JPH0416734A - Method for measuring light emission characteristic - Google Patents
Method for measuring light emission characteristicInfo
- Publication number
- JPH0416734A JPH0416734A JP12223390A JP12223390A JPH0416734A JP H0416734 A JPH0416734 A JP H0416734A JP 12223390 A JP12223390 A JP 12223390A JP 12223390 A JP12223390 A JP 12223390A JP H0416734 A JPH0416734 A JP H0416734A
- Authority
- JP
- Japan
- Prior art keywords
- light
- current
- measurement
- measurement points
- light emitting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 8
- 238000005259 measurement Methods 0.000 claims abstract description 34
- 238000000691 measurement method Methods 0.000 claims description 4
- 238000004020 luminiscence type Methods 0.000 claims description 2
- 230000002950 deficient Effects 0.000 abstract 1
- 238000012545 processing Methods 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000003607 modifier Substances 0.000 description 1
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
【発明の詳細な説明】
「産業上の利用分野」
この発明は例えばレーザダイオードのような発光素子の
電流対発光量の特性を測定する発光特性測定装置に関す
る。DETAILED DESCRIPTION OF THE INVENTION "Field of Industrial Application" The present invention relates to a light emission characteristic measuring device for measuring the current versus light emission characteristics of a light emitting element such as a laser diode.
「従来の技術」
第３図及び第４図にレーザダイオードの電流対発光量の
特性を示す１図において横軸Ｉ、は被測定発光素子に与
える電流値、縦軸Ｐは被測定発光素子の発光量を示す。"Prior Art" Figures 3 and 4 show the characteristics of the current versus light emission amount of a laser diode. Indicates the amount of light emitted.
レーザダイオードのような発光素子では電流！。In a light emitting device like a laser diode, current! .
を境にこれより電流■３が増加すると発光量Ｐが急激に
増加し、Ｘ、以下では発光量Ｐは小さい。When the current 3 increases beyond this point, the amount of light emitted P increases rapidly, and below X, the amount P of light emitted light is small.
つまり電流１１以上て点灯し、■１以下では非点灯状態
と見られている。In other words, when the current is 11 or more, the lamp lights up, and when the current is 1 or less, it is considered to be in a non-lighting state.
発光素子の電流−発光量特性を測定する理由は以下の如
くである。The reason for measuring the current-light emission characteristics of a light emitting element is as follows.
レーザダイオードのような発光素子は光変調器の光源と
して利用される。このため電流−発光量特性が図示する
Ｑ点のように弯曲していると変調された光が非直線歪み
を持つことになるため、変調器の光源として利用するこ
とができないことになる。A light emitting device such as a laser diode is used as a light source for an optical modulator. For this reason, if the current-light emission characteristic is curved like point Q shown in the figure, the modulated light will have non-linear distortion and cannot be used as a light source for a modulator.
従って光変調器として利用するレーザダイオードは［流
−発光量特性を測定し、弯曲部Ｑが存在するか否かを測
定している。Therefore, the flow-emission characteristics of the laser diode used as an optical modulator are measured to determine whether a curved portion Q exists or not.
「発明が解決しようとする課題ｊ
レーザダイオードの電流−発光量特性において、弯曲部
Ｑは比較的急峻な弯曲となっている。``Problem to be Solved by the Invention j'' In the current-emission characteristics of a laser diode, the curved portion Q has a relatively steep curve.
このためこの弯曲部Ｑを検出するには測定ボイントＰを
第４図に示すように細かく採らなければならない、つま
り第３図に示すように測定ポイントＰを粗く採った場合
は弯曲部Ｑを見逃してしまうおそれがある。Therefore, in order to detect this curved part Q, the measurement points P must be taken finely as shown in Figure 4.In other words, if the measurement points P are taken roughly as shown in Figure 3, the curved part Q will be missed. There is a risk that this may occur.
然しながら測定ポイントＰを細かく採ることによって測
定に時間が掛る欠点が生じる。However, by taking the measurement points P finely, a drawback arises in that the measurement takes time.
この発明の目的はこのように相反する条件を克服して弯
曲点Ｑを見逃すことなく短時間に発光素子の電流−発光
量特性を測定することができる測定方法を提案しようと
するものである。An object of the present invention is to overcome these conflicting conditions and to propose a measurement method that can measure the current-light emission characteristics of a light emitting element in a short time without missing the curved point Q.
「課題を解決するための手段」
この発明では電流の供給によって或る電流値を境に発光
状態と非発光状態とに区分けされて動作する発光素子の
電流−発光量特性測定方法において、
発光素子の非発光領域では測定ポイントを粗に選定し、
これにより発光Ｎ域では測定ポイントを密に採っても全
体の測定時間を短かくすることができるようにした発光
特性測定方法を提案するものである。"Means for Solving the Problems" The present invention provides a method for measuring current-light emission characteristics of a light-emitting element that operates by dividing the light-emitting element into a light-emitting state and a non-light-emitting state at a certain current value by supplying a current. In the non-emitting area, measurement points are roughly selected,
As a result, we propose a light emission characteristic measuring method that can shorten the overall measurement time even if measurement points are taken densely in the light emission N region.
二の発明の発光特性測定方法によれば光変訓器の光源と
して利用する場合に、その良否を判定する発光領域の測
定ポイントを密に採り、非発光領域の測定ポイントを粗
に採ったから、全体の測定時間を短かくすることができ
る。According to the method for measuring luminescence characteristics of the second invention, when used as a light source for a light modifier, the measurement points in the light-emitting area to judge the quality are taken closely, and the measurement points in the non-light-emitting area are taken loosely. The overall measurement time can be shortened.
然も発光領域の測定ポイントを密に採るから弯曲部を見
逃すことはない、従って短時間に然も信転性の高い発光
素子の電流−発光量特性を測定することができる。Moreover, since the measurement points in the light emitting region are taken closely, curved parts are not overlooked, and therefore the current-light emission characteristics of the light emitting element with high reliability can be measured in a short period of time.
「実施例」
第り図にこの発明の一実施例を示す、この実施例では被
測定発光素子が発光状態となる領域Ａでは境界となる電
流値１ｈを境に測定点Ｐの間隔をΔＩずつ採り、非発光
領域Ｂでは測定点Ｐの間隔をｎ・ΔＩ（ｎ≧２）に選定
した場合を示す。"Example" Figure 2 shows an example of the present invention. In this example, in region A where the light emitting element to be measured is in a light emitting state, the interval between measurement points P is increased by ΔI from the current value 1h which is the boundary. In the non-emission region B, the interval between the measurement points P is selected to be n·ΔI (n≧2).
具体的にはΔＩ ＝ ０．１−＾、ｎ’ΔＩ＝：２＋Ａ
、Ｉｈ−７０＋ｗＡ、最大電流１＝＝９０ｍＡとした場
合、発光領域Ａで２００ポイント、非発光領域Ｂで３５
ポイントの測定点の数となる。Specifically, ΔI = 0.1-^, n'ΔI=:2+A
, Ih-70+wA, maximum current 1==90mA, 200 points in light-emitting area A, 35 points in non-light-emitting area B
This is the number of measurement points.
従ってこの発明によれば全体で測定ポイントＰの数は２
３５ポイントとなる。Therefore, according to this invention, the total number of measurement points P is 2.
It will be 35 points.
これに対し従来は０〜９０■への領域の全体を０．１■
Ａのステップで測定するから測定ポイントＰの数は９０
０ポイントになる。In contrast, conventionally the entire range from 0 to 90■ is 0.1■
Since the measurement is performed at step A, the number of measurement points P is 90.
It becomes 0 points.
例えば１ポイントの測定時間が２０ｍ５とすると従来の
測定方法では９００Ｘ２（１＋ａ’＝１８秒となる。こ
れに対し、この発明による測定方法によれば２３５Ｘ２
０ｗｓ＝４．７秒となる。For example, if the measurement time for one point is 20m5, the conventional measurement method would take 900X2 (1+a'=18 seconds.On the other hand, according to the measurement method of the present invention, it would take 235X2
0ws=4.7 seconds.
第２図にこの発明による測定方法によって動作する測定
装置の構成を示す。FIG. 2 shows the configuration of a measuring device that operates according to the measuring method according to the present invention.
図中１は被測定レーザダイオード、２はこの被測定レー
ザダイオードｌに電流１．を与える電流源、３は被測定
ダイオード１から出射される光４を受光して光４のエネ
ルギを電気信号に変換する受光素子を示す。In the figure, 1 is the laser diode to be measured, 2 is the laser diode to be measured, and the current 1. 3 indicates a light receiving element that receives light 4 emitted from the diode 1 to be measured and converts the energy of the light 4 into an electrical signal.
受光素子３は光４のエネルギに対応した電流１、を出力
し、この１．を電流−電圧変換器５で電圧信号Ｖに変換
し、この電圧信号■をＡＤ変換器６でＡＤ変換して制御
器７に入力する。The light receiving element 3 outputs a current 1 corresponding to the energy of the light 4, and this 1. is converted into a voltage signal V by a current-voltage converter 5, and this voltage signal (2) is AD-converted by an AD converter 6 and input to a controller 7.
制御器７はマイクロコンピュータによって構成すること
ができる。マイクロコンピュータは周知のように中央演
算処理袋ｆｃＰＵと、この中央演算処理装置ＣＰＵを所
定の順序に従って動作させるプログラムを収納するリー
ドオンリーメモリＲＯＭと、データ等を一時記憶するメ
モリＲＡＭと、入力ポートＩＮＦ、出力ポート○ＵＰと
によって構成される。The controller 7 can be configured by a microcomputer. As is well known, a microcomputer has a central processing unit fcPU, a read-only memory ROM that stores a program for operating the central processing unit CPU in a predetermined order, a memory RAM that temporarily stores data, etc., and an input port INF. , and an output port UP.
入カポ−） ＴＮＰにはＡＤ変換器６の外に数値入力手
段８が接続され、この数値入力手段８から被測定レーザ
ダイオード１の発光ＨＭＡと非発光領域Ｂの境界１＋ｂ
（予想値）を入力すると共に、発光領域Ａの測定ス
テップＰのステツプ幅を規定する電流値ΔＩ及び非発光
領域Ｂの測定ステップ幅を決めるｎ値を入力する。A numerical input means 8 is connected to the TNP outside the AD converter 6, and from this numerical input means 8 the boundary 1+b between the light emitting HMA of the laser diode 1 to be measured and the non-emitting region B is connected to the TNP.
(estimated value), and also input the current value ΔI that defines the step width of the measurement step P in the light emitting region A and the n value that determines the measurement step width in the non-light emitting region B.
中央演算処理装置は数値入力手段８から入力された各設
定値に従って非発光領域Ｂでは測定ポイン）Ｐをｎ・Δ
Ｉのステップで変化する制御信号を出力ポートＯＵＰか
ら出力し、この制御信号を電流源２に与えて被試験レー
ザダイオード！に与える電流■、をｎ・ΔＩのステップ
で変化させる。The central processing unit calculates the measurement point (P) in the non-light-emitting area B according to each setting value inputted from the numerical input means 8 by n·Δ.
A control signal that changes in steps I is output from the output port OUP, and this control signal is applied to the current source 2 to drive the laser diode under test! The current (■) given to the current is changed in steps of n·ΔI.
被試験レーザダイオードｌに与える電流１□が数値入力
手段８から入力した境界値■１に等しいか、大きくなる
かすると、中央演算処理装置ＣＰ［ｌは電流Ｉ□の変化
ステップをΔＩに変更し、電流源２を制御する。When the current 1□ applied to the laser diode under test l is equal to or larger than the boundary value ■1 input from the numerical input means 8, the central processing unit CP [l changes the change step of the current I□ to ΔI. , controls the current source 2.
このようにして非点灯領域Ｂと点灯領域Ａにおける被測
定レーザダイオードｌに与える電流！。In this way, the current given to the laser diode l to be measured in the non-lighting region B and the lighting region A! .
の変化ステップを変化させ、点灯領域Ａにおいて変化ス
テップを密に採るように動作させる。The change step is changed, and the change step is taken densely in the lighting area A.
被測定レーザダイオード１から出射される光４は受光素
子３に受光され、光４のエネルギに対応した電流Ｉ０に
変換される。この電流Ｉ０は電流−電圧変換器５で電圧
信号に変換されＡＤ変換器６でディジタル信号に変換さ
れ、中央演算処理装置ＣＰＵに取込まれる。Light 4 emitted from the laser diode 1 to be measured is received by the light receiving element 3 and converted into a current I0 corresponding to the energy of the light 4. This current I0 is converted into a voltage signal by a current-voltage converter 5, converted into a digital signal by an AD converter 6, and taken into the central processing unit CPU.
中央演算処理装置ＣＰＵに取込まれた測定データはメモ
リＲＡＭに記憶されると共に、出力ポートＯＵＰから表
示器９に出力されて発光量に対応した値と電流１．の値
を表示する。これらの数値は必要に応してプリンタ１０
によって印字させることができる。The measurement data taken into the central processing unit CPU is stored in the memory RAM, and is also output from the output port OUP to the display 9 to display the value corresponding to the amount of light emitted and the current 1. Display the value of These numbers can be added to the printer 10 as needed.
It can be printed by
「発明の効果」
以上説明したように、この発明によればレーザダイオー
ドｌの電流−発光量特性を測定する際に、発光領域Ａの
測定ステップを密に採り、非発光領域Ｂでは測定ステッ
プを粗に採ったから、非発光領域Ｂにおける測定時間を
短縮することができる。"Effects of the Invention" As explained above, according to the present invention, when measuring the current-light emission characteristics of the laser diode l, the measurement steps are closely taken in the light-emitting region A, and the measurement steps are not taken in the non-light-emitting region B. Since the samples were taken sparsely, the measurement time in the non-light emitting region B can be shortened.
この結果レーザダイオードの電流−発光量特性を効率よ
く測定することができ、光変調器の光源用に用いること
ができるか否かを短時間に判定することができ、多くの
数のレーザダイオードを効率よく検査することができる
利点が得られる。As a result, the current-emission characteristics of a laser diode can be efficiently measured, and whether or not it can be used as a light source for an optical modulator can be determined in a short time. This provides the advantage of being able to perform inspections efficiently.
第１図はこの発明による測定方法を説明するためのグラ
フ、第２図はこの発明による測定方法を実行する測定装
置の一例を示すブロック図、第３図及び第４図は従来の
技術を説明するためのグラフである。
Ａ：発光領域、Ｂ：非発光領域、Ｐ：測定ポイント、１
１ ：境界値。FIG. 1 is a graph for explaining the measuring method according to the present invention, FIG. 2 is a block diagram showing an example of a measuring device for carrying out the measuring method according to the present invention, and FIGS. 3 and 4 are for explaining conventional techniques. This is a graph for A: Light-emitting area, B: Non-light-emitting area, P: Measurement point, 1
1: Boundary value.
Claims (1)
非発光領域とに分かれて動作する発光特性を持つ発光素
子の電流−発光量特性を測定する発光特性測定方法にお
いて、 上記非発光領域では測定ポイントを粗に選定し測定時間
を短縮するようにした発光特性測定方法。(1) In the method for measuring the light emitting characteristics of a light emitting element having a light emitting characteristic that operates by dividing into a light emitting region and a non-light emitting region at a certain current value by supplying a current, the above-mentioned non-light emitting A luminescence characteristic measurement method that shortens measurement time by roughly selecting measurement points in the area.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12223390A JP2862331B2 (en) | 1990-05-11 | 1990-05-11 | Emission characteristics measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12223390A JP2862331B2 (en) | 1990-05-11 | 1990-05-11 | Emission characteristics measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0416734A true JPH0416734A (en) | 1992-01-21 |
| JP2862331B2 JP2862331B2 (en) | 1999-03-03 |
Family
ID=14830869
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12223390A Expired - Lifetime JP2862331B2 (en) | 1990-05-11 | 1990-05-11 | Emission characteristics measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2862331B2 (en) |
-
1990
- 1990-05-11 JP JP12223390A patent/JP2862331B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2862331B2 (en) | 1999-03-03 |
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