JPH0426360U - - Google Patents

Info

Publication number
JPH0426360U
JPH0426360U JP6736490U JP6736490U JPH0426360U JP H0426360 U JPH0426360 U JP H0426360U JP 6736490 U JP6736490 U JP 6736490U JP 6736490 U JP6736490 U JP 6736490U JP H0426360 U JPH0426360 U JP H0426360U
Authority
JP
Japan
Prior art keywords
electrode
comparison
decrease
concentration
internal liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6736490U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6736490U priority Critical patent/JPH0426360U/ja
Publication of JPH0426360U publication Critical patent/JPH0426360U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP6736490U 1990-06-26 1990-06-26 Pending JPH0426360U (US20080293856A1-20081127-C00150.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6736490U JPH0426360U (US20080293856A1-20081127-C00150.png) 1990-06-26 1990-06-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6736490U JPH0426360U (US20080293856A1-20081127-C00150.png) 1990-06-26 1990-06-26

Publications (1)

Publication Number Publication Date
JPH0426360U true JPH0426360U (US20080293856A1-20081127-C00150.png) 1992-03-02

Family

ID=31600873

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6736490U Pending JPH0426360U (US20080293856A1-20081127-C00150.png) 1990-06-26 1990-06-26

Country Status (1)

Country Link
JP (1) JPH0426360U (US20080293856A1-20081127-C00150.png)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002107324A (ja) * 2000-07-25 2002-04-10 Mettler Toledo Ag 電位差測定用測定プローブ、測定プローブの老化状態を監視する方法及び測定プローブの使用法
JP2009282011A (ja) * 2008-05-22 2009-12-03 Korea Atom Energ Res Inst 自動校正機能を有する基準電極及びそれを使用した電気化学的電位自動補正装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002107324A (ja) * 2000-07-25 2002-04-10 Mettler Toledo Ag 電位差測定用測定プローブ、測定プローブの老化状態を監視する方法及び測定プローブの使用法
JP2009282011A (ja) * 2008-05-22 2009-12-03 Korea Atom Energ Res Inst 自動校正機能を有する基準電極及びそれを使用した電気化学的電位自動補正装置

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