JPH04220938A - Neutralizing device of ion implantation device - Google Patents
Neutralizing device of ion implantation deviceInfo
- Publication number
- JPH04220938A JPH04220938A JP40403990A JP40403990A JPH04220938A JP H04220938 A JPH04220938 A JP H04220938A JP 40403990 A JP40403990 A JP 40403990A JP 40403990 A JP40403990 A JP 40403990A JP H04220938 A JPH04220938 A JP H04220938A
- Authority
- JP
- Japan
- Prior art keywords
- electrons
- base board
- grid
- filament
- semiconductor substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005468 ion implantation Methods 0.000 title claims description 9
- 230000003472 neutralizing effect Effects 0.000 title abstract description 4
- 239000004065 semiconductor Substances 0.000 claims abstract description 28
- 239000000758 substrate Substances 0.000 claims description 26
- 238000006386 neutralization reaction Methods 0.000 claims description 16
- 150000002500 ions Chemical class 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 230000001133 acceleration Effects 0.000 abstract description 2
- 239000002784 hot electron Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は半導体基板にイオンを注
入するイオン注入装置に関し、特に半導体基板の帯電を
解消するイオン注入装置における中和装置(以下単に中
和装置と呼ぶ)に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an ion implantation device for implanting ions into a semiconductor substrate, and more particularly to a neutralization device (hereinafter simply referred to as a neutralization device) in an ion implantation device for eliminating electrical charge on a semiconductor substrate.
【0002】0002
【従来の技術】図2は従来の中和装置の一例を示す概略
図である。従来のこの種の中和装置は、図2に示すよう
に、熱電子を放出するフィラメント2と、熱電子を加速
するウェネルト電極1と、加速された電子4の衝突によ
り2次電子5を発生するターゲット3とを有している。
次に、この中和装置の動作について説明する。まず、フ
ィラメント2より熱電子が放出され、ウェネルト電極1
とターゲット3の間にかけられた加速電圧により電子4
がターゲット3の方へ引っぱられる。次に、この熱電子
4がターゲット3に衝突することにより、ターゲット3
から2次電子5が放出され、この2次電子5が、イオン
ビームと一緒に半導体基板7に到達し半導体基板7に蓄
えられていた正の電荷を中和していた。2. Description of the Related Art FIG. 2 is a schematic diagram showing an example of a conventional neutralization device. As shown in FIG. 2, this type of conventional neutralization device generates secondary electrons 5 through collision between a filament 2 that emits thermoelectrons, a Wehnelt electrode 1 that accelerates the thermoelectrons, and the accelerated electrons 4. It has a target 3. Next, the operation of this neutralization device will be explained. First, thermionic electrons are emitted from the filament 2, and the Wehnelt electrode 1
Due to the accelerating voltage applied between the target 3 and the electron 4
is pulled towards target 3. Next, as the thermoelectrons 4 collide with the target 3, the target 3
Secondary electrons 5 were emitted from the ion beam, and the secondary electrons 5 reached the semiconductor substrate 7 together with the ion beam, neutralizing the positive charges stored in the semiconductor substrate 7.
【0003】0003
【発明が解決しようとする課題】この従来の中和装置で
はフィラメントとターゲットの距離が離れており、また
、2次電子を効率よく取り出すのにフィラメントとター
ゲット間に印加する加速電圧は、数百ボルトの電圧が必
要になる。しかしながら、ターゲットより発生した2次
電子の持つエネルギーは低エネルギーのものから高エネ
ルギーのものまで存在し、このエネルギー量を制御しに
くく、しばしば2次電子が、半導体基板上の正の電荷を
中和するだけではなく、逆に半導体基板を負に帯電させ
ることになり、イオン注入が不十分になるという問題点
があった。[Problems to be Solved by the Invention] In this conventional neutralization device, the distance between the filament and the target is large, and the accelerating voltage applied between the filament and the target is several hundred to efficiently extract secondary electrons. Volts of voltage are required. However, the energy of the secondary electrons generated from the target ranges from low energy to high energy, and it is difficult to control this energy amount, and the secondary electrons often neutralize the positive charges on the semiconductor substrate. Not only this, but also the semiconductor substrate is negatively charged, which causes the problem that ion implantation becomes insufficient.
【0004】本発明の目的は、かかる問題を解消すべく
、過剰に電子を照射させることなく電子流を制御出来る
中和装置を提供することである。[0004]An object of the present invention is to provide a neutralization device that can control the electron flow without excessively irradiating electrons, in order to solve this problem.
【0005】[0005]
【課題を解決するための手段】本発明のイオン注入装置
における中和装置は、半導体基板にイオンを注入するイ
オン注入装置における中和装置において、熱電子を放出
するフィラメントと、熱電子流を制御する平板状のグリ
ッドと備え、このグリッドを通過する電子を前記半導体
基板に照射することを特徴としている。[Means for Solving the Problems] A neutralization device for an ion implantation apparatus according to the present invention controls a filament that emits thermionic electrons and a thermionic flow in the neutralization device for an ion implantation device that implants ions into a semiconductor substrate. The semiconductor substrate is characterized in that the semiconductor substrate is provided with a flat grid, and the semiconductor substrate is irradiated with electrons passing through the grid.
【0006】[0006]
【実施例】次に、本発明について図面を参照して説明す
る。図1は本発明の中和装置の一実施例を示す概略図で
ある。この中和装置は同図に示すように、熱電子を放出
するフィラメント2の前段にフィラメント2に対して数
ボルトの電圧を印加し、熱電子流を制御するグリッド8
を設け、グリッド8と、アノード側である半導体基板7
に従来より低い加速電圧を印加し、電子4を直接半導体
基板7に照射することである。このように三極管である
電子銃を用いることによって、フィラメント2より放出
された熱電子は、数ボルトの電圧をかけられたグリッド
2により引き出され、半導体基板7面に低速である低エ
ネルギーの電子流をあびせることにより、半導体基板上
に帯電している正の電荷を中和する。DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained with reference to the drawings. FIG. 1 is a schematic diagram showing an embodiment of the neutralization device of the present invention. As shown in the figure, this neutralization device applies a voltage of several volts to the filament 2 in front of the filament 2 that emits thermionic electrons, and a grid 8 that controls the flow of thermionic electrons.
A grid 8 and a semiconductor substrate 7 on the anode side are provided.
The method is to apply a lower acceleration voltage than the conventional one to irradiate the semiconductor substrate 7 with electrons 4 directly. By using the electron gun, which is a triode, the thermoelectrons emitted from the filament 2 are extracted by the grid 2 to which a voltage of several volts is applied, and a low-speed, low-energy electron stream is generated on the surface of the semiconductor substrate 7. By applying , the positive charges on the semiconductor substrate are neutralized.
【0007】また、他の実施例として、フィラメントの
スパッタリングによる半導体基板の汚染を防止するため
に、グリッドによって引き出す電子の方向を半導体基板
とは、別の方向に引き出した後、磁場をかけて、電子を
半導体基板上付近に導いて電子をあびせ、半導体基板上
の正の帯電を中和しても良い。In another embodiment, in order to prevent contamination of the semiconductor substrate due to filament sputtering, a magnetic field is applied after the electrons are drawn out in a direction different from that of the semiconductor substrate using a grid. Electrons may be guided near the top of the semiconductor substrate and bombarded with electrons to neutralize the positive charge on the semiconductor substrate.
【0008】尚、どちらの実施例の場合もフィラメント
2と半導体基板を支持するディスクとの間に、わずか数
ボルト以内の電圧を印加し、グリッド8に数ボルトの電
圧をかけることによって、電子のエネルギーが数エレク
トロンボルト以下の電子雲を発生させ、半導体基板にダ
メージを与えることなく、帯電を有効に解消することが
できる。In both embodiments, a voltage within a few volts is applied between the filament 2 and the disk supporting the semiconductor substrate, and a voltage of several volts is applied to the grid 8 to generate electrons. By generating an electron cloud with an energy of several electron volts or less, it is possible to effectively eliminate static electricity without damaging the semiconductor substrate.
【0009】また、フィラメント2の放出する熱電子量
をグリッド8により制御出来るので、必要以上電子を照
射することはない。さらに、このグリッド8は電子を収
束する必要がないので、通常の板電極に電子が通過する
穴を設けたもので良い。Furthermore, since the amount of thermoelectrons emitted by the filament 2 can be controlled by the grid 8, no more electrons are irradiated than necessary. Furthermore, since the grid 8 does not need to converge electrons, it may be an ordinary plate electrode provided with holes through which the electrons pass.
【0010】0010
【発明の効果】以上説明したように本発明は、低エネル
ギーの電子を制御するグリッドを設け、半導体基板全域
に浴びるように電子を照射することによって、電子は半
導体基板上の正の電荷を中和するのみに使用され、半導
体基板を逆に負に帯電させたりすることのないイオン注
入装置における中和装置が得られるという効果を有する
。Effects of the Invention As explained above, the present invention provides a grid for controlling low-energy electrons, and by irradiating the electrons so as to cover the entire area of the semiconductor substrate, the electrons neutralize the positive charges on the semiconductor substrate. This has the effect of providing a neutralizing device in an ion implantation device that is used only to neutralize the ions and does not negatively charge the semiconductor substrate.
【図1】本発明の中和装置の一実施例を示す概略図であ
る。FIG. 1 is a schematic diagram showing an embodiment of the neutralization device of the present invention.
【図2】従来の中和装置の一例を示す概略図である。FIG. 2 is a schematic diagram showing an example of a conventional neutralization device.
1 ウェネルト電極 2 フィラメント 3 ターゲット 4 電子 5 2次電子 6 イオン 7 半導体基板 8 グリッド 1 Wehnelt electrode 2 Filament 3 Target 4 Electron 5 Secondary electrons 6 Ion 7 Semiconductor substrate 8 Grid
Claims (1)
注入装置における中和装置において、熱電子を放出する
フィラメントと、熱電子流を制御する平板状のグリッド
と備え、このグリッドを通過する電子を前記半導体基板
に照射することを特徴とするイオン注入装置における中
和装置。1. A neutralization device for an ion implantation apparatus for implanting ions into a semiconductor substrate, which comprises a filament that emits thermionic electrons and a flat grid that controls the flow of thermionic electrons, and the neutralization device includes a filament that emits thermionic electrons, and a flat grid that controls the flow of thermionic electrons. A neutralization device in an ion implantation device characterized by irradiating a semiconductor substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP40403990A JPH04220938A (en) | 1990-12-20 | 1990-12-20 | Neutralizing device of ion implantation device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP40403990A JPH04220938A (en) | 1990-12-20 | 1990-12-20 | Neutralizing device of ion implantation device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04220938A true JPH04220938A (en) | 1992-08-11 |
Family
ID=18513733
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP40403990A Pending JPH04220938A (en) | 1990-12-20 | 1990-12-20 | Neutralizing device of ion implantation device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04220938A (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02109245A (en) * | 1988-10-18 | 1990-04-20 | Nissin Electric Co Ltd | Ion processing apparatus |
JPH02288143A (en) * | 1989-04-28 | 1990-11-28 | Nissin Electric Co Ltd | Low energy electron generating device |
-
1990
- 1990-12-20 JP JP40403990A patent/JPH04220938A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02109245A (en) * | 1988-10-18 | 1990-04-20 | Nissin Electric Co Ltd | Ion processing apparatus |
JPH02288143A (en) * | 1989-04-28 | 1990-11-28 | Nissin Electric Co Ltd | Low energy electron generating device |
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Legal Events
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A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 19971118 |