JPH0434165B2 - - Google Patents
Info
- Publication number
- JPH0434165B2 JPH0434165B2 JP57054201A JP5420182A JPH0434165B2 JP H0434165 B2 JPH0434165 B2 JP H0434165B2 JP 57054201 A JP57054201 A JP 57054201A JP 5420182 A JP5420182 A JP 5420182A JP H0434165 B2 JPH0434165 B2 JP H0434165B2
- Authority
- JP
- Japan
- Prior art keywords
- node
- abnormality
- result
- occurred
- observation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
- G05B19/058—Safety, monitoring
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Measurement Of Current Or Voltage (AREA)
- Testing And Monitoring For Control Systems (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57054201A JPS58168964A (ja) | 1982-03-30 | 1982-03-30 | プラント診断装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57054201A JPS58168964A (ja) | 1982-03-30 | 1982-03-30 | プラント診断装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58168964A JPS58168964A (ja) | 1983-10-05 |
JPH0434165B2 true JPH0434165B2 (enrdf_load_stackoverflow) | 1992-06-05 |
Family
ID=12963927
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57054201A Granted JPS58168964A (ja) | 1982-03-30 | 1982-03-30 | プラント診断装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58168964A (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57191591A (en) * | 1981-05-22 | 1982-11-25 | Nippon Atomic Ind Group Co | Method and device for diagnosing atomic power plant |
-
1982
- 1982-03-30 JP JP57054201A patent/JPS58168964A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58168964A (ja) | 1983-10-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5214577A (en) | Automatic test generation for model-based real-time fault diagnostic systems | |
CN102110485B (zh) | 数码发电站保护系统的健全性测试的自动化方法及装置 | |
Najafi et al. | Bisecting commits and modeling commit risk during testing | |
Ricks et al. | Diagnosis for uncertain, dynamic and hybrid domains using Bayesian networks and arithmetic circuits | |
CN115114064A (zh) | 一种微服务故障分析方法、系统、设备及存储介质 | |
Escobet et al. | A methodology for incipient fault detection | |
JPH0434165B2 (enrdf_load_stackoverflow) | ||
CN1559034A (zh) | 用于处理故障假设的方法和系统 | |
KR870000116B1 (ko) | 히스토리 메모리 제어방식 | |
JP2890815B2 (ja) | プラントの異常診断装置 | |
Montmain et al. | Qualitative event analysis for fault diagnosis | |
JPH0147836B2 (enrdf_load_stackoverflow) | ||
JPS58168966A (ja) | プラント診断装置 | |
JPS59168510A (ja) | プラント診断装置 | |
JPS58186807A (ja) | プラント診断装置 | |
KR100190267B1 (ko) | 전문가 시스템 테스트용 테스트 시스템 및 전문가 시스템 테스트 방법 | |
JPS58163015A (ja) | プラント診断装置 | |
JPH059805B2 (enrdf_load_stackoverflow) | ||
JPS58176708A (ja) | プラント診断装置 | |
JPS58168967A (ja) | プラント診断装置 | |
JPH0413729B2 (enrdf_load_stackoverflow) | ||
Wilikens et al. | Formentor: A real-time expert system for risk prevention in complex hazardous environments: A case study | |
Liu et al. | Development of Reliability Measurement Method and Tool for Nuclear Power Plant Safety Software | |
JPH0658716B2 (ja) | 故障診断装置及び故障診断システム | |
JPS60226132A (ja) | 半導体デバイス用試験装置 |