JPH04276078A - Chemical vapor growth method - Google Patents
Chemical vapor growth methodInfo
- Publication number
- JPH04276078A JPH04276078A JP12065991A JP12065991A JPH04276078A JP H04276078 A JPH04276078 A JP H04276078A JP 12065991 A JP12065991 A JP 12065991A JP 12065991 A JP12065991 A JP 12065991A JP H04276078 A JPH04276078 A JP H04276078A
- Authority
- JP
- Japan
- Prior art keywords
- tin
- diketone
- indium
- raw material
- beta
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 12
- 239000000126 substance Substances 0.000 title description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical group [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 25
- 239000002994 raw material Substances 0.000 claims abstract description 12
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims abstract description 11
- 229910003437 indium oxide Inorganic materials 0.000 claims abstract description 10
- 229910052738 indium Inorganic materials 0.000 claims abstract description 6
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical group [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000002019 doping agent Substances 0.000 claims abstract description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 3
- 239000001301 oxygen Substances 0.000 claims abstract description 3
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 3
- 238000005229 chemical vapour deposition Methods 0.000 claims description 8
- 239000007789 gas Substances 0.000 claims description 6
- 125000005594 diketone group Chemical group 0.000 claims description 4
- 239000010408 film Substances 0.000 abstract description 17
- 239000010409 thin film Substances 0.000 abstract description 11
- 239000006200 vaporizer Substances 0.000 abstract description 6
- 239000012159 carrier gas Substances 0.000 abstract description 3
- 238000006467 substitution reaction Methods 0.000 abstract 5
- 239000000463 material Substances 0.000 abstract 4
- 239000000376 reactant Substances 0.000 abstract 4
- 238000010586 diagram Methods 0.000 description 5
- 238000002834 transmittance Methods 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- SKWCWFYBFZIXHE-UHFFFAOYSA-K indium acetylacetonate Chemical compound CC(=O)C=C(C)O[In](OC(C)=CC(C)=O)OC(C)=CC(C)=O SKWCWFYBFZIXHE-UHFFFAOYSA-K 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Photovoltaic Devices (AREA)
- Manufacturing Of Electric Cables (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、化学気相成長方法に関
し、さらに詳しくは、透明導電膜として有用な錫をドー
ピングした酸化インジウム膜の製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chemical vapor deposition method, and more particularly to a method for manufacturing a tin-doped indium oxide film useful as a transparent conductive film.
【0002】0002
【従来の技術】化学気相成長(Chemical V
apor Deposition、CVD)法は、高
性能膜を量産できる方法として広く実用化されている。
酸化インジウム膜の化学気相成長法としては、リヤボヴ
ァ(Ryabova)ら、シン・ソリッド・フィルムズ
(Thin Solid Films)92(19
82)327〜332に報告されている。リヤボヴァら
によれば、酸化インジウム膜合成の原料としてインジウ
ムのアセチルアセトナートが適している。[Prior art] Chemical vapor deposition (Chemical V
The apor deposition (CVD) method has been widely put into practical use as a method for mass-producing high-performance films. As a chemical vapor deposition method of indium oxide film, Ryabova et al., Thin Solid Films 92 (19
82) reported in 327-332. According to Ryabova et al., indium acetylacetonate is suitable as a raw material for synthesizing indium oxide films.
【0003】0003
【発明が解決しようとする課題】しかし、薄膜合成時の
錫の微量添加のみでは膜の低抵抗化が達成されず、リヤ
ボヴァらは成膜後10−2Torrの真空下400℃で
30〜45minアニーリングを行なうことによりを低
抵抗化を図っている。本発明は上記難点に鑑みてなされ
たものであり、その目的とするところは、アニーリング
を行なうことなく、薄膜合成時のドーピングのみで、高
い透明導電性を示す透明導電性薄膜を容易に合成し得る
新たな化学気相成長法の提供にある。[Problems to be Solved by the Invention] However, it was not possible to reduce the resistance of the film by adding only a small amount of tin during thin film synthesis, and Ryabova et al. By doing this, we aim to lower the resistance. The present invention has been made in view of the above-mentioned difficulties, and its purpose is to easily synthesize a transparent conductive thin film exhibiting high transparent conductivity without annealing and only by doping during thin film synthesis. The objective is to provide a new chemical vapor deposition method for obtaining
【0004】0004
【課題を解決するための手段】インジウムのβジケトン
を酸化インジウムの原料、錫のβジケトン、例えば、錫
のβジケトンがビスアセチルアセトナート錫またはビス
アセチルアセトナート錫を錫のドーピング剤として用い
、反応ガスとして、例えば、酸素または空気を原料ガス
に加えることにより、被処理物表面に錫をドーピングし
た酸化インジウム膜を成長させることを特徴とする化学
気相成長方法。[Means for Solving the Problems] A β diketone of indium is used as a raw material for indium oxide, a β diketone of tin, for example, a β diketone of tin is used as a tin bisacetylacetonate or a tin bisacetylacetonate as a doping agent for tin; A chemical vapor deposition method characterized in that a tin-doped indium oxide film is grown on the surface of a workpiece by adding, for example, oxygen or air to a source gas as a reactive gas.
【0005】[0005]
【作用】本発明方法によるときは、取り扱い上も安全な
原料を用いて、少ない工程で、アニーリングを行なって
得られるものより優れた高性能透明導電性膜を容易にに
成長させることができる。[Operation] When the method of the present invention is used, a high-performance transparent conductive film superior to that obtained by annealing can be easily grown using raw materials that are safe to handle and in a small number of steps.
【実施例】以下、本発明の実施例について説明する。図
1に成膜装置の模式図を示す。原料としてアセチルアセ
トナートインジウムを用い、これを180〜190℃に
保った気化器内で気化した。錫源としてビスアセチルア
セトナート錫を用いた。これを気化器内の80℃に保た
れた気化室内で気化し、窒素ガスをキャリアガスとして
これを気化器内に導入した。反応ガスとして酸素ガス(
流量200cm3/min)を用い、これを気化器内に
導入した。全キャリア流量一定(750cm3/min
)のもとで錫源のキャリア流量と温度を変化させること
により、錫のドーピング量を広く(Sn/In=0〜0
.4)変化させた。基板として、硼珪酸ガラスとシリコ
ン単結晶を用いた。反応温度350〜500℃で反応さ
せたところ、錫をドーピングしたIn2O3薄膜が得ら
れた。図2に合成された薄膜のX線回折パターンの1例
を示す。図3に合成された膜厚215nmの薄膜の光透
過率を光の波長に対して示す。膜の可視光透過率は80
%以上であった。この膜の抵抗率は1.8×10−4Ω
・cmであった。図4に合成された薄膜の抵抗率、キャ
リア濃度、移動度を膜の原子比Sn/Inに対して示す
。以上本発明につき好適な実施例を挙げて種々説明した
が、本発明はこの実施例に限定されるものではなく、発
明の精神を逸脱しない範囲内で多くの改変を施し得るの
はもちろんのことである。[Examples] Examples of the present invention will be described below. FIG. 1 shows a schematic diagram of the film forming apparatus. Indium acetylacetonate was used as a raw material and was vaporized in a vaporizer maintained at 180 to 190°C. Tin bisacetylacetonate was used as the tin source. This was vaporized in a vaporization chamber maintained at 80° C. inside the vaporizer, and introduced into the vaporizer using nitrogen gas as a carrier gas. Oxygen gas (
This was introduced into the vaporizer using a flow rate of 200 cm3/min). Total carrier flow rate constant (750cm3/min
) by changing the carrier flow rate and temperature of the tin source, the tin doping amount can be varied widely (Sn/In=0~0
.. 4) Changed. Borosilicate glass and silicon single crystal were used as the substrate. When the reaction was carried out at a reaction temperature of 350 to 500°C, a tin-doped In2O3 thin film was obtained. FIG. 2 shows an example of the X-ray diffraction pattern of the synthesized thin film. FIG. 3 shows the light transmittance of the synthesized thin film with a thickness of 215 nm versus the wavelength of light. The visible light transmittance of the film is 80
% or more. The resistivity of this film is 1.8×10-4Ω
・It was cm. FIG. 4 shows the resistivity, carrier concentration, and mobility of the synthesized thin film with respect to the atomic ratio Sn/In of the film. Although the present invention has been variously explained above with reference to preferred embodiments, the present invention is not limited to these embodiments, and it goes without saying that many modifications can be made without departing from the spirit of the invention. It is.
【図1】装置の概略図である。FIG. 1 is a schematic diagram of the device.
【図2】合成された薄膜のX線回折パターンの1例を示
す図である。FIG. 2 is a diagram showing an example of an X-ray diffraction pattern of a synthesized thin film.
【図3】合成された薄膜の光の透過率を光の波長に対し
て示した図である。FIG. 3 is a diagram showing the light transmittance of a synthesized thin film versus the wavelength of light.
【図4】合成された薄膜の抵抗率、キャリア濃度、移動
度を膜の原子比Sn/Inに対して示した図である。FIG. 4 is a diagram showing the resistivity, carrier concentration, and mobility of a synthesized thin film with respect to the atomic ratio Sn/In of the film.
1 キャリアガスボンベ 2 反応ガスボンベ 3 ガス流量制御器 4 温度検出器 5 気化器 6 錫原料 7 インジウム原料 8 反応器 9 ヒーター 10 被処理物 1 Carrier gas cylinder 2 Reaction gas cylinder 3 Gas flow controller 4 Temperature detector 5. Vaporizer 6. Tin raw material 7 Indium raw material 8 Reactor 9 Heater 10 Object to be treated
Claims (3)
ウムの原料、錫のβジケトンを錫のドーピング剤として
用い、反応ガスを原料ガスに加えることにより、被処理
物表面に錫をドーピングした酸化インジウム膜を成長さ
せることを特徴とする化学気相成長方法。Claim 1: By using β-diketone of indium as a raw material for indium oxide, β-diketone of tin as a doping agent for tin, and adding a reactive gas to the raw material gas, an indium oxide film doped with tin is formed on the surface of a workpiece. A chemical vapor deposition method characterized by growing.
ナート錫またはビスアセチルアセトナート錫の誘導体で
ある特許請求範囲第1項記載の化学気相成長方法。2. The chemical vapor deposition method according to claim 1, wherein the β diketone of tin is tin bisacetylacetonate or a derivative of tin bisacetylacetonate.
請求範囲第1項記載の化学気相成長方法。3. The chemical vapor deposition method according to claim 1, wherein the reactive gas is oxygen or air.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12065991A JPH04276078A (en) | 1991-02-28 | 1991-02-28 | Chemical vapor growth method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12065991A JPH04276078A (en) | 1991-02-28 | 1991-02-28 | Chemical vapor growth method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04276078A true JPH04276078A (en) | 1992-10-01 |
Family
ID=14791718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12065991A Pending JPH04276078A (en) | 1991-02-28 | 1991-02-28 | Chemical vapor growth method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04276078A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000065611A1 (en) * | 1999-04-22 | 2000-11-02 | Seiko Instruments Inc. | Method of forming conducting transparent film, method of repairing wiring connection, and apparatus for forming conducting transparent film |
JP2004063195A (en) * | 2002-07-26 | 2004-02-26 | Konica Minolta Holdings Inc | Article with transparent conductive thin film, its manufacturing method, and thin film forming device |
JP2015506416A (en) * | 2012-01-27 | 2015-03-02 | ユーピー ケミカル カンパニー リミテッド | Oxide film containing indium and method for producing the same |
-
1991
- 1991-02-28 JP JP12065991A patent/JPH04276078A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000065611A1 (en) * | 1999-04-22 | 2000-11-02 | Seiko Instruments Inc. | Method of forming conducting transparent film, method of repairing wiring connection, and apparatus for forming conducting transparent film |
JP2004063195A (en) * | 2002-07-26 | 2004-02-26 | Konica Minolta Holdings Inc | Article with transparent conductive thin film, its manufacturing method, and thin film forming device |
JP2015506416A (en) * | 2012-01-27 | 2015-03-02 | ユーピー ケミカル カンパニー リミテッド | Oxide film containing indium and method for producing the same |
US9431144B2 (en) | 2012-01-27 | 2016-08-30 | Up Chemical Co., Ltd. | Indium-containing oxide film and preparing method thereof |
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