JPH04172662A - Managing method for defect of memory medium - Google Patents

Abstract

PURPOSE:To shorten a seeking time by dispersively disposing an alternate sector in a data sector. CONSTITUTION:An alternate sector to be replaced with a defective sector generated in a data sector after initializing is dispersively disposed in the data sector for storing data. As the alternate sector of the defective sector, a nearest alternate sector at the rear of the defective sector is used. If the alternate sector is not sufficient, next nearest alternate sector is further sequentially used. Thus, a seeking time can be shortened by writing a content of the defective sector in the near alternate sector at the rear of the defective sector.

Description

DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a defect management method when a defect occurs in a storage medium.

Conventional technology The storage area of a storage medium such as an optical disk consists of a user area used by the user of the host system, and a replacement area for replacing bad sectors other than the initial bad sectors that are bad sectors when the optical disk is shipped. and a management area to manage the replaced information. Defect management to manage this bad sector (sector slipping defect management (on defect mafujimen day)
Sector slipping Defect Ma
(hereinafter referred to as SDM) and Linear Replacement Defect Management (Linea
r replacement Defect )'Ia
nageaient (hereinafter referred to as LDM).

Before a user uses an optical disc for the first time, SDM
This is a method of removing bad sectors.Certification is performed on the track numbers and sector numbers that are physically managed on the optical disk.Initial bad sectors are detected by erasing, writing, helifi, or other means on the entire optical disk. (and complement the bad sectors), except for the bad sectors and replacement areas.
Allocates logical addresses for access from the upper system.

LDM is a method for removing defective sectors from an optical disk that has been subjected to SDM, if such bad sectors subsequently occur.

An example of such defect management using LDM will be explained with reference to FIG.

FIG. 8 is a plan view of an optical disk, and (a) shows a state in which the vertical axis shows physical track addresses, the horizontal axis shows physical sector addresses, and logical addresses are written. D.
,D,,D3. D, indicates the initialization detection sector detected by the SDM during initialization, and this sector is skipped (
(by slipping) a logical address is assigned. A circled 53 indicates that a write defective sector was detected as a result of a write operation and helifi after SDM. (b) shows a situation in which the contents to be stored in this 53 have been written in the replacement area, and (C1 indicates that this 53 has been written in the management area and is being managed as a defect.

Next, in (a), a write operation is performed after SDM, and the procedure for reading after being written to the spare area will be explained using FIG. 9 and the tenth section.

FIG. 9 is a write operation flowchart for writing to sectors 50 to 59 after SDM. A write operation is performed on the logical atlases 50 to 59 (step 9I), and a refinement is performed to check whether the writing is correct or not, and it is detected that there is a defect in the logical atlas 53 (step 92). In order to rewrite this defective sector 53, seek the replacement area in FIG.
Step 94). After writing, step 95) to confirm that it has been written correctly. Then the 8th
Step 96) Seek the management area shown in step (C).
, A53 is written in the management area (step 97),
The state in which 53 is written in the replacement area is managed, the result is helified (step 98), and the process ends.

Next, the procedure for reading out a disc written in this manner will be explained using the flowchart of FIG. 10. First, the logical addresses 50 to 52 are searched (step 101), and then, since 53 is written in the spare area as a defective sector, a seek is performed to the spare area (step 102), and 53 is written here. Next step 103), return to the 5th track in the user area (step 104), and move the remaining 54 to 59 by 1J.
- (step 105), and the process ends.

Problems to be Solved by the Invention As mentioned above, if the written sector is defective, the contents to be stored in the defective sector are written to the replacement area, so when reading, the data is sought to the replacement area and read from there. After that, you had to seek back to the original user area again, which took a lot of time.

The present invention has been made in view of the above problems, and
It is an object of the present invention to provide a defect management method for a storage medium that enables rewriting of a defective sector to a replacement area with a short seek time.

Means for Solving the Problems In order to achieve the above object, the storage medium defect management method of the present invention provides a data sector number after initialization in a data sector for storing data, which replaces a defective sector that has occurred. are distributed and placed, and the nearest replacement sector after the defective sector is used as a replacement sector for the defective sector, and when this replacement sector alone is insufficient, the next closest replacement sector is used for 1@. This is what I did.

Effect: With the above configuration, the replacement sectors are distributed and arranged within the data sector, so the seek time is shortened by writing the contents of the defective sector into the replacement sector closest to the rear of the defective sector.

Example Embodiments of the present invention will be described below with reference to the drawings.

FIG. 1 shows a state in which an optical disc is displayed in a plan view for explaining the present embodiment. The vertical axis indicates physical track addresses, the horizontal axis indicates physical sector addresses, and the displayed numbers indicate logical addresses.

D1 to D4 indicate defective sectors detected at the time of initialization, and logical addresses are numbered to skip (slip) these defective sectors. R,, R2 are replacement sectors for defective sectors that were written after initialization and detected by repair, R1 is replacement sectors for defective sectors that occurred in sectors between 0 and 56, and R2 is replacement sectors for sectors 57 and 103. sector.

Next, the procedure for writing to sectors 50 to 59 in the state shown in step 111Q will be explained using the write operation flow diagram of FIG. After writing to sectors 50 to 59 (step 1), when the attempt was made to perform herifing of the sectors (step 2), sector 53 was found to be defective (step 3). Therefore, the contents written to 53 to 56 are stored at track address 5. Write to sectors at sector addresses 6 to 9 (step 4).

This makes the old 53 a defective sector, and R.

The contents of the old 56 will be written to. Next, add the newly written numbers 53 to 56 (Step 5)
, it will exit if written correctly. This state is the third
As shown in the figure. Incidentally, when 5402 sectors instead of 53 appear, or when a defective sector is detected again in step 5 - refi, similar operations are performed up to R2.

The fourth panel is a flow diagram showing the procedure for using the replacement sector R. Part 5, FIG. 6 is a defective sector management chart used when R is used. First, FIGS. 5 and 6 will be explained.

Figure 5 S: Set, LBA (+, 0g1ca! Old ock
Address) indicates a logical address numbered after a defective sector detected during initialization and a replacement sector for the defective sector detected after subsequent writing.

PBA (Physical Block Add
ress) -LB A indicates the difference between the physical address and the logical address, which indicates the cumulative number of defective sectors and replacement sectors from the beginning. The number of spares indicates the number of replacement sectors. The numerical values listed in this table indicate the 1st V state. That is, LBAl,4 represents logical address 14 in FIG.
, 1-LBA is the number 1 of defective sectors D1 before this 14
The spare number 0 indicates that the sector before this 14 is not the replacement sector R.

Also, LBA57 with serial number 4 represents 57 in Figure 1, and PB
A-LBA 3 comes before this 57, Dz.

It shows that there are three R3s, and the reserve number 1 represents the number of R1s. Figure 6 is R by rewriting Figure 4 Q, but not shown.
Figure 5 shows the modified result of using . Next, a method of using the replacement sector R will be explained using FIG. In FIG. 1, it is assumed that data is written to sectors 50 to 59, and as a result of helifi, 53 is found to be a defective sector. So this 53
Find the logical address 53 of . (Step 11). Next, based on this 53, the serial number 4 with the closest LBA (57 in this case) larger than 53 is determined from FIG. 5 (step 12), and the replacement sector R1 of this serial number is determined (step 13).

Next, the contents to be stored in sectors 53 to 56 are newly stored in sectors 53 to 56 (track 5, sectors 6 to 56) as shown in Figure 3.
9) and performs slip processing and writes (step 14). Next, as shown in Figure 6, the LBA of serial number 4 is rewritten from 57 to 53 (Step 15), and the number of spares is changed from 1 to 0.
(step 16).

Depending on how the replacement sectors R+, Rz, . . . , Ro shown in FIG. For this purpose, it is desirable to place more R in areas where many defective sectors occur, and less R in areas where fewer defective sectors occur.

For this purpose, FIG. 7 shows a flowchart for arranging the replacement sector R in a location where defects such as writing are likely to occur. In FIG. 7, when a defective sector (D) after writing is detected (step 20), the defective sector (D) is detected (step 20).
D), step 21), increment the value A of the counter for counting the number of defective sectors, step 22), check whether the value of A is greater than a predetermined number of defective sectors, step 23), and if it is smaller. Finish and search for the next defective sector. When A becomes larger than k in step 23, the counter value A is cleared,
The number of reserves is set (step 25). If the defect (D) is not detected in step 20, check whether the number of spares is set or not (step 26), and if the number of spares is set in step 25, register it as spare R in the column of number of spares in Figure 5. Step 27), reset the number of reserves set in step 25 (step 28).If the number of reserves is not set in step 26, the inspected sector is a normal safeter and a logical address cannot be assigned. Since it is possible, register it as a logical address (step 29).

Effects of the Invention As is clear from the above description, the present invention makes it possible to shorten the seek time by distributing and arranging replacement sectors within the data sector.

[Brief explanation of the drawing]

FIG. 1 is a two-dimensional diagram of an optical disk for explaining the present invention in detail, FIG. 2 is a flowchart of a write operation according to the present embodiment, and FIG.
Figure 4 is a flowchart showing the usage operation of replacement sector R, Figures 5 and 6 are diagrams showing specific examples of defective sector management charts, and Figure 7 is a diagram showing the arrangement of replacement sector R. Flowchart to explain, FIG. 8 is a plan view of an optical disk to explain the conventional example, FIG. 9 is a flowchart showing the writing operation in FIG. 8, and FIG. 10 is the readout operation shown in FIG. FIG. Name of agent: Patent attorney Akira Okaji and two others Figure 1 Physical sector address □ Figure 2 Figure 3 Physical sector address - 01234,56789 Figure 4 Figure 5 Figure 6 Serial number LBA PBA-LBA Reserve number 7 Figure 8 Physical sector address Figure 9 Figure 10

Claims (1)

[Claims] (1) Replacement sectors that replace defective sectors that occur in data sectors after initialization are distributed in data sectors that store data, and replacement sectors that are closest to the rear of this defective sector are used as replacement sectors for defective sectors. 1. A storage medium defect management method, characterized in that when the replacement sector is insufficient, the next closest replacement sector is sequentially used.