JPH047378U - - Google Patents
Info
- Publication number
- JPH047378U JPH047378U JP4776990U JP4776990U JPH047378U JP H047378 U JPH047378 U JP H047378U JP 4776990 U JP4776990 U JP 4776990U JP 4776990 U JP4776990 U JP 4776990U JP H047378 U JPH047378 U JP H047378U
- Authority
- JP
- Japan
- Prior art keywords
- board
- testing device
- led
- board testing
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 8
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Description
第１図は、この考案の一実施例による基板試験
装置を示す構成図、第２図は、この考案の一実施
例による外観図、第３図はこの考案の一実施例に
よる被試験物１を固定した状態時の断面図、第４
図は、この考案の一実施例による動作を示すフロ
ーチヤート、第５図は、従来の基板試験装置を示
す外観図、第６図は、従来の被試験物１を固定し
た状態時の断面図である。
図において、１……被試験物、２……パーソナ
ルコンピユータ、３……信号測定器、４……デイ
スプレイ、７……７セグメントＬＥＤ、１１……
コンタクトピン、１３……中央処理装置、１４…
…メモリ、１５……ＣＲＴインターフエース、１
６……パラレルインターフエース、１７……バス
インターフエース。なお、図中、同一符号は同一
、又は相当部分を示す。
Fig. 1 is a configuration diagram showing a board testing device according to an embodiment of this invention, Fig. 2 is an external view of an embodiment of this invention, and Fig. 3 is a test object 1 according to an embodiment of this invention. Sectional view when fixed, No. 4
The figure is a flowchart showing the operation of an embodiment of the invention, FIG. 5 is an external view of a conventional board testing device, and FIG. 6 is a cross-sectional view of the conventional test object 1 in a fixed state. It is. In the figure, 1...Device under test, 2...Personal computer, 3...Signal measuring device, 4...Display, 7...7 segment LED, 11...
Contact pin, 13...Central processing unit, 14...
...Memory, 15...CRT interface, 1
6...parallel interface, 17...bus interface. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.
Claims (1)
、ＬＥＤの端子間の降下電圧を測定するとともに
測定電圧値を判定する手段を設けたことを特徴と
する基板試験装置。 A board testing device for testing a board on which an LED is mounted, characterized in that the board testing device is provided with means for measuring a voltage drop between terminals of the LED and determining a measured voltage value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4776990U JPH047378U (en) | 1990-05-08 | 1990-05-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4776990U JPH047378U (en) | 1990-05-08 | 1990-05-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH047378U true JPH047378U (en) | 1992-01-23 |
Family
ID=31563991
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4776990U Pending JPH047378U (en) | 1990-05-08 | 1990-05-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH047378U (en) |
-
1990
- 1990-05-08 JP JP4776990U patent/JPH047378U/ja active Pending
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