JPH0389136A - Load apparatus for microscopic material tester - Google Patents
Load apparatus for microscopic material testerInfo
- Publication number
- JPH0389136A JPH0389136A JP22654189A JP22654189A JPH0389136A JP H0389136 A JPH0389136 A JP H0389136A JP 22654189 A JP22654189 A JP 22654189A JP 22654189 A JP22654189 A JP 22654189A JP H0389136 A JPH0389136 A JP H0389136A
- Authority
- JP
- Japan
- Prior art keywords
- load
- indenter
- plate spring
- displacement
- lever
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000463 material Substances 0.000 title description 2
- 230000005540 biological transmission Effects 0.000 claims description 16
- 238000004154 testing of material Methods 0.000 claims description 4
- 238000012360 testing method Methods 0.000 abstract description 12
- 238000006073 displacement reaction Methods 0.000 abstract description 11
- 238000005259 measurement Methods 0.000 abstract description 6
- 238000005452 bending Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000007373 indentation Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
【発明の詳細な説明】 [産業上の利用分野] 本発明は、超微小材料試験機の荷重装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a loading device for an ultra-fine material testing machine.
[従来の技術]
超微小材料試験装置には、天秤状の棒材の一端部に電磁
力発生手段、他端部に圧子を設け、電磁力発生手段に負
荷電流を供給することにより該天秤のバランスをくずし
て圧子を試料表面に押し込むようにしたものがある。従
来のこの種の荷重装置は、第3図に示すように、電磁コ
イル29とコアで構成された電磁力発生部30に通電し
て上向きの力を発生させ、発生部に接続された発生力伝
達レバー31の一端部を支点32回りに押し上げ、他端
部を押し下げるようになっている。レバー31の他端部
には発生力伝達用板バネ33の一端部が連結されており
、板バネ33の他端部は、圧子35を保持する縦方向の
保持具34に設けた連結片36に連結されている。従っ
て、電磁力発生部30側のレバー31が押し上げられる
と、発生力伝達用板バネ33を介して圧子保持具34が
押し下げられ、圧子が試料へ押し込まれる。[Prior Art] An ultra-fine material testing device is equipped with an electromagnetic force generating means at one end of a balance-shaped bar and an indenter at the other end, and the balance is operated by supplying a load current to the electromagnetic force generating means. There is a method in which the indenter is pushed into the sample surface by destroying the balance of the indenter. As shown in FIG. 3, this type of conventional loading device generates an upward force by energizing an electromagnetic force generating section 30 composed of an electromagnetic coil 29 and a core, and generates a force connected to the generating section. One end of the transmission lever 31 is pushed up around the fulcrum 32, and the other end is pushed down. One end of a leaf spring 33 for generating force transmission is connected to the other end of the lever 31, and the other end of the leaf spring 33 is connected to a connecting piece 36 provided on a vertical holder 34 that holds an indenter 35. is connected to. Therefore, when the lever 31 on the side of the electromagnetic force generating section 30 is pushed up, the indenter holder 34 is pushed down via the generated force transmission plate spring 33, and the indenter is pushed into the sample.
[発明が解決しようとする課題]
上記した従来の荷重装置では、圧子へ試験荷重を負荷す
る際、発生力伝達用板バネに圧縮荷重が加わるため、試
験荷重が大きくなると、板バネが座屈することがあった
。このため荷重が50gf程度に限定されるという問題
点があった。また、板バネの損傷率も高いので、かなり
の頻度で部材交換を必要としていた。これを解決するた
め板バネを厚くして強度を高めようとすると、感度が低
下するので好ましくなかった。[Problems to be Solved by the Invention] In the conventional loading device described above, when applying a test load to the indenter, a compressive load is applied to the leaf spring for transmitting the generated force, so when the test load increases, the leaf spring buckles. Something happened. Therefore, there was a problem that the load was limited to about 50 gf. In addition, the leaf springs had a high rate of damage, so parts had to be replaced quite frequently. In order to solve this problem, attempts were made to increase the strength of the leaf spring by making it thicker, but this was undesirable because the sensitivity decreased.
そこで本発明は、従来と同じような板バネを使用しても
、試験荷重の増加が可能で、板バネの破損率も低下させ
ることができる荷重装置を提供することを目的とする。Therefore, an object of the present invention is to provide a loading device that can increase the test load and reduce the failure rate of the leaf spring even if a leaf spring similar to the conventional one is used.
[課題を解決するための手段]
本発明は、上記課題を解決するために、次のような構成
を採用した。[Means for Solving the Problems] In order to solve the above problems, the present invention employs the following configuration.
すなわち、本発明にかかる超微小材料試験機の荷重装置
は、上下方向に移動自在な圧子保持具の下端部に取り付
けられた圧子と、中間部に設けられた支点を中心として
上下に回動自在な天秤状の負荷伝達レバーと、該負荷伝
達レバーの一端部に設けられ該端部に上向きの荷重を加
える負荷発生部とを備え、前記負荷伝達レバーの負荷発
生部と反対側の端部は、板バネを介して該端部よりも上
方で前記圧子保持具に連結されていることを特徴とする
。In other words, the loading device of the ultra-fine materials testing machine according to the present invention has an indenter attached to the lower end of an indenter holder that is movable in the vertical direction, and a fulcrum that is provided in the middle of the indenter and rotates up and down. The load transmission lever includes a freely adjustable load transmission lever, and a load generation section that is provided at one end of the load transmission lever and applies an upward load to the end, the end of the load transmission lever opposite to the load generation section. is characterized in that it is connected to the indenter holder above the end portion via a leaf spring.
[作用]
負荷発生部の荷重が天秤式の負荷伝達レバーの端部に上
向きに加えられると、該レバーの反対側の端部が板バネ
を介して圧子保持具に下向きの力を加えるため圧子が試
料表面に押し込まれる。このとき板バネには引張荷重が
加わるので座屈や曲げが生じない。[Function] When the load of the load generating section is applied upward to the end of the balance-type load transmission lever, the opposite end of the lever applies a downward force to the indenter holder via the leaf spring. is pushed into the sample surface. At this time, a tensile load is applied to the leaf spring, so buckling or bending does not occur.
[実施例]
第1図は、本考案の1実施例装置の構成を示す断面図で
あり、枠体20内に自動平衡型電子天秤タイプの荷重装
置1が設けられている。この荷重装置lは、電磁コイル
3に負荷電流を供給することにより電子天秤のバランス
をくずして圧子6で試験荷重を負荷するもので、第2図
にこの荷重機構の構成を模式的に示す。すなわち、この
荷重装置工のカップ形の電磁コイル3は、その開放部が
下向きに配置され、電磁コイル3の下方に天秤式負荷伝
達レバー21が設けられている。計測制御装置12から
電磁コイル3に直流の負荷電流を供給すると、レバー2
1を上方に引き上げる電磁力が発生し、中間部に設けら
れた支点22回りにレバー21の他端部を押し下げる力
が働く。当該レバー21の他端部には上下方向に設けら
れた板バネ23の下端部が連結されており、この板バネ
の上端部は、圧子6を保持する上下動自在な保持具25
の連結片24に連結されている。このように構成された
荷重伝達機構において、負荷伝達レバー21のNfa力
発生部側の端部を引き上げると、負荷伝達レバー21が
回動して板バネ23を下方に引張るため、連結片24を
介して圧子保持具25が下方へ押し下げられ、圧子6が
試料表面に押し込まれる。[Embodiment] FIG. 1 is a sectional view showing the configuration of an apparatus according to an embodiment of the present invention, in which a self-balancing electronic balance type loading device 1 is provided within a frame 20. This loading device 1 unbalances the electronic balance by supplying a load current to the electromagnetic coil 3 and applies a test load with an indenter 6. FIG. 2 schematically shows the configuration of this loading mechanism. That is, the cup-shaped electromagnetic coil 3 of this loading device is arranged with its open portion facing downward, and a balance type load transmission lever 21 is provided below the electromagnetic coil 3. When a DC load current is supplied from the measurement control device 12 to the electromagnetic coil 3, the lever 2
An electromagnetic force is generated that pulls the lever 21 upward, and a force that pushes down the other end of the lever 21 acts around a fulcrum 22 provided at the intermediate portion. The other end of the lever 21 is connected to the lower end of a leaf spring 23 provided in the vertical direction, and the upper end of this leaf spring is attached to a vertically movable holder 25 that holds the indenter 6.
It is connected to the connecting piece 24 of. In the load transmission mechanism configured in this manner, when the end of the load transmission lever 21 on the Nfa force generating section side is pulled up, the load transmission lever 21 rotates and pulls the leaf spring 23 downward, so that the connecting piece 24 is pulled up. The indenter holder 25 is pushed down through the indenter holder 25, and the indenter 6 is pushed into the sample surface.
圧子6の上方には差動トランス式の変位検出器5が設け
られでおり、荷重をかけている間、圧子6によって押し
付けられた試料7表面での変位(くぼみ深さ)を検出す
る。変位検出器5によって検出された変位量、すなわち
圧子6の移動量は変位測定器(アンプ)10によって定
量的にとらえられて計測制御装置12に内蔵される。荷
重装置1で発生させる荷重は、計測制御装置12に入力
されているので、ある荷重下での変位をリアルタイムで
測定することができる。計測制御制御装置12は、これ
ら得られたデータをもとに演算処理し、必要な測定結果
を図示しないレコーダ等の記録装置13へ出力する。A differential transformer type displacement detector 5 is provided above the indenter 6, and detects the displacement (indentation depth) on the surface of the sample 7 pressed by the indenter 6 while a load is being applied. The amount of displacement detected by the displacement detector 5, that is, the amount of movement of the indenter 6, is quantitatively captured by a displacement measuring device (amplifier) 10 and incorporated into the measurement control device 12. Since the load generated by the loading device 1 is input to the measurement control device 12, displacement under a certain load can be measured in real time. The measurement control device 12 performs arithmetic processing on the obtained data and outputs necessary measurement results to a recording device 13 such as a recorder (not shown).
実施例装置には、補助的装置として光学モニタ15が設
けられている。光学モニタ15は、対物レンズ17、接
眼レンズ16等を備え、試料7の表面で試験を行なう位
置を測定したり、圧子6によって付けられたくぼみの状
態を作業者が観察するために用いられる。なお、試料台
8は昇降可能な構造を有し、X−Y方向、回転方向での
移動可能なステージ9が着脱自在に設けられ、ステージ
9の上面には試料7を固定するバイスが取り付けられる
。試料台8を操作して圧子6と試料7を近づけたり、任
意の試験位置に移動させることができる。The embodiment device is provided with an optical monitor 15 as an auxiliary device. The optical monitor 15 includes an objective lens 17, an eyepiece 16, etc., and is used by an operator to measure the position on the surface of the sample 7 to be tested and to observe the state of the depression formed by the indenter 6. Note that the sample stage 8 has a structure that can be raised and lowered, and a stage 9 that can be moved in the X-Y direction and rotational direction is detachably provided, and a vice for fixing the sample 7 is attached to the upper surface of the stage 9. . By operating the sample stage 8, the indenter 6 and sample 7 can be brought closer together or moved to any desired test position.
この実施例装置は上記のように構成されているので、試
験荷重を伝達する板バネには引張荷重が加わる状態で圧
子への負荷伝達が行なわれることになる。そのため、板
バネが座屈することが回避でき、試験荷重を増加するこ
とができる。このようなことから板バネを短かくするこ
ともでき試験機全体のコンパクト化に有利である。また
、常に板バネに張力が作用することになるので、板バネ
の破損率を低下することができるとともに、負荷開始時
のベンディングがなく圧子の押込み精度も良くなる。ま
た、電磁力発生部のコイルが開放部を下向きにして設置
されているので、電磁力発生部に塵埃等が溜らず、汚れ
に起因する誤動作の防止を期待できる。Since this embodiment apparatus is constructed as described above, the load is transmitted to the indenter while a tensile load is applied to the leaf spring that transmits the test load. Therefore, buckling of the leaf spring can be avoided, and the test load can be increased. For this reason, the leaf spring can be shortened, which is advantageous in making the entire testing machine more compact. Further, since tension is always applied to the leaf spring, the breakage rate of the leaf spring can be reduced, and there is no bending at the start of loading, and the indenter's indentation accuracy can be improved. Furthermore, since the coil of the electromagnetic force generating section is installed with the open part facing downward, dust and the like will not accumulate in the electromagnetic force generating section, and malfunctions due to dirt can be prevented.
[発明の効果]
上記説明から明らかなように、本発明にかかる超微小材
料試験装置の荷重装置によれば、試験荷重を伝達する板
バネに引張り荷重が負荷されるので、試験荷重の増加を
図れるとともに、その破損のおそれを少なくすることが
できるようになった。[Effects of the Invention] As is clear from the above description, according to the loading device of the ultra-fine material testing device according to the present invention, a tensile load is applied to the leaf spring that transmits the test load, so that the test load is increased. This makes it possible to reduce the risk of damage.
第1図は本発明の実施例の構成を示す断面図、第2図は
要部の構成を模式的に示す図、第3図は従来装置の構成
を模式的に示す図である。
1・・・荷重装置 6・・・圧子 21−・・負荷
伝達レバー 23・−板バネ 24−・・連結片2
5−・・圧子保持具FIG. 1 is a sectional view showing the configuration of an embodiment of the present invention, FIG. 2 is a diagram schematically showing the configuration of main parts, and FIG. 3 is a diagram schematically showing the configuration of a conventional device. 1... Loading device 6... Indenter 21-- Load transmission lever 23-- Leaf spring 24-... Connection piece 2
5-...Indenter holder
Claims (1)
付けられた圧子と、中間部に設けられた支点を中心とし
て上下に回動自在な天秤状の負荷伝達レバーと、該負荷
伝達レバーの一端部に設けられ該端部に上向きの荷重を
加える負荷発生部とを備え、前記負荷伝達レバーの負荷
発生部と反対側の端部は、板バネを介して該端部よりも
上方で前記圧子保持具に連結されていることを特徴とす
る超微小材料試験機の荷重装置。(1) An indenter attached to the lower end of an indenter holder that is movable in the vertical direction, a scale-shaped load transmission lever that is vertically rotatable around a fulcrum provided in the middle, and the load transmission lever a load generating section provided at one end and applying an upward load to the end; the end of the load transmission lever opposite to the load generating section is arranged above the end through a leaf spring; A loading device for an ultra-fine material testing machine, characterized in that it is connected to the indenter holder.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22654189A JPH0389136A (en) | 1989-08-31 | 1989-08-31 | Load apparatus for microscopic material tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22654189A JPH0389136A (en) | 1989-08-31 | 1989-08-31 | Load apparatus for microscopic material tester |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0389136A true JPH0389136A (en) | 1991-04-15 |
JPH0585019B2 JPH0585019B2 (en) | 1993-12-06 |
Family
ID=16846766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22654189A Granted JPH0389136A (en) | 1989-08-31 | 1989-08-31 | Load apparatus for microscopic material tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0389136A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008096224A (en) * | 2006-10-10 | 2008-04-24 | Shimadzu Corp | Material testing machine |
KR101131318B1 (en) * | 2010-10-01 | 2012-04-04 | 홍상오 | Vertical palm oil mill |
-
1989
- 1989-08-31 JP JP22654189A patent/JPH0389136A/en active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008096224A (en) * | 2006-10-10 | 2008-04-24 | Shimadzu Corp | Material testing machine |
JP4671045B2 (en) * | 2006-10-10 | 2011-04-13 | 株式会社島津製作所 | Material testing machine |
KR101131318B1 (en) * | 2010-10-01 | 2012-04-04 | 홍상오 | Vertical palm oil mill |
Also Published As
Publication number | Publication date |
---|---|
JPH0585019B2 (en) | 1993-12-06 |
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