JPH0442033A - Reexamination of brake tester - Google Patents

Reexamination of brake tester

Info

Publication number
JPH0442033A
JPH0442033A JP2148632A JP14863290A JPH0442033A JP H0442033 A JPH0442033 A JP H0442033A JP 2148632 A JP2148632 A JP 2148632A JP 14863290 A JP14863290 A JP 14863290A JP H0442033 A JPH0442033 A JP H0442033A
Authority
JP
Japan
Prior art keywords
item
brake
items
braking force
reexamination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2148632A
Other languages
Japanese (ja)
Inventor
Koji Tomita
幸治 富田
Hiromitsu Takanaka
高中 弘光
Toshinori Takizawa
滝沢 敏徳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Motor Corp
Anzen Motor Car Co Ltd
Original Assignee
Toyota Motor Corp
Anzen Motor Car Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Motor Corp, Anzen Motor Car Co Ltd filed Critical Toyota Motor Corp
Priority to JP2148632A priority Critical patent/JPH0442033A/en
Publication of JPH0442033A publication Critical patent/JPH0442033A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make it possible to reexamine only intended items simply and quickly by pushing a foot brake and detecting the fluctuation of braking force when there are disqualified items after the examination of all test items regardless of the success and disqualification. CONSTITUTION:In a brake tester, the slip rate of each driving wheel of load cells 10A... is converted and measured in response t a load. Based on the measured voltage values, a microcomputer 12 sequentially examines the items of tire drag, braking force of a foot brake and parking holding force of a side brake with a judging circuit. After the end of the examination, the brake is pushed and the reexamination operation is started when there is the disqualified measured item based on the success and the disqualification of all items. For each item. the reexamination is performed for the disqualified item and the next item is examined when the item is successful in sequence. Only the disqualified item is examined. Thus, the reexamination can be conducted safely and quickly.

Description

【発明の詳細な説明】 「産業上の利用分野」 本発明はブレーキテスタの再検査方法に係り、特に車両
を検査台上に順次侵入/載置させながらサイドスリップ
、スピード、ブレーキ、その他の各種試験を順次且つ連
続的に行うように構成した車両自動総合試験装置に用い
られるブレーキテスタの再検査方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for re-inspecting a brake tester, and in particular, inspects side slip, speed, brake, etc. while sequentially entering and placing a vehicle on an inspection table. The present invention relates to a method for re-inspecting a brake tester used in a comprehensive vehicle automatic test system configured to perform tests sequentially and continuously.

「従来の技術] 従来より例えば検査台上に車両進入方向に沿ってホイー
ルベース計測装置、サイドスリップテスタ、輪重測定装
置、ブレーキスピードメータテスタ、ヘッドライトテス
タ等を配置し、車両を検査台上に進入させた後、順次所
定検査位置に移動させながら前記各種試験を行うように
した車両自動総合試験装置は公知である。
``Prior art'' Conventionally, for example, a wheel base measuring device, a side slip tester, a wheel load measuring device, a brake speed meter tester, a headlight tester, etc. are arranged along the vehicle approach direction on an inspection table, and the vehicle is placed on the inspection table. A vehicle automatic comprehensive test device is known that performs the various tests described above while sequentially moving the vehicle to predetermined inspection positions after entering the vehicle.

この種の試験装置に組込まれるブレーキテスタは例えば
駆動ローラとアイドルローラからなるブレーキローラ対
上に夫々のタイヤを載置した状態で、ブレーキローラを
モータを介して駆動させ、この状態でタイヤとブレーキ
ローラ間のスリップ率を検知するロードセル等の測定器
を利用して、第1にクラッチをアイドル状態にする事に
より引きずり測定(合否判定)、次にフットブレーキを
踏むことにより制動力測定(合否判定)、そして最後に
サイドブレーキを引く事により駐車保持力(合否判定)
の各項目を行うように構成し、そして前記各判定項目を
進める際に、タイマ若しくは押し釦により行うように構
成していた。
A brake tester built into this type of test equipment, for example, places each tire on a pair of brake rollers consisting of a drive roller and an idle roller, drives the brake roller via a motor, and tests the tires and brakes in this state. Using a measuring device such as a load cell that detects the slip rate between the rollers, first, the clutch is placed in an idle state to measure drag (pass/fail judgment), and then the braking force is measured by stepping on the foot brake (pass/fail judgment). ), and finally the parking holding force (pass/fail judgment) by pulling the handbrake.
The system is configured to perform each of the following items, and is configured to use a timer or a push button to proceed through each of the determination items.

「発明が解決しようとする技術的課題」しかしながら、
前記タイマによる判定項目の進行方法では試験用車両に
搭乗している運転者(試験を行うもの)が機械に追われ
る意識が意識が強く、又タイムアツプするまでは次の判
定項目に進めないために、タイムロスが生じるという欠
点を有するのみならず、不合格が出た場合の再検査が極
めて困難である。
“The technical problem that the invention aims to solve” However,
In the method of progressing through the judgment items using the timer, the driver in the test vehicle (those conducting the test) has a strong sense of being chased by the machine, and also because he cannot proceed to the next judgment item until the time is up. Not only does this have the drawback of time loss, but it is also extremely difficult to re-inspect in the event of a failure.

一方、押し釦方式では試験項目終了毎に、車両近傍に設
けた押し釦を押しながら次の試験項目に移る為に確実で
あるが、運転者が身を乗り出して車両側部にある押し釦
を押さなければ次の試験項目に移る事や再検査を行う事
が不可能であり、運転者に無用な動作を強いるのみなら
ずその全試験時間が遅延する。
On the other hand, the push-button method is reliable because each time a test item is completed, the driver presses a push button near the vehicle to move on to the next test item, but the driver leans forward and presses the push button on the side of the vehicle. If the button is not pressed, it is impossible to move on to the next test item or perform a re-inspection, which not only forces the driver to make unnecessary movements but also delays the entire test time.

本発明はかかる従来技術の欠点に鑑み、再検査を速やか
に且つタイムロスが生じる事なく容易に行う事の出来る
再検査方式を提供する事を目的とする。
In view of the drawbacks of the prior art, it is an object of the present invention to provide a reexamination method that allows reexamination to be performed quickly and easily without any time loss.

本発明の他の目的とする所は、機械に追われる事なく又
タイムロスが生じる事なく速やかに所望の試験項目の再
検査を行う事の出来るブレーキテスタの再検査方式を提
供する事を目的とする。
Another object of the present invention is to provide a re-inspection method for a brake tester that allows the re-examination of desired test items to be carried out promptly without being overtaken by machines or without causing time loss. do.

「課題を解決する為の技術手段」 本発明はかかる技術的課題を達成するために、■前記引
きずり、制動力、駐車保持力の各試験項目の合否と無関
係に全ての試験項目の検査を行う工程。
"Technical Means for Solving the Problem" In order to achieve the technical problem, the present invention: ■ Inspects all test items regardless of whether each of the test items of drag, braking force, and parking holding force pass or fail. Process.

■前記全ての試験項目の検査後に、少なくとも一の不合
格試験項目が存在した場合にフットブレーキを踏む事に
よりその制動力の変動を検知する工程 ■前制動力変化を検知後、再検査動作に移行させる工程 からなる事を特徴とするブレーキテスタの再検査方法に
を提案する。
■Step of detecting the change in braking force by stepping on the foot brake if there is at least one failed test item after inspecting all the test items mentioned above.■After detecting the change in the previous braking force, proceed to re-inspection operation. This paper proposes a method for re-inspecting a brake tester, which is characterized by a transition process.

「作用」 かかる発明によれば、車外に設けた押し釦を押す事なく
、単に制動力試験用のフットブレーキを踏む事により再
検査に移行できるために、安全且つ再検査を速やかに行
う事が出来る。
"Operation" According to this invention, the re-inspection can be carried out safely and quickly because the re-inspection can be started simply by stepping on the foot brake for braking force test without pressing the push button provided outside the vehicle. I can do it.

又本発明は各試験項目毎に再検査を行うのではな(、各
試験項目の合否と無関係に全ての試験項目の検査を行い
、その後に再検査動作を行うために、再検査が煩雑化す
る事がない。
In addition, the present invention does not require re-inspection for each test item (instead of re-inspecting each test item, all test items are inspected regardless of whether each test item passes or failed, and then the re-inspection operation is performed, making re-inspection complicated). There's nothing to do.

「実施例」 以下、図面に基づいて本発明の実施例を例示的−λどは
特に特定的な記載がない限りは、この発明の範囲をそれ
のみに限定する趣旨ではなく単なる説明例に過ぎない。
"Example" The following is an example of the present invention based on the drawings. do not have.

第1図乃至第4図はいずれも車両自動総合試験装置に組
込まれるブレーキテスタの実施例に係り、先ず第1図に
基づいてその全体回路構成を説明するに、IOA・・・
は各駆動輪のスリップ率を荷重に対応する測定電圧値V
siに変換して測定するロードセルで前記電圧値Vsi
はアンプIIA・・・により増幅させてマイクロコンピ
ュータ12内に送り込まれる。
1 to 4 all relate to embodiments of a brake tester incorporated in a vehicle automatic comprehensive test system. First, the overall circuit configuration will be explained based on FIG. 1. IOA...
is the measured voltage value V that corresponds to the load on the slip rate of each drive wheel.
The voltage value Vsi is converted into si and measured by the load cell.
is amplified by the amplifier IIA and sent into the microcomputer 12.

第2図(A)は前記マイクロコンピュータ12に組込ま
れた判定回路で、先ず引きずり測定の合否判定は、合否
判定基準を設定する基準電圧設定回路21、該基*電圧
VBと前記測定電圧値Vsiとを比較する比較器22、
アンド回路24.タイマ25及び制御回路26からなり
、前記測定電圧値Vsiが基準電圧V9を以下の場合に
インバータ23により反転させた反転信号をアンド回路
23に出力し、所定タイマ25設定時間以内に該アンド
回路24により前記全ての駆動輪1の反転信号が得られ
た場合に引きずり合格信号を出力可能に構成させる。
FIG. 2(A) shows a judgment circuit built into the microcomputer 12. First, the pass/fail judgment of the drag measurement is performed by a reference voltage setting circuit 21 that sets the pass/fail judgment standard, the base*voltage VB and the measured voltage value Vsi. a comparator 22 for comparing
AND circuit 24. Consisting of a timer 25 and a control circuit 26, when the measured voltage value Vsi is less than or equal to the reference voltage V9, an inverted signal inverted by the inverter 23 is output to the AND circuit 23, and the signal is output to the AND circuit 24 within a predetermined time set by the timer 25. Accordingly, when inversion signals for all the drive wheels 1 are obtained, a drag pass signal can be output.

そして制動力/駐車測定の為の判定は、前記回路と同様
に合否判定基準を設定する基準電圧設定回路27、該基
準電圧■自と前記測定電圧値Vsiとを比較する比較器
28、アンド回路29、及び前記制御回路26からなり
、前記全ての駆動輪の測定電圧値Vsiが基準電圧vf
3以上若しくは以下の場合に各アンド回路より出力され
る信号に基づいて制動力の上昇/下降判定を行う。
Judgment for braking force/parking measurement is made by a reference voltage setting circuit 27 that sets a pass/fail judgment standard similarly to the circuit described above, a comparator 28 that compares the reference voltage with the measured voltage value Vsi, and an AND circuit. 29, and the control circuit 26, the measured voltage value Vsi of all the drive wheels is a reference voltage vf.
In the case of 3 or more or less than 3, the increase/decrease of the braking force is determined based on the signal output from each AND circuit.

尚前記の様に全ての駆動輪の比較信号のアンドを採る構
成では精度は向上するが、不合格若しくは再検に移行す
る場合が多(なる。 そこで第2図(B)に示すように
前記各駆動輪毎の測定電圧値Vsiを加算器31により
加算してその加算値Vtと基準電圧設定回路33.34
よりの基準電圧vI:lI vBlとを比較してその比
較信号に基づいて前記引きずり測定の合否判定、又制動
力の上昇/下降判定を行う様に構成するのが好ましい。
As mentioned above, the configuration in which the comparison signals of all the drive wheels are ANDed improves accuracy, but there are many cases where the result is a failure or a re-examination is required.Therefore, as shown in Figure 2 (B), The measured voltage value Vsi for each driving wheel is added by the adder 31 and the added value Vt is added to the reference voltage setting circuit 33.34.
It is preferable to compare the reference voltages vI:lI and vBl, and to determine whether or not the drag measurement is successful or to determine whether the braking force is increased or decreased based on the comparison signal.

次に各判定項目におけるスリップ率の変動状態を示す第
3図、及びその測定順序を示す第4図のフローチャート
図を参照しながらその測定動作を順を追って説明する。
Next, the measurement operation will be explained step by step with reference to FIG. 3 which shows the fluctuation state of the slip ratio in each determination item, and the flowchart of FIG. 4 which shows the order of measurement.

先ず第1図に示すように、駆動ローラ2とアイドルロー
ラ3からなるブレーキローラ対上に夫々のタイヤ1を載
置した状態で、ブレーキローラ2を駆動させた後、先ず
クラッチをアイドル状態にする事により引きずり測定を
行う。
First, as shown in FIG. 1, with each tire 1 placed on a pair of brake rollers consisting of a drive roller 2 and an idle roller 3, the brake rollers 2 are driven, and then the clutch is placed in an idle state. Depending on the situation, carry out drag measurements.

引きずり測定は前記クラッチをアイドル状態に入れると
同時にタイマ25が作動し、該タイマ25がタイムアツ
プするまでに前記全ての駆動輪l若しくは該駆動輪1の
加算値Vtが基準電圧■。r VBr ”T:II’ 
vB′値以下になるまで前記回路にて繰り返し引きずり
測定を行う、  (STEPI) そして前記タイムアツプ後着しくは引きずり合格信号が
出力された後、制動力測定を行う。
In drag measurement, the timer 25 is activated at the same time as the clutch is put into the idle state, and by the time the timer 25 times up, all of the driving wheels 1 or the sum value Vt of the driving wheels 1 have reached the reference voltage (2). r VBr ``T:II'
Drag measurement is repeated in the circuit until it becomes equal to or less than the vB' value (STEPI). Then, after the time-up is reached or the drag pass signal is output, the braking force is measured.

制動力測定はフットブレーキを踏むことにより制動力が
基準電圧vG++’Q’値以上に上昇したか否か、そし
て上昇した後、フットブレーキを離して制動駐車測定は
、サイドブレーキを引く事によりその固持力が基準電圧
V。、−′値以上に上昇したか否か、そして上昇した後
、フットブレーキを離して前記固持力が基準電圧vl:
bvl:l″値以下に下降したか否かを判定する。(S
TEP3) そして前記各測定項目全てが合格したか否かを判断しく
5TEP4) 、不合格測定項目がある場合はフットブ
レーキを再度踏む(STEP5 )。そして踏まれた事
を前記制動力判定回路にて判断して再検動作に移る。(
STEP6)この場合、前記制動力測定が不合格の場合
はフットブレーキの上昇下降が判断できないために、判
定回路に示すように、各駆動輪夫々の比較出力を採り出
し、何れかが基憔電圧v鉛私’より上昇したか否かを判
断してもよ(、又加算器31を用いた回路の場合は特別
に再検用基準電圧■cを設定してもよい。
Braking force measurement is performed by stepping on the foot brake to determine whether or not the braking force has increased above the reference voltage vG++'Q' value. Holding force is reference voltage V. , -' value or more, and after the rise, release the foot brake and the holding force becomes the reference voltage vl:
bvl: Determine whether the value has fallen below the l'' value. (S
TEP 3) Then, it is determined whether all of the measurement items have passed or not. 5TEP 4) If there are any measurement items that have failed, step on the foot brake again (STEP 5). Then, the braking force determination circuit determines that the brake pedal has been stepped on, and a retesting operation is performed. (
STEP 6) In this case, if the braking force measurement fails, it is not possible to judge whether the foot brake is rising or falling, so as shown in the judgment circuit, the comparative outputs of each drive wheel are taken, and one of them is determined to be the base voltage. It is also possible to judge whether or not the voltage has risen from v lead I' (or, in the case of a circuit using an adder 31, a special reference voltage c for retesting may be set).

そして前記再検動作に移った後においては引きずり測定
が合格か否かを判断して不合格の場合は再検を、又合格
の場合は次の測定項目である制動力測定に(STEP7
) 、更に制動力測定が合格の場合は駐車測定に移行し
く5TEP8)、不合格の測定項目のみを検査する事が
出来る。(STEP9)「効果] 以上記載の如く本発明によれば、単にフットブレーキを
踏む事により、簡単に且つ速やかに所望の試験項目のみ
の再検を行う事が出来、而も先ず引きずり、制動力、駐
車の全ての試験項目を終了後に再検動作を行うために、
又タイムロスが生じる事もない。
After moving on to the re-testing operation, it is determined whether the drag measurement passes or not, and if it fails, the re-test is performed, and if it passes, the next measurement item, braking force measurement, is performed (STEP 7).
), Furthermore, if the braking force measurement passes, the process moves to parking measurement (5TEP8), and only the measurement items that fail can be inspected. (STEP 9) ``Effects'' As described above, according to the present invention, by simply stepping on the foot brake, only the desired test items can be re-examined easily and quickly. In order to perform a retest operation after completing all parking test items,
Also, there is no time loss.

等の種々の著効を有す。It has various effects such as

【図面の簡単な説明】[Brief explanation of drawings]

第1図乃至第4図はいずれも車両自動総合試験装置に組
込まれるブレーキテスタの実施例に係り、第1図はその
全体ブロック図、第2図(A)  (B)は要部回路構
成図、第3図は各判定項目におけるスリップ率の変動状
態を示す作用図、第4図はその測定順序を示すフローチ
ャート図である。 特許出願人:トヨタ自動車株式会社 同     安全自動車株式会社 第2図 CB) f
Figures 1 to 4 all relate to embodiments of a brake tester incorporated into a vehicle automatic comprehensive testing system, with Figure 1 being an overall block diagram, and Figures 2 (A) and 2 (B) being circuit configuration diagrams of main parts. , FIG. 3 is an action diagram showing the fluctuation state of the slip ratio in each judgment item, and FIG. 4 is a flowchart showing the measurement order. Patent applicant: Toyota Motor Corporation Anzen Jidosha Co., Ltd. Figure 2 CB) f

Claims (1)

【特許請求の範囲】[Claims] タイヤの引きずり、フットブレーキにおける制動力、サ
イドブレーキにおける駐車保持力の各試験項目を順を追
って検査可能に構成したブレーキテスタの再検査方法に
おいて、前記各試験項目の合否と無関係に全ての試験項
目の検査を行った後、少なくとも一の不合格試験項目が
存在した場合にフットブレーキを踏む事によりその制動
力の変動を検知し、再検査動作に移行させる事を特徴と
するブレーキテスタの再検査方法
In the re-inspection method of the brake tester, which is configured to be able to sequentially inspect each test item of tire drag, braking force of foot brake, and parking holding force of handbrake, all test items are tested regardless of whether each test item passes or fails. A re-inspection of a brake tester characterized in that if there is at least one failed test item after performing the above-mentioned test, a change in braking force is detected by stepping on a foot brake, and the re-inspection operation is performed. Method
JP2148632A 1990-06-08 1990-06-08 Reexamination of brake tester Pending JPH0442033A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2148632A JPH0442033A (en) 1990-06-08 1990-06-08 Reexamination of brake tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2148632A JPH0442033A (en) 1990-06-08 1990-06-08 Reexamination of brake tester

Publications (1)

Publication Number Publication Date
JPH0442033A true JPH0442033A (en) 1992-02-12

Family

ID=15457135

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2148632A Pending JPH0442033A (en) 1990-06-08 1990-06-08 Reexamination of brake tester

Country Status (1)

Country Link
JP (1) JPH0442033A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016075605A (en) * 2014-10-08 2016-05-12 株式会社バンザイ Vehicle testing device and setting method of vehicle testing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016075605A (en) * 2014-10-08 2016-05-12 株式会社バンザイ Vehicle testing device and setting method of vehicle testing device

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