JPH0463137U - - Google Patents
Info
- Publication number
- JPH0463137U JPH0463137U JP10460290U JP10460290U JPH0463137U JP H0463137 U JPH0463137 U JP H0463137U JP 10460290 U JP10460290 U JP 10460290U JP 10460290 U JP10460290 U JP 10460290U JP H0463137 U JPH0463137 U JP H0463137U
- Authority
- JP
- Japan
- Prior art keywords
- section
- image recognition
- data
- image
- nonvolatile storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10460290U JPH0463137U (fr) | 1990-10-04 | 1990-10-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10460290U JPH0463137U (fr) | 1990-10-04 | 1990-10-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0463137U true JPH0463137U (fr) | 1992-05-29 |
Family
ID=31849947
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10460290U Pending JPH0463137U (fr) | 1990-10-04 | 1990-10-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0463137U (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001236493A (ja) * | 2000-02-23 | 2001-08-31 | Nikon Corp | 外観検査装置 |
-
1990
- 1990-10-04 JP JP10460290U patent/JPH0463137U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001236493A (ja) * | 2000-02-23 | 2001-08-31 | Nikon Corp | 外観検査装置 |