JPH04122863A - Connection diagnostic apparatus - Google Patents

Abstract

PURPOSE:To specify the location where connection abnormality is generated in a cable and to also detect momentary interruption by supplying a test signal to a plurality of the conductors in the cable connecting units and obtaining the AND of the test signals from a plurality of the conductors in the other unit. CONSTITUTION:When a test signal Ts of one level is sent out to a unit 112 from a test means T through a scanner 131, the test output To from a unit 113 is supplied to the means T from a scanner 132 and, therefore, when the signal of one level is returned from the scanner 132, the means T obtains such a diagnostic result that a connection state is normal inclusive of the connection of the connector parts between the unit 112, a cable 122 and the unit 113. Next, when the change-over contact of the scanners 131, 132 of a scanning circuit Sc moves to the left by one contact, the signal Ts of one level from the means T is sent out to a unit 111 from the scanner 131 and the output To from the unit 112 is supplied to the means T from the scanner 132 but, if the input from the scanner 132 of the means T is a zero level, a diagnostic result such that the connection between the unit 111, a cable 121 and the unit 112 is in a cut-off state is obtained.

Description

DETAILED DESCRIPTION OF THE INVENTION [Summary] The present invention relates to a connection diagnostic device that detects connection abnormalities in cables that transmit data, control signals, etc. between units in electronic equipment.

The purpose is to make it possible to identify the location where a connection error occurs in the cables that connect each unit, and also to detect instantaneous interruptions. A connection diagnostic device was constructed by providing means for supplying test signals to each of the plurality of 21 wires in this cable, and means for obtaining a logical product of the test signals from the plurality of conducting wires in the other unit.

[Industrial application field]

The present invention relates to a connection diagnostic device for detecting connection abnormalities in cables that transmit data, control signals, etc. between units in electronic equipment, such as a central processing unit unit and a main memory unit that constitute a computer, for example.

[Conventional technology]

It is common practice to connect multiple units with cables to configure the required equipment, but as the number of units increases, the connection between the sockets provided on these units and the plugs provided at the end of the cable becomes difficult. Equipment failures due to poor connections at connector portions that make electrical connections through fitting also significantly increase.

For example, as the system configuration of electronic computer systems becomes more complex, early detection of defective locations when a failure occurs becomes an urgent need.

Figure 6 shows connector parts C, C, in which sockets S, S, provided in a plurality of units U+, UZ, and plugs P+, pg provided at both ends of a cable W are fitted, respectively. , shows an example of a conventional connection diagnostic device in which the plurality of units U+ and Uz are electrically connected to form a required device.

The above-mentioned cable W is provided with one test wire t1 attached to it or using a conductor in the cable, and this test wire t
Both ends of 1 are plugs P+ provided at both ends of cable W,
Each plug is connected to an assigned connection pin of Pa, and is further connected to each plug Pl.

A connection line t3 for connecting to a connection line of another connector section is drawn out from the other connection pin of P2.

This plug (P) is connected to the socket (S) provided in the unit U1.
t, the test wire t1 is connected to the test conductor t2 in the unit through the corresponding connection pin of the socket S1 on the unit side at the connector part C3, like the other conductors of the cable W. They are electrically connected, and the other end of this test conductor 1t is connected to the connection pin of the socket that corresponds to the connection pin of the plug P from which the connection wire t3 is drawn out, so that the plug P1 and the socket S are connected. If the connection is good, a current path will be created along the path of the above test gt+=tz''ts.

As shown, in the conventional test equipment, the above test line tI+t! for each connector is used. , t2 are all connected in series, and whether or not these test wires constitute a closed loop can be determined by conducting a continuity test between terminals x and y using, for example, an ohmmeter or lamp. Diagnosing the connection status of the connector.

[Problem to be solved by the invention]

However, in such conventional methods, the connection status of many connectors is diagnosed simultaneously, so even if a connection abnormality is detected, it is not only impossible to identify the connector where the failure has occurred, but also There is a problem in that connection abnormalities due to disconnection cannot be detected.

SUMMARY OF THE INVENTION An object of the present invention is to provide a connection/disconnection device that is capable of specifying a location where a connection abnormality occurs in a cable connecting each unit, and is also capable of detecting a momentary disconnection.

[Means to solve the problem]

A cable that connects the units via the connector part,
A connection diagnostic device was constructed by providing means for supplying test signals to each of the plurality of conductive wires in the cable in one unit, and means for obtaining a logical product of the test signals from the plurality of conductive wires in the other unit.

[For production]

FIG. 1 is a diagram showing the principle of the present invention, in which two units L and 1g are connected to sockets 31.3z provided in these units 11.1□, plugs 40 provided at both ends of cable 2, 4□ are connected to each other by a connector part fitted with the cable 2, and the test wire 5
I, 5□ are provided, and these test wires are also connected to the test wires 61, 6□, 71. in each unit at the connector section. '
Connected to 7m.

The test lines 6i and 6g in the unit 11 are configured so that the same signal is applied to them by, for example, being commonly connected, and when performing diagnosis, the test signal Ts is applied to these test lines 65.6□. It is also supplied to the test wires 7, . 7! are connected to the input terminals of the AND circuit 8, respectively.

Therefore, the test signal Ts is transmitted to the test lines 61 and 6 by scanning by a service processor (not shown) or the like.
When supplied to □, the socket 31 in the connector part
．． 3□ and plug 4. ．． 4. If the contact is complete, this test signal will be transmitted to the test wire 58.5 attached to cable 2.
After □, Uni, To 1! Test line 7. , L to the input terminal of the AND circuit 8, the AND circuit 8 outputs a test output TO which is equal to the test signal Ts.

However, if the contact between the connector parts is insufficient, unit 1. Test line 7 or 7. Since the test signal Ts does not arrive at at least one of the units 1. The test output To is not produced from the AND circuit 8, and it can be diagnosed that there is a fault in the connection between the socket 3° and the plug 4 or between the socket 3□ and the plug 4□.

Although data used in normal processing can be used as the test signal, it is preferable to use positive or negative DC voltage or pulses from the viewpoint of processing. It can be applied to periodic diagnostics, such as when cable connection work is completed, or when an abnormality occurs in system operation.

〔Example〕

FIG. 2 is a block diagram showing a first embodiment of the present invention in which connection diagnosis is performed by a service processor SP, and includes three units 11. ．． Two cables connecting between 11z and 113 12. ．． This shows a case where the connection status of 12□ is diagnosed.

Unit 11. The circuit constituted by three drivers in unit l1g and the circuit constituted by two receivers and one AND circuit in unit txt and unit 113 each have the same function as the diagnostic circuit described in connection with FIG. Since it is clear that these circuits have the following functions, a description of the operation of these circuits will be omitted.

The service processor SP includes a scan circuit sc and a test means T, and a unit) If of the scan circuit Sc,
, 11□ output side scanner 13. which outputs the test signal. and unit 11. The switching contacts with the input side scanner 132 to which test outputs from the scanners 13., IIs are input are switched in synchronization with each other.
sends the test signal from the test means T to the unit 12z, and the scanner 13□ sends the test signal from the test means T to the unit 11. The test output is supplied to the test means T. Note that the scan circuit Sc
Scanner 13. ．． It goes without saying that 13□ is preferably constructed as an electronic switching circuit.

Therefore, when the test signal Ts at the "1" level is sent from the test means T to the unit 11□ through the scanner 131 in the illustrated state, the unit 11. Since the empty test output To is supplied to the scanner 13 □ and the empty testing means T, this testing means T detects the unit 11 □, the cable 12 □, and the unit 113 when a "1'' level signal is returned from the scanner 132. It is possible to obtain a diagnosis result that the connection state including the connection of the connector portion between the two is normal.

Next, the scanner 13. of scanning time 11Sc. ．． When the switching contact 13□ moves one contact to the left from the position shown in the figure, the "1" level test signal Ts from the test means T is transferred to the scanner 1.
3. from the scanner 13 to the unit 111.
．． The test output To from the unit 11□ is supplied to the test means T, but if the scanner 1 of this test means T
If the input force from 3□ is at 0” level, it is a unit)11.
, cable 121. It is possible to obtain a diagnosis result that the connection between the units 118 is cut off and the connection state is abnormal.

FIG. 3 shows an embodiment in which the transmission line for transmitting data between units is also used for testing, without providing a separate signal line for diagnosis. Three units21. ．． A case is shown in which the connection state of two cables 221 and 22□ connecting between 21g and 21z is diagnosed. In addition, D is a driver, R is a receiver,
The fact that & indicates an AND circuit is similar to the embodiment shown in FIG.

Unit 21g and unit 21. which are cascade connected by cable 22□. This will be explained using an example of a connection test between

Unit 21! When 2 is in a normal processing state, the logic circuit installed in the unit 21 receives data transmitted from the previous unit 21 via the transmission path, i, , L□, respectively, to the receiver R2□R2b. transmission path through. +L! k, and processes the data, and the processed output is sent to two drivers D-++, D□!, each connected in cascade from the output transmission line Ltm'rLZb'. ,D
melt D 822 and the next unit 21. through transmission lines L2°, . Cable 22□
Sent via .

A test is performed by the service processor SP when starting up the device or diagnosing the connection state, but the next unit 21. This unit 21 is used to test the connection between
In □, the output side transmission line Ltm'+L of the above logic circuit etc.
Two drivers D a r r connected in cascade to 2b'
AND circuits A□ are provided in the transmission lines L□' and Lzb'' between rD a r z and R,z,,D,,2, respectively.

+AZbo is supplied, and a test signal Tia+Ts& is input from this AND circuit to each transmission path.

That is, an AND circuit At whose output is connected to the transmission line L2.7. For example, one input terminal receives the test signal T sent out by the service processor SP from the bus B1 common to each unit. However, the other input terminal receives a "1" level gate signal G from the service processor SP via the scanner SC1 bus BZI.
is applied, the test signal T□ is transmitted from this AND circuit A2so. ', and the driver D
3, 2 to the transmission line L2゜1, the cable 22 connected at the connector part. and the transmission line 88 within the unit 213. is supplied to one input terminal of the AND circuit A31H.

Since the gate signal G is also supplied to the other input terminal of this AND circuit Ass, this AND circuit A3
．． From there, test output T is sent to bus B3, which is common to each unit. ,
is output.

Similarly, unit 21. The test output T from the AND circuit A3b. It is output to bus B4 common to each unit, and these buses ill B3. The test output T (111+'r,b) from B4 is input to the input terminal of the service processor SP, and as shown by the dotted line in the test means T, both test outputs are output by an AND means such as an AND circuit. The connection state is determined based on the presence or absence of T Oa+ Tob.

In addition, in this FIG. 3, the test signal T mm * Tub from the service processor SP is connected to separate bus lines B3 and B3, respectively.
Although the same signal Ts as the test signal T Mar Tub is shown as being supplied to the test signal T Mar Tub as described in FIG.
When using the test signal Ts, it is sufficient to use only one bus bar and supply the test signal Ts to this bus bar.

Also, an AND circuit for obtaining a test output in each unit 21, for example, an AND circuit A3 of the unit 213. If an AND circuit that takes the logical product of the outputs of A, A, and 1 is provided in the same way as in the case of FIG. 1, each unit can output the test output To. ,
It is clear that one bus bar may be provided in place of B, and that there is no need for an AND means as shown by the dotted line in the test means T.

Fig. 4 shows an example of a momentary interruption detection circuit for detecting momentary interruption, and the driver, receiver, etc. are omitted from illustration, and Fig. 5 is a time chart showing its operation. The circled numbers inside correspond to the circled numbers appended to the embodiment of the instantaneous interruption detection circuit in FIG.

The instantaneous interruption detection circuit of the unit 32 includes a NAND circuit N which receives a pair of test signal inputs from the previous unit 31 as cent inputs, and an S
A NAND circuit NZ constituting an R flip-flop, an inverter I that inputs a reset signal to one input terminal of the NAND circuit N2, and an inverter 1.1 that inverts the output of the NAND circuit Nl. It is composed of.

When a system abnormality is detected by a service processor (not shown), the service processor outputs a reset pulse shown in the waveform diagram (■) in FIG. 5 at time t1, and this reset signal is passed through an inverter I The output (2) of the NAND circuit N2 is set to the "1" level, and the output (2) of the NAND circuit N1 is set to the "0" level.

In this reset state, if the test signals ■ and ■ from the previous unit 31 both maintain "1", the output of the NAND circuit N1 maintains the "0" level, and therefore the test signal from the inverter ■2 The output ■ becomes the "1" level.

As shown in FIG.
When the test signal from the NAND circuit Nr N is interrupted momentarily, the output of the NAND circuit Nr N I goes to the "1" level and the test output ■ becomes the "0" level, and the output of the NAND circuit N2 also changes due to the output of this NAND circuit N. Even if the instantaneous interruption of the test signal is eliminated, this state can be maintained by the cross-connection between these NAND circuits N I and N z.

〔Effect of the invention〕

According to the present invention, it is possible not only to specify a connector portion with a defective connection, but also to detect a connection abnormality due to a momentary disconnection.

Furthermore, it is possible to use data used in normal processing as a test signal, and in addition, it is possible to perform a test using a line used for data transmission.

[Brief explanation of drawings]

Fig. 1 is a diagram showing the principle of the present invention, Fig. 2 and Fig. 3 are block diagrams showing different embodiments of the invention, Fig. 4 is a diagram showing a momentary interruption detection circuit, and Fig. 5 is its operation. FIG. 6 is a diagram for explaining a conventional connection diagnostic device.

Claims (1)

[Claims] A cable that connects the units via the connector part,
A connection diagnostic device comprising means for supplying test signals to each of the plurality of conductors in the cable in one unit, and means for obtaining a logical product of the test signals from the plurality of conductors in the other unit. .