JPH0424995A - Method and equipment for plating through hole of circuit board - Google Patents

Method and equipment for plating through hole of circuit board

Info

Publication number
JPH0424995A
JPH0424995A JP12506290A JP12506290A JPH0424995A JP H0424995 A JPH0424995 A JP H0424995A JP 12506290 A JP12506290 A JP 12506290A JP 12506290 A JP12506290 A JP 12506290A JP H0424995 A JPH0424995 A JP H0424995A
Authority
JP
Japan
Prior art keywords
catalyst
hole
plating
circuit board
completely
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12506290A
Other languages
Japanese (ja)
Inventor
Hideki Fujishima
藤島 英輝
Shiro Saito
斉藤 四郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP12506290A priority Critical patent/JPH0424995A/en
Publication of JPH0424995A publication Critical patent/JPH0424995A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a through hole plating method and its equipment capable of completely depositing electroless plating even when the diameter of a through hole is smaller than or equall to 0.4mm, by passing two or more times catalyst process necessary for deposition of electroless plating. CONSTITUTION:Catalyst 5 is a process for imparting catalyst to copper foils on both surfaces of a substratum layer 11 of epoxy resin or the like of a circuit board. When catalyst 13 is imparted in said process, it happens that the catalyst is not completely imparted to the inner side of a through hole 20. This is because, when the diameter of a through hole is smaller than or equal to 0.4mm, the movement of liquid is decreased, the liquid does not circulate, and therefore the efficiency of catalyst impartment is reduced. However, when catalyst is again imparted in catalyst 6 being a second catalyst imparting process, the catalyst 13 is completely imparted to the inner side of the through hole 20. After rinsing, the catalyst is activated by an accelerator 7, and electroless plating is completely deposited in the through hole 20 in virtue of the catalyst in electroless copper plating 8.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、回路基板のスルーホールメ とスルーホールメンキ装置に関スる。[Detailed description of the invention] [Industrial application field] The present invention provides through-hole mechanisms for circuit boards. and related to through-hole repair equipment.

ツキ方法 〔発明の概要〕 この発明は、スルーホールを有する回路基板のスルーホ
ールメッキ方法及び装置において、無電解メッキの前工
程である触媒付与工程を2回以上通過させることにより
、スルーホールメッキのスルーホール内の無電解メッキ
の析出不完全を防止し完全なスルーホールメッキを得る
ことができる。
Method for plating [Summary of the invention] The present invention provides a through-hole plating method and apparatus for a circuit board having through-holes, in which through-hole plating is achieved by passing through a catalyst application step, which is a pre-process of electroless plating, twice or more. It is possible to prevent incomplete deposition of electroless plating inside the through-hole and obtain perfect through-hole plating.

〔従来の技術〕[Conventional technology]

従来、第2図に示すように、スルーホールメッキとして
一般的な銅メッキを用いる方法では、コンディショナ1
で回路基板の表面を洗浄するとともに回路基板に穴明け
されたスルーホール用の穴への液の浸透性を高める。ソ
フトエツチング2において回路基板の金属表面を化学的
に溶解し表面の酸化物等を除去する。酸3では金属表面
を活性化する。ブリデイツプ4ではキャタリスト5の液
の変化を防止する。キャタリスト5で無電解メッキが析
出するために必要な触媒の付与を回路基板に対して行う
。アクセレータ7は付与された触媒を活性化する。無電
解銅メンキメフキ8で付与された触媒を核に銅メッキの
析出が行われる。硫酸9では無電解銅メッキにより析出
した銅表面を活性化する。銅メッキ10では無電解銅メ
ッキで得られた銅皮膜が薄いため電気メッキにより銅皮
膜を必要な厚味まで厚くすることで回路基板のスルーホ
ール内・7キを実施していた。
Conventionally, as shown in Figure 2, in the method of using general copper plating as through-hole plating, conditioner 1 was used.
This cleans the surface of the circuit board and increases the permeability of the liquid into the through-holes drilled in the circuit board. In soft etching 2, the metal surface of the circuit board is chemically dissolved to remove oxides and the like on the surface. Acid 3 activates the metal surface. The fluid dip 4 prevents the liquid in the catalyst 5 from changing. A catalyst 5 applies a catalyst necessary for electroless plating to the circuit board. The accelerator 7 activates the provided catalyst. Copper plating is deposited using the catalyst applied with electroless copper coating 8 as a nucleus. Sulfuric acid 9 activates the copper surface deposited by electroless copper plating. In copper plating 10, since the copper film obtained by electroless copper plating is thin, the copper film was thickened to the required thickness by electroplating to perform 7-ki in the through holes of the circuit board.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかし、従来のスルーホールメッキ装置では、スルーホ
ールの径が0.4fi以下に小さくなった場合、スルー
ホール内に無電解メッキに必要な触媒が十分に付与され
ないために無電解メッキが完全に析出せずスルーホール
メッキネ良を発生させてしまうという課題があった(第
4図)。
However, with conventional through-hole plating equipment, when the diameter of the through-hole becomes smaller than 0.4fi, the electroless plating is completely deposited because the catalyst required for electroless plating is not sufficiently applied inside the through-hole. However, there was a problem in that through-hole plating defects were caused due to failure (Fig. 4).

そこで、この発明は、従来のこのような課題を解決する
ため、スルーホールの径が0.4n以下に小さくなって
もスルーホール内に完全に無電解メッキが析出するスル
ーホールメッキ方法及び装置を得ることを目的としてい
る。
Therefore, in order to solve these conventional problems, the present invention provides a through-hole plating method and apparatus that allows electroless plating to be completely deposited inside the through-hole even if the diameter of the through-hole is reduced to 0.4 nm or less. The purpose is to obtain.

〔課題を解決するための手段] 上記課題を解決するために、この発明は、スルーホール
メッキ方法及びスルーホールメッキ装置の構造を、無電
解メッキの析出に必要な触媒の付与工程を2回以上通過
させるようにすることにより、スルーホール内への触媒
の付与を完全な状態とし、スルーホール内の無電解メッ
キが完全に析出しないことを防止できるようにした。
[Means for Solving the Problems] In order to solve the above problems, the present invention provides a through-hole plating method and a structure of a through-hole plating apparatus in which the step of applying a catalyst necessary for electroless plating deposition is performed twice or more. By allowing the catalyst to pass through the through hole, the catalyst is completely applied to the through hole, and electroless plating within the through hole can be prevented from being completely deposited.

〔作用〕[Effect]

上記のようなスルーホールメッキ方法及びスルーホール
メッキ装置により、スルーホール用の穴明けをした回路
基板にスルーホールメッキを実施すると最初の触媒付与
の工程でスルーホール内に十分触媒が付与されていない
ものも、2回以上触媒付与の工程を実施することで触媒
はスルーホール内に十分付与され、無電解メッキの析出
を完全にさせることとなる。
When through-hole plating is performed on a circuit board with holes for through-holes using the through-hole plating method and through-hole plating equipment as described above, the catalyst may not be sufficiently applied to the through-holes in the first catalyst application process. Also, by carrying out the catalyst application process two or more times, the catalyst will be sufficiently applied within the through-holes, and the electroless plating will be completely deposited.

〔実施例〕〔Example〕

以下にこの発明の実施例を、図面に基づいて説明する。 Embodiments of the present invention will be described below based on the drawings.

第1図は本発明のスルーホールメッキ装置の銅メッキの
場合の構成図で、スルーホール用の穴明けをされた回路
基板(図示しない)は、左端のコンディショナ1に浸漬
され、湯洗、水洗と右側の槽へ移動式リフト等により工
程順に搬送されていく。最初の触媒付与の工程であるキ
ャタリスト5の槽を出た回路基板は水洗され、−旦乾燥
される。
FIG. 1 is a block diagram of the through-hole plating apparatus of the present invention in the case of copper plating, in which a circuit board (not shown) with holes for through-holes is immersed in conditioner 1 on the left end, washed with hot water, They are washed with water and transported to the tank on the right side in the order of the process using a mobile lift. The circuit board leaving the catalyst tank 5, which is the first catalyst application step, is washed with water and then dried.

次のキャタリスト6を通過し、最初に触媒付与された上
に再度触媒が付与されることでスルーホール内への触媒
付与はより完全な状態を得ることができる。
By passing through the next catalyst 6 and applying catalyst again on top of the first catalyst, it is possible to achieve a more complete state of catalyst application within the through-hole.

すなわち、第3図に示すように回路基板のエポキシ樹脂
等の基材層11の両面に銅箔12を有するものに触媒付
与工程であるキャタリスト5において触媒13を付与し
ても、スルーホール20の内側には完全に触媒13が付
与されないことがある。
That is, as shown in FIG. 3, even if a catalyst 13 is applied in the catalyst 5, which is a catalyst application step, to a circuit board having copper foils 12 on both sides of a base material layer 11 of epoxy resin, etc., the through holes 20 The catalyst 13 may not be completely applied to the inner side of the container.

これはスルーホールの径が0.4fi以下と小さくなっ
てくるとスルーホール20内での液の動きが悪くなり液
が循環しないため触媒付与の効率が悪くなるためである
This is because when the diameter of the through hole becomes smaller than 0.4 fi, the movement of the liquid within the through hole 20 becomes poor and the liquid does not circulate, resulting in a decrease in the efficiency of catalyst application.

しかし、第2回目の触媒付与工程であるキャタリスト6
において再度触媒を付与すると、第5図に示すようにス
ルーホール20の内側に触媒13が完全に付与される。
However, in the second catalyst application process, Catalyst 6
When the catalyst is applied again in the step, the catalyst 13 is completely applied inside the through hole 20 as shown in FIG.

水洗の後、アクセレータ7により触媒が活性化され、無
電解銅メッキ8で触媒の働きにより第6図に示すように
、無電解銅メッキがスルーホール20内に完全に析出す
る。更に硫酸9を通り、銅メッキ10において機能的に
十分な厚味をもった銅による導体がスルーホール内に完
成される。この方法と装置に使用される薬品は一般に市
販されているものがそのまま適用できる。又、装置の構
造は回路基板を搬送する移動式リフト等が移動順序がコ
ンピュータ等により可変可能なものであるならば第1図
に示すように触媒付与の工程をキャタリスト6と7に別
に設けなくとも一つに統一することが可能であることは
いうまでもない。
After washing with water, the catalyst is activated by the accelerator 7, and the electroless copper plating is completely deposited in the through hole 20 by the action of the catalyst in the electroless copper plating 8, as shown in FIG. Further, through sulfuric acid 9, copper plating 10 completes a functionally sufficient copper conductor in the through hole. As for the chemicals used in this method and apparatus, generally commercially available chemicals can be applied as they are. In addition, if the structure of the device is such that the movement order of the mobile lift etc. that transports the circuit board can be changed by a computer etc., the process of applying the catalyst is provided separately to the catalysts 6 and 7 as shown in FIG. It goes without saying that it is possible to at least unify them into one.

〔発明の効果〕〔Effect of the invention〕

この発明は、以上説明したように触媒付与の工程を2回
以上通過する方法と触媒付与の工程を2回以上通過させ
ることのできる構造を有するスルーホールメッキ装置に
より、直径小さなスルーホ−ル径を有する回路基板のス
ルーホール穴にスルーホールメッキが十分析出しないこ
とによるスルーホールメソキネ良の発生を防止する効果
がある。
As explained above, the present invention uses a method of passing through the catalyst application process two or more times and a through-hole plating apparatus having a structure that allows the catalyst application process to pass through the process two or more times. This has the effect of preventing the occurrence of through-hole mesokine defects due to insufficient through-hole plating being produced in the through-hole holes of the circuit board.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明にかかるスルーホールメッキ装置の銅
メッキの場合の構成図、第2図は従来のスルーホール銅
メッキ装置の構成図、第3図及び第4図は従来方法によ
るスルーホールメンキの触媒付与と無電解銅メッキの状
態を示した回路基板の部分断面図、第5図および第6図
はこの発明によるスルーホールメッキの触媒付与と無電
解銅メッキの状態を示した回路基板の部分断面図である
。 1 ・ ・ 2 ・ ・ 3 ・ ・ 4 ・ ・ 7 ・ ・ ・コンディショナ ・ソフトエツチング ・酸 ・プリデイツプ ・・・キャタリスト ・アクセレータ 無電解銅メッキ 硫酸 部分メッキ 回路基板のエポキシ樹脂等の基材層 回路基板上の銅箔 触媒付与工程で付与された触媒 無電解銅メッキにより析出した銅皮膜 スルーホール 以上 出願人 セイコー電子工業株式会社 代理人 弁理士 林  敬 之 助 第3図 第5図 第4図 第6図
Fig. 1 is a block diagram of a through-hole plating apparatus according to the present invention for copper plating, Fig. 2 is a block diagram of a conventional through-hole copper plating apparatus, and Figs. 3 and 4 are through-hole plating by a conventional method. FIGS. 5 and 6 are partial cross-sectional views of circuit boards showing the state of catalyst application and electroless copper plating, and FIGS. FIG. 1 ・ ・ 2 ・ ・ 3 ・ ・ 4 ・ ・ 7 ・ ・ Conditioner, soft etching, acid, pre-dip...Catalyst, accelerator Electroless copper plating Sulfuric acid partial plating Base material layer circuit such as epoxy resin of circuit board Copper film through-hole deposited by catalytic electroless copper plating applied in the copper foil catalyst application process on the substrate Figure 6

Claims (2)

【特許請求の範囲】[Claims] (1)スルーホールを有する回路基板のスルーホールメ
ッキ方法において、無電解メッキの前工程である触媒付
与工程を2回以上通過させることを特徴とする回路基板
のスルーホールメッキ方法。
(1) A through-hole plating method for a circuit board having through-holes, the method comprising passing through a catalyst application step, which is a pre-electroless plating step, twice or more.
(2)スルーホールを有する回路基板のスルーホールメ
ッキ装置において、前記スルーホールメッキ装置の構造
が、無電解メッキの前工程である触媒付与工程を2回以
上通過させる装置を有することを特徴とする回路基板の
スルーホールメッキ装置。
(2) A through-hole plating device for a circuit board having through-holes, characterized in that the structure of the through-hole plating device includes a device for passing through a catalyst application step, which is a pre-step of electroless plating, twice or more. Through-hole plating equipment for circuit boards.
JP12506290A 1990-05-15 1990-05-15 Method and equipment for plating through hole of circuit board Pending JPH0424995A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12506290A JPH0424995A (en) 1990-05-15 1990-05-15 Method and equipment for plating through hole of circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12506290A JPH0424995A (en) 1990-05-15 1990-05-15 Method and equipment for plating through hole of circuit board

Publications (1)

Publication Number Publication Date
JPH0424995A true JPH0424995A (en) 1992-01-28

Family

ID=14900879

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12506290A Pending JPH0424995A (en) 1990-05-15 1990-05-15 Method and equipment for plating through hole of circuit board

Country Status (1)

Country Link
JP (1) JPH0424995A (en)

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