では、エアロッ
ク室26の壁面を貫通していて矢印Eのように前後動可
能な軸36と、その先端部に取り付けられていて基板2
を支持する支持板(フォークとも呼ばれる)38とを有
している。
In this example, the transfer arm 34 penetrates the wall surface of the airlock chamber 26 and is movable back and forth as indicated by an arrow E, and is attached to the tip of the shaft 36 so that the substrate 2
And a support plate (also referred to as a fork) 38 that supports the.

【0008】動作例を説明すると、処理室4は常に真空
排気されているものとして、蓋28を開いて未処理の基
板2を搬送アーム34の支持板38に載せて蓋28を閉
じ、エアロック室26内を真空排気する。このときフラ
ップ弁30は閉じられており、エアロック室26内が所
定の真空度に達したら、フラップ弁30を開いて搬送ア
ーム34を前進させ、かつ昇降軸24によってクランパ
ー12を上昇させ(図1参照)、基板2を基板台11と
クランパー12間に搬送し、その状態で昇降軸24をも
う1段上昇させて昇降ピン20で基板2を支持板38か
ら受け取る。
Explaining an operation example, assuming that the processing chamber 4 is constantly evacuated, the lid 28 is opened, the unprocessed substrate 2 is placed on the support plate 38 of the transfer arm 34, the lid 28 is closed, and the air lock is performed. The chamber 26 is evacuated. At this time, the flap valve 30 is closed, and when the inside of the airlock chamber 26 reaches a predetermined vacuum degree, the flap valve 30 is opened to advance the transfer arm 34, and the lift shaft 24 raises the clamper 12 (see FIG. 1), the substrate 2 is conveyed between the substrate base 11 and the clamper 12, and in that state, the elevating shaft 24 is raised by another step and the elevating pin 20 receives the substrate 2 from the support plate 38.

【0009】その後搬送アーム34を後退させ、更に昇
降軸24を下降させてクランパー12と基板台11との
間にばね16の力で基板2を保持(挟持)し、フラップ
弁30を閉じ、イオン源6から基板保持装置10上の基
板2にイオンビーム8を照射して処理を施す。処理後の
基板2の大気中への搬出は、上記と逆の動作で行われ
る。
After that, the transfer arm 34 is retracted, and the lifting shaft 24 is further lowered to hold (nip) the substrate 2 between the clamper 12 and the substrate table 11 by the force of the spring 16, and the flap valve 30 is closed, so that the ion is released. The substrate 2 on the substrate holding device 10 is irradiated with the ion beam 8 from the source 6 to be processed. The unloading of the substrate 2 after processing into the atmosphere is performed in the reverse operation.

【0010】[0010]

【発明が解決しようとする課題】ところが近年は、薄膜
トランジスタ式の液晶ディスプレイ等に代表されるよう
に、基板2が大型化し、それに伴って重量も重くストロ
ークも伸びてきており、上記のような従来の装置で大型
の基板2を搬送アーム34の支持板38に載せて搬送す
る場合、搬送アーム34が前進した時に当該搬送アーム
34が例えば図2中に2点鎖線で示すように大きく撓
(たわ)み、うまく基板2を搬送することができなくな
るという問題がある。これに対しては、搬送アーム34
やその支持部の強度を大きくすることが考えられるが、
それでも上記のように大きく前進した搬送アーム34の
撓みは避けられない。
However, in recent years, as typified by a thin film transistor type liquid crystal display or the like, the substrate 2 has been increased in size, and accordingly, the weight and the stroke have been extended, and the conventional method as described above is used. When a large substrate 2 is placed on the support plate 38 of the transfer arm 34 and transferred by the above apparatus, when the transfer arm 34 moves forward, the transfer arm 34 is largely bent (for example, as shown by a two-dot chain line in FIG. 2). However, there is a problem that the substrate 2 cannot be conveyed properly. For this, the transfer arm 34
Although it is possible to increase the strength of the
Even so, the bending of the transfer arm 34, which is greatly advanced as described above, cannot be avoided.

【0011】そこでこの発明は、簡単な構成によって、
大型基板を搬送する場合でも搬送アームの撓みを防止す
ることができるようにした基板処理装置を提供すること
を主たる目的とする。
Therefore, the present invention has a simple structure.
A main object of the present invention is to provide a substrate processing apparatus capable of preventing the bending of a transfer arm even when transferring a large substrate.

【0012】[0012]

【課題を解決するための手段】上記目的を達成するた
め、この発明の基板処理装置は、前述したような搬送ア
ームの進路上に、同搬送アームを前後動可能に支持する
ローラを設けたことを特徴とする。
In order to achieve the above object, the substrate processing apparatus of the present invention is provided with a roller for supporting the transfer arm so as to be movable back and forth on the path of the transfer arm as described above. Is characterized by.

【0013】[0013]

【作用】上記構成によれば、ローラによって搬送アーム
を前後動可能に支持することができるので、大型基板を
搬送する場合でも搬送アームの撓みを防止することがで
き、従って大型基板の搬送が可能になる。
According to the above construction, since the transfer arm can be supported by the rollers so as to be movable back and forth, it is possible to prevent the transfer arm from bending even when transferring a large substrate, and thus it is possible to transfer a large substrate. become.

【0014】[0014]

【実施例】図1は、この発明の一実施例に係る基板処理
装置を示す断面図である。図2の従来例と同一または相
当する部分には同一符号を付し、以下においては当該従
来例との相違点を主に説明する。
1 is a sectional view showing a substrate processing apparatus according to an embodiment of the present invention. The same or corresponding portions as those of the conventional example in FIG. 2 are denoted by the same reference numerals, and the differences from the conventional example will be mainly described below.

【0015】前述したフラップ弁30は図示のように下
側に開くようにされており、この実施例ではこのフラッ
プ弁30の開いた状態の上側であって搬送アーム34の
進路上に位置する所に、搬送アーム34を前後動可能に
支持するローラ50を支柱52を介して取り付けてい
る。勿論このローラ50および支柱52は、フラップ弁
30の開閉およびその本来の目的(即ち処理室4とエア
ロック室26との間の仕切り)に支障のない位置に設け
ている。
The flap valve 30 described above is designed to open downward as shown in the figure. In this embodiment, the flap valve 30 is located above the open state of the flap valve 30 and on the path of the transfer arm 34. Further, a roller 50 that supports the transport arm 34 so as to be movable back and forth is attached via a column 52. Of course, the roller 50 and the support column 52 are provided at a position that does not interfere with the opening and closing of the flap valve 30 and its original purpose (that is, the partition between the processing chamber 4 and the airlock chamber 26).

【0016】このようにすれば、搬送アーム34を前進
させて基板2を処理室4内へ(又は処理室4内から)搬
送する場合、ローラ50によって搬送アーム34を前後
動可能に支持することができるので、大型基板2を搬送
する場合でも搬送アーム34の撓みを防止することがで
き、従って大型基板2の搬送が可能になる。しかも、フ
ラップ弁30上にローラ50を設けるだけで良いので、
構成も非常に簡単である。
With this arrangement, when the transfer arm 34 is moved forward to transfer the substrate 2 into (or out of) the processing chamber 4, the transfer arm 34 is supported by the roller 50 so as to be movable back and forth. Therefore, even when the large substrate 2 is transferred, the bending of the transfer arm 34 can be prevented, and thus the large substrate 2 can be transferred. Moreover, since it is only necessary to provide the roller 50 on the flap valve 30,
The configuration is also very simple.

【0017】また、ローラ50はフラップ弁30とは別
の所に設けても良いが、この実施例のようにフラップ弁
30上に設けると、余分なスペースを一切必要としない
ので、処理室4やエアロック室26を大きくしなくて済
むという効果も得られる。
Further, the roller 50 may be provided at a place different from the flap valve 30, but if it is provided on the flap valve 30 as in this embodiment, no extra space is required and therefore the processing chamber 4 It is also possible to obtain the effect that the air lock chamber 26 does not need to be large.

【0018】なお、上述した基板保持装置10の構成や
イオン源6、蓋28を設けること等はあくまでも一例で
あり、この発明はそのようなものを採用した以外の基板
処理装置にも広く適用することができる。
The configuration of the substrate holding device 10 and the provision of the ion source 6 and the lid 28 described above are merely examples, and the present invention is widely applied to substrate processing devices other than those adopting such a device. be able to.

【0019】[0019]

【発明の効果】以上のようにこの発明によれば、搬送ア
ームの進路上に、同搬送アームを前後動可能に支持する
ローラを設けたので、大型基板を搬送する場合でも搬送
アームの撓みを防止することができ、従って大型基板の
搬送が可能になる。しかもローラを設けるだけで良いの
で、構成も非常に簡単である。
As described above, according to the present invention, since the roller for supporting the transfer arm so as to be movable back and forth is provided on the path of the transfer arm, the transfer arm is not bent even when transferring a large substrate. This can be prevented, and thus a large substrate can be transported. Moreover, the structure is very simple because it is sufficient to provide rollers.

【図面の簡単な説明】[Brief description of drawings]

【図1】 この発明の一実施例に係る基板処理装置を示
す断面図である。
FIG. 1 is a sectional view showing a substrate processing apparatus according to an embodiment of the present invention.

【図2】 従来の基板処理装置の一例を示す断面図であ
る。
FIG. 2 is a sectional view showing an example of a conventional substrate processing apparatus.

【符号の説明】[Explanation of symbols]

2 基板 4 処理室 26 エアロック室 30 フラップ弁 34 搬送アーム 36 軸 38 支持板 50 ローラ 2 substrate 4 processing chamber 26 air lock chamber 30 flap valve 34 transfer arm 36 shaft 38 support plate 50 roller

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 真空中で基板を処理するための処理室
と、基板をこの処理室と大気中との間で出し入れするた
めのエアロック室と、前後動可能な軸およびその先端部
に取り付けられていて基板を支持する支持板を有してい
て、この軸を前後動させることにより基板を前記エアロ
ック室と処理室との間で搬送する搬送アームとを備える
基板処理装置において、前記搬送アームの進路上に、同
搬送アームを前後動可能に支持するローラを設けたこと
を特徴とする基板処理装置。
1. A processing chamber for processing a substrate in a vacuum, an air lock chamber for loading and unloading the substrate between the processing chamber and the atmosphere, and a shaft that can be moved back and forth and its tip end. And a supporting plate for supporting the substrate, the substrate processing apparatus including a transfer arm that transfers the substrate between the airlock chamber and the processing chamber by moving the shaft back and forth. A substrate processing apparatus characterized in that a roller that supports the transfer arm so as to be movable back and forth is provided on the path of the arm.
JP3292170A 1991-10-11 1991-10-11 Substrate treating equipment Pending JPH05106039A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3292170A JPH05106039A (en) 1991-10-11 1991-10-11 Substrate treating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3292170A JPH05106039A (en) 1991-10-11 1991-10-11 Substrate treating equipment

Publications (1)

Publication Number Publication Date
JPH05106039A true JPH05106039A (en) 1993-04-27

Family

ID=17778468

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3292170A Pending JPH05106039A (en) 1991-10-11 1991-10-11 Substrate treating equipment

Country Status (1)

Country Link
JP (1) JPH05106039A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1326228C (en) * 2003-05-29 2007-07-11 东京毅力科创株式会社 Substrate delivery device and method, and vacuum processing device
KR101174154B1 (en) * 2005-06-13 2012-08-14 엘지디스플레이 주식회사 sputtering apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1326228C (en) * 2003-05-29 2007-07-11 东京毅力科创株式会社 Substrate delivery device and method, and vacuum processing device
KR101174154B1 (en) * 2005-06-13 2012-08-14 엘지디스플레이 주식회사 sputtering apparatus
US8470142B2 (en) 2005-06-13 2013-06-25 Lg Display Co., Ltd. Sputtering apparatus and driving method thereof

Similar Documents

Publication Publication Date Title
KR100272890B1 (en) Dual cassette load lock
KR0179385B1 (en) Vacuum apparatus
US6331095B1 (en) Transportation system and processing apparatus employing the transportation system
JP6336231B1 (en) Vacuum processing equipment
KR20180111592A (en) Substrate processing apparatus
JP2001104776A (en) Treatment apparatus and method
KR900003469B1 (en) Vacuum processing apparatus
JP2837332B2 (en) Transfer arm
JPH05106039A (en) Substrate treating equipment
TWI789436B (en) storage box opener
JPH10135229A (en) Heat treating apparatus
JP4302817B2 (en) Vacuum processing system
JP3260427B2 (en) Vacuum processing apparatus and substrate transfer method in vacuum processing apparatus
JPS6339102B2 (en)
TWI632630B (en) Vertical heat treatment apparatus
JPH03155619A (en) Vacuum processor
JP3426222B2 (en) Alignment mechanism, processing device and alignment method in load lock chamber
JP3160691B2 (en) Processing equipment
JPH06252245A (en) Vacuum processing equipment
JP2582578Y2 (en) Multi-chamber semiconductor processing equipment
JP3082148B2 (en) Compound type wafer processing equipment
JPH08181185A (en) Continuous vacuum process equipment
JP2583675Y2 (en) Thin film vapor deposition equipment
JPH04282848A (en) Manufacturing device for semiconductor device
JPH0755533Y2 (en) Distortion correction device for substrate storage cassette