JPH045643U - - Google Patents
Info
- Publication number
- JPH045643U JPH045643U JP4550090U JP4550090U JPH045643U JP H045643 U JPH045643 U JP H045643U JP 4550090 U JP4550090 U JP 4550090U JP 4550090 U JP4550090 U JP 4550090U JP H045643 U JPH045643 U JP H045643U
- Authority
- JP
- Japan
- Prior art keywords
- lead
- probe card
- probe
- groove
- probes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 12
- 238000005452 bending Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は本考案の一実施例の要部の平面図、第
２図は第１図の側面図、第３図ａおよびｂはプロ
ーブ先端部の正面図および底面図、第４図は本考
案のプローブによるリードとの接触状態を示す拡
大正面図、第５図は本考案の他の実施例を示す第
４図と同様の図、第６図は従来のプローブカード
の一部の平面図、第７図は第６図の側面図、第８
図は従来のプローブカードの問題点を説明するた
めの拡大正面図である。
１……ＴＡＢ製品、２……絶縁テープ、３……
リード、１０……プローブカード、１１……カー
ド部、１２……プローブ、１３……先端部、１４
……屈曲部、１５……曲げ部、１６……先端面、
１７……溝、１８……円弧状面、２１……カード
部、２２……プローブ、２３……先端部。
FIG. 1 is a plan view of the main parts of an embodiment of the present invention, FIG. 2 is a side view of FIG. 1, FIGS. 3 a and b are front and bottom views of the probe tip, and FIG. FIG. 5 is a view similar to FIG. 4 showing another embodiment of the invention; FIG. 6 is a plan view of a portion of a conventional probe card; FIG. , Figure 7 is a side view of Figure 6, and Figure 8 is a side view of Figure 6.
The figure is an enlarged front view for explaining the problems of the conventional probe card. 1... TAB product, 2... Insulating tape, 3...
Lead, 10...Probe card, 11...Card part, 12...Probe, 13...Tip part, 14
...Bending portion, 15...Bending portion, 16...Tip surface,
17... Groove, 18... Arc-shaped surface, 21... Card portion, 22... Probe, 23... Tip portion.
Claims (1)
複数本のプローブを備えたプローブカードにおい
て、前記プローブの先端部およびその近傍を前記
リードと平行になるように曲げ形成するとともに
、前記リードに直接接触されるプローブ先端面に
該リードを内抱可能な幅寸法の凹部を形成したこ
とを特徴とするプローブカード。 ２ リードの最大幅よりも大きな幅の溝で凹部を
形成し、かつこの溝をリードと平行な方向に形成
してなる実用新案登録請求の範囲第１項記載のプ
ローブカード。[Claims for Utility Model Registration] 1. In a probe card equipped with a plurality of probes that come into contact with leads formed on an insulating tape, the tips of the probes and their vicinity are bent so as to be parallel to the leads. In addition, a probe card characterized in that a recess with a width dimension capable of containing the lead is formed on the tip end surface of the probe that is in direct contact with the lead. 2. The probe card according to claim 1, wherein the recess is formed by a groove having a width larger than the maximum width of the lead, and the groove is formed in a direction parallel to the lead.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4550090U JPH045643U (en) | 1990-04-28 | 1990-04-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4550090U JPH045643U (en) | 1990-04-28 | 1990-04-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH045643U true JPH045643U (en) | 1992-01-20 |
Family
ID=31559734
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4550090U Pending JPH045643U (en) | 1990-04-28 | 1990-04-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH045643U (en) |
-
1990
- 1990-04-28 JP JP4550090U patent/JPH045643U/ja active Pending
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