JPH0457776U - - Google Patents
Info
- Publication number
- JPH0457776U JPH0457776U JP9998090U JP9998090U JPH0457776U JP H0457776 U JPH0457776 U JP H0457776U JP 9998090 U JP9998090 U JP 9998090U JP 9998090 U JP9998090 U JP 9998090U JP H0457776 U JPH0457776 U JP H0457776U
- Authority
- JP
- Japan
- Prior art keywords
- board
- integrated circuit
- semiconductor integrated
- socket
- detection sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9998090U JPH0457776U (fr) | 1990-09-25 | 1990-09-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9998090U JPH0457776U (fr) | 1990-09-25 | 1990-09-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0457776U true JPH0457776U (fr) | 1992-05-18 |
Family
ID=31842288
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9998090U Pending JPH0457776U (fr) | 1990-09-25 | 1990-09-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0457776U (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007225496A (ja) * | 2006-02-24 | 2007-09-06 | Espec Corp | 環境試験装置 |
-
1990
- 1990-09-25 JP JP9998090U patent/JPH0457776U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007225496A (ja) * | 2006-02-24 | 2007-09-06 | Espec Corp | 環境試験装置 |
| JP4554535B2 (ja) * | 2006-02-24 | 2010-09-29 | エスペック株式会社 | 環境試験装置 |