JPH0388153U - - Google Patents

Info

Publication number
JPH0388153U
JPH0388153U JP14875989U JP14875989U JPH0388153U JP H0388153 U JPH0388153 U JP H0388153U JP 14875989 U JP14875989 U JP 14875989U JP 14875989 U JP14875989 U JP 14875989U JP H0388153 U JPH0388153 U JP H0388153U
Authority
JP
Japan
Prior art keywords
probe
sealed case
flaw detection
probes
rubber member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14875989U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14875989U priority Critical patent/JPH0388153U/ja
Publication of JPH0388153U publication Critical patent/JPH0388153U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP14875989U 1989-12-26 1989-12-26 Pending JPH0388153U (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14875989U JPH0388153U (zh) 1989-12-26 1989-12-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14875989U JPH0388153U (zh) 1989-12-26 1989-12-26

Publications (1)

Publication Number Publication Date
JPH0388153U true JPH0388153U (zh) 1991-09-09

Family

ID=31695195

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14875989U Pending JPH0388153U (zh) 1989-12-26 1989-12-26

Country Status (1)

Country Link
JP (1) JPH0388153U (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009510419A (ja) * 2005-09-27 2009-03-12 シーメンス アクチエンゲゼルシヤフト 基板の表面を検査するための測定装置および測定システム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009510419A (ja) * 2005-09-27 2009-03-12 シーメンス アクチエンゲゼルシヤフト 基板の表面を検査するための測定装置および測定システム

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