JPH041733Y2 - - Google Patents

Info

Publication number
JPH041733Y2
JPH041733Y2 JP1982101609U JP10160982U JPH041733Y2 JP H041733 Y2 JPH041733 Y2 JP H041733Y2 JP 1982101609 U JP1982101609 U JP 1982101609U JP 10160982 U JP10160982 U JP 10160982U JP H041733 Y2 JPH041733 Y2 JP H041733Y2
Authority
JP
Japan
Prior art keywords
resin
mold
sealed
semiconductor device
product
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1982101609U
Other languages
Japanese (ja)
Other versions
JPS596844U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10160982U priority Critical patent/JPS596844U/en
Publication of JPS596844U publication Critical patent/JPS596844U/en
Application granted granted Critical
Publication of JPH041733Y2 publication Critical patent/JPH041733Y2/ja
Granted legal-status Critical Current

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  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Description

【考案の詳細な説明】 本考案は樹脂封止型半導体装置製造用の樹脂封
止金型に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a resin molding mold for manufacturing a resin molded semiconductor device.

従来の樹脂封止金型を用いた樹脂封止型半導体
装置の製造工程の一部である封止工程は、第1図
に示すようにまずリードフレームを封止金型内部
に固定し(第1図A)、その後樹脂を封入する
(第1図B)。樹脂が完全に固化した後金型を2分
割し、突き出し棒を用いて半導体装置の一部を押
し、製品を取り出す方法が一般的である(第1図
C)。
In the encapsulation process, which is part of the manufacturing process for resin-encapsulated semiconductor devices using conventional resin encapsulation molds, as shown in Figure 1, the lead frame is first fixed inside the encapsulation mold. 1A), and then encapsulated with resin (FIG. 1B). A common method is to divide the mold into two parts after the resin has completely solidified, and use an ejector rod to push a part of the semiconductor device to take out the product (FIG. 1C).

この工程において樹脂は金型との密着がよいた
め第1図のCに示す突き出し工程において樹脂の
一部が金型に付着し金型側に残り、製品のカケ、
割れ等の不良を引き起こすことがしばしばあつ
た。この現象は半導体装置容器の表面が鏡面で構
成されている時には起こりにくく、表面に細かい
凹凸のあるいわゆる無光沢面であるものでより起
こりやすい。しかし表面が鏡面のみで構成された
容器は、その面積が広い部分においては樹脂封止
工程中金型の汚れた部分の影響を受け製品の表面
が汚れ易くなり商品価値を下げるものである。さ
らに鏡面においては製品名等の捺印もつきにく
い。この捺印性を良くするという目的で捺印面の
みを無光沢にする方法は従来よりあるが、これで
は捺印面と相対する広い面は汚れが目立ちやす
い。又第1図5に示す部分、すなわち、金型に樹
脂の流入する部分(以後ゲート部と称す。)は製
品が金型から離脱する際製品と共に離脱しなけれ
ばならない。しかし、このゲート部は他の部分に
比べ金型との接触面積が大きく、その上非常に細
くなつているため離脱不良が起こりやすく容器の
カケ、割れ不良が起こりやすい部分である。
In this process, the resin adheres well to the mold, so in the ejection process shown in C in Figure 1, a part of the resin adheres to the mold and remains on the mold side, resulting in chipping and chipping of the product.
This often caused defects such as cracks. This phenomenon is less likely to occur when the surface of the semiconductor device container has a mirror surface, and more likely to occur when the surface is a so-called matte surface with fine irregularities. However, in a container whose surface is made of only a mirror surface, the surface of the product tends to become dirty due to the influence of dirty parts of the mold during the resin sealing process in the large area, which lowers the product value. Furthermore, it is difficult to stamp product names etc. on mirror surfaces. There has been a conventional method of making only the stamping surface matte in order to improve the stamping performance, but with this method, stains tend to be noticeable on the wide surface facing the stamping surface. Further, the part shown in FIG. 1, ie, the part where the resin flows into the mold (hereinafter referred to as the gate part), must be removed together with the product when the product is removed from the mold. However, this gate part has a larger contact area with the mold than other parts, and is also very thin, so it is a part where detachment failures are likely to occur and the container is likely to chip or crack.

本考案の目的は製品の表面が汚れにくく、か
つ、もっともカケ、割れ不良の発生する箇所の対
策を行った半導体装置用樹脂封止金型を提供する
ことにある。
The purpose of the present invention is to provide a resin-sealing mold for a semiconductor device in which the surface of the product is resistant to staining and measures are taken to address the areas where chips and cracks are most likely to occur.

本考案によれば、半導体装置用の樹脂封止金型
において、樹脂が流入する1面のみをJIS B0601
で規程されたラツプ仕上げに相当する鏡面で構成
し、その他の全ての面は0.1〜0.8ミクロンの凹凸
を有する無光沢の粗面である樹脂封止金型を得
る。樹脂が流入される部分を有する面はカケ、割
れが発生しやすいからここを鏡面としている。一
方、それ以外の面は全て製品の汚れを考えて粗面
とする。この粗面の0.1〜0.8ミクロンはカケ、割
れと汚れとの両要因を考慮して実用的見地から定
められたものである。
According to the present invention, in a resin sealing mold for semiconductor devices, only one surface into which the resin flows is JIS B0601
A resin-sealed mold is obtained, which has a mirror surface corresponding to the lap finish specified by the method, and all other surfaces are matte rough surfaces with irregularities of 0.1 to 0.8 microns. The surface that has the part where the resin flows is prone to chipping and cracking, so this part is made into a mirror surface. On the other hand, all other surfaces are made rough in consideration of product contamination. The roughness of 0.1 to 0.8 microns was determined from a practical standpoint, taking into consideration both chipping, cracking, and staining.

以下本考案を実施例に基づいて説明する。 The present invention will be explained below based on examples.

第2図は本考案による樹脂封止金型により製造
した樹脂封止型半導体装置の一実施例を示す斜示
図である。これは外部リードが導出されない2面
のうちの1面から樹脂が注入されたもので、その
面のみを指定された鏡面9で構成し、その他の表
面を指定された無光沢の面8で構成している。
FIG. 2 is a perspective view showing an embodiment of a resin-sealed semiconductor device manufactured using a resin-sealed mold according to the present invention. This is one in which resin is injected from one of the two surfaces from which external leads are not led out, and only that surface is made up of a specified mirror surface 9, and the other surfaces are made of a specified matte surface 8. are doing.

この様にすると樹脂封止工程中金型から最も離
脱しにくい樹脂流入部分が離脱しやすい鏡面で構
成されているため全面無光沢のものに比べワレ、
カケ等の不良が起こりにくく歩留まりの向上が期
待できる。又全面鏡面のものに比べると容器の大
部分が無光沢面で構成されているため金型の汚れ
の影響を受けにくく、商品価値の高いものが出
来、かつ捺印性の良いことは当然のことである。
In this way, during the resin sealing process, the resin inlet part that is the most difficult to separate from the mold is made of a mirror surface that is easy to separate from, so there is less cracking compared to a completely matte one.
Defects such as chips are less likely to occur, and yields can be expected to improve. In addition, compared to a fully mirrored container, most of the container is made of a matte surface, so it is less susceptible to dirt from the mold, making it possible to produce products with high commercial value, as well as being easy to stamp. It is.

さらに半導体装置をレール上をすべらせ、プリ
ント基盤等に自動装着する場合、装置の方向を光
を用いて反射率を測定することにより容易に検出
出来るため装着時の方向まちがいを簡単に防止出
来非常に便利なものである。
Furthermore, when a semiconductor device is slid on a rail and automatically attached to a printed circuit board, etc., the direction of the device can be easily detected by measuring the reflectance using light, making it easy to prevent the wrong direction when attaching. It is convenient for

その上、封止金型において摩耗の速いゲート部
のみを交換する時も、鏡面であるため他の面との
接触も良く簡単に交換出来設備費の低減を計るこ
とが出来る。
Furthermore, even when only the gate portion of the sealing mold, which wears quickly, is to be replaced, the mirror surface allows for good contact with other surfaces, making it easy to replace, and equipment costs can be reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図A〜Cは従来の樹脂封止金型を用いた樹
脂封止型半導体装置の製造工程を示す断面図であ
る。第2図は本考案による樹脂封止金型により製
造した樹脂封止型半導体装置の一実施例を示す斜
視図である。 1……半導体素子、2……樹脂封止金型、3…
…リードフレーム、4……樹脂、5……ゲート
部、6……押し出し棒、7……外部リード、8…
…無光沢面、9……光沢面である。
FIGS. 1A to 1C are cross-sectional views showing the manufacturing process of a resin-sealed semiconductor device using a conventional resin-sealed mold. FIG. 2 is a perspective view showing an embodiment of a resin-sealed semiconductor device manufactured using a resin-sealed mold according to the present invention. 1... Semiconductor element, 2... Resin sealing mold, 3...
... Lead frame, 4 ... Resin, 5 ... Gate section, 6 ... Extrusion rod, 7 ... External lead, 8 ...
... Matte surface, 9... Glossy surface.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 4つの側面のうち2つの側面から複数の外部リ
ードが導出された樹脂封止型半導体装置用の樹脂
封止金型において、前記樹脂封止金型内壁の前記
4つの側面に相当する面のうち、樹脂が流入する
1面のみをラツプ仕上げに相当する鏡面で構成
し、前記樹脂封止金型内壁の残りの面の全ては
0.1〜0.8ミクロンの凹凸を有する無光沢の粗面で
あることを特徴とする樹脂封止金型。
In a resin-sealed mold for a resin-sealed semiconductor device in which a plurality of external leads are led out from two of the four side surfaces, one of the surfaces corresponding to the four side surfaces of the inner wall of the resin-sealed mold , only one surface into which the resin flows is made of a mirror surface equivalent to lap finishing, and all the remaining surfaces of the inner wall of the resin sealing mold are
A resin-sealed mold characterized by a matte rough surface having irregularities of 0.1 to 0.8 microns.
JP10160982U 1982-07-05 1982-07-05 Resin-encapsulated semiconductor device Granted JPS596844U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10160982U JPS596844U (en) 1982-07-05 1982-07-05 Resin-encapsulated semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10160982U JPS596844U (en) 1982-07-05 1982-07-05 Resin-encapsulated semiconductor device

Publications (2)

Publication Number Publication Date
JPS596844U JPS596844U (en) 1984-01-17
JPH041733Y2 true JPH041733Y2 (en) 1992-01-21

Family

ID=30239875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10160982U Granted JPS596844U (en) 1982-07-05 1982-07-05 Resin-encapsulated semiconductor device

Country Status (1)

Country Link
JP (1) JPS596844U (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2529690Y2 (en) * 1989-11-20 1997-03-19 天龍工業株式会社 Vehicle seat with impact energy absorber

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS607484Y2 (en) * 1979-01-18 1985-03-13 日本電気ホームエレクトロニクス株式会社 Resin molding equipment for electronic parts
JPS55111348U (en) * 1979-10-02 1980-08-05

Also Published As

Publication number Publication date
JPS596844U (en) 1984-01-17

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