JPH04325679A - Substrate holder - Google Patents

Substrate holder

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Publication number
JPH04325679A
JPH04325679A JP12470391A JP12470391A JPH04325679A JP H04325679 A JPH04325679 A JP H04325679A JP 12470391 A JP12470391 A JP 12470391A JP 12470391 A JP12470391 A JP 12470391A JP H04325679 A JPH04325679 A JP H04325679A
Authority
JP
Japan
Prior art keywords
substrate holder
substrate
holder
substrates
alloy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12470391A
Other languages
Japanese (ja)
Inventor
Michio Nagase
長瀬 道夫
Chikara Hayashi
林 主税
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vacuum Metallurgical Co Ltd
Original Assignee
Vacuum Metallurgical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vacuum Metallurgical Co Ltd filed Critical Vacuum Metallurgical Co Ltd
Priority to JP12470391A priority Critical patent/JPH04325679A/en
Publication of JPH04325679A publication Critical patent/JPH04325679A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To prevent the failure in mounting of substrates and the dislodgment from the substrate holder of an inline type sputtering device without generating plastic deformation even in a high-temp. atmosphere by constituting the above- mentioned holder of Ti or Ti alloy. CONSTITUTION:The substrate holder 1 used in the inline type sputtering device in which a robot is used for attaching and detaching the substrates is constituted of a sheet consisting of the Ti or Ti alloy having plural substrate holding parts 7. Nearly circular apertures 9 are formed in the substrate holding parts 7 and U-shaped grooves 10 are formed in the peripheral edge parts on the lower side thereof. The circular substrates transported by the robot are held in the grooves 10 in the apertures 9. The substrate holder 1 is made of the Ti or Ti alloy and, therefore, the generation of the plastic deformation by the effect of high temp. does not arise at the time of putting the holder 1 into the high- temp. atmosphere of >=300 deg.C and forming the films by sputtering. The failure in mounting the substrates to the holding parts 7 of the substrate holder 1 and the dislodgment of the substrates from the holder 1 are thus prevented.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は基板ホルダー、特に基板
の脱着にロボットを用いるインライン式スパッタリング
装置に用いて最適な基板ホルダーに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate holder, and more particularly to a substrate holder suitable for use in an in-line sputtering apparatus that uses a robot to attach and detach a substrate.

【0002】0002

【従来の技術及びその問題点】図1は従来のインライン
式スパッタリング装置における基板の着脱装置の全体を
示すものであるが、図2及び図3にその詳細が明示され
る基板ホルダー1は例えば特開昭61−6274号公報
に開示されているが、図示されていない真空室から取出
された位置において示されており、その下端部には支持
部14が一体的に形成されており、真空室内に設けられ
図示されていない搬送機構により固持されて基板ホルダ
ー1を真空室内に導入し所定の位置に配設するか、また
は基板を着脱するために図示の位置に真空室から上記搬
送機構により外部へと取出されるようになっている。こ
の基板ホルダー1の近傍にロボット本体3が配設され、
これはハンド2を備えており図において上下方向及び左
右方向にロボット本体3内に設けられる駆動機構により
移動可能となっている。
[Prior Art and its Problems] FIG. 1 shows the entire structure of a substrate attachment/detachment device in a conventional in-line sputtering apparatus. Although disclosed in JP-A No. 61-6274, it is shown in a position taken out from a vacuum chamber (not shown), and a support part 14 is integrally formed at the lower end of the support part 14. The substrate holder 1 can be introduced into the vacuum chamber and fixed by a transport mechanism (not shown) installed in the vacuum chamber and placed at a predetermined position, or it can be moved from the vacuum chamber to the position shown in the diagram by the transport mechanism outside to attach or remove the substrate. It is now being taken out. A robot main body 3 is arranged near this substrate holder 1,
This robot is equipped with a hand 2, which can be moved vertically and horizontally in the figure by a drive mechanism provided within the robot body 3.

【0003】図2において基板ホルダー1は薄板で成り
、これに9個の基板保持部7が形成されている(上記公
報では更に多数の基板保持部が形成されているが図を簡
略化するために9個とする)。これらはそれぞれほゞ円
形の開口9及びこの下側周縁部に図3に明示されるよう
なコ字形状の溝10を備えている。このような溝10は
弧状に延びているがロボット本体3により搬送された円
形の基板を開口9にもたらし、所定の位置においてハン
ド2の操作によりこの基板を溝10に保持させるように
している。各基板保持部7に基板を上述するように保持
させた後、図1において基板ホルダー1をその支持部1
4を固持して搬送機構により真空室内に導入し、公知の
スパッタリング操作を行う。
In FIG. 2, the substrate holder 1 is made of a thin plate, on which nine substrate holding parts 7 are formed (in the above publication, a larger number of substrate holding parts are formed, but for the sake of simplifying the diagram, ). Each of these is provided with a substantially circular opening 9 and a U-shaped groove 10 on its lower periphery as best seen in FIG. Although the groove 10 extends in an arc, a circular substrate carried by the robot body 3 is brought into the opening 9, and the substrate is held in the groove 10 by operating the hand 2 at a predetermined position. After each substrate holding section 7 holds the substrate as described above, the substrate holder 1 is moved to its supporting section 1 in FIG.
4 is held firmly and introduced into a vacuum chamber by a transport mechanism, and a known sputtering operation is performed.

【0004】以上述べたように、インライン式連続スパ
ッタリング成膜装置用基板ホルダーとは基板を装荷して
スパッタリング装置内を搬送するための治具である。
As described above, the substrate holder for an in-line continuous sputtering film forming apparatus is a jig for loading a substrate and transporting it within the sputtering apparatus.

【0005】300℃を超える温度条件の雰囲気で成膜
するインライン式成膜装置用基板ホルダーでは成膜工程
中の加熱で塑性変形しないことが要求される。理由は■
基板が基板ホルダーに確実に装荷できること、■搬送中
に基板が基板ホルダーから脱落しないこと、及び■搬送
行程路中で基板ホルダーとスパッタリング装置内部の周
辺部品との寸法の取り合いが不良となって、搬送不能と
ならないようにするためである。
[0005] A substrate holder for an in-line film forming apparatus that forms a film in an atmosphere with a temperature of over 300° C. is required to not undergo plastic deformation due to heating during the film forming process. The reason is■
■ The substrate must be reliably loaded onto the substrate holder, ■ The substrate must not fall off the substrate holder during transportation, and ■ The dimensional alignment between the substrate holder and peripheral parts inside the sputtering equipment may become defective during the transportation process. This is to prevent transport from becoming impossible.

【0006】従来は、基板ホルダーはアルミ合金又はス
テンレス鋼で形成されているが、これら材質には以下の
問題点がある。
Conventionally, substrate holders have been made of aluminum alloy or stainless steel, but these materials have the following problems.

【0007】(1)アルミ合金の問題点は、アルミ合金
は室温では鋼に匹敵する機械強度を持つ材料もあるが、
200℃以上から機械的強度が急激に低下して、300
℃以上では実用的な強度を維持することはできず、塑性
変形する。図4、図5は代表的な高強度アルミ合金の機
械強度−温度特性である。アルミ合金は高温の機械強度
が低いといわれており300℃以上での信頼性のある機
械特性に関する資料は少ない。
(1) The problem with aluminum alloys is that some aluminum alloys have mechanical strength comparable to steel at room temperature, but
Mechanical strength rapidly decreases from 200°C or higher, reaching 300°C.
At temperatures above ℃, practical strength cannot be maintained and plastic deformation occurs. 4 and 5 show the mechanical strength-temperature characteristics of typical high-strength aluminum alloys. Aluminum alloys are said to have low mechanical strength at high temperatures, and there are few materials regarding reliable mechanical properties at temperatures above 300°C.

【0008】(2)ステンレス鋼の問題点は、高温での
機械強度は大きいが熱伝導率が小さいので基板ホルダー
のように赤外線ヒータによる輻射加熱を行なうと局部的
な温度むらができやすい。また、ステンレス鋼は熱膨張
係数も大きいので部分的な温度のむらが大きな熱膨張差
となって現れる。その結果、大きな内部応力が発生して
塑性変形に至る。
(2) The problem with stainless steel is that although it has high mechanical strength at high temperatures, it has low thermal conductivity, so when it is heated by radiation using an infrared heater like a substrate holder, local temperature unevenness tends to occur. Furthermore, since stainless steel has a large coefficient of thermal expansion, local temperature unevenness appears as a large difference in thermal expansion. As a result, large internal stress occurs, leading to plastic deformation.

【0009】以上の問題点により、300℃を超える温
度条件で成膜される基板、例えば、磁気記録用ハードデ
ィスクの磁性膜の成膜や液晶ディスプレイの透明電導膜
の成膜などを行なう時の基板搬送用に利用する場合、上
記の■■■の問題がしばしば生じていた。
[0009] Due to the above-mentioned problems, substrates on which films are formed at temperatures exceeding 300°C, for example, substrates used for forming magnetic films for magnetic recording hard disks or transparent conductive films for liquid crystal displays, etc. When used for transportation, the above-mentioned problems often occur.

【0010】0010

【発明が解決しようとする問題点】本発明は上記問題に
鑑みてなされ、300°以上の加熱雰囲気内で基板に成
膜を施す場合でも、上記■■■の問題が生ずることのな
い基板ホルダーを提供することを目的とする。
Problems to be Solved by the Invention The present invention has been made in view of the above-mentioned problems, and provides a substrate holder that does not cause the above-mentioned problems even when forming a film on a substrate in a heated atmosphere of 300° or more. The purpose is to provide

【0011】[0011]

【問題点を解決するための手段】上記目的は、加熱雰囲
気内で成膜される基板を保持するための基板ホルダーに
おいて、チタン又はチタン合金で形成されたことを特徴
とする基板ホルダー、によって達成される。
[Means for solving the problem] The above object is achieved by a substrate holder for holding a substrate to be formed into a film in a heated atmosphere, which is characterized by being made of titanium or a titanium alloy. be done.

【0012】0012

【作用】チタン又はチタン合金は300℃以上に加熱さ
れても耐力、最大耐変形温度差が従来の材質より大きい
ので塑性変形することなく、よって基板は確実にこの基
板ホルダーに装荷でき、またその装荷も円滑に行なうこ
とができる。基板が搬送中に基板ホルダーから脱落する
ことはなく、またスパッタリング装置内の各部との寸法
の取り合いが不良となって搬送不能となることはない。
[Function] Even when titanium or titanium alloy is heated to over 300°C, its yield strength and maximum deformation resistance temperature difference are larger than those of conventional materials, so it does not undergo plastic deformation. Therefore, the substrate can be reliably loaded onto this substrate holder, and its Loading can also be carried out smoothly. The substrate will not fall off the substrate holder during transportation, and the substrate will not be unable to be transported due to poor dimensional alignment with various parts within the sputtering apparatus.

【0013】[0013]

【実施例】本発明の実施例による基板ホルダーは図2に
示す従来例のそれと形状は同一であるとする。然しなが
ら、材質は異なり、チタン又はチタン合金で形成される
DESCRIPTION OF THE PREFERRED EMBODIMENTS It is assumed that the substrate holder according to the embodiment of the present invention has the same shape as that of the conventional example shown in FIG. However, the material is different and is made of titanium or a titanium alloy.

【0014】次に従来の材質であるステンレスで形成さ
れる基板ホルダーの特性と比較するためにまず加熱によ
り生ずる材質の内部応力について説明する。
Next, in order to compare the characteristics of a substrate holder made of stainless steel, which is a conventional material, the internal stress of the material caused by heating will be explained first.

【0015】加熱による変形の原因は一体をなした基板
ホルダーを熱輻射によって加熱すると、部分的に温度む
らを生じることにある。部分的な温度むらは部分的な熱
膨張差となって現れ、材料内に内部応力が発生する。こ
の内部応力が材料の耐力以上になると基板ホルダーは塑
性変形する。
The cause of deformation due to heating is that when an integrated substrate holder is heated by thermal radiation, temperature unevenness occurs locally. Local temperature unevenness appears as a local thermal expansion difference, which generates internal stress within the material. When this internal stress exceeds the proof stress of the material, the substrate holder is plastically deformed.

【0016】熱膨張差により発生する内部応力の式はσ
=E×α×ΔT/2(1−ν)と表される。ここで、σ
:発生する内部応力、E:縦弾性係数、α:熱膨張係数
、ΔT:温度差、ν:ポアソン比である。
The formula for the internal stress caused by the difference in thermal expansion is σ
It is expressed as =E×α×ΔT/2(1−ν). Here, σ
: generated internal stress, E: longitudinal elastic modulus, α: thermal expansion coefficient, ΔT: temperature difference, ν: Poisson's ratio.

【0017】従って、上記式により計算された内部応力
σが材料の耐力を超えなければその材料は加熱により同
一の材料内で熱膨張の差があったとしても塑性変形する
ことはない。
Therefore, if the internal stress σ calculated by the above formula does not exceed the proof stress of the material, the material will not undergo plastic deformation due to heating even if there is a difference in thermal expansion within the same material.

【0018】ステンレス鋼、各種チタン材の高温部が3
00℃〜450℃付近の温度となった場合に塑性変形が
生じる低温部との温度差を下記の表1に示す。
[0018] High temperature parts of stainless steel and various titanium materials are 3
Table 1 below shows the temperature difference with the low temperature part where plastic deformation occurs when the temperature is around 00°C to 450°C.

【0019】[0019]

【表1】[Table 1]

【0020】上記表1で明らかなようにチタン材はステ
ンレス鋼に比べて大きな温度差が生じても塑性変形に至
らない。
As is clear from Table 1 above, titanium material does not undergo plastic deformation even when a large temperature difference occurs compared to stainless steel.

【0021】また、アルミ合金に対しては前述のように
300℃を超える温度では200℃までの機械強度特性
より推定してチタン材より劣ることは明らかである。
Furthermore, as mentioned above, it is clear that aluminum alloys are inferior to titanium materials at temperatures above 300°C, as estimated from the mechanical strength properties up to 200°C.

【0022】上記の温度領域は磁気記録用ハードディス
クや液晶表示板用の酸化インジウム錫透明電導膜をPV
D法により成膜する場合の温度条件として充分な実用的
温度である。従って、表1の値はチタン材が実用温度領
域では充分な耐変形強度を有することを示している。
The above temperature range applies to PV indium tin oxide transparent conductive films for magnetic recording hard disks and liquid crystal display panels.
This temperature is sufficient for practical use as a temperature condition when forming a film by method D. Therefore, the values in Table 1 indicate that the titanium material has sufficient deformation resistance in the practical temperature range.

【0023】次に磁気記録用ハードディスクの成膜に使
用する基板ホルダーとして使用した場合の具体例につい
て説明する。
Next, a specific example of use as a substrate holder for film formation of a magnetic recording hard disk will be described.

【0024】磁気記録用ハードディスクとして使用した
場合、基板ホルダーが変形して問題となるのは以下の点
である。
When used as a magnetic recording hard disk, deformation of the substrate holder poses the following problems.

【0025】(1)ロボットによる基板ホルダーへの基
板装着が不能となる。(2)基板ホルダーに装着された
基板が搬送中に脱落する。(3)成膜後の基板を基板ホ
ルダーから取りはずすとき、ロボットで取りはずし不能
となる。(4)基板ホルダーの搬送行程路途中の基板ホ
ルダーと成膜装置内の相接する部品との間の寸法が相互
に干渉するようになり、搬送が不能となる。
(1) It becomes impossible for the robot to mount the substrate on the substrate holder. (2) The substrate mounted on the substrate holder falls off during transportation. (3) When removing the substrate after film formation from the substrate holder, the robot cannot remove it. (4) Transporting the substrate holder The dimensions of the substrate holder and adjacent parts in the film forming apparatus in the middle of the transport path come to interfere with each other, making transport impossible.

【0026】上記の不具合をアルミ合金製(JISA5
052材)基板ホルダーとチタン製(Ti2種)基板ホ
ルダーを製作して、成膜テストを行ない、不具合の発生
率を比較した(テスト条件=成膜中の基板ホルダー温度
条件;350℃、製作した基板ホルダー:基板外径5.
25インチ用−基板ホルダー1枚の基板装着数:9枚、
同3.5インチ用;16枚、同2.5インチ用;25枚
。テスト基板数量:10,000枚及び6ケ月以上)。 下記表2に基板装着不能、基板脱落、基板取りはずし不
能の発生比率を、下記表3に搬送不能となるまでの使用
期間を示す。
[0026] The above defects can be solved by using aluminum alloy (JISA5
052 material) substrate holder and a titanium (Ti type 2) substrate holder were fabricated, a film formation test was conducted, and the incidence of defects was compared (test conditions = substrate holder temperature conditions during film formation; 350°C; fabricated. Board holder: Board outer diameter 5.
For 25 inches - Number of boards installed in one board holder: 9,
16 sheets for 3.5 inches, 25 sheets for 2.5 inches. Test board quantity: 10,000 pieces and over 6 months). Table 2 below shows the incidence of failure to mount the board, fall off of the board, and failure to remove the board, and Table 3 below shows the period of use until transport becomes impossible.

【0027】[0027]

【表2】[Table 2]

【0028】[0028]

【表3】[Table 3]

【0029】上記表2から明らかなように、いずれの大
きさの磁気記録用ハードディスクにおいても、本発明の
チタン、又はチタン合金でなる基板ホルダーの方が各特
性において不具合の発生率がはるかに小となっている。 すなわち、装着不能となるものはアルミ合金でなる基板
ホルダーと比べ、0.12から0.02、0.14から
0.03、0.15から0.03%と大巾に減少してお
り、また脱落するものに至っては零である。更に取りは
ずし不能となるものについても、アルミ合金でなる基板
ホルダーが0.04、0.06及び0.07であるのに
対し、各々0.01、0.01、0.01%と殆ど零に
近い。
As is clear from Table 2 above, for magnetic recording hard disks of any size, the substrate holder made of titanium or titanium alloy of the present invention has a much lower incidence of defects in each characteristic. It becomes. In other words, compared to substrate holders made of aluminum alloy, the number of devices that cannot be mounted is significantly reduced from 0.12 to 0.02, from 0.14 to 0.03, and from 0.15 to 0.03%. Moreover, the number of things that fall off is zero. Furthermore, regarding non-removable items, the percentages for substrate holders made of aluminum alloy are 0.04, 0.06, and 0.07, while the percentages are 0.01, 0.01, and 0.01%, respectively, which are almost zero. close.

【0030】更に表3から明らかなように基板を装着し
て搬送不能になるまでの使用期間についても各大きさの
ハードディスクに対し、本発明のチタン、又はチタン合
金でなる基板ホルダーの方がはるかに長期間であり、ほ
ぼ倍の期間となっている。
Furthermore, as is clear from Table 3, the period of use from when a board is mounted until it becomes impossible to transport is also shown in that the board holder made of titanium or titanium alloy of the present invention is much longer for hard disks of various sizes. It was a long period of time, almost twice as long.

【0031】以上本発明の実施例について説明したが、
勿論本発明はこれに限定されることなく、本発明の技術
的思想に基いて種々の変形が可能である。
Although the embodiments of the present invention have been described above,
Of course, the present invention is not limited to this, and various modifications can be made based on the technical idea of the present invention.

【0032】例えば以上の実施例ではスパッタリング方
法で基板に成膜する場合について説明したが、勿論他の
化学的、あるいは物理的方法で成膜を施す場合にも本発
明は適用可能である。
For example, in the above embodiments, the case where a film is formed on a substrate by a sputtering method has been described, but the present invention is of course applicable to cases where a film is formed by other chemical or physical methods.

【0033】また以上の実施例では基板ホルダーの基板
保持部は円形の保持部を説明したが、勿論この形状に限
定されることなく、従来存在する全ての基板保持部の形
状にも本発明は適用可能である。
Further, in the above embodiments, the substrate holder of the substrate holder is circular in shape, but the present invention is not limited to this shape, and can be applied to all conventional substrate holder shapes. Applicable.

【0034】[0034]

【発明の効果】以上述べたように、本発明の基板ホルダ
ーによれば、基板に成膜するための加熱温度は300℃
以上であったとしても塑性変形することなく、よってロ
ボットによる基板ホルダーへの基板装着が不能となった
り、基板ホルダーに装着された基板が搬送中に脱落する
ということはなく、また成膜後の基板を基板ホルダーか
ら取りはずすとき、ロボットによる取りはずしが不能と
なるようなことはない。更に基板ホルダーの搬送行程路
途中で成膜装置内で近接する各部品、各部の寸法が基板
ホルダーが大きく変形したために、相互に干渉するとい
うことはなく、従来見られていた搬送が不能となること
はない。また搬送不能になるまでの使用期間は従来の材
質より大巾に長期とすることができる。
Effects of the Invention As described above, according to the substrate holder of the present invention, the heating temperature for forming a film on the substrate is 300°C.
Even if it is above, there will be no plastic deformation, and therefore the robot will not be able to attach the substrate to the substrate holder, or the substrate attached to the substrate holder will not fall off during transportation, and the When removing the substrate from the substrate holder, there is no possibility that the robot will not be able to remove it. Furthermore, because the substrate holder is greatly deformed due to the dimensions of the parts and parts that are close to each other in the film forming apparatus during the transport process of the substrate holder, they do not interfere with each other, and the transport that was previously seen is no longer possible. Never. Furthermore, the period of use before it becomes impossible to transport can be made much longer than with conventional materials.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の実施例の基板ホルダーとロボットとの
相対的位置関係を示す側面図である。
FIG. 1 is a side view showing the relative positional relationship between a substrate holder and a robot according to an embodiment of the present invention.

【図2】図1における基板ホルダーの拡大正面図である
FIG. 2 is an enlarged front view of the substrate holder in FIG. 1.

【図3】図2における[3]−[3]線方向拡大断面図
である。
FIG. 3 is an enlarged sectional view taken along line [3]-[3] in FIG. 2;

【図4】アルミニウムの温度−耐力特性を示すグラフで
ある。
FIG. 4 is a graph showing the temperature-yield strength characteristics of aluminum.

【図5】アルミニウムの温度−引っ張り強さ特性を示す
グラフである。
FIG. 5 is a graph showing the temperature-tensile strength characteristics of aluminum.

【符号の説明】[Explanation of symbols]

1  基板ホルダー 1 Substrate holder

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】  加熱雰囲気内で成膜される基板を保持
するための基板ホルダーにおいて、チタン又はチタン合
金で形成されたことを特徴とする基板ホルダー。
1. A substrate holder for holding a substrate on which a film is to be formed in a heated atmosphere, the substrate holder being made of titanium or a titanium alloy.
【請求項2】  前記基板ホルダーは薄板で成り、円形
の開口を有し、この開口の下側の円周縁部に部分的な溝
を形成させ、この溝に円形の基板の縁部を挿入させ、立
った姿勢で該基板を保持するようにした請求項1に記載
の基板ホルダー。
2. The substrate holder is made of a thin plate and has a circular opening, a partial groove is formed at the lower circumferential edge of the opening, and the edge of the circular substrate is inserted into the groove. 2. The substrate holder according to claim 1, wherein the substrate holder is configured to hold the substrate in a standing position.
【請求項3】  前記加熱雰囲気の加熱温度は300℃
以上である請求項1又は2に記載の基板ホルダー。
3. The heating temperature of the heating atmosphere is 300°C.
The substrate holder according to claim 1 or 2, which is the above.
JP12470391A 1991-04-26 1991-04-26 Substrate holder Pending JPH04325679A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12470391A JPH04325679A (en) 1991-04-26 1991-04-26 Substrate holder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12470391A JPH04325679A (en) 1991-04-26 1991-04-26 Substrate holder

Publications (1)

Publication Number Publication Date
JPH04325679A true JPH04325679A (en) 1992-11-16

Family

ID=14892009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12470391A Pending JPH04325679A (en) 1991-04-26 1991-04-26 Substrate holder

Country Status (1)

Country Link
JP (1) JPH04325679A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6248427B1 (en) 1995-08-16 2001-06-19 Zweckform Etikettiertechnik Gmbh Adhesive label
GB2382631A (en) * 2001-11-15 2003-06-04 Daido Metal Co Sliding member with composite plating film
DE102005045718A1 (en) * 2005-09-24 2007-04-05 Applied Materials Gmbh & Co. Kg Carrier for a substrate
DE102005045717B3 (en) * 2005-09-24 2007-05-03 Applied Materials Gmbh & Co. Kg Carrier for a substrate
KR100979383B1 (en) * 2005-06-27 2010-08-31 엘지디스플레이 주식회사 Sputtering apparatus

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6248427B1 (en) 1995-08-16 2001-06-19 Zweckform Etikettiertechnik Gmbh Adhesive label
GB2382631A (en) * 2001-11-15 2003-06-04 Daido Metal Co Sliding member with composite plating film
GB2382631B (en) * 2001-11-15 2004-05-19 Daido Metal Co Sliding member with composite plating film
KR100979383B1 (en) * 2005-06-27 2010-08-31 엘지디스플레이 주식회사 Sputtering apparatus
US7820016B2 (en) 2005-06-27 2010-10-26 Lg Display Co., Ltd. Sputtering apparatus and method of preventing damage thereof
US8052853B2 (en) 2005-06-27 2011-11-08 Lg Display Co., Ltd. Sputtering apparatus and method of preventing damage thereof
DE102005045718A1 (en) * 2005-09-24 2007-04-05 Applied Materials Gmbh & Co. Kg Carrier for a substrate
DE102005045717B3 (en) * 2005-09-24 2007-05-03 Applied Materials Gmbh & Co. Kg Carrier for a substrate
DE102005045718B4 (en) * 2005-09-24 2009-06-25 Applied Materials Gmbh & Co. Kg Carrier for a substrate
US8083912B2 (en) 2005-09-24 2011-12-27 Applied Materials Gmbh & Co. Kg. Substrate carrier

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