JPH0479138A - Exb-type energy filter - Google Patents

Exb-type energy filter

Info

Publication number
JPH0479138A
JPH0479138A JP2191927A JP19192790A JPH0479138A JP H0479138 A JPH0479138 A JP H0479138A JP 2191927 A JP2191927 A JP 2191927A JP 19192790 A JP19192790 A JP 19192790A JP H0479138 A JPH0479138 A JP H0479138A
Authority
JP
Japan
Prior art keywords
voltage
energy filter
electric field
magnetic poles
type energy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2191927A
Other languages
Japanese (ja)
Other versions
JP2856518B2 (en
Inventor
Katsushige Tsuno
勝重 津野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP2191927A priority Critical patent/JP2856518B2/en
Publication of JPH0479138A publication Critical patent/JPH0479138A/en
Application granted granted Critical
Publication of JP2856518B2 publication Critical patent/JP2856518B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To satisfy imaging codition without astigmatism constantly for an unkown effective filter length by installing a means to apply either positive or negative optional voltage between magnetic poles. CONSTITUTION:Magnetic poles l, 1' which are tilted are connected with a yoke 3 through an electrical insulator 4 and the magnetic poles and the yoke are connected magnetically, and voltage -V2 from an electric power source is applied between the magnetic poles 1, 1'. Working voltage +V1, -V1 from an electric power source 7 is applied between electrodes 2, 2', and if the voltage -V1 applied to said electrode 2' satisfies -V1>-V2, quadrupole components of an electric field are generated and a1 term to obtain images without astigmatism in a Wien filter is obtained. The value of the a1 term is able to be altered from outside by adjusting the voltage to applied to the magnetic poles 1, 1'. The conditions for imaging without astigmatism for an unkown effective filter length are thus satisfied.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、電場と磁場が互いに直交して形成されている
重畳場を有するE×B型エネルギーフィルタに関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an E×B type energy filter having a superimposed field in which an electric field and a magnetic field are formed orthogonally to each other.

[従来の技術] 従来、電場と磁場を直交させ、この重畳場に直交する方
向に荷電粒子を直進させることによってエネルギー分析
を行なうE×B型エネルギーフィルタ(以下、単にエネ
ルギーフィルタと称す)か知られている。このようなエ
ネルギーフィルタの構造については種々提案されている
が、電子顕微鏡等の光軸中に接続または挿入して使用さ
れるエネルギーフィルタについて第4図(a)〜(C)
に基づいて説明する。
[Prior Art] Conventionally, an E×B type energy filter (hereinafter simply referred to as an energy filter) is known, which performs energy analysis by orthogonalizing an electric field and a magnetic field and causing charged particles to travel straight in a direction perpendicular to this superimposed field. It is being Various structures have been proposed for such energy filters, but the energy filters used by connecting or inserting them into the optical axis of an electron microscope, etc. are shown in Figures 4 (a) to (C).
The explanation will be based on.

第4図(a)に示すエネルギーフィルタは電子線光軸に
対して互いに直交する電場と磁場が与えられており、電
場による電子線の偏向作用を磁場による偏向作用で打ち
消すことによって、入射した電子線の内の特定のエネル
ギーを持った電子のみが直進されるよう構成されている
。ここで、二つの磁極片1,1゛の間の磁極片間距離と
二つの電極2.2′の間の電極間距離とは路間−か、望
ましくは等しく配置されている。なお、Zはエネルギー
フィルタの光軸であり、電子顕微鏡の光軸と一致してい
る。
The energy filter shown in Fig. 4(a) is provided with an electric field and a magnetic field that are orthogonal to each other with respect to the optical axis of the electron beam, and by canceling the deflection effect of the electron beam due to the electric field with the deflection effect due to the magnetic field, the energy filter It is constructed so that only electrons with a specific energy within the line travel straight. Here, the inter-pole distance between the two magnetic pole pieces 1, 1' and the inter-electrode distance between the two electrodes 2, 2' are preferably equal to or equal to each other. Note that Z is the optical axis of the energy filter, which coincides with the optical axis of the electron microscope.

第4図(a)に示すような構成によれば、エネルギーフ
ィルタの内部では勿論のこと、フリンジ場、即ちエネル
ギーフィルタにおける電子線の入射部および出射部にお
いてもウィーン条件を満足できる。つまり、エネルギー
フィルタにおいては荷電粒子を直進させる必要があり、
電場をE1磁場をB、荷電粒子の速度をVとしたとき、
Emv・Bというウィーン条件を満足しなければならな
い。但し、ESB、Vはいずれもベクトルである。
According to the configuration shown in FIG. 4(a), the Wien condition can be satisfied not only inside the energy filter but also in the fringe field, that is, the electron beam entrance and exit portions of the energy filter. In other words, in an energy filter, charged particles must travel straight,
When the electric field is E1, the magnetic field is B, and the velocity of the charged particle is V,
The Vienna condition of Emv.B must be satisfied. However, both ESB and V are vectors.

しかし、前記電場および磁場に−様な電場と磁場を用い
た場合に、第5図(a)に示すように電子線が電場方向
には収束されるか、磁場方向には収束作用を持たすに発
散するため、エネルギーフィルタに円形のビームを入射
した場合でも、円弧状のビームか出射される。この欠点
を補うために、第4図(b)に示すような傾斜磁場型の
フィルタや同図(c)に示すような弧状電極型フィルタ
などが提案されている。これらのフィルタでは、電場E
x、磁場BY、を次のような式 Ex−Eo (1+a、x+a2 x2+・)  式■
B 3/ −B o  (1+b + ’/ + b 
2 y2+ −)  式■で表したとき、b1項または
81項が夫々付加され、この成分によってX方向への収
束作用が遅らされると共に、X方向への収束作用が発生
し、適切な81項またはb1項または両頂の組み合わせ
により、第5図(b)に示すようなx、X方向の軌道を
一致させた非点のない像が得られることが知られている
。なお、この非点なし結像を与える81項またはb1項
の値は、フィルタ長しによって決定される。
However, when using electric and magnetic fields that are similar to the above, the electron beam is either focused in the direction of the electric field or has no focusing effect in the direction of the magnetic field, as shown in Figure 5(a). Because of the divergence, even if a circular beam is incident on the energy filter, an arc-shaped beam will be emitted. In order to compensate for this drawback, a gradient magnetic field type filter as shown in FIG. 4(b) and an arc electrode type filter as shown in FIG. 4(c) have been proposed. In these filters, the electric field E
x, magnetic field BY, using the following formula Ex-Eo (1+a, x+a2 x2+・) Formula ■
B 3/ -B o (1+b + '/ + b
2 y2+ -) When expressed by formula (■), the b1 term or the 81 term is added, and this component delays the convergence effect in the X direction, and also causes the convergence effect in the It is known that by using the term or the b1 term or a combination of both vertices, an image without astigmatism with matching trajectories in the x and X directions as shown in FIG. 5(b) can be obtained. Note that the value of the 81 term or the b1 term that provides this astigmatic imaging is determined by the filter length.

[発明が解決しようとする課H さて、第4図(b)に示したようなエネルギーフィルタ
の作る電場および磁場の分布をZ軸方向について調べる
と、第6図に示すように磁場は磁極間隙か大きい磁極縁
端部でゆっくりと変化するのに対して、電極間隙は狭い
ために、電場は急俊な変化を示す。
[Problem to be solved by the invention H Now, if we examine the distribution of the electric field and magnetic field created by the energy filter shown in Figure 4(b) in the Z-axis direction, we will see that the magnetic field is distributed between the magnetic poles as shown in Figure 6. The electric field changes slowly at the large pole edges, whereas the electric field changes quickly because the electrode gap is narrow.

このように、磁極間隙と電極間隙とで異なる場合には縁
端部での磁場の減衰の仕方か異なり、フィルタ中心部分
のみでしかウィーン条件が満足されず、入射した電子線
は縁端部において大きく偏向されてしまい、フィルタ内
では光軸から離れた部分を勝手な方向に進行することに
なる。そのため、計算で予測したような軌道結果が得ら
れないことか問題とされている。
In this way, when the magnetic pole gap and the electrode gap are different, the way the magnetic field is attenuated at the edges is different, and the Wien condition is satisfied only at the center of the filter, so that the incident electron beam is attenuated at the edges. The beam will be greatly deflected, and will proceed in an arbitrary direction within the filter in a portion away from the optical axis. Therefore, it is considered a problem that the orbit results cannot be obtained as predicted by calculation.

前述したようにウィーンフィルタにおいて非点なし結像
を実現するための、81項またはb1項の設定はフィル
タ長しによって決定されるが、該値は実際には縁端部の
およぶ範囲にも関係するもので、明確には求めることは
難しい。また、有効フィルタ長は物面Pと像面Iのフィ
ルタとの位置関係によっても異なり、実際のフィルタ長
しの機械的な長さとは異なる。そのため、非点なし結像
条件を実現するエネルギーフィルタは、シミュレーショ
ンで求められた電極および磁極形状を基にして、実験的
に磁極片の傾斜を変える等して最も非点の少なくなる磁
極片を選定する方法によって実現されていた。
As mentioned above, the setting of the 81 term or the b1 term to achieve astigmatic imaging in the Wien filter is determined by the filter length, but this value is actually related to the range of the edge. However, it is difficult to determine clearly. Further, the effective filter length varies depending on the positional relationship between the filter on the object plane P and the image plane I, and differs from the mechanical length of the actual filter length. Therefore, the energy filter that realizes the astigmatism-free imaging condition is based on the electrode and magnetic pole shapes obtained through simulation, and experimentally changes the inclination of the magnetic pole pieces to find the magnetic pole pieces that have the least astigmatism. This was achieved through a selection method.

本発明は、上述した問題点を考慮し、不明な有効フィル
タ長に対しても常に非点なし結像条件を満足させること
ができる機能を備えたE×B型エ主エネルギ−フィルタ
供することを目的としている。
In consideration of the above-mentioned problems, the present invention provides an E×B type main energy filter that has a function that can always satisfy the astigmatism-free imaging condition even for an unknown effective filter length. The purpose is

[課題を解決するための手段] 第1の本発明は、電場と磁場か互いに直交して形成され
てなるE×B型エネルギーフィルタにおいて、磁極片間
に正または負の任意の電圧を印加する手段を設けたこと
を特徴としている。
[Means for Solving the Problems] The first invention is an E×B type energy filter in which an electric field and a magnetic field are formed orthogonally to each other, and an arbitrary positive or negative voltage is applied between the magnetic pole pieces. It is characterized by the provision of means.

第2の本発明は、電場と磁場か互いに直交して形成され
てなるE×B型エ主エネルギ−フィルタいて、前記磁極
片対を基準電位に保つと共に、前記電極に印加される電
圧を前記基準電圧に対して独立して変化させるための電
源を設けたことを特徴としている。
A second aspect of the present invention is an E×B main energy filter in which an electric field and a magnetic field are formed orthogonally to each other, and the magnetic pole piece pair is maintained at a reference potential, and the voltage applied to the electrode is It is characterized by the provision of a power supply for independently changing the reference voltage.

[実施例] 以下、本発明の実施例を図面に基づいて説明する。第1
図は第1の本発明の一実施例を説明するための構成図、
第2図は第2の本発明の一実施例を説明するための図、
3図(a)(b)は本発明によるE×B型エネルギーフ
ィルタの電場分布を説明するための図である。
[Example] Hereinafter, an example of the present invention will be described based on the drawings. 1st
The figure is a configuration diagram for explaining an embodiment of the first invention,
FIG. 2 is a diagram for explaining an embodiment of the second invention,
3(a) and 3(b) are diagrams for explaining the electric field distribution of the ExB type energy filter according to the present invention.

まず、第1図に基づいて第1の本発明について説明する
。第1図において、1.1−は磁極片、2.2′は電極
、3はヨーク、4,5は電気絶縁物、6は励磁コイル、
7は電場電源、8は磁極片間用電源である。
First, the first invention will be explained based on FIG. In Figure 1, 1.1- is a magnetic pole piece, 2.2' is an electrode, 3 is a yoke, 4 and 5 are electrical insulators, 6 is an excitation coil,
7 is an electric field power supply, and 8 is a power supply between magnetic pole pieces.

傾斜された磁極片1.1−はヨーク3に電気絶縁物4を
介して接続されており、該磁極片とヨークとは磁気的に
は接続されている。そして、該磁極片1,1−には電源
8から電圧−■2が印加されている。ここで、電極2,
2′間には電源7から作動電圧+V、、−V、が印加さ
れており、前記電極2′への印加電圧−■1が−V、>
−V2なる関係にあれば、第3図(a)に示すような電
場の4極子酸分が発生し、前記0式に示されるa、項が
得られる。この磁極片1,1′に印加される電圧を調整
することにより、81項の値を外部より変化させること
ができるため、不明確な有効フィルタ長に対して常に非
点なし結合条件を満足させることかできる。
The tilted pole piece 1.1- is connected to the yoke 3 via an electrical insulator 4, and the pole piece and the yoke are magnetically connected. A voltage -2 is applied from a power source 8 to the magnetic pole pieces 1, 1-. Here, electrode 2,
Operating voltages +V, -V, are applied from the power source 7 between electrodes 2', and the voltage -1 applied to the electrodes 2' is -V, >
-V2, a quadrupolar acid component of the electric field as shown in FIG. 3(a) is generated, and the term a shown in the above equation 0 is obtained. By adjusting the voltage applied to these magnetic pole pieces 1 and 1', the value of term 81 can be changed externally, so that the astigmatic coupling condition is always satisfied for an uncertain effective filter length. I can do it.

次に、第2図に基づいて、第2の本発明について説明す
る。第2図において、1,1′は磁極片、2.2−は電
極、7a、7bは電場電源である。
Next, the second invention will be explained based on FIG. In FIG. 2, 1 and 1' are magnetic pole pieces, 2 and 2- are electrodes, and 7a and 7b are electric field power supplies.

磁極片対1,1′は共に接地され、基準電位V。に保た
れている。そして、電極2.2′には磁極片1.1′の
電位に対して独立して変化される電源7a、7bから個
々に正および負の電圧子■1、−Vlか印加されている
。このように、電極2および電極2′に印加する電圧を
磁極片1.1′に与えられる電位に対して独立して調整
できるように印加することにより、第3図(b)に示す
ような電場の4極子酸分が発生し、前記0式に示される
81項が得られる。この電極2,2′に印加される電圧
を個々に調整することにより、81項の値を外部より変
化させることができるため、不明確な有効フィルタ長に
対して常に非点なし結合条件を満足させることかできる
The pair of magnetic pole pieces 1, 1' are both grounded and at a reference potential V. is maintained. Positive and negative voltage elements 1 and -Vl are respectively applied to the electrodes 2.2' from power sources 7a and 7b which are changed independently with respect to the potential of the magnetic pole piece 1.1'. In this way, by applying the voltages applied to the electrodes 2 and 2' so that they can be adjusted independently of the potential applied to the pole piece 1.1', a voltage as shown in FIG. 3(b) can be obtained. A quadrupolar acid component of the electric field is generated, and the 81 term shown in the above equation 0 is obtained. By adjusting the voltages applied to electrodes 2 and 2' individually, the value of term 81 can be changed externally, so the astigmatism-free coupling condition is always satisfied for uncertain effective filter lengths. I can do it.

[発明の効果コ 以上の説明から明らかなように、第1の本発明によれば
、電場と磁場が互いに直交して形成されてなるE×B型
エネルギーフィルタにおいて、磁極片間に正または負の
任意の電圧を印加する手段を設けたことにより、a□項
の値を外部より変化させることができるようになり、不
明確な有効フィルタ長に対して常に非点なし結像条件を
満足させることができる。
[Effects of the Invention] As is clear from the above description, according to the first invention, in the E×B type energy filter in which the electric field and the magnetic field are formed orthogonally to each other, there is a positive or negative polarity between the magnetic pole pieces. By providing a means for applying an arbitrary voltage, it is now possible to change the value of the a□ term from the outside, and the astigmatism-free imaging condition is always satisfied for an uncertain effective filter length. be able to.

まンコ、第2の本発明によれば、電場と磁場が互いに直
交して形成されてなるE×B型エネルギーフィルタにお
いて、前記磁極片対を基準電位に保つと共に、前記電極
に印加される電圧を前記基準電圧に対して独立して変化
させるための電源を設けたことにより、81項の値を外
部より変化させることができるようになり、不明確な有
効フィルタ長に対して常に非点なし結像条件を満足させ
ることができる。
According to the second aspect of the present invention, in an E×B type energy filter in which an electric field and a magnetic field are formed orthogonally to each other, the pair of magnetic pole pieces is maintained at a reference potential, and the voltage applied to the electrodes is By providing a power supply to vary the value independently from the reference voltage, it is now possible to change the value of item 81 from the outside, and there is no stigma at all times for uncertain effective filter lengths. Imaging conditions can be satisfied.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は第1の本発明によるE×B型エネルギーフィル
タの一実施例を説明するための構成図。 第2図は第2の本発明によるE×B型エネルギーフィル
タの一実施例を説明するための構成図、第3図(a)(
b)は本発明によるE×B型エネルギーフィルタの電場
分布を説明するための図、第4図(a)乃至(C)は従
来のE×B型エネルギーフィルタを説明するための図、
第5図は(a)(b)エネルギーフィルタ内での電子の
軌道を示す図、第6図はエネルギーフィルタの縁端基に
おける電場分布および磁場分布を説明するための図であ
る。 1.1 二磁極片 2.2−:電極 ヨーク 電気絶縁物 励磁コイル 電場電源 磁極片間用電源
FIG. 1 is a configuration diagram for explaining an embodiment of an E×B type energy filter according to the first invention. FIG. 2 is a configuration diagram for explaining an embodiment of the E×B type energy filter according to the second invention, and FIG. 3(a) (
b) is a diagram for explaining the electric field distribution of the E×B type energy filter according to the present invention, FIGS. 4(a) to (C) are diagrams for explaining the conventional E×B type energy filter,
5A and 5B are diagrams showing electron trajectories within the energy filter, and FIG. 6 is a diagram illustrating the electric field distribution and magnetic field distribution at the edge groups of the energy filter. 1.1 Two magnetic pole pieces 2.2-: Electrode yoke Electric insulator Excitation coil Electric field power supply Power supply between the magnetic pole pieces

Claims (2)

【特許請求の範囲】[Claims] (1)電場と磁場が互いに直交して形成されてなるE×
B型エネルギーフィルタにおいて、磁極片間に正または
負の任意の電圧を印加する手段を設けたことを特徴とす
るE×B型エネルギーフィルタ。
(1) E× where the electric field and magnetic field are formed orthogonally to each other
An E×B type energy filter characterized in that the B type energy filter is provided with means for applying a positive or negative arbitrary voltage between the magnetic pole pieces.
(2)電場と磁場が互いに直交して形成されてなるE×
B型エネルギーフィルタにおいて、前記磁極片対を基準
電位に保つと共に、前記電極に印加される電圧を前記基
準電圧に対して独立して変化させるための電源を設けた
ことを特徴とするE×B型エネルギーフィルタ。
(2) E× where the electric field and magnetic field are formed orthogonally to each other
The B-type energy filter is characterized in that a power source is provided for maintaining the pair of magnetic pole pieces at a reference potential and for varying the voltage applied to the electrodes independently of the reference voltage. type energy filter.
JP2191927A 1990-07-20 1990-07-20 Ex-B type energy filter Expired - Fee Related JP2856518B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2191927A JP2856518B2 (en) 1990-07-20 1990-07-20 Ex-B type energy filter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2191927A JP2856518B2 (en) 1990-07-20 1990-07-20 Ex-B type energy filter

Publications (2)

Publication Number Publication Date
JPH0479138A true JPH0479138A (en) 1992-03-12
JP2856518B2 JP2856518B2 (en) 1999-02-10

Family

ID=16282759

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2191927A Expired - Fee Related JP2856518B2 (en) 1990-07-20 1990-07-20 Ex-B type energy filter

Country Status (1)

Country Link
JP (1) JP2856518B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008293977A (en) * 2007-05-24 2008-12-04 Ceos Corrected Electron Optical Systems Gmbh Monochromator and radiation source equipped with monochromator
WO2022091475A1 (en) * 2020-10-28 2022-05-05 株式会社ニューフレアテクノロジー Wien filter and multi-electron beam inspection device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008293977A (en) * 2007-05-24 2008-12-04 Ceos Corrected Electron Optical Systems Gmbh Monochromator and radiation source equipped with monochromator
WO2022091475A1 (en) * 2020-10-28 2022-05-05 株式会社ニューフレアテクノロジー Wien filter and multi-electron beam inspection device
JPWO2022091475A1 (en) * 2020-10-28 2022-05-05

Also Published As

Publication number Publication date
JP2856518B2 (en) 1999-02-10

Similar Documents

Publication Publication Date Title
US6191423B1 (en) Correction device for correcting the spherical aberration in particle-optical apparatus
EP1045425B1 (en) Charged particle beam column with chromatic aberration compensation
JP3207196B2 (en) Correction device for high resolution charged particle beam equipment
US4661712A (en) Apparatus for scanning a high current ion beam with a constant angle of incidence
CA1187543A (en) Multiple sextupole system for the correction of third and higher order aberration
JP4286913B2 (en) Correction device for correcting chromatic aberration in particle optical equipment
JP2001222969A (en) Converged ion beam column including energy filter
KR20060060531A (en) Beam deflecting method, beam deflector for scanning, ion implantation method, and ion implantation system
JPS62168324A (en) Detector of secondary or backward scattered electrons in electronic apparatus
US8785880B2 (en) Chromatic aberration corrector and electron microscope
EP0039688B1 (en) Sextupole system for the correction of spherical aberration
JP4242101B2 (en) Vienna filter
JP2001522514A (en) Microdevices for generating multipole fields, especially for separating, deflecting or focusing charged particles
JPS62108438A (en) High current mass spectrometer employing space charge lens
US7473905B2 (en) Electrostatic deflector
JPH0479138A (en) Exb-type energy filter
TWI819505B (en) Method of influencing a charged particle beam, multipole device, and charged particle beam apparatus
JPH03165444A (en) Electrostatic multipole lens for charged particle beams
JPH08212970A (en) Device for removal of ions form electron beam
JP2008135336A (en) Wien filter
JP2956706B2 (en) Mass spectrometer
JPH01115040A (en) Focusing deflection device of charged particle beam
RU2063108C1 (en) Multiple-pole magnetic lens
JPH0479139A (en) Exb-type energy filter
JPH05275057A (en) Wien filter

Legal Events

Date Code Title Description
FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081127

Year of fee payment: 10

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091127

Year of fee payment: 11

LAPS Cancellation because of no payment of annual fees