JPH0399438U - - Google Patents

Info

Publication number
JPH0399438U
JPH0399438U JP884690U JP884690U JPH0399438U JP H0399438 U JPH0399438 U JP H0399438U JP 884690 U JP884690 U JP 884690U JP 884690 U JP884690 U JP 884690U JP H0399438 U JPH0399438 U JP H0399438U
Authority
JP
Japan
Prior art keywords
socket
connection
terminal
insulating substrate
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP884690U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP884690U priority Critical patent/JPH0399438U/ja
Publication of JPH0399438U publication Critical patent/JPH0399438U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP884690U 1990-01-30 1990-01-30 Pending JPH0399438U (US08124630-20120228-C00102.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP884690U JPH0399438U (US08124630-20120228-C00102.png) 1990-01-30 1990-01-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP884690U JPH0399438U (US08124630-20120228-C00102.png) 1990-01-30 1990-01-30

Publications (1)

Publication Number Publication Date
JPH0399438U true JPH0399438U (US08124630-20120228-C00102.png) 1991-10-17

Family

ID=31512463

Family Applications (1)

Application Number Title Priority Date Filing Date
JP884690U Pending JPH0399438U (US08124630-20120228-C00102.png) 1990-01-30 1990-01-30

Country Status (1)

Country Link
JP (1) JPH0399438U (US08124630-20120228-C00102.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020246300A1 (ja) * 2019-06-04 2020-12-10 株式会社クオルテック 半導体素子試験装置および半導体素子の試験方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020246300A1 (ja) * 2019-06-04 2020-12-10 株式会社クオルテック 半導体素子試験装置および半導体素子の試験方法
US11994551B2 (en) 2019-06-04 2024-05-28 Qualtec Co., Ltd. Semiconductor component test device and method of testing semiconductor components

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