JPH0467337U - - Google Patents

Info

Publication number
JPH0467337U
JPH0467337U JP11001690U JP11001690U JPH0467337U JP H0467337 U JPH0467337 U JP H0467337U JP 11001690 U JP11001690 U JP 11001690U JP 11001690 U JP11001690 U JP 11001690U JP H0467337 U JPH0467337 U JP H0467337U
Authority
JP
Japan
Prior art keywords
insulator
semiconductor wafer
under test
probe card
wafer under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11001690U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11001690U priority Critical patent/JPH0467337U/ja
Publication of JPH0467337U publication Critical patent/JPH0467337U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP11001690U 1990-10-19 1990-10-19 Pending JPH0467337U (US06272168-20010807-M00014.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11001690U JPH0467337U (US06272168-20010807-M00014.png) 1990-10-19 1990-10-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11001690U JPH0467337U (US06272168-20010807-M00014.png) 1990-10-19 1990-10-19

Publications (1)

Publication Number Publication Date
JPH0467337U true JPH0467337U (US06272168-20010807-M00014.png) 1992-06-15

Family

ID=31857294

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11001690U Pending JPH0467337U (US06272168-20010807-M00014.png) 1990-10-19 1990-10-19

Country Status (1)

Country Link
JP (1) JPH0467337U (US06272168-20010807-M00014.png)

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