JPH0395645U - - Google Patents
Info
- Publication number
- JPH0395645U JPH0395645U JP225690U JP225690U JPH0395645U JP H0395645 U JPH0395645 U JP H0395645U JP 225690 U JP225690 U JP 225690U JP 225690 U JP225690 U JP 225690U JP H0395645 U JPH0395645 U JP H0395645U
- Authority
- JP
- Japan
- Prior art keywords
- metal film
- shield metal
- probe needle
- utility
- scope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 239000000523 sample Substances 0.000 claims description 3
- 238000011156 evaluation Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 239000012212 insulator Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Description
第1図はこの考案の一実施例であるプローブ針
の使用状態を示す説明図、第2図は従来のプロー
ブ針の説明図である。
図において、1……タングステン針、2……絶
縁物、3……シールド金属皮膜、4……ガード金
属皮膜、5……測定器、6……低雑音ケーブル、
7……コネクタ、8……シールドを示す。なお、
図中、同一符号は同一、または相当部分を示す。
FIG. 1 is an explanatory view showing how a probe needle according to an embodiment of this invention is used, and FIG. 2 is an explanatory view of a conventional probe needle. In the figure, 1... Tungsten needle, 2... Insulator, 3... Shield metal film, 4... Guard metal film, 5... Measuring device, 6... Low noise cable,
7...Connector, 8...Shield. In addition,
In the figures, the same reference numerals indicate the same or corresponding parts.
Claims (1)
外皮のシールド金属皮膜の内側にシールド金属皮
膜を形成したことを特徴とする微小電流測定用プ
ローブ針。 A probe needle for microcurrent measurement used for semiconductor evaluation, characterized in that a shield metal film is formed inside the outermost shield metal film.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP225690U JPH0395645U (en) | 1990-01-11 | 1990-01-11 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP225690U JPH0395645U (en) | 1990-01-11 | 1990-01-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0395645U true JPH0395645U (en) | 1991-09-30 |
Family
ID=31506134
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP225690U Pending JPH0395645U (en) | 1990-01-11 | 1990-01-11 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0395645U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002022807A (en) * | 2000-07-11 | 2002-01-23 | Ricoh Co Ltd | Inspection apparatus for circuit board |
JP2017102002A (en) * | 2015-12-01 | 2017-06-08 | 三菱電機株式会社 | Check device |
-
1990
- 1990-01-11 JP JP225690U patent/JPH0395645U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002022807A (en) * | 2000-07-11 | 2002-01-23 | Ricoh Co Ltd | Inspection apparatus for circuit board |
JP2017102002A (en) * | 2015-12-01 | 2017-06-08 | 三菱電機株式会社 | Check device |
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