JPH0415536A - Automatic positioning device for testing device - Google Patents
Automatic positioning device for testing deviceInfo
- Publication number
- JPH0415536A JPH0415536A JP11748190A JP11748190A JPH0415536A JP H0415536 A JPH0415536 A JP H0415536A JP 11748190 A JP11748190 A JP 11748190A JP 11748190 A JP11748190 A JP 11748190A JP H0415536 A JPH0415536 A JP H0415536A
- Authority
- JP
- Japan
- Prior art keywords
- positioning
- pin
- tested
- machine
- supporting plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical group C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 5
- 230000006835 compression Effects 0.000 abstract description 2
- 238000007906 compression Methods 0.000 abstract description 2
- 239000003638 chemical reducing agent Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 1
Landscapes
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Testing Of Engines (AREA)
Abstract
Description
【発明の詳細な説明】
［産業上の利用分野］
この発明は、試験装置と被試験機との回転中心を合わせ
るために基準穴を合わせる位置決め装置で、特に、複数
の被試験機を試験するための試験装置の自動位置決め装
置に関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention is a positioning device that aligns a reference hole to align the rotation centers of a test device and a device under test, and is particularly suitable for testing a plurality of devices under test. This relates to an automatic positioning device for testing equipment.
「従来の技術］
第５図、第６図は、例えば実開昭５９−１４２７５１号
公報に示された従来の位置決め装置で、自動位置決め装
置を支持する架台（１）上の自動位置決め装置スライド
軸受（２）に支持枠（３）が支承されている。この支持
枠（３）に取付げらな支持板スライド軸受（２４）には
支持板（７）が、支持枠（３）上を水平方向にスライド
可能に取付けられている。（２５）は支持枠（３）に固
定され、支持板（７）に連結された支持板スライドシリ
ンダである。支持板（７）には各１対の位置決めピン（
２２） （２６）が埋め込まれている。（４）はコンベ
ア、（５）はコンベア（４）上のパレッｌ−１（６）は
パレット（５）上に支持された被試験機である。"Prior Art" Figures 5 and 6 show a conventional positioning device shown in, for example, Japanese Utility Model Application Publication No. 59-142751, in which an automatic positioning device slide bearing on a pedestal (1) supporting the automatic positioning device is shown. A support frame (3) is supported on the support frame (3).A support plate (7) is attached to the support plate slide bearing (24) that is attached to the support frame (3) horizontally. (25) is a support plate slide cylinder fixed to the support frame (3) and connected to the support plate (7). Each support plate (7) has a pair of Positioning pin(
22) (26) is embedded. (4) is a conveyor, (5) is a pallet on the conveyor (4), and l-1 (6) is a tested machine supported on the pallet (5).
以上の構成により、被試験１（６）はパレット（５）に
より支持され、コンベア（４）により試験装置に順次搬
入される。まず、試験装置に搬入された被試＠機（６）
に対し、支持枠（３）に取付けられた支持板スライド軸
受（２４）および支持板スライドシリンダ（２５）によ
り、支持板（７）を被試験ｍ（６）のバリエーションに
合った位置（図では位置決めピン（２２）の方）にスラ
イドしてセラＩ・される。次に架台（１）に取付けられ
た位置決め装置スライド軸受（２）により支持枠（３）
を前進させる。これにより支持板（７）が前進し被試験
機（６）の基準穴に支持板（７）に埋め込まれた位置決
めピン（２２）が入り込み被試験機（６）が試験装置の
規定位置に位置決めされる。With the above configuration, the test objects 1 (6) are supported by the pallet (5) and are sequentially carried into the test apparatus by the conveyor (4). First, the machine under test (6) was carried into the test equipment.
Meanwhile, the support plate slide bearing (24) and support plate slide cylinder (25) attached to the support frame (3) move the support plate (7) to a position suitable for the variation of the test m (6) (in the figure). locating pin (22)) to be inserted. Next, the support frame (3) is moved by the positioning device slide bearing (2) attached to the pedestal (1).
advance. As a result, the support plate (7) moves forward, and the positioning pin (22) embedded in the support plate (7) enters the reference hole of the device under test (6), positioning the device under test (6) at the specified position of the test equipment. be done.
次に、上記被試験機とは寸法の異なるものが搬入された
ときは、スライドシリンダ（２５）により支持板（７）
を水平方向に移動して、上述と同じ方法で位置決めされ
る。Next, when a machine with different dimensions from the above-mentioned tested machine is brought in, the support plate (7) is moved by the slide cylinder (25).
is moved horizontally and positioned in the same manner as described above.
［発明が解決し７ようとする課題］
従来の試験装置の自動位置決め装置は以トのように構成
されているので、寸法の異る被試験機を位置決めする場
合、２種類の被試験機にしが対応できず、かつ、支持板
を水平方向に移動させるため、幅方向の寸法が大きくな
る等の問題があった。[Problems to be Solved by the Invention] Since the automatic positioning device of the conventional test equipment is configured as shown below, when positioning the machines under test with different dimensions, it is difficult to position two types of machines under test. However, since the supporting plate is moved horizontally, there are problems such as an increase in the widthwise dimension.
この発明は上記のような問題点を解消するためになされ
たもので、２種類以上の被試験機に対応できるとともに
、全体の幅方向が小さくてきる試験装置の自動位置決め
装置を得ることを目的とする。This invention was made to solve the above-mentioned problems, and its purpose is to provide an automatic positioning device for testing equipment that can handle two or more types of test equipment and that can reduce the overall width direction. shall be.
［課題を解決する′１：めの手段］
この発明に係る試験装置の自動位置決め装置は、被試験
機を位置決めする支持板を回転可能とし、位置決めピン
を支持板の中に前後可動に埋め込み、後部支持枠に組込
ん／ごエアシリンダを駆動させて必要な位置決めピンだ
（−）を支持板よりも前方へ突出させるようにしたもの
て′ある、。[Means for Solving the Problem '1] An automatic positioning device for a test device according to the present invention has a support plate for positioning a device under test that is rotatable, a positioning pin embedded in the support plate so as to be movable back and forth, There is one that is built into the rear support frame and driven by an air cylinder to make the necessary positioning pin (-) protrude further forward than the support plate.
［作 用］
この発明においては、位置決めピンを２種類以−し、数
多く支持板に埋込むことが可能であり、がっ、被試験機
に適応した位置決めピンだけが突出するため、他のピン
が位置決めの妨げにならない。[Function] In this invention, two or more types of positioning pins can be embedded in a large number of support plates, and only the positioning pins suitable for the machine under test protrude, so other pins can be embedded. does not interfere with positioning.
「実施例］
以下、この発明の一実施例を図について説明する。第１
図、第２「４、第３図、第４図において、支持板げ）は
、４箇所の回転支持軸受（９）に支えられ、かつ、外周
部に回転駆動をｌｊ、えるための大歯車（８）が取付け
られ、大歯車（８）と噛合って支持板（７）を回転させ
る小歯車（１６）が４支持枠（３）に取イ４けられた減
速機付パルスモータ（１５）の軸端に装着されている。“Example” An example of the present invention will be described below with reference to the drawings.
The support plate (in Figures 2 and 4) is supported by four rotational support bearings (9) and is a large gear for providing rotational drive on the outer periphery. (8) is attached, and the small gear (16) that meshes with the large gear (8) to rotate the support plate (7) is attached to the four support frames (3). ) is attached to the shaft end.
（１２ａ）（１２ｂ）は支持板（７）を位置決めするた
めの穴で、その後面には支持板（７）と支持枠（３）と
を位置決めする位置決めピン（１９）が配置され、フロ
ーティングジョイン１〜（１８）を介して駆動シリンダ
（１０）に接続されている。ブラケッ？−（１７）は駆
動シリンダ（１０）を支持枠（３）に取付（）ている。(12a) and (12b) are holes for positioning the support plate (7), and positioning pins (19) for positioning the support plate (7) and the support frame (3) are arranged on the rear surface, and the floating joint It is connected to the drive cylinder (10) via 1 to (18). Bracket? - (17) attaches the drive cylinder (10) to the support frame (3).
穴（１３）には、支持板（７）と被試験機（６）とを位
置決めするための位置決めピン（２２）が出入する。位
置決めピン（２２）は、後面に弾着した圧縮コイルバネ
（２３）により常に後方へ待機している。A positioning pin (22) for positioning the support plate (7) and the device under test (6) moves in and out of the hole (13). The positioning pin (22) is always held at the rear by a compression coil spring (23) that is attached to the rear surface.
位置決めピン（２２）を前方へ押出すための押し金具（
２１）は駆動シリンダ（１１）に取付けられている。ブ
ラケッ１−（２０）は支持枠（３）に駆動シリンダ（１
１）を取付けている。（１４）は位置をずらして設（）
られた駆動シリンダである。A push metal fitting (for pushing the positioning pin (22) forward)
21) is attached to the drive cylinder (11). Bracket 1-(20) is attached to drive cylinder (1) on support frame (3).
1) is installed. (14) is set at a different position ()
This is the driven cylinder.
その他、第５図、第６図と同一・符号は同一部分を示し
７ている。Other parts are the same as those in FIGS. 5 and 6, and the same reference numerals indicate the same parts 7.
次に動作について説明する。被試験機（６）はパレット
（５）により支持されコンベア（４）により試験装置に
順次搬入される。駆動シリンダ（１０）によって位置決
めピン（１９）を前進させ、支持枠（３）に支持板（７
）を位置決めする。次に、駆動シリンダ（１１）によっ
て位置決めピン（２２）を前進させて支持板（７）より
前方に突出させる。Next, the operation will be explained. The machines under test (6) are supported by a pallet (5) and are sequentially carried into the testing apparatus by a conveyor (4). The positioning pin (19) is advanced by the drive cylinder (10), and the support plate (7) is attached to the support frame (3).
). Next, the positioning pin (22) is advanced by the drive cylinder (11) to protrude forward from the support plate (7).
次に、架台（１）に取付けられた位置決め装置スライド
軸受（２）により支持枠（３）を前進させる。Next, the support frame (3) is advanced by the positioning device slide bearing (2) attached to the pedestal (1).
これにより支持枠（７）が前ａ Ｌ、被試験機（６）の
基準穴に支持板上に突き出た位置決めピン（２２）が入
り込み、被試験機（６）が試験装置の規定位置に位置決
めされる。As a result, the support frame (7) is moved forward a L, the positioning pin (22) protruding from the support plate enters the reference hole of the device under test (6), and the device under test (6) is positioned at the specified position of the test device. be done.
次に上記被試験機とは寸法の異なるものが搬入されてき
たときには、減速機付パルスモータ（１５）を被試験機
に合った位置［図では穴（↑２ａ）がら（１２ｂ）位置
へ１まで回転させる。その後の位置決め手＋１１ｉ￥は
上述と同様である。Next, when a machine with different dimensions from the machine under test is brought in, move the pulse motor with reducer (15) to a position that matches the machine under test [in the figure, move it to position 1 through the hole (↑2a) (12b). Rotate until. The subsequent positioning means +11i\ are the same as described above.
なお、」二層実施例ては、減速機付パルスモータて支持
板を回転させたが、サーボモータあるいはシリンダ駆動
等で回転させてもよく、同様の効果を奏する、。In addition, in the two-layer embodiment, the support plate is rotated by a pulse motor with a speed reducer, but it may be rotated by a servo motor or cylinder drive, and the same effect can be obtained.
［発明の効果］
以上のように、この発明によれば、支持板を回転可能と
し、複数個の位置決めピン支持板に出入可能に設けたの
て、装置の幅方向を小さくでき、かつ、数多くの被試験
機に対応して位置決めできる等の効果がある。[Effects of the Invention] As described above, according to the present invention, the support plate is made rotatable and provided so as to be able to move in and out of the plurality of positioning pin support plates, so that the width direction of the device can be reduced, and the number of pins can be reduced. This has the advantage of allowing positioning to be performed in accordance with the machine under test.
第１図〜第４図はこの発明の一実施例を示し、第１図は
正面図、第２図は側面図、第３図、第４図はそれぞれ一
部側断面図である。第５図は従来の試験装置の自動位置
決め装置の正面図、第６図は同じく側面図である。
（１）・ 架台、（３） ・支持枠、（６）・・被
試験機、（７）・・支持板、（８）・・大歯車、（１０
）（１１，）（１，４） 、 、駆動シリンダ、（１２
ａ）（１２ｂ）（１３）−−位置決め穴、（１５）・
減速機付パルスモータ、（１６）・・小歯車、（１９）
（２２）・・位置決めビン。
なお、各図中、同一符号は同−又は相当部分を示す。1 to 4 show an embodiment of the present invention, in which FIG. 1 is a front view, FIG. 2 is a side view, and FIGS. 3 and 4 are partially side sectional views. FIG. 5 is a front view of an automatic positioning device of a conventional test device, and FIG. 6 is a side view of the same. (1) Frame, (3) Support frame, (6) Machine under test, (7) Support plate, (8) Large gear, (10
)(11,)(1,4) , , drive cylinder, (12
a) (12b) (13)--Positioning hole, (15)・
Pulse motor with reducer, (16)...Small gear, (19)
(22)...Positioning bin. In each figure, the same reference numerals indicate the same or corresponding parts.
Claims (1)
枠と、この支持枠に回転可能に取付けられた支持板と、
異なる寸法の被試験機に対し適合する複数個の位置決め
手段をもち自動にて前記支持板を回転位置決めする手段
と、前記支持板内に出入可能に埋込んだ位置決めピンを
選択して突出させ前記被試験機に係合させる手段とを備
えてなる試験装置の自動位置決め装置。a support frame that is horizontally slidably attached to the pedestal; a support plate that is rotatably attached to the support frame;
A means for automatically rotating and positioning the support plate by having a plurality of positioning means adapted to test machines of different sizes, and a positioning pin removably embedded in the support plate is selected and protruded. An automatic positioning device for a test device, comprising: means for engaging a device under test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11748190A JPH0663939B2 (en) | 1990-05-09 | 1990-05-09 | Automatic positioning device for test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11748190A JPH0663939B2 (en) | 1990-05-09 | 1990-05-09 | Automatic positioning device for test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0415536A true JPH0415536A (en) | 1992-01-20 |
| JPH0663939B2 JPH0663939B2 (en) | 1994-08-22 |
Family
ID=14712775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11748190A Expired - Lifetime JPH0663939B2 (en) | 1990-05-09 | 1990-05-09 | Automatic positioning device for test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0663939B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012208023A (en) * | 2011-03-30 | 2012-10-25 | Fuji Heavy Ind Ltd | Motoring device |
| JP2013213835A (en) * | 2013-07-17 | 2013-10-17 | Akebono Brake Ind Co Ltd | Brake dynamometer |
-
1990
- 1990-05-09 JP JP11748190A patent/JPH0663939B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012208023A (en) * | 2011-03-30 | 2012-10-25 | Fuji Heavy Ind Ltd | Motoring device |
| JP2013213835A (en) * | 2013-07-17 | 2013-10-17 | Akebono Brake Ind Co Ltd | Brake dynamometer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0663939B2 (en) | 1994-08-22 |
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