JPH0471159U - - Google Patents
Info
- Publication number
- JPH0471159U JPH0471159U JP11466190U JP11466190U JPH0471159U JP H0471159 U JPH0471159 U JP H0471159U JP 11466190 U JP11466190 U JP 11466190U JP 11466190 U JP11466190 U JP 11466190U JP H0471159 U JPH0471159 U JP H0471159U
- Authority
- JP
- Japan
- Prior art keywords
- high frequency
- inspected
- output
- power supply
- electrical signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 3
- 230000006698 induction Effects 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 3
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 230000007547 defect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11466190U JPH0471159U (OSRAM) | 1990-10-31 | 1990-10-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11466190U JPH0471159U (OSRAM) | 1990-10-31 | 1990-10-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0471159U true JPH0471159U (OSRAM) | 1992-06-24 |
Family
ID=31862367
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11466190U Pending JPH0471159U (OSRAM) | 1990-10-31 | 1990-10-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0471159U (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017507487A (ja) * | 2014-02-06 | 2017-03-16 | シーメンス アクチエンゲゼルシヤフトSiemens Aktiengesellschaft | インダクタ |
-
1990
- 1990-10-31 JP JP11466190U patent/JPH0471159U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017507487A (ja) * | 2014-02-06 | 2017-03-16 | シーメンス アクチエンゲゼルシヤフトSiemens Aktiengesellschaft | インダクタ |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TR199900074T2 (xx) | Elektrik alanı ve voltaj kapasitif algılaması için yöntem, cihaz ve algılayıcı ve bunların kullanımı. | |
| JPH0471159U (OSRAM) | ||
| JPH0353155A (ja) | 鋼材の内部欠陥又は損傷検出装置 | |
| JPS6372502U (OSRAM) | ||
| JPH0397656U (OSRAM) | ||
| EP0135204A3 (en) | Measuring device for surface and subsurface defects in metal bodies above the curie temperature | |
| JPS57144456A (en) | Non-destructive inspecting device | |
| JPS62128362U (OSRAM) | ||
| SU669284A1 (ru) | Вихретоковый дефектоскоп | |
| JPH0450510Y2 (OSRAM) | ||
| JPS5739344A (en) | Eddy current flaw detector | |
| JPS56150348A (en) | Nondestructive inspecting device using magnetic anisotropic sensor | |
| JPS5724804A (en) | Detector for crack depth | |
| JPH0380352U (OSRAM) | ||
| JPH0374306U (OSRAM) | ||
| JPH0469737U (OSRAM) | ||
| JPH0339142U (OSRAM) | ||
| SU1670571A1 (ru) | Преобразователь магнитного пол с тепловозбуждением | |
| JPS6442427U (OSRAM) | ||
| JPH03117757U (OSRAM) | ||
| JPS63148863U (OSRAM) | ||
| JPH0210740U (OSRAM) | ||
| JPS6276622U (OSRAM) | ||
| JPH0247556U (OSRAM) | ||
| Sadeghi et al. | Non-Destructive Testing for Cracks in Metals |