JPH04366768A - Probe - Google Patents
ProbeInfo
- Publication number
- JPH04366768A JPH04366768A JP14052891A JP14052891A JPH04366768A JP H04366768 A JPH04366768 A JP H04366768A JP 14052891 A JP14052891 A JP 14052891A JP 14052891 A JP14052891 A JP 14052891A JP H04366768 A JPH04366768 A JP H04366768A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- limit
- cross
- tip
- notch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 title claims abstract description 28
- 239000011111 cardboard Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明はプロービング用探針に関
し、特に針先を研磨し、先端が短くなってゆくプロービ
ング用探針に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probing probe, and more particularly to a probing probe whose tip is polished and whose tip becomes shorter.
【0002】0002
【従来の技術】図3(a)は従来のプロービング用探針
を示す正面図、図3(b)は図3(a)の側面図、図3
(c)は図3(b)のX−X′線の断面図、図3(d)
は図3(b)のY−Y′線の断面図である。[Prior Art] FIG. 3(a) is a front view showing a conventional probing probe, FIG. 3(b) is a side view of FIG. 3(a), and FIG.
(c) is a cross-sectional view taken along the line X-X' in FIG. 3(b), and FIG. 3(d)
is a sectional view taken along the line YY' in FIG. 3(b).
【0003】従来のこの種のプロービング用探針は、図
3のように、先端部の断面形状が、どの位置でもほぼ円
形であり((c),(d))、針先の研磨による削れ量
に対し、断面形状による使用限界Lの検出はできない構
造となっていた。[0003] As shown in FIG. 3, the conventional probing probe of this type has a cross-sectional shape of the tip that is almost circular at any position ((c), (d)). The structure was such that it was impossible to detect the usage limit L based on the cross-sectional shape.
【0004】この探針1は、先端部Tが折れまがり、そ
の反対端が半田付部Hとなっている。[0004] This probe 1 has a bent tip T and a soldered portion H at the opposite end.
【0005】[0005]
【発明が解決しようとする課題】このような従来のプロ
ービング用探針では、探針先端Tを研磨した時、使用限
界Lに対し、断面形状による判断が出来ない為、針先端
を横または斜め方向からみて残りの長さを測り、使用限
界L以内かどうか判断するしかなく、更にカード基板に
取り付けられた状態では、針を横または斜め方向からみ
て長さを測ることは非常に困難であった。[Problem to be Solved by the Invention] With such conventional probing probes, when the probe tip T is polished, the usage limit L cannot be determined based on the cross-sectional shape, so the tip of the probe is polished horizontally or diagonally. The only way to determine whether it is within the usage limit L is to measure the remaining length when viewed from the direction of the needle.Furthermore, when the needle is attached to the card board, it is extremely difficult to measure the length when looking at the needle from the side or diagonally. Ta.
【0006】即ち、プロービング用探針1の先端長が使
用限界L以内かどうか判断しにくいという問題があった
。That is, there is a problem in that it is difficult to judge whether the tip length of the probing probe 1 is within the usage limit L or not.
【0007】本発明の目的は、前記問題点を解決し、先
端部が使用限界内であるか否かが直ちに解かるようにし
たプロービング用探針を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide a probing probe that solves the above-mentioned problems and allows it to be immediately determined whether or not the tip is within the usage limit.
【0008】[0008]
【課題を解決するための手段】本発明のプロービング用
探針の構成は、先端研削限界を検出する為の切り欠き(
溝)または突起を有する先端部を備えたことを特徴とす
る。[Means for Solving the Problems] The configuration of the probing probe of the present invention includes a notch (
It is characterized by having a tip having a groove or a protrusion.
【0009】[0009]
【実施例】図1(a)は本発明の一実施例のプロービン
グ用探針を示す正面図、図1(b)は図1(a)の側面
図、図1(c)は図1(b)のX−X′線の断面図、図
1(d)は図1(b)のY−Y′線の断面図である。[Embodiment] FIG. 1(a) is a front view showing a probing probe according to an embodiment of the present invention, FIG. 1(b) is a side view of FIG. 1(a), and FIG. FIG. 1(d) is a sectional view taken along the line Y-Y' in FIG. 1(b).
【0010】図1(a)〜(d)において、本実施例の
プロービング用探針は、使用限界Lを下限とする切り欠
き2が、先端部Tに設けられている。使用限界Lより先
端は、図1(d)に示すように円形をしているが、使用
限界Lを越えると、図1(c)に示すように、切り欠き
2が明瞭にあわられる。In FIGS. 1A to 1D, the probing probe of this embodiment has a notch 2 at its tip T whose lower limit is the usage limit L. The tip from the usage limit L has a circular shape as shown in FIG. 1(d), but when the usage limit L is exceeded, a notch 2 clearly appears as shown in FIG. 1(c).
【0011】使用限界L以内では断面形状がY−Y′断
面のようにほぼ円形であり、使用限界Lをこすと断面形
状がX−X′断面のように円の一部に欠損部が見られる
。Within the usage limit L, the cross-sectional shape is almost circular like the Y-Y' cross-section, and when the usage limit L is crossed, the cross-sectional shape is like the X-X' cross-section where a missing part can be seen. It will be done.
【0012】本実施例のプロービング用探針は、特にカ
ード基板に取りつけられた状態で、探針先端の残り量即
ち使用限界Lが容易に判る様に断面形状が限界で変わる
構造となる切り欠きを備えている。The probing probe of this embodiment has a cutout structure in which the cross-sectional shape changes at the limit so that the remaining amount of the tip of the probe, that is, the usage limit L, can be easily determined especially when it is attached to the card board. It is equipped with
【0013】図2(a)は本発明の他の実施例の正面図
、図2(b)は図2(a)の側面図、図2(c)は図2
(b)のX−X′線の断面図、図2(d)は図2(b)
のY−Y′線の断面図である。FIG. 2(a) is a front view of another embodiment of the present invention, FIG. 2(b) is a side view of FIG. 2(a), and FIG. 2(c) is a side view of FIG.
(b) is a cross-sectional view taken along line X-X', and Figure 2 (d) is Figure 2 (b).
FIG.
【0014】図2(a)〜(d)において、本実施例の
探針1は、使用限界Lを下限とする突起3を形成してい
る。今、先端部Tが使用限界L内であれば、図2(d)
に示すように、円形断面であるが、使用限界Lを越える
と図3(c)に示すように突起3があらわれる。In FIGS. 2A to 2D, the probe 1 of this embodiment has a protrusion 3 whose lower limit is a usage limit L. Now, if the tip T is within the usage limit L, then Fig. 2(d)
As shown in FIG. 3(c), the cross section is circular, but when the usage limit L is exceeded, a protrusion 3 appears as shown in FIG. 3(c).
【0015】これら図1,図2に示す様に、本発明は、
断面形状の変化で使用限界を容易に判断出来る。As shown in FIGS. 1 and 2, the present invention
Usage limits can be easily determined by changes in cross-sectional shape.
【0016】[0016]
【発明の効果】以上説明したように、本発明は、探針の
先端長の使用限界以降に切り欠き又は突起を備えること
で、特針の研磨に対し、探針先端の形状(断面形状に同
じ)から、使用の可否を容易に判断出来るという効果を
有する。Effects of the Invention As explained above, the present invention provides a notch or protrusion beyond the usable limit of the tip length of the probe, so that the shape of the tip (cross-sectional shape) (same), it has the effect that it is easy to judge whether or not it can be used.
【図1】(a),(b),(c),(d)は本発明の一
実施例のプロービング用探針を示す正面図,側面図,X
−X′線の断面図,Y−Y′線の断面図である。[Fig. 1] (a), (b), (c), and (d) are front and side views showing a probing probe according to an embodiment of the present invention;
They are a sectional view taken along the -X' line and a sectional view taken along the YY' line.
【図2】(a),(b),(c),(d)は本発明の他
の実施例のプロービング用探針を示す正面図,側面図,
X−X′線の断面図,Y−Y′線の断面図である。[Fig. 2] (a), (b), (c), and (d) are front and side views showing probing probes according to other embodiments of the present invention;
They are a cross-sectional view taken along line X-X' and a cross-sectional view taken along line Y-Y'.
【図3】(a),(b),(c),(d)は従来のプロ
ービング用探針を示す正面図,側面図,X−X′線の断
面図,Y−Y′線の断面図である。[Figure 3] (a), (b), (c), and (d) show a front view, a side view, a cross-sectional view along the X-X' line, and a cross-sectional view along the Y-Y' line, showing a conventional probing probe. It is a diagram.
1 プロービング用探針 2 切り欠き 3 突起 1 Probing probe 2 Notch 3.Protrusion
Claims (1)
または突起を有する先端部を備えたことを特徴とするプ
ロービング用探針。1. A probing probe characterized by having a tip having a notch or projection for detecting the tip grinding limit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14052891A JPH04366768A (en) | 1991-06-13 | 1991-06-13 | Probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14052891A JPH04366768A (en) | 1991-06-13 | 1991-06-13 | Probe |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04366768A true JPH04366768A (en) | 1992-12-18 |
Family
ID=15270768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14052891A Pending JPH04366768A (en) | 1991-06-13 | 1991-06-13 | Probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04366768A (en) |
-
1991
- 1991-06-13 JP JP14052891A patent/JPH04366768A/en active Pending
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