JPH037442A - Fault equipment location system - Google Patents
Fault equipment location systemInfo
- Publication number
- JPH037442A JPH037442A JP1143564A JP14356489A JPH037442A JP H037442 A JPH037442 A JP H037442A JP 1143564 A JP1143564 A JP 1143564A JP 14356489 A JP14356489 A JP 14356489A JP H037442 A JPH037442 A JP H037442A
- Authority
- JP
- Japan
- Prior art keywords
- channel
- minor
- faulty
- fault
- devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000002955 isolation Methods 0.000 claims description 5
- 239000011159 matrix material Substances 0.000 abstract 1
- 238000012545 processing Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
Landscapes
- Hardware Redundancy (AREA)
- Detection And Prevention Of Errors In Transmission (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は交換機システムなどにおける軽度障害多発時の
障害装置切り分け方式に関し、特に複数の装置群の中か
らそれぞれ１つの装置が選択され選択された装置が直列
に接続されて動作する場合の障害装置切り分け方式に関
する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a system for isolating faulty devices when a number of minor faults occur in a switching system, etc., and particularly relates to a method for isolating faulty devices when a number of minor faults occur in a switching system or the like. This invention relates to a faulty device isolation method when devices are connected in series and operate.
従来の障害装置切り分け方式においては、軽度障害が発
生した際に、軽度障害のパターンから障害が発生したと
みなす装置群を一意的に決定し、決定された装置群内の
接続装置における一定時間前からその時点までの軽度障
害発生回数を調べ、規定回数以上の軽度障害が発生した
場合その決定された装置が障害であると判定していた。In the conventional failure device isolation method, when a minor failure occurs, a group of devices that are considered to have failed is uniquely determined based on the pattern of the minor failure, and the connected device within the determined device group is identified a certain period of time ago. The number of times minor failures have occurred since then was checked, and if a minor failure occurred more than a specified number of times, it was determined that the device was at fault.
上述した従来の障害装置切り分け方式では、多発する軽
度障害のパターンと障害を起こしている装置群を関係付
けることは、ハードウェアの設計者が設計初期に検討し
た結果であり、現実にその決定が妥当であるか否かは、
製品の検査が終了するまで正確にはわからないことがあ
る。一方、実際に障害装置の切り分けを行う機能はハー
ドウェアの開発と平行して開発されるソフトウェアにて
実現されることが一般的であり、ハードウェアの検査が
終了するまでに発見された軽度障害のパターンから障害
が発生したとみなす装置群の変更がハードウェア開発者
からソウトウエア開発者へ報告されるたびに、ソフトウ
ェア開発者は膨大な後戻りの作業を行う。In the conventional failure device isolation method described above, the relationship between the pattern of frequent minor failures and the group of devices causing the failure is the result of consideration by the hardware designer at the early stage of the design, and it is difficult to make decisions in reality. Whether it is valid or not,
Sometimes we don't know exactly until the product has been tested. On the other hand, the function to actually isolate faulty devices is generally realized in software that is developed in parallel with hardware development, and minor faults discovered before hardware inspection is completed. Every time a hardware developer reports to a software developer a change in a group of devices that is considered to have failed based on the pattern, the software developer must perform a huge amount of backtracking work.
また、実際の障害は、設計者が予想したものより複雑な
様相を呈して、一つの軽度障害のパターンから障害の発
生した装置群を一意的に決定すること自体が不可能であ
ることが発生するため、障害の発生装置群の切り分けが
正確に行われないことがある。すなわち、別な装置群で
発生する障害が同一の軽度障害パターンを引き起こすこ
とがある。Furthermore, actual failures tend to be more complex than what designers expected, and it has become impossible to uniquely determine the group of equipment in which a failure has occurred based on a single pattern of minor failures. Therefore, it may not be possible to accurately isolate the group of devices that are causing the failure. That is, failures occurring in different device groups may cause the same minor failure pattern.
さらに、直列に接続された装置群の障害を正確に切り分
けしようとすると、それらの装置群の間に障害検出のた
めのロジックを挿入する必要があり、総合的にはシステ
ムを大規模化させる。Furthermore, in order to accurately isolate a fault in a group of devices connected in series, it is necessary to insert logic for fault detection between the groups of devices, which increases the overall scale of the system.
本発明は装置ごとの軽度障害発生回数の代わりに、直列
に接続された装置および装置とは独立なことを示す識別
子を配列の要素として軽度障害発生回数を管理すること
により、上述の問題を全て解消することを目的とする。The present invention solves all of the above-mentioned problems by managing the number of times a minor failure occurs by using array elements of serially connected devices and an identifier indicating that the device is independent, instead of the number of times a minor failure occurs for each device. The purpose is to eliminate the problem.
本発明の障害装置切り分け方式は複数の装置群の中から
それぞれ１つの装置を選択し選択した装置を直列に接続
して動作させ、軽度障害が発生したとき、接続していた
装置を配列の要素として障害発生履歴を管理する構成で
ある。The faulty device isolation method of the present invention selects one device from each of a plurality of device groups, connects the selected devices in series and operates them, and when a minor failure occurs, the connected devices are replaced as elements of the array. This configuration manages the history of failure occurrences.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第１図は本発明の一実施例において軽度障害発生回数の
管理方法を説明するための図であり、Ｘは装置Ａ１を使
用時の軽度障害発生回数を管理する配列、Ｙは装置Ａｍ
を使用時の軽度障害発生回数を管理する配列、およびＺ
は装置Ａｉ （ｉ＝１〜ｍ）とは無関係と考えられる軽
度障害発生回数を管理する配列である。また、Ａ、Ｂ、
Ｒは直列に接続される複数の装置群である。軽度障害発
生回数を管理する配列は直列に接続される装置群Ａ（Ａ
１ 、 Ａ ２−・・Ａｍ ） 、装置群Ｂ（Ｂｌ、
Ｂ２．、。FIG. 1 is a diagram for explaining a method for managing the number of occurrences of minor failures in an embodiment of the present invention, where X is an array for managing the number of times minor failures occur when device A1 is used, and Y is an array for managing the number of times minor failures occur when device A1 is used.
An array that manages the number of minor failures when using
is an array that manages the number of occurrences of minor failures that are considered to be unrelated to device Ai (i=1 to m). Also, A, B,
R is a group of devices connected in series. The array that manages the number of mild failure occurrences consists of a group of devices connected in series A (A
1, A2-...Am), device group B (Bl,
B2. ,.
Ｂｎ）、装置群Ｒ（Ｒ１，Ｒ２−・−Ｒｒ）に対して（
ｍ＋１）ｘ （ｎ＋１）Ｘ （ｒ＋１）の配列の要素を
持っており、次元数は直列に接続される装置群の数であ
る。Bn), for the device group R (R1, R2-...-Rr) (
It has elements of an array of m+1)x (n+1)x (r+1), and the number of dimensions is the number of devices connected in series.
第２図は本発明の一実施例におけるシステム遺戒を示し
、システム全体は中央処理装置１０によって制御される
。また、通信は中央処理装置１０が管理可能なメモリ装
置１１とチャネル１，２、サブ・チャネル３，４．５を
通して入出力装置６．７．８．９の配下の回線１７．１
８，１９゜２０の間で行われる。１つのチャネルは任意
のサブ・チャネルの使用が可能であり、１つのサブ・チ
ャネルは任意の入出力装置の使用が可能である。チャネ
ル−サブ・チャネル−入出力装置間の経路は一般には任
意の経路の選択が可能である。FIG. 2 shows a system configuration in one embodiment of the present invention, and the entire system is controlled by a central processing unit 10. As shown in FIG. Also, communication is carried out through the memory device 11 that can be managed by the central processing unit 10, channels 1 and 2, and sub-channels 3 and 4.5, and the line 17.1 under the input/output device 6.7.8.9.
It is carried out between 8,19°20. One channel can use any sub-channel, and one sub-channel can use any input/output device. Generally, any route can be selected as the route between the channel, sub-channel, and input/output device.
中央処理装置１０が通信を行うための装置を選択すると
、交叉装置１２または１３と交叉装置１４゜１５または
１６とを固定する。これにより、直列に接続されたシス
テムが構成される。When the central processing unit 10 selects a device for communication, the crossover device 12 or 13 and the crossover device 14, 15, or 16 are fixed. This creates a series-connected system.
このシステムにおいて、チャネル、サブ・チャネル、入
出力装置をそれぞれ装置群とした時の軽度障害管理方法
について第３図を参照して説明する。第２図のチャネル
２−サブ・チャネル３−入出力装置９の経路選択がなさ
れたとする。この経路上で軽度障害が発生した場合、
（１）チャネル２、サブ・チャネル３、入出力装置９に
対応した軽度障害発生回数Ｆ１
（２）チャネル２、サブ・チャネル３に対応した軽度障
害発生回数Ｆ２
（３）チャネル２、入出力装置９に対応した軽度障害発
生回数Ｆ３
（４）チャネル２に対応した軽度障害発生回数４
（５）サブ・チャネル３、入出力装置９に対応した軽度
障害発生回数Ｆ５
（６）サブ・チャネル３に対応した軽度障害発生回数Ｆ
６
（７）入出力装置９に対応した軽度障害発生回数７
を更新し、障害が発生したか否かの判定のため参照する
０例えば、サブ・チャネル３が障害を起こしていれば、
サブ・チャネル３を使用したすべての経路で軽度障害が
発生するはずであり、軽度障害発生回数Ｆ６が規定回数
以上になって障害発生と判定されるが、軽度障害発生回
数Ｆ１〜Ｆ５゜Ｆ７は各チャネル、入出力装置に分散さ
れるため。In this system, a mild fault management method when channels, sub-channels, and input/output devices are each grouped into device groups will be described with reference to FIG. Assume that the route selection of channel 2 - sub channel 3 - input/output device 9 in FIG. 2 has been made. If a minor failure occurs on this route, (1) Number of minor failure occurrences F1 corresponding to channel 2, sub-channel 3, and input/output device 9 (2) Minor failure occurrence corresponding to channel 2, sub-channel 3 Number of times F2 (3) Number of minor failures corresponding to channel 2, input/output device 9 F3 (4) Number of minor failures corresponding to channel 2 4 (5) Minor failures corresponding to sub channel 3, input/output device 9 Number of occurrences F5 (6) Number of minor fault occurrences F corresponding to sub-channel 3
6 (7) Update the number of minor failure occurrences 7 corresponding to the input/output device 9 and refer to it to determine whether a failure has occurred.For example, if sub-channel 3 has caused a failure,
Minor failures should occur on all routes using sub-channel 3, and it is determined that a failure has occurred when the number of minor failure occurrences F6 exceeds the specified number of times, but the number of minor failure occurrences F1 to F5゜F7 is Because each channel is distributed across input and output devices.
に規定回数以上とならないことで切り分けが可能である
。また、チャネル２とサブ・チャネル３との間が障害の
場合は軽度障害発生回数Ｆｌ、Ｆ３〜Ｆ７は規定回数以
上とならないが軽度障害発生回数Ｆ２は規定回数以上と
なって障害装置の切り分けが正確に行える。It is possible to classify the problem by not exceeding a specified number of times. In addition, if there is a failure between channel 2 and sub-channel 3, the number of minor failure occurrences Fl and F3 to F7 will not exceed the specified number, but the number of minor failure occurrences F2 will exceed the specified number and it will be possible to isolate the faulty device. Can be done accurately.
以上説明したように本発明によれば、複数の装置群の中
からそれぞれ１つの装置が選択されて、選択された装置
が直列に接続される構成のシステムに対して、接続され
た装置および装置とは独立な識別子を配列の要素とした
軽度障害発生回数を観測することにより、障害装置の切
り分けを正確に行える。As described above, according to the present invention, one device is selected from a plurality of device groups, and the connected devices and devices are By observing the number of times a minor failure occurs using an identifier independent of the array as an element, the faulty device can be accurately isolated.
第１図、第２図および第３図は本発明の一実施例を説明
するための図である。FIG. 1, FIG. 2, and FIG. 3 are diagrams for explaining one embodiment of the present invention.
１．２・・・チャネル、３，４．５・・・サブ・チャネ
ル、６，７．８．９・・・入出力装置、１０・・・中央
処理装置、１１・・・メモリ、１２．１３，１４，１５
゜１６・・・交叉装置、１７，１８，１９．２０・・・
回線、Ｆ１〜Ｆ７・・・軽度障害発生回数。1.2... Channel, 3, 4.5... Sub channel, 6, 7.8.9... Input/output device, 10... Central processing unit, 11... Memory, 12. 13, 14, 15
゜16... Crossing device, 17, 18, 19.20...
Line, F1 to F7...Number of minor failures.
Claims (1)
択した装置を直列に接続して動作させ、軽度障害が発生
したとき、接続していた装置を配列の要素として障害発
生履歴を管理することを特徴とする障害装置切り分け方
式。Select one device from a group of devices, connect the selected devices in series, operate them, and when a minor failure occurs, manage the history of failure occurrences using the connected devices as elements of the array. A faulty device isolation method featuring:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1143564A JPH037442A (en) | 1989-06-05 | 1989-06-05 | Fault equipment location system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1143564A JPH037442A (en) | 1989-06-05 | 1989-06-05 | Fault equipment location system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH037442A true JPH037442A (en) | 1991-01-14 |
Family
ID=15341683
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1143564A Pending JPH037442A (en) | 1989-06-05 | 1989-06-05 | Fault equipment location system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH037442A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003005086A (en) * | 2001-06-20 | 2003-01-08 | Olympus Optical Co Ltd | Microscopic apparatus |
| US8973453B2 (en) | 2010-01-18 | 2015-03-10 | Smc Kabushiki Kaisha | Feed screw mechanism |
-
1989
- 1989-06-05 JP JP1143564A patent/JPH037442A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003005086A (en) * | 2001-06-20 | 2003-01-08 | Olympus Optical Co Ltd | Microscopic apparatus |
| US8973453B2 (en) | 2010-01-18 | 2015-03-10 | Smc Kabushiki Kaisha | Feed screw mechanism |
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