JPH0433230A - Chip type fuse - Google Patents

Chip type fuse

Info

Publication number
JPH0433230A
JPH0433230A JP13696790A JP13696790A JPH0433230A JP H0433230 A JPH0433230 A JP H0433230A JP 13696790 A JP13696790 A JP 13696790A JP 13696790 A JP13696790 A JP 13696790A JP H0433230 A JPH0433230 A JP H0433230A
Authority
JP
Japan
Prior art keywords
conductor
chip
sections
conductive sections
type fuse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13696790A
Other languages
Japanese (ja)
Inventor
Takeo Rokusha
六車 武雄
Hiroshi Asanuma
博 浅沼
Kazuhiko Seki
和彦 関
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kamaya Electric Co Ltd
Mitsubishi Materials Corp
Original Assignee
Kamaya Electric Co Ltd
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kamaya Electric Co Ltd, Mitsubishi Materials Corp filed Critical Kamaya Electric Co Ltd
Priority to JP13696790A priority Critical patent/JPH0433230A/en
Publication of JPH0433230A publication Critical patent/JPH0433230A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To safely cut off the short circuit current and give high circuit stability by providing narrow sections narrower in width than the other conductive sections on multiple conductive sections crossing the opposing directions of end electrodes of a corrugated conductor. CONSTITUTION:Multiple conductive sections 4a1 perpendicular to the opposing directions of end electrodes 3 and curved conductive sections 4b connecting the adjacent conductive sections 4a1 and curved into a circular arc shape are arranged in turn for a conductor 4 to form a nearly rectangular wave-form, and narrow sections 4a2 narrower in width than the other conductive sections are formed at the center sections of the conductive sections 4a2. A thinner electroless nickel/phosphorus film 5 is formed on the thin metal film of the conductor 4 thus formed. The thin metal film forming the conductor 4 is made of copper, copper-zinc alloy, silver and their mixture.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は電子機器のプリント回路基板やハイブリッドI
Cの安全対策部品を表面実装するチップヒユーズに関す
るものである。
[Detailed Description of the Invention] <Industrial Application Field> The present invention is applicable to printed circuit boards of electronic devices and hybrid I
This relates to a chip fuse that surface-mounts safety components of C.

〈従来の技術〉 近年、電子機器の軽薄短小化に伴い、使用されている回
路基板も高密度表面実装基板が多用されている。中でも
電源回路を内蔵した半導体ペアチップ等で構成されるハ
イブリッドICは小面積の基板に特に高密度に実装され
、樹脂封止されている。これらの機器の安全対策として
、表面実装できるチップ型ヒユーズが使用されている。
<Prior Art> In recent years, as electronic devices have become lighter, thinner, shorter, and smaller, high-density surface-mounted circuit boards are increasingly being used. Among them, hybrid ICs, which are composed of semiconductor pair chips with built-in power supply circuits, are particularly densely mounted on small-area substrates and sealed with resin. As a safety measure for these devices, surface-mountable chip type fuses are used.

従来のチップ型ヒユーズには絶縁性のチップ基板下面に
設けた凹部内に金属薄膜よりなる導電体に形成し、これ
を前記チップ基板の両端面に電気的に接続したものが知
られている(実公昭61−11881号公報)。
A conventional chip-type fuse is known in which a conductor made of a thin metal film is formed in a recess provided on the bottom surface of an insulating chip substrate, and this is electrically connected to both end surfaces of the chip substrate. Utility Model Publication No. 61-11881).

また、ヒユーズ素子の機能としてタイムラグ性能を要求
される場合は、導電体44aを矩形波形状としく第4図
(a))、また速断性能を要求される場合には、導電体
44bの中央部を両側部に比べて幅狭に形成する(第4
図(b))等が行なわれていた。
In addition, when time lag performance is required as a function of the fuse element, the conductor 44a is formed into a rectangular wave shape (Fig. 4(a)), and when fast-acting performance is required, the central part of the conductor 44b is is formed to be narrower than both sides (fourth
Figure (b)) etc. were carried out.

〈発明が解決しようとする課題〉 しかし、導電体の形状を矩形波形状とした場合、周知の
ように電流は導電体間の最短経路を通る性質があり、導
電体の形状を第4図(a)に示す矩形波形状とすれば、
最短経路である角部45に電流が多く流れ、この角部4
5から溶融を開始し、結果的にどの箇所で、どのような
状態で溶断するかは、諸条件により様々に変化を示すも
のであった。また、導電体の外周部における隣接する角
部47に電界が集中するため、この角部47間で異常放
電を起こしたり、さらに近接するその他の実装部品との
間で異常放電を生ずる場合があった。
<Problems to be Solved by the Invention> However, when the shape of the conductor is a rectangular wave shape, as is well known, the current has a property of passing through the shortest path between the conductors, and the shape of the conductor is shown in Fig. 4 ( Given the rectangular wave shape shown in a),
A large amount of current flows through the corner 45 which is the shortest path, and this corner 4
Melting starts from No. 5, and the location and state in which the melting occurs varies depending on various conditions. Furthermore, since the electric field concentrates on adjacent corners 47 on the outer periphery of the conductor, abnormal discharge may occur between the corners 47 or between other mounted components in the vicinity. Ta.

従って、導電体を矩形波形状としタイムラグ性能を持た
せた場合、電源電圧がAC250Vのように高くなると
短絡電流によってヒユーズエレメント(金属薄膜導電体
)が部分的に溶融気化して回路が遮断されても、溶断に
よって生じた絶縁ギャップが狭い場合もあり、ギャップ
間に加わる250vの電圧或いは回路のインダクタンス
によって生じる逆起電力等も重畳して再び放電を開始し
て再アークに発展し、電子回路全体に大きな焼損破壊が
波及する危険がある。特に3216タイプ(長さ3.2
閣9幅1.6mm、厚さ0.5m)のような小型のチッ
プ型ヒユーズになると安全に回路を遮断できるものは得
られていないのが現状である。
Therefore, when the conductor has a rectangular wave shape and has time lag performance, when the power supply voltage becomes high such as 250 VAC, the fuse element (metallic thin film conductor) is partially melted and vaporized by the short circuit current, and the circuit is interrupted. In some cases, the insulation gap caused by the melting is narrow, and the back electromotive force generated by the 250V voltage applied across the gap or the inductance of the circuit is also added, and the discharge starts again, developing into a re-arc and damaging the entire electronic circuit. There is a risk of major fire damage spreading to the area. Especially the 3216 type (length 3.2
Currently, there are no small chip-type fuses such as the 9 (1.6 mm wide, 0.5 m thick) that can safely interrupt the circuit.

また、ヒユーズエレメントの部分にあらかじめシリコン
樹脂膜で絶縁被覆した構造のチップ型ヒユーズについて
も、AC250V回路で生じる溶断後のアークエネルギ
ーを吸収できる十分な消弧能力はないことが知られてい
る。さらに、シリコン樹脂を単にヒユーズ面に被覆する
程度ではチップ型ヒユーズを製造し自動搭載する迄に幾
多のハンドリングによって加えられる機械的ストレスに
よってヒユーズエレメントとシリコン樹脂膜との密着も
弱められるので十分な効果は期待できないという欠点が
あった。
It is also known that chip-type fuses having a structure in which the fuse element is insulated in advance with a silicone resin film do not have sufficient arc extinguishing ability to absorb arc energy after blowing out in an AC 250V circuit. Furthermore, simply coating the fuse surface with silicone resin is insufficiently effective because the mechanical stress applied during the numerous handling steps required to manufacture and automatically mount the chip-type fuse weakens the adhesion between the fuse element and the silicone resin film. The drawback was that it was not as expected.

さらにまた、導電体の中央部に幅が狭い挟小部を形成し
、速断性能を持たせた場合、第4図(b)に示すように
挟小部46が一部に集中すると、溶断によって生じた絶
縁ギャップも小さく、AC250v(波高値355Vp
)回路では再アークを防止できなかった。また限定され
た挟小部に過電力が集中するため周囲の絶縁材料に対し
ても熱劣化、即ち炭化を促進させこれも再アークの原因
につながっていた。その他インラッシュ電流に対しても
部分加熱による抵抗値変化を起こさせる等の問題点があ
った。
Furthermore, when a narrow pinched part is formed in the center of the conductor to provide quick breaking performance, if the pinched part 46 is concentrated in one part as shown in FIG. The resulting insulation gap is small, and AC250V (peak value 355Vp)
) circuit could not prevent re-arc. Furthermore, since excessive power is concentrated in a limited narrow portion, thermal deterioration, that is, carbonization, of the surrounding insulating material is promoted, which also leads to re-arcing. There are also other problems with inrush currents, such as changes in resistance due to partial heating.

本発明は上記欠点を解決すべくなされたものであり、電
源電圧AC250V以下の回路において、通常は抵抗値
変化の少ない抵抗器として作用し、回路短絡等の異常時
には、短絡電流を安全に遮断し、高い回路安定性を発揮
するチップ型ヒユーズを提供することを目的とする。
The present invention was made in order to solve the above-mentioned drawbacks, and in a circuit with a power supply voltage of 250 VAC or less, it normally acts as a resistor with little change in resistance value, and in the event of an abnormality such as a short circuit, it can safely cut off the short circuit current. The purpose is to provide a chip-type fuse that exhibits high circuit stability.

〈課題を解決するための手段〉 本発明は上記目的に鑑みてなされたものであり、その要
旨は、lI!縁性のチップ基板と、該チップ基板の対向
する両側部に形成した一対の端面電極と、前記チップ基
板上面に形成し、前記一対の端面電極を電気的に接続す
る波形の導電体とを有するチップ型ヒユーズにおいて、
前記波形の導電体における前記端面電極の対向方向に対
してクロスする複数の導電部に、他′℃導電体に比して
幅の狭い挟小部を設けたチップ型ヒユーズにある。
<Means for Solving the Problems> The present invention has been made in view of the above-mentioned objects, and the gist thereof is lI! The chip substrate has a peripheral chip substrate, a pair of end surface electrodes formed on opposing both sides of the chip substrate, and a wavy conductor formed on the top surface of the chip substrate to electrically connect the pair of end surface electrodes. In chip type fuses,
The chip-type fuse is provided with a plurality of conductive parts of the wave-shaped conductor that cross the direction in which the end face electrodes are opposed to each other, and provided with narrow portions having a narrower width than other conductors.

また、前記導電体は、前記挟小部を設けた導電部と、円
弧状に湾曲する湾曲導電部とを交互に配して前記波形を
形成することもできる。
Further, the conductor may form the waveform by alternately arranging conductive portions provided with the narrow portions and curved conductive portions curved in an arc shape.

さらにまた、前記導電体を形成する金属薄膜は、銅、銅
−亜鉛合金、銀又はこれらの混合物から形成すると共に
、前記導電体の金属薄膜上に無電解ニッケル・リン膜を
形成し、表面を被覆しても良い。
Furthermore, the metal thin film forming the conductor is formed from copper, copper-zinc alloy, silver, or a mixture thereof, and an electroless nickel-phosphorous film is formed on the metal thin film of the conductor to coat the surface. It may be covered.

なお、前記波形とは正弦波、矩形波及び台形波等その他
すべての波形を含むものである。
Note that the waveform includes all other waveforms such as a sine wave, a rectangular wave, and a trapezoidal wave.

く作用〉 短絡時などに過電流が流れた場合、前記導電体は複数の
挟小部で確実に溶断される。また、この複数の挟小部の
溶断により、前記端面電極間に所望の絶縁ギャップが得
られるように作用する。。
Effects> If an overcurrent flows during a short circuit or the like, the conductor is reliably fused at the plurality of pinched portions. Further, the fusing of the plurality of narrow portions acts to obtain a desired insulation gap between the end face electrodes. .

〈実施例〉 失1旌よ 本発明に係るチップ型ヒユーズを添付図面に基づいてに
説明する。
<Example> First, a chip type fuse according to the present invention will be explained based on the accompanying drawings.

チップ型ヒユーズ1は、+!1!縁性のチップ基板2(
長さ3. 2++wnt @1.6mn、厚さ0.5a
m)と、チップ基板2の対向する両側部に形成した一対
の端面電極3と、前記一対の端面電極3を電気的に接続
する金属薄膜から成る導電体4とで基本構成を成す。
Chip type fuse 1 is +! 1! Edge chip substrate 2 (
Length 3. 2++wnt @1.6mm, thickness 0.5a
m), a pair of end face electrodes 3 formed on opposite sides of the chip substrate 2, and a conductor 4 made of a metal thin film that electrically connects the pair of end face electrodes 3.

前記導電体4を形成する金属薄膜は、乾式法で知られる
スパッタリング或は真空蒸着等により成膜し、更にその
上に浸式法で知られる無電解めっき或いは電気めっきで
形成された膜を重畳したもので、材料には銅、銅−亜鉛
合金、銀及びこれらの混合物等が使用できる。前記金属
薄膜を従来のフォトエツチングによるパターン形成の方
法でヒユーズエレメントとなる導電体4を形成する。
The metal thin film forming the conductor 4 is formed by sputtering or vacuum deposition, which is known as a dry method, and then a film formed by electroless plating or electroplating, which is known as an immersion method, is superimposed thereon. Copper, copper-zinc alloy, silver, mixtures thereof, etc. can be used as the material. A conductor 4, which will become a fuse element, is formed on the metal thin film by patterning it using conventional photoetching.

前記導電体4の形状は、端面電極3の対向方向に対して
直交する複数の導電部4aよと、隣接する導電部4a1
を接続し円弧状に湾曲する湾曲導電部4bとを交互に配
し、略矩形波形状の波形を成す。また導電部4a□の中
央部には、他の導電部に比べ幅の狭い挟小部4a、を形
成している。
The shape of the conductor 4 is such that a plurality of conductive parts 4a perpendicular to the facing direction of the end electrode 3 and an adjacent conductive part 4a1
Curved conductive portions 4b connected to each other and curved in an arc shape are arranged alternately to form a substantially rectangular waveform. Further, a narrow portion 4a having a narrower width than other conductive portions is formed in the center of the conductive portion 4a□.

また、形成した導電体4の金属薄膜の上には、更に薄い
無電解ニッケル・リン膜5を形成する。
Further, on the formed metal thin film of the conductor 4, an even thinner electroless nickel/phosphorous film 5 is formed.

次に端面電極3を公知の方法で形成する。まず、チップ
基板2の対向する側面にめっき下地電極6を形成し、め
っき下地電極6と導電体4との電気的接続部に厚い銅め
っきを施して銅電極7を形成し、最後に銅電極7上に、
表面実装の際ハンダぬれ性の良好なハンダめっきを行い
めっき電極8を形成し端面電極3とする。前記ハンダめ
っきの代りに銅めっきの後、薄いニッケルめっきを施し
、前記導電体4も含めて金の置換めっきを行っても良い
Next, the end face electrode 3 is formed by a known method. First, plating base electrodes 6 are formed on opposing sides of the chip substrate 2, thick copper plating is applied to the electrical connections between the plating base electrodes 6 and the conductor 4 to form copper electrodes 7, and finally the copper electrodes 7 on top,
During surface mounting, solder plating with good solder wettability is performed to form plated electrodes 8, which serve as end surface electrodes 3. Instead of the solder plating, copper plating may be followed by thin nickel plating, and gold displacement plating may be performed on the conductor 4 as well.

以上のように形成したチップ型ヒユーズlに過電流が流
れた場合、導電体4は各挟小部4a2で瞬時に確実に溶
断されて電流を遮断する。また、この溶断に際しては、
導電体4に挟小部4a2が複数存在すること及び導電体
4を波形に形成したこと等から一種のタイムラグ性能を
発揮すると共に、再アークを十分防止し得る絶縁ギャッ
プを両端面電極3間に確実に得ることができる。このと
き、導電体4の湾曲導電部4a1には前述した第4図(
a)に示すような角部45がないため、電流は湾曲導電
部4a1の全幅に亘って略−様に流れるため、この箇所
での部分的な溶融は低減される。
When an overcurrent flows through the chip-type fuse l formed as described above, the conductor 4 is instantly and reliably fused at each of the pinched portions 4a2 to cut off the current. In addition, when this melting occurs,
Due to the presence of a plurality of pinched portions 4a2 in the conductor 4 and the waveform formation of the conductor 4, it exhibits a kind of time lag performance, and an insulating gap that can sufficiently prevent re-arcing is created between the electrodes 3 on both end faces. You can definitely get it. At this time, the curved conductive portion 4a1 of the conductor 4 is attached to the curved conductive portion 4a1 shown in FIG.
Since there is no corner 45 as shown in a), the current flows in a substantially negative direction over the entire width of the curved conductive portion 4a1, so that partial melting at this location is reduced.

また、チップ型ヒユーズは第2図(a)、(b)に示す
ようにチップ基Fi、2の対向する両側部にサイドスル
ーホール9を設け、端面電極3とすることもできる。
Further, the chip type fuse can be formed into an end surface electrode 3 by providing side through holes 9 on both opposing sides of the chip base Fi, 2 as shown in FIGS. 2(a) and 2(b).

なお、前記チップ型ヒユーズ1を回路基板に実装後、シ
リコン樹脂コート及びエポキシ樹脂封止処理等を施すこ
とにより、導電体4の溶断部で発生する金属蒸気による
アークの連続が防止され、−層信頼性の高い回路遮断性
能を発揮する。
After mounting the chip-type fuse 1 on the circuit board, applying a silicone resin coating and epoxy resin sealing treatment prevents arcing due to metal vapor generated at the fused portion of the conductor 4, and Demonstrates highly reliable circuit breaking performance.

11叢主 以下に示す3種のチップ型ヒユーズを用いて交流電流に
よる溶断試験を行った。
A fusing test using alternating current was conducted using three types of chip-type fuses shown below.

〈試験方法〉 試験試料36となるチップ型ヒユーズA、B。<Test method> Chip type fuses A and B serve as test sample 36.

Cを試験回路基板30にハンダ付け34を行ない、引出
しり−ド31を取付けた後、この試験回路基板30の上
面をシリコン樹脂35で被覆する。この後、試験ケース
32内の中央に挿入し、この周囲にエポキシ樹脂33を
注形する。この状態で引出しリード31間に試験電圧と
して200V、250V、300Vを加え、異常破壊す
るチップ型ヒユーズの個数を調べる。
After soldering 34 to the test circuit board 30 and attaching the drawer door 31, the upper surface of the test circuit board 30 is covered with silicone resin 35. Thereafter, it is inserted into the center of the test case 32, and epoxy resin 33 is cast around it. In this state, test voltages of 200V, 250V, and 300V are applied between the extraction leads 31, and the number of chip-type fuses that break down abnormally is determined.

〈試験対象〉 A・・・前記第1図に示した本発明に係るチップ型ヒユ
ーズ。
<Test object> A...Chip-type fuse according to the present invention shown in FIG. 1 above.

B・・・前記Aにおいて導電部4a1に挟小部4a2を
形成せず、導電部4a、と湾曲導電部4bとの幅を全て
一定とし導電 体4を形成したチップ型ヒユーズ。
B: A chip-type fuse in which the narrow portion 4a2 is not formed in the conductive portion 4a1 in the above A, and the conductor 4 is formed with the widths of the conductive portion 4a and the curved conductive portion 4b all being constant.

C・・・導電体4の形状を前述した第4図(a)に示す
矩形波形状に形成したチップ型 ヒユーズ。
C: A chip type fuse in which the conductor 4 is formed into the rectangular wave shape shown in FIG. 4(a).

本抵抗値(A、B、C)−−−1,1+0.1Ωく試験
結果〉 試験結果を表1に示す。
Main resistance values (A, B, C)---1,1+0.1Ω Test results> The test results are shown in Table 1.

表1 溶断試験で異常破壊した個数(試験数量200個
)チップ型ヒユーズAによる溶断試験後の状況は両端面
電極3の方向に並置して設けた挟小部4a2を中心に両
端面電極間に広範囲の絶縁ギャップが形成されており、
シリコン樹脂による消弧作用による相乗効果とともに、
両アーク放電電圧を高めている。一方、挟小部4a2の
形成しないチップ型ヒユーズBや従来品によるチップ型
ヒユーズCの場合、放電箇所は特定されず、また、導電
体4も角のある形状(C参照)のため再アーク放電電圧
も低くなり、再アークによる異常破壊を生じ、回路遮断
素子として十分機能していないことが確認された。
Table 1 Number of abnormally broken pieces in the fusing test (test quantity: 200 pieces) The situation after the fusing test with the chip type fuse A is between the both end face electrodes around the narrow part 4a2 provided in parallel in the direction of the both end face electrodes 3. A wide insulation gap is formed,
Along with the synergistic effect of the arc-extinguishing effect of silicone resin,
Both arc discharge voltages are increased. On the other hand, in the case of a chip-type fuse B that does not have the narrow part 4a2 or a chip-type fuse C that is a conventional product, the discharge location is not specified, and the conductor 4 also has an angular shape (see C), so re-arcing occurs. The voltage also became low, causing abnormal breakdown due to re-arcing, and it was confirmed that it was not functioning adequately as a circuit breaker element.

以上のようにチップ型ヒユーズAは、AC300v以下
の回路でシリコン樹脂の被覆がなされるハイブリッドI
C回路に使用されるヒユーズとして信頼の高い素子であ
り、安全対策部品としてきわめて有益であり、また角形
チップ抵抗器等の共通仕様で大量に生産可能である。
As mentioned above, the chip type fuse A is a hybrid I which is coated with silicone resin in a circuit of AC300v or less.
It is a highly reliable element as a fuse used in C circuits, is extremely useful as a safety component, and can be mass-produced with common specifications such as square chip resistors.

〈発明の効果〉 本発明に係るチップ型ヒユーズは、一対の端面電極を電
気的に接続する波形の導電体の複数箇所、即ち前記端面
電極の対向方向に対してクロスする複数の導電部に、他
の導電体に比して幅の狭い挟小部を設ける構成を採用し
た。従って過電流が流れた場合、前記導電体はこの複数
の挟小部で確実に遮断されるため、前記端面電極間に所
望の絶縁ギャップを得ることができ、高い回路安全性を
発揮するものである。
<Effects of the Invention> The chip-type fuse according to the present invention has a plurality of conductive portions that electrically connect a pair of end surface electrodes, that is, a plurality of conductive portions that cross with respect to the opposing direction of the end surface electrodes. A configuration was adopted in which a narrow portion is provided that is narrower than other conductors. Therefore, when an overcurrent flows, the conductor is reliably cut off by the plurality of small parts, so a desired insulation gap can be obtained between the end electrodes, and high circuit safety is achieved. be.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)は本発明に係るチップ型ヒユーズを示す平
面図、第1図(b)は第1図(a)の■−IJi断面図
、第2図(a)は他の実施例を示す平面図、第2図(b
)は第2図(a)(7)n−n線断面図、第3図(a)
は試験状態を示す側面図、第3図(b)は第3図(a)
のm−m線断面図、第4図(a)、(b)は従来のチッ
プ型ヒユーズを示す平面図である。 1・・チップ型ヒユーズ、2・・チップ基板、3・・端
面電極、4・・導電体、4ai・・導電部、4a、・・
挟小部、4b・・湾曲導電部。 !/図 tσノ (b) 図 (b)
FIG. 1(a) is a plan view showing a chip-type fuse according to the present invention, FIG. 1(b) is a sectional view taken along the line 1-IJi in FIG. 1(a), and FIG. 2(a) is another embodiment. 2 (b)
) are cross-sectional views taken along line nn in Figures 2(a) and (7), and Figure 3(a).
Figure 3(b) is a side view showing the test condition, Figure 3(a) is
FIGS. 4(a) and 4(b) are plan views showing a conventional chip type fuse. 1... Chip type fuse, 2... Chip substrate, 3... End surface electrode, 4... Conductor, 4ai... Conductive part, 4a,...
Pincer part, 4b... curved conductive part. ! /Figure tσノ(b) Figure (b)

Claims (1)

【特許請求の範囲】 1)絶縁性のチップ基板と、該チップ基板の対向する両
側部に形成した一対の端面電極と、前記チップ基板上面
に形成し、前記一対の端面電極を電気的に接続する波形
の導電体とを有するチップ型ヒューズにおいて、 前記波形の導電体における前記端面電極の対向方向に対
してクロスする複数の導電部に、他の導電体に比して幅
の狭い挟小部を設けることを特徴とするチップ型ヒュー
ズ。 2)前記導電体は、前記挟小部を設けた導電部と、円弧
状に湾曲する湾曲導電部とを交互に配して前記波形を形
成することを特徴とする請求項1記載のチップ型ヒュー
ズ。 3)前記導電体を形成する金属薄膜は、銅、銅−亜鉛合
金、銀又はこれらの混合物から形成すると共に、前記導
電体の金属薄膜上に無電解ニッケル・リン膜を形成し、
表面を被覆することを特徴とする請求項1記載のチップ
型ヒューズ。
[Scope of Claims] 1) An insulating chip substrate, a pair of end surface electrodes formed on opposite sides of the chip substrate, and an electrical connection between the pair of end surface electrodes formed on the top surface of the chip substrate. In a chip type fuse having a waveform conductor, a plurality of conductive portions of the waveform conductor that cross the direction in which the end face electrodes face each other are provided with narrow portions having a width narrower than other conductors. A chip type fuse characterized by being provided with. 2) The chip type according to claim 1, wherein the conductor is formed by alternately arranging conductive parts provided with the narrow portions and curved conductive parts curved in an arc shape to form the waveform. fuse. 3) The metal thin film forming the conductor is formed from copper, copper-zinc alloy, silver, or a mixture thereof, and an electroless nickel-phosphorus film is formed on the metal thin film of the conductor,
The chip type fuse according to claim 1, characterized in that the surface is coated.
JP13696790A 1990-05-29 1990-05-29 Chip type fuse Pending JPH0433230A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13696790A JPH0433230A (en) 1990-05-29 1990-05-29 Chip type fuse

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13696790A JPH0433230A (en) 1990-05-29 1990-05-29 Chip type fuse

Publications (1)

Publication Number Publication Date
JPH0433230A true JPH0433230A (en) 1992-02-04

Family

ID=15187671

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13696790A Pending JPH0433230A (en) 1990-05-29 1990-05-29 Chip type fuse

Country Status (1)

Country Link
JP (1) JPH0433230A (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07504296A (en) * 1992-02-28 1995-05-11 エーヴイエックス コーポレーション thin film surface mount fuse
WO1996041359A1 (en) * 1995-06-07 1996-12-19 Littelfuse, Inc. Improved method and apparatus for a surface-mounted fuse device
US5790008A (en) * 1994-05-27 1998-08-04 Littlefuse, Inc. Surface-mounted fuse device with conductive terminal pad layers and groove on side surfaces
US5844477A (en) * 1994-05-27 1998-12-01 Littelfuse, Inc. Method of protecting a surface-mount fuse device
US5974661A (en) * 1994-05-27 1999-11-02 Littelfuse, Inc. Method of manufacturing a surface-mountable device for protection against electrostatic damage to electronic components
JP2002203468A (en) * 2001-01-04 2002-07-19 Kengo Hirose Fuse link
JP2005039220A (en) * 2003-06-26 2005-02-10 Nec Electronics Corp Semiconductor device
US6878004B2 (en) 2002-03-04 2005-04-12 Littelfuse, Inc. Multi-element fuse array
US7233474B2 (en) 2003-11-26 2007-06-19 Littelfuse, Inc. Vehicle electrical protection device and system employing same
JP2010080418A (en) * 2007-11-08 2010-04-08 Panasonic Corp Circuit protective device and method for manufacturing the same
CN104599917A (en) * 2015-02-14 2015-05-06 南京萨特科技发展有限公司 Protecting element

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61266539A (en) * 1985-05-22 1986-11-26 Mitsubishi Shindo Kk Alloy for fuse
JPS63141233A (en) * 1986-12-01 1988-06-13 オムロン株式会社 Chip type fuse
JPS63213628A (en) * 1987-03-02 1988-09-06 Nippon Mining Co Ltd Copper alloy for fuse
JPH0243701A (en) * 1988-08-03 1990-02-14 Koa Corp Chip type fuse resistor and manufacture thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61266539A (en) * 1985-05-22 1986-11-26 Mitsubishi Shindo Kk Alloy for fuse
JPS63141233A (en) * 1986-12-01 1988-06-13 オムロン株式会社 Chip type fuse
JPS63213628A (en) * 1987-03-02 1988-09-06 Nippon Mining Co Ltd Copper alloy for fuse
JPH0243701A (en) * 1988-08-03 1990-02-14 Koa Corp Chip type fuse resistor and manufacture thereof

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07504296A (en) * 1992-02-28 1995-05-11 エーヴイエックス コーポレーション thin film surface mount fuse
US5790008A (en) * 1994-05-27 1998-08-04 Littlefuse, Inc. Surface-mounted fuse device with conductive terminal pad layers and groove on side surfaces
US5844477A (en) * 1994-05-27 1998-12-01 Littelfuse, Inc. Method of protecting a surface-mount fuse device
US5943764A (en) * 1994-05-27 1999-08-31 Littelfuse, Inc. Method of manufacturing a surface-mounted fuse device
US5974661A (en) * 1994-05-27 1999-11-02 Littelfuse, Inc. Method of manufacturing a surface-mountable device for protection against electrostatic damage to electronic components
US6023028A (en) * 1994-05-27 2000-02-08 Littelfuse, Inc. Surface-mountable device having a voltage variable polgmeric material for protection against electrostatic damage to electronic components
WO1996041359A1 (en) * 1995-06-07 1996-12-19 Littelfuse, Inc. Improved method and apparatus for a surface-mounted fuse device
JP2002203468A (en) * 2001-01-04 2002-07-19 Kengo Hirose Fuse link
US6878004B2 (en) 2002-03-04 2005-04-12 Littelfuse, Inc. Multi-element fuse array
JP2005039220A (en) * 2003-06-26 2005-02-10 Nec Electronics Corp Semiconductor device
US7795699B2 (en) 2003-06-26 2010-09-14 Nec Electronics Corporation Semiconductor device
US7233474B2 (en) 2003-11-26 2007-06-19 Littelfuse, Inc. Vehicle electrical protection device and system employing same
JP2010080418A (en) * 2007-11-08 2010-04-08 Panasonic Corp Circuit protective device and method for manufacturing the same
US9035740B2 (en) 2007-11-08 2015-05-19 Panasonic Intellectual Property Management Co., Ltd. Circuit protective device and method for manufacturing the same
CN104599917A (en) * 2015-02-14 2015-05-06 南京萨特科技发展有限公司 Protecting element
CN104599917B (en) * 2015-02-14 2017-03-08 南京萨特科技发展有限公司 A kind of protection element

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