JPH0494733U - - Google Patents
Info
- Publication number
- JPH0494733U JPH0494733U JP89791U JP89791U JPH0494733U JP H0494733 U JPH0494733 U JP H0494733U JP 89791 U JP89791 U JP 89791U JP 89791 U JP89791 U JP 89791U JP H0494733 U JPH0494733 U JP H0494733U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP89791U JPH0494733U (ja) | 1991-01-17 | 1991-01-17 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP89791U JPH0494733U (ja) | 1991-01-17 | 1991-01-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0494733U true JPH0494733U (ja) | 1992-08-17 |
Family
ID=31727914
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP89791U Pending JPH0494733U (ja) | 1991-01-17 | 1991-01-17 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0494733U (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20220008765A (ko) * | 2020-07-14 | 2022-01-21 | 도쿄엘렉트론가부시키가이샤 | 검사 장치 |
-
1991
- 1991-01-17 JP JP89791U patent/JPH0494733U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20220008765A (ko) * | 2020-07-14 | 2022-01-21 | 도쿄엘렉트론가부시키가이샤 | 검사 장치 |
US11536768B2 (en) * | 2020-07-14 | 2022-12-27 | Tokyo Electron Limited | Inspection apparatus |