JPH0453548U - - Google Patents
Info
- Publication number
- JPH0453548U JPH0453548U JP9514990U JP9514990U JPH0453548U JP H0453548 U JPH0453548 U JP H0453548U JP 9514990 U JP9514990 U JP 9514990U JP 9514990 U JP9514990 U JP 9514990U JP H0453548 U JPH0453548 U JP H0453548U
- Authority
- JP
- Japan
- Prior art keywords
- ray
- crystal
- rowland circle
- radius
- curvature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 claims description 5
- 238000002441 X-ray diffraction Methods 0.000 claims 2
- 230000003595 spectral effect Effects 0.000 claims 1
- 238000000441 X-ray spectroscopy Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9514990U JPH0453548U (en, 2012) | 1990-09-10 | 1990-09-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9514990U JPH0453548U (en, 2012) | 1990-09-10 | 1990-09-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0453548U true JPH0453548U (en, 2012) | 1992-05-07 |
Family
ID=31833650
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9514990U Pending JPH0453548U (en, 2012) | 1990-09-10 | 1990-09-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0453548U (en, 2012) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011122020A1 (ja) * | 2010-03-31 | 2011-10-06 | 独立行政法人物質・材料研究機構 | Ｘ線照射装置および分析装置 |
-
1990
- 1990-09-10 JP JP9514990U patent/JPH0453548U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011122020A1 (ja) * | 2010-03-31 | 2011-10-06 | 独立行政法人物質・材料研究機構 | Ｘ線照射装置および分析装置 |
| JP5550082B2 (ja) * | 2010-03-31 | 2014-07-16 | 独立行政法人物質・材料研究機構 | Ｘ線照射装置および分析装置 |
| US9080947B2 (en) | 2010-03-31 | 2015-07-14 | National Institute For Materials Science | X-ray irradiation device and analysis device |