JPH0499837U - - Google Patents

Info

Publication number
JPH0499837U
JPH0499837U JP502791U JP502791U JPH0499837U JP H0499837 U JPH0499837 U JP H0499837U JP 502791 U JP502791 U JP 502791U JP 502791 U JP502791 U JP 502791U JP H0499837 U JPH0499837 U JP H0499837U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP502791U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP502791U priority Critical patent/JPH0499837U/ja
Publication of JPH0499837U publication Critical patent/JPH0499837U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP502791U 1991-02-08 1991-02-08 Pending JPH0499837U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP502791U JPH0499837U (enrdf_load_stackoverflow) 1991-02-08 1991-02-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP502791U JPH0499837U (enrdf_load_stackoverflow) 1991-02-08 1991-02-08

Publications (1)

Publication Number Publication Date
JPH0499837U true JPH0499837U (enrdf_load_stackoverflow) 1992-08-28

Family

ID=31735270

Family Applications (1)

Application Number Title Priority Date Filing Date
JP502791U Pending JPH0499837U (enrdf_load_stackoverflow) 1991-02-08 1991-02-08

Country Status (1)

Country Link
JP (1) JPH0499837U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004028596A (ja) * 2002-06-21 2004-01-29 New Japan Radio Co Ltd 半導体装置のテスト用電極装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004028596A (ja) * 2002-06-21 2004-01-29 New Japan Radio Co Ltd 半導体装置のテスト用電極装置

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