JPH048372Y2 - - Google Patents
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- Publication number
- JPH048372Y2 JPH048372Y2 JP19409584U JP19409584U JPH048372Y2 JP H048372 Y2 JPH048372 Y2 JP H048372Y2 JP 19409584 U JP19409584 U JP 19409584U JP 19409584 U JP19409584 U JP 19409584U JP H048372 Y2 JPH048372 Y2 JP H048372Y2
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- Prior art keywords
- connection piece
- voltage
- metal conductive
- conductive plate
- type test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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- 239000002184 metal Substances 0.000 claims description 49
- 238000012360 testing method Methods 0.000 claims description 33
- 238000009413 insulation Methods 0.000 claims description 8
- 238000000465 moulding Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 14
- 238000009434 installation Methods 0.000 description 6
- 239000012212 insulator Substances 0.000 description 4
- 238000010276 construction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Description
【考案の詳細な説明】
〔考案の技術分野〕
本考案は、締付形試験端子用接続片、特にPT，
CT2次回路等の電圧、電流の測定及び配電盤、制
御盤等（以下盤と称す）に取付けられた機器の試
験を行なうために、予め試験端子間を接続する締
付形試験端子用接続片に関するものである。
〔考案の技術的背景〕
盤へ予め配置される各締付形試験端子間の取付
間隔寸法は、装置の常時運用時とPT，CT2次回
路等の電圧、電流測定時及び機器の試験時に、必
要に応じて各締付形試験端子間を接続片にて接続
したり、開放したりするように構成されている。
第５図はPT回路に使用されている電圧回路用
締付形試験端子の位置を示す結線図、第６図は
CT回路に使用されている電流回路用締付形試験
端子の位置を示す結線図であり、両者とも装置の
常時運用時の状態である。
第５図及び第６図において、１は電圧回路用締
付形試験端子（接続片を含めた記号）、４は電流
回路用締付形試験端子（接続片を含めた記号）
で、PT，CT2次回路は前記締付形試験端子１又
は４を介して盤用機器２に接続されている。な
お、３は締付形試験端子１，４及び盤用機器２が
取付く盤である。
第７図及び第８図は前記第５図及び第６図に示
す従来の接続片を使用した締付形試験端子の構成
を示す図であり、第７図ａは前記した第５図の電
圧回路用締付形試験端子（以下電圧用Ｔ，Ｔと称
す）１が盤３に取付いた状態を示す正面図、第７
図ｂは側面図である。第８図ａは前記した第６図
の電流回路用締付形試験端子（以下電流用Ｔ，Ｔ
と称す）４が盤３に取付いた状態を示す正面図、
第８図ｂは側面図である。
そして、電圧用Ｔ，Ｔ１は軸ネジ９に絶縁固定
ナツト１０及び絶縁固定ツマミ１２が固定され、
可動ツマミ１１が可動するように構成されて、接
続片５は絶縁固定ナツト金属部１０ａと可動ツマ
ミ金属部１１ａ間に締付け取付けられている。
又、電流用Ｔ，Ｔは軸ネジ１３に絶縁固定ナツ
ト１０，１４及び絶縁固定ツマミ１２が固定さ
れ、可動ツマミ１１，１５が可動するように構成
され、接続片５は絶縁固定ナツト金属部１０ａと
可動ツマミ金属部１１ａ間及び絶縁固定ナツト金
属部１４ａと可動ツマミ金属部１５ａ間に、夫々
締付け取付けられている。
第７図ａにおいて、電圧用Ｔ，Ｔ１はL1＜L2
の寸法関係となるように配置され、装置の常時運
用時は、接続片５により上、下の電圧用Ｔ，Ｔを
接続している。この状態では第７図ｂに示すよう
に、下側の電圧用Ｔ，ＴがPT2次回路へ接続さ
れ、上側の電圧用Ｔ，Ｔは盤用機器２へ接続され
ているので、接続片５でPT2次回路と盤用機器２
を電気的に接続している。
他方、電流用Ｔ，Ｔ４は第８図ａに示すよう
に、L1＝L3の寸法関係となるように配置され、
装置の常時運用時は、接続片５により上、下の電
流用Ｔ，Ｔを接続している。但し、第８図ｂに示
すように、上、下の電流用Ｔ，Ｔは接続片５を２
本使用して接続するように構成している。第８図
ｂにおいて下側の電流用Ｔ，ＴはCT2次回路へ接
続され、上側の電流用Ｔ，Ｔは盤用機器２へ接続
されているので、結果として接続片５はCT2次回
路と盤用機器２を電気的に接続している。
第９図に示すように従来の接続片５は、金属導
電部６，６′絶縁モ−ルド部７、及び金属導電部
６，６′に設けた切欠き円弧８，８′により構成さ
れ、前記切欠き円弧８と８′の寸法は、第７図ａ、
第８図ａに示す寸法L1となつている。なお、全
長はL4で示している。
第７図の電圧用Ｔ，Ｔの構成において、例えば
盤用機器２を図示しない別電源で試験する時に
は、接続片５を取り外して、PT2次回路を開放に
した状態で上側の電圧用Ｔ，Ｔに図示しない別電
源を接続して試験を実施する。
他方、第８図の電流用Ｔ，Ｔの構成において
は、第１０図ａ，ｂに示すように、一方の接続片
５を取り外して点線で示すようにＲ，Ｓ，Ｔ，Ｎ
間を短絡し、CT2次回路を一括短絡した後で、も
う一方の接続片５（実線で示す）を取り外して、
上側の電流用Ｔ，Ｔに図示しない別電源を接続し
て盤用機器２の試験を実施する。なお、第１０図
においてもL1＝L3の寸法関係となつている。
〔背景技術の問題点〕
上記構成を有する従来の接続片５を用いた第７
図の電圧用Ｔ，Ｔにおいて、盤面縮少の観点から
各電圧用Ｔ，Ｔ間の取付寸法間隔L2を出来るだ
け小さくする必要があり、L2はL1寸法に近づく
傾向にある。よつて必然的に第１１図に示すよう
に左右の電圧用Ｔ，Ｔの可動ツマミ金属部１１ａ
間の寸法L5も狭くなるので、接続片５の全長L4
よりもL5の方が小さくなつてくる。このために
前述した図示しない別電源による盤用機器２の試
験時に、接続片５を取り外した後で、接続片５を
落下させた場合等において、左右の電圧用Ｔ，Ｔ
間が接続片５の金属導電部６，６′で短絡される
ので（第１１図の点線で示す状態）、PT2次回路
の短絡事故を起す要因となつていた。
この対策として第１２図に示すように、締付形
Ｔ，Ｔへ締付けられる金属部１８を除いた部分を
絶縁物１７で覆つた接続片１６があるが、この場
合は左右の電圧用Ｔ，Ｔ間の短絡は防げるが、第
１０図に示す電流用Ｔ，Ｔにおいて、盤用機器２
を図示しない別電源で試験する場合には、下側の
電流用Ｔ，Ｔ間を連続して短絡する必要がある
が、本接続片１６では不可能である。したがつて
電圧用接続片１６（第１２図）と電流用接続片５
（第９図）の２種類が必要となるだけでなく、使
い分けによる間違いが生じる恐れがあり、抜本的
な対策とはなつていなかつた。
〔考案の目的）
本考案は上記問題点を解決するためになされた
ものであり、電圧用Ｔ，Ｔ間の不必要な短絡を防
止すると共に、電流用Ｔ，Ｔにおいても各電流用
Ｔ，Ｔ間を連続して一括短絡させることが可能な
締付形試験端子用接続片を提供することを目的と
している。
〔考案の概要〕
本考案では、接続片の金属導電部分を必要に応
じて絶縁物で覆い、その長手方向延長上に、開口
方向が互に直角になるような切欠き円弧をもうけ
て導電部位とし、電圧用Ｔ，Ｔ間短絡が不必要な
取付け寸法の時には、一方端を絶縁物で絶縁して
誤短絡を防止すると共に、電流用Ｔ，Ｔ間を連続
して短絡させたい場合には、確実な短絡動作を保
証するために、接続片の端部にある金属導電部分
を互に重ね合せることにより接触できるようにし
ようとするものである。
〔考案の実施例〕
以下図面を参照して実施例を説明する。第１図
は本考案による締付形試験端子用接続片の一実施
例構成図である。
第１図において、接続片２０は金属導電板２１
と絶縁モ−ルド部２２とからなり、これらは一体
構成されている。金属導電板２１には電圧用Ｔ，
Ｔの軸ネジ９及び電流用Ｔ，Ｔの軸ネジ１３の半
径より若干大きめの切欠き円弧２１ａ，２１ｂが
もうけられる。そして切欠き円弧２１ａ，２１ｂ
は切欠き円弧の中心延長線上において互の開口部
が直角方向となるようにもうけられ、かつ開口部
間の寸法は締付形Ｔ，Ｔ取付寸法L1に対応して
いる。そして切欠円弧２１ｂにはその円弧の外周
に接する延長上に任意の角度で、切欠き２１ｃ及
び２１ｄを設けてある。２１ｅは金属導電板２１
の端部にある切欠き２１ａの開口部の端であり、
２１ｆは切欠き円弧２１ｂ側の金属導電板表面で
ある。又、絶縁モ−ルド部２２には前記した金属
導電板２１の切欠き円弧２１ｂの中心と同心円状
に、円弧２２ａがもうけられ、これは電圧用Ｔ，
Ｔ、電流用Ｔ，Ｔの可動ツマミ１１，１５の外周
より若干大きめとなつている。更に、金属導電板
２１の切欠き２１ｃと同角で切欠いた切欠き２２
ｃを有している。なお、切欠き２２ｃ、絶縁モ−
ルド部右端２２ｅ以外の絶縁モ−ルド部は、金属
導電板２１の外形を覆う形で施されており、絶縁
ふち２２ｂと突端部２２ｄを有している。絶縁モ
−ルド部溝幅T2は金属導電板２１の幅T1より若
干広くしてあり、T2＞T1となつている。又、溝
幅T2部分の肉厚ｔは金属導電板２１の板厚と同
じになるように構成されている。更に寸法につい
ては全長をL6とし、L7とL8の関係はL7＞L8とな
つている。
第２図ａは上記構成になる接続片を電圧用Ｔ，
Ｔに使用した場合の取付状態図であり、第２図ｂ
は側面図である。
先ず取付け時は第２図ａの点線で示すように、
接続片２０の金属導電板２１の端部にある切欠き
円弧２１ａを電圧用Ｔ，Ｔの軸ネジ９へ押圧し、
この状態から矢印方向に回動させ、更に上部にあ
る電圧用Ｔ，Ｔの軸ネジ９へ切欠き円弧２１ｂを
接触させた状態で、可動ツマミ１１をまわして絶
縁固定ナツト金属部１０ａと可動ツマミ金属部１
１ａ間に接続片２０を締付け固定する。
この状態を第２図ａの実線で示すが、上部の電
圧用Ｔ，Ｔの可動ツマミ１１と絶縁固定ナツト１
０は接続片２０の絶縁モ−ルド部２２の円弧２２
ａに若干沈んだ状態として金属導電板２１のみで
接続することになる。即ち、第２図ｂに示すよう
に、PT2次回路と盤用機器２とを接続片２０で電
気的に接続したことになる。
第３図は接続片を電圧用Ｔ，Ｔに使用した場合
に左右の電圧用Ｔ，Ｔ間の短絡が防止できること
を示す図である。即ち、盤用機器２を図示しない
別電源で試験するに際して、接続片２０を取外し
てPT2次回路を開放状態にした後で、例えば接続
片２０を誤つて落下させる場合が考えられる。こ
の場合は第３図の上部電圧用Ｔ，Ｔ間に接続片２
０が、点線で示す状態にひっかかることになり、
接続片２０の金属導電板２１の端部２１ｅは左側
の電圧用Ｔ，Ｔの可動ツマミ金属部１１ａ又は軸
ネジ９に接触しているが、右側の電圧用Ｔ，Ｔに
は絶縁モ−ルド部２２のふち２２ｂが当つている
ので、電圧用Ｔ，Ｔ間は絶対に短絡することはな
い。
同じく第３図の下方に示すように、下部電圧用
Ｔ，Ｔ間に接続片２０が点線の状態でひつかかる
場合も考えられる。この場合は左側の電圧用Ｔ，
Ｔの可動ツマミ金属部１１ａ又は軸ネジ９に金属
導電板２１の端部２１ｅが接触しているが、右側
の電圧用Ｔ，Ｔには絶縁モ−ルド部２２の突端２
２ｄが当ることになるので、電圧用Ｔ，Ｔ間は絶
対に短絡することはない。これは第３図の接続片
２０が逆向きであつても、又、接続片２０が上下
間の電圧用Ｔ，Ｔを接続した状態で取付いていて
も同じように、左右の電圧用Ｔ，Ｔ間の短絡はあ
り得ない。
第４図ａは接続片を電流用Ｔ，Ｔに使用した場
合の取付状態図であり、第４図ｂは正面図であ
る。
先ず盤用機器２を図示しない別電源で試験する
場合には、一方の接続片２０を取外し点線で示す
ように、Ｒ，Ｓ，Ｔ，Ｎ間を短絡して、CT2次回
路を一括短絡する必要がある。
ここで接続片２０は第１図に示したように、金
属導電板２１の幅T1と絶縁モ−ルド部の溝幅T2
とが、T2＞T1、又、溝幅T2の肉厚ｔが金属導電
板２１の板厚と等しく、かつL7＞L8の各寸法関
係になつているので、金属導電板２１と絶縁モ−
ルド部溝幅T2の金属導電板表面２１ｆが、隣り
合う各々の接続片同志間で互に重ね合さり、その
結果、可動ツマミ金属部１１ａと絶縁固定ナツト
金属部１０ａ間に締付け固定されるので、連続し
て左右の電流用Ｔ，Ｔ間を短絡できる。この後、
もう一方の接続片２０（実線で示す）を取外し
て、上側の電流用Ｔ，Ｔに図示しない別電源を接
ぎ込んで、盤用機器２の試験を実施する。なお、
第４図においても、L1＝L3の寸法関係になつて
いる。
上記各説明から明らかなように、一種類の接続
片２０のみで電圧用、電流用を兼用することがで
きると共に、従来の欠点を解決することができ
る。
〔考案の効果）
以上説明した如く、本考案によれば接続片を金
属導電板とこれを覆う絶縁モ−ルド部とによつて
構成し、この接続片の長手方向延長上に、開口方
向が互に直角方向となるように切欠き円弧をもう
けて、各円弧間の距離を締付形試験端子取付寸法
とし、かつ電圧用Ｔ，Ｔ端子間距離と電流用端子
間距離とを同一にして接続片を共用できるよう構
成したので、一種類だけの接続片でPT2次回路及
びCT2次回路で使い分けが不要となり、又、接続
片の取付け、取外しが容易で、しかも接続片の取
扱い時に細心の注意を払うことがなくなり、工数
低減及び工期短縮等の利点があり、高信頼度化及
び盤面縮小化等の可能な締付形試験端子用接続片
を提供できる。 [Detailed description of the invention] [Technical field of the invention] The invention is a connection piece for a clamping type test terminal, especially PT,
Concerning connection pieces for clamp-type test terminals that connect test terminals in advance in order to measure voltage and current of CT secondary circuits, etc., and test equipment installed on switchboards, control boards, etc. (hereinafter referred to as "boards"). It is something. [Technical background of the invention] The installation spacing between each clamp type test terminal placed on the panel in advance is determined based on the following: during regular operation of the device, when measuring voltage and current of PT and CT secondary circuits, etc., and when testing the equipment. It is configured to connect or disconnect each clamping type test terminal with a connecting piece as necessary. Figure 5 is a wiring diagram showing the position of the voltage circuit clamp type test terminal used in the PT circuit, and Figure 6 is
It is a wiring diagram showing the positions of the clamp type test terminals for the current circuit used in the CT circuit, both of which are in a state in which the device is in constant operation. In Figures 5 and 6, 1 is a clamping type test terminal for voltage circuits (symbol including connecting piece), 4 is clamping type test terminal for current circuit (symbol including connecting piece)
The PT and CT secondary circuits are connected to the panel equipment 2 via the tightening type test terminal 1 or 4 . Note that 3 is a panel to which the clamping type test terminals 1 and 4 and panel equipment 2 are attached. 7 and 8 are diagrams showing the configuration of a tightening type test terminal using the conventional connection pieces shown in FIGS. 5 and 6, and FIG. 7a shows the voltage A front view showing the state in which circuit clamping type test terminal (hereinafter referred to as voltage T, T) 1 is attached to panel 3, No. 7
Figure b is a side view. Figure 8a shows the clamp type test terminal for the current circuit (hereinafter referred to as T for current, T
4 is attached to the panel 3,
FIG. 8b is a side view. The voltage T and T1 have an insulating fixing nut 10 and an insulating fixing knob 12 fixed to the shaft screw 9,
The movable knob 11 is configured to be movable, and the connecting piece 5 is fastened between the insulating fixed nut metal part 10a and the movable knob metal part 11a. Further, the current T, T is configured such that insulating fixing nuts 10, 14 and insulating fixing knob 12 are fixed to shaft screw 13, movable knobs 11, 15 are movable, and connection piece 5 is connected to insulating fixing nut metal part 10a. and the movable knob metal part 11a, and between the insulating fixing nut metal part 14a and the movable knob metal part 15a, respectively. In Figure 7a, voltage T and T 1 are L 1 <L 2
When the device is in regular operation, the upper and lower voltage Ts are connected by the connecting piece 5 . In this state, as shown in FIG. 7b, the lower voltage T and T are connected to the PT secondary circuit, and the upper voltage T and T are connected to the panel equipment 2, so the connection piece 5 PT secondary circuit and panel equipment 2
are electrically connected. On the other hand, as shown in Fig. 8a, the current T and T4 are arranged so that the dimensional relationship L1 = L3 is established.
When the device is in constant operation, the upper and lower current Ts are connected by the connecting piece 5 . However, as shown in Figure 8b, for the upper and lower current T and T, connect the connecting piece 5 to 2.
The book is configured to connect using. In Fig. 8b, the lower current T and T are connected to the CT secondary circuit, and the upper current T and T are connected to the panel equipment 2, so as a result, the connection piece 5 is connected to the CT secondary circuit. The panel equipment 2 is electrically connected. As shown in FIG. 9, the conventional connecting piece 5 is composed of a metal conductive part 6, 6' insulating molded part 7, and notched circular arcs 8, 8' provided in the metal conductive part 6, 6'. The dimensions of the cutout arcs 8 and 8' are as shown in FIG. 7a,
The dimension L 1 is shown in FIG. 8a. The total length is indicated by L 4 . In the configuration of the voltage T and T shown in FIG. 7, for example, when testing the panel equipment 2 with a separate power supply (not shown), remove the connection piece 5 and open the upper voltage T, with the PT secondary circuit open. Connect a separate power supply (not shown) to T and conduct the test. On the other hand, in the configuration of the current T and T shown in FIG. 8, as shown in FIGS.
After short-circuiting the CT secondary circuit, remove the other connection piece 5 (shown with a solid line),
A separate power supply (not shown) is connected to the upper current T and T, and the panel equipment 2 is tested. In addition, in FIG. 10 as well, the dimensional relationship is L 1 =L 3 . [Problems with the background art] The seventh connection piece using the conventional connection piece 5 having the above configuration
Regarding the voltage Ts and Ts shown in the figure, it is necessary to make the mounting dimension interval L 2 between each voltage T and T as small as possible from the viewpoint of reducing the panel surface area, and L 2 tends to approach the L 1 dimension. Therefore, as shown in FIG. 11, the left and right voltage T, T movable knob metal parts 11a
Since the dimension L 5 between them also becomes narrower, the total length L 4 of the connecting piece 5
L 5 becomes smaller than that. For this reason, when testing the panel equipment 2 using a separate power source (not shown), when the connecting piece 5 is dropped after being removed, the left and right voltage T, T
Since the metal conductive parts 6 and 6' of the connecting piece 5 are short-circuited (the state shown by the dotted line in FIG. 11), this has been a cause of short-circuit accidents in the PT secondary circuit. As a countermeasure for this, there is a connecting piece 16 whose part, excluding the metal part 18 that is tightened to the clamping type T, is covered with an insulator 17, as shown in FIG. 12. In this case, the left and right voltage T, Although short circuits between the Ts can be prevented, in the current Ts and Ts shown in Fig. 10, the panel equipment 2
When testing with a separate power supply (not shown), it is necessary to continuously short-circuit the lower current Ts, but this is not possible with the present connection piece 16 . Therefore, the voltage connection piece 16 (Fig. 12) and the current connection piece 5
Not only are the two types (Figure 9) required, but there is also the risk of mistakes caused by using different types, so this has not been a fundamental countermeasure. [Purpose of the invention] The present invention was made to solve the above problems, and it prevents unnecessary short circuits between the voltage T and T, and also prevents unnecessary short circuits between the voltage T and T. It is an object of the present invention to provide a connection piece for a tightening type test terminal that can continuously short-circuit between Ts. [Summary of the invention] In this invention, the metal conductive part of the connecting piece is covered with an insulator as necessary, and a notch arc is formed on the longitudinal extension of the metal conductive part so that the opening directions are perpendicular to each other to form the conductive part. When the installation dimensions do not require a short circuit between the voltage T and T, insulate one end with an insulator to prevent erroneous short circuits, and if you want to continuously short between the current T and T, In order to ensure a reliable short-circuit operation, the metal conductive parts at the ends of the connecting pieces are brought into contact by overlapping each other. [Embodiments of the invention] Examples will be described below with reference to the drawings. FIG. 1 is a structural diagram of an embodiment of a connection piece for a clamp type test terminal according to the present invention. In FIG. 1, the connecting piece 20 is a metal conductive plate 21.
and an insulating molded portion 22, which are integrally constructed. The metal conductive plate 21 has a T for voltage,
Cutout arcs 21a and 21b are formed which are slightly larger than the radius of the T shaft screw 9 and the current T and T shaft screws 13. And notched circular arcs 21a, 21b
are formed so that the openings are perpendicular to each other on the central extension line of the notched arc, and the dimension between the openings corresponds to the tightening type T and the T mounting dimension L1 . The notched arc 21b is provided with notches 21c and 21d at arbitrary angles on an extension tangent to the outer periphery of the arc. 21e is a metal conductive plate 21
is the end of the opening of the notch 21a at the end of the
21f is the surface of the metal conductive plate on the side of the notched arc 21b. Further, an arc 22a is formed in the insulating molded part 22 concentrically with the center of the notched arc 21b of the metal conductive plate 21, and this is a voltage T,
It is slightly larger than the outer circumference of the movable knobs 11 and 15 of the T, current T, and T. Furthermore, a notch 22 is cut out at the same angle as the notch 21c of the metal conductive plate 21.
It has c. Note that the notch 22c,
The insulating molded portion other than the right end 22e of the molded portion is formed to cover the outer shape of the metal conductive plate 21, and has an insulating edge 22b and a tip portion 22d. The insulation mold groove width T 2 is slightly wider than the width T 1 of the metal conductive plate 21, and T 2 >T 1 . Further, the wall thickness t of the groove width T 2 portion is configured to be the same as the thickness of the metal conductive plate 21 . Furthermore, regarding the dimensions, the total length is assumed to be L 6 , and the relationship between L 7 and L 8 is L 7 > L 8 . Figure 2a shows the connection piece with the above configuration as voltage T,
This is an installation state diagram when used for T, and Fig. 2 b
is a side view. First, when installing, as shown by the dotted line in Figure 2 a,
Press the notched arc 21a at the end of the metal conductive plate 21 of the connection piece 20 to the voltage T, T shaft screw 9,
From this state, rotate it in the direction of the arrow, and then turn the movable knob 11 with the notched arc 21b in contact with the shaft screw 9 of the voltage T and T at the top, and then rotate the insulating fixing nut metal part 10a and the movable knob. Metal part 1
The connecting piece 20 is tightened and fixed between 1a. This state is shown by the solid line in FIG.
0 is the arc 22 of the insulation mold part 22 of the connection piece 20
It is connected only by the metal conductive plate 21 in a slightly sunken state at point a. That is, as shown in FIG. 2b, the PT secondary circuit and the panel equipment 2 are electrically connected by the connecting piece 20 . FIG. 3 is a diagram showing that short circuits between the left and right voltage Ts can be prevented when connecting pieces are used for the voltage Ts. That is, when testing the panel equipment 2 using a separate power source (not shown), it is conceivable that the connecting piece 20 may be accidentally dropped after the connecting piece 20 is removed to open the PT secondary circuit. In this case, use the connecting piece 2 between the upper voltage T and T shown in Figure 3.
0 will be caught in the state shown by the dotted line,
The end 21e of the metal conductive plate 21 of the connection piece 20 is in contact with the movable knob metal part 11a of the left voltage T, T or the shaft screw 9, but the right voltage T, T is insulating molded. Since the edge 22b of the portion 22 is in contact, there will never be a short circuit between the voltage T and T. Similarly, as shown in the lower part of FIG. 3, it is also possible that the connection piece 20 is connected between the lower voltage T and T as shown by the dotted line. In this case, the voltage T on the left,
The end 21e of the metal conductive plate 21 is in contact with the movable knob metal part 11a of the T or the shaft screw 9, but the tip 2 of the insulating mold part 22 is connected to the voltage T and T on the right side.
2d, there will never be a short circuit between the voltage T and T. This is the same even if the connection piece 20 in Fig. 3 is oriented in the opposite direction, or even if the connection piece 20 is installed with the voltage Ts and Ts between the upper and lower sides connected. A short circuit between T is impossible. FIG. 4a is a diagram of the installation state when the connecting piece is used for current T, T, and FIG. 4b is a front view. First, when testing the panel equipment 2 with a separate power supply (not shown), remove one connection piece 20 and short-circuit R, S, T, and N as shown by the dotted line to short-circuit the CT secondary circuit all at once. There is a need. Here, as shown in FIG. 1, the connecting piece 20 has a width T 1 of the metal conductive plate 21 and a groove width T 2 of the insulating mold part.
are T 2 > T 1 , and the thickness t of the groove width T 2 is equal to the thickness of the metal conductive plate 21 , and the dimensional relationship is L 7 >L 8 , so the metal conduction plate 21 and insulation motor
The metal conductive plate surfaces 21f having a groove width T 2 of the metal conductive plate are overlapped between adjacent connection pieces, and as a result, the movable knob metal part 11a and the insulating fixing nut metal part 10a are tightened and fixed. Therefore, it is possible to continuously short-circuit the left and right current Ts. After this,
Remove the other connection piece 20 (indicated by a solid line), connect a separate power supply (not shown) to the upper current T and T, and test the panel equipment 2. In addition,
Also in FIG. 4, the dimensional relationship is L 1 =L 3 . As is clear from the above descriptions, only one type of connecting piece 20 can be used for both voltage and current purposes, and the drawbacks of the conventional devices can be solved. [Effects of the invention] As explained above, according to the invention, the connecting piece is composed of a metal conductive plate and an insulating mold part that covers it, and the opening direction is formed on the longitudinal extension of the connecting piece. Create notched arcs so that they are perpendicular to each other, and make the distance between each arc the tightening type test terminal installation dimension, and make the distance between the voltage T and T terminals the same as the distance between the current terminals. Since the connecting piece is configured so that it can be shared, there is no need to use only one type of connecting piece for the PT secondary circuit and CT secondary circuit, and it is easy to install and remove the connecting piece. It is possible to provide a connecting piece for a tightening type test terminal, which has advantages such as reducing the number of man-hours and shortening the construction period, since there is no need to pay attention to it, and can improve reliability and reduce the size of the board.
第１図は本考案による締付形試験端子用接続片
の一実施例構成図、第２図ａは前記接続片を電圧
用Ｔ，Ｔに使用した場合の取付状態図、第２図ｂ
は側面図、第３図は接続片を電圧用Ｔ，Ｔに使用
した場合に左右の電圧用Ｔ，Ｔ間の短絡が防止で
きることを示す図、第４図ａは接続片を電流用
Ｔ，Ｔに使用した場合の取付状態図、第４図ｂは
正面図、第５図は電圧用Ｔ，Ｔの使用位置を示す
図、第６図は電流用Ｔ，Ｔの使用位置を示す図、
第７図ａは第５図の電圧用Ｔ，Ｔを盤に取付けた
正面図、第７図ｂは同じく側面図、第８図ａは第
６図の電流用Ｔ，Ｔを盤に取付けた正面図、第８
図ｂは同じく側面図、第９図は従来の接続片の斜
視図、第１０図ａ，ｂは第８図の状態から手前側
の電流用Ｔ，Ｔ間を連続して短絡した状態図、第
１１図は左右の電圧用Ｔ，Ｔ間が従来の接続片で
短絡された状態図、第１２図は従来の他の接続線
斜視図である。
１……電圧用Ｔ，Ｔ、２……盤用機器、３……
盤、４……電流用Ｔ，Ｔ、５，１６……従来の接
続片、６，６′……金属導電部、７，２２……絶
縁モ−ルド部、８，８′，２１ａ，２１ｂ……切
欠き円弧、９，１３……軸ネジ、１１，１５……
可動ツマミ、１０ａ，１４ａ……絶縁固定ナツト
金属部、１１ａ，１５ａ……可動ツマミ金属部、
１７……絶縁物、１８……金属部、２０……本考
案の接続片、２１……金属導電板、２１ｃ，２１
ｄ……切欠き、２１ｅ……金属導電板端部、２１
ｆ……金属導電板表面、２２ａ……円弧、２２ｂ
……絶縁ふち、２２ｃ……絶縁モ−ルド部切欠
き、２２ｄ……絶縁モ−ルド部突端。
Fig. 1 is a configuration diagram of an embodiment of the connection piece for a clamp type test terminal according to the present invention, Fig. 2a is an installation state diagram when the connection piece is used for voltage T, T, Fig. 2b
is a side view, Figure 3 is a diagram showing that a short circuit between the left and right voltage Ts can be prevented when the connecting piece is used for the voltage T, Fig. 4b is a front view, Fig. 5 is a diagram showing the usage position of voltage T, T, Fig. 6 is a diagram showing the usage position of current T,
Figure 7a is a front view of the voltage Ts and Ts shown in Figure 5 attached to the panel, Figure 7b is a side view of the same, and Figure 8a is the current Ts and Ts of Figure 6 installed to the panel. Front view, No. 8
Figure b is a side view, Figure 9 is a perspective view of the conventional connection piece, Figures 10a and b are state diagrams in which the current T and T on the near side are continuously shorted from the state shown in Figure 8, FIG. 11 is a diagram showing a state in which the left and right voltage Ts are short-circuited by a conventional connection piece, and FIG. 12 is a perspective view of another conventional connection line. 1 ... Voltage T, T, 2... Panel equipment, 3...
Panel, 4 ... Current T, T, 5 , 16 ... Conventional connection piece, 6, 6'... Metal conductive part, 7, 22... Insulating mold part, 8, 8', 21a, 21b ... Notched arc, 9, 13 ... Shaft screw, 11, 15 ...
Movable knob, 10a, 14a...Insulating fixing nut metal part, 11a, 15a...Movable knob metal part,
17... Insulator, 18... Metal part, 20 ... Connection piece of the present invention, 21... Metal conductive plate, 21c, 21
d...Notch, 21e...Metal conductive plate end, 21
f...Metal conductive plate surface, 22a...Circular arc, 22b
...Insulation edge, 22c...Insulation mold part notch, 22d...Insulation mold part tip.
Claims (1)
行なうために、予め前記各盤に設置されている締
付形試験端子間を接続したり開放したりする接続
片において、前記接続片は金属導電板とこれの一
部分を除いた大部分を覆う絶縁モ−ルド部とによ
つて形成し、この接続片の長手方向延長上の一方
端に開口方向が長手方向に一致するよう設けた第
１の切欠き円弧と、他方端側面に第２の切欠き円
弧を設けて夫々開口方向が互に直角方向となるよ
うにし、これらの円弧間の距離を前記締付形試験
端子の取付間隔寸法に設定し、かつ前記第１、第
２の各切欠き円弧は締付形試験端子を構成する軸
ネジの半径よりも若干大きくすると共に、前記絶
縁モ−ルド範囲は、他方側面に設けた第２の切欠
き円弧の中心と同心円状に後退して設け、第２の
切欠き円弧側端部にある絶縁モ−ルド部溝幅部分
の溝幅は第１の切欠き円弧を有する金属導電板の
板幅よりも若干広くすると共に溝幅部分のモール
ド肉厚はそれに続く金属導電板の板厚と同じに
し、絶縁ふちと突端部を含めたその他の部分は第
１の切欠き円弧端から所定長残して、絶縁モ−ル
ドを段加工したことを特徴とする締付形試験端子
用接続片。 In order to test equipment installed on switchboards and control boards, the connection piece is a metal conductive plate that connects and disconnects the clamping type test terminals installed in each panel in advance. and an insulating mold part that covers most of the connection piece except for a part, and a first cut is provided at one end of the longitudinal extension of the connection piece so that the opening direction coincides with the longitudinal direction. A notched circular arc and a second notched circular arc are provided on the side surface of the other end so that the respective opening directions are perpendicular to each other, and the distance between these circular arcs is set to the mounting interval dimension of the tightening type test terminal. , and each of the first and second notched arcs is made slightly larger than the radius of the shaft screw constituting the tightening type test terminal, and the insulation mold range is formed by the second notch provided on the other side. The groove width of the groove width portion of the insulating mold part at the end of the second notch arc is set back concentrically with the center of the notch arc, and the width of the groove is equal to the width of the metal conductive plate having the first notch arc. The mold wall thickness at the groove width portion is made the same as the thickness of the metal conductive plate following it, and the other portions including the insulating edge and the tip are left a predetermined length from the first notch arc end. , a connection piece for a tightening type test terminal characterized by stepped insulation molding.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19409584U JPH048372Y2 (en) | 1984-12-21 | 1984-12-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19409584U JPH048372Y2 (en) | 1984-12-21 | 1984-12-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61108974U JPS61108974U (en) | 1986-07-10 |
| JPH048372Y2 true JPH048372Y2 (en) | 1992-03-03 |
Family
ID=30751531
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19409584U Expired JPH048372Y2 (en) | 1984-12-21 | 1984-12-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH048372Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4749208B2 (en) * | 2006-04-12 | 2011-08-17 | 中国電力株式会社 | Electrical connection instrument for testing, detachable cover body and electrical test method used for equipment maintenance |
-
1984
- 1984-12-21 JP JP19409584U patent/JPH048372Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61108974U (en) | 1986-07-10 |
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