JPH0373865A - Device for testing power supply voltage fluctuation for control unit - Google Patents

Abstract

PURPOSE:To automatically execute the power supply voltage fluctuation test of a control device by setting up the upper and lower limit values of fluctuation in a rated voltage in a power supply device as testing voltages and switching the supply of the testing voltage to the control device in accordance with an external command. CONSTITUTION:In a normal state, a rated voltage (e.g. DC 5V) is supplied from a power supply card (power supply device) 2 to respective control cards (control devices) 3. When an operator transmits an external command from a master man-machine interface 11 to a control unit 1, either one of the fluctuation upper limit value (e.g. DC 5V+5%) and fluctuation lower limit value (e.g. DC 5V-5%) of the rated voltage set up in the power supply card 2 is selected in accordance with the external command, the selected voltage is supplied to respective control cards 3 as a testing command.

Description

[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention is a power supply voltage fluctuation test of one or more control devices that operate by being supplied with rated voltage from an integrally housed power supply device. The present invention relates to a device for performing

(Prior Art) FIG. 3 shows a typical configuration of a control system, and FIG. 4 shows a conventional configuration of a control unit including a power supply voltage fluctuation test device.

The control unit 101 is equipped with a power supply card 102 and a plurality of control cards 103 that are operated by being supplied with power from the power supply card 102. Generally, the power supply card 102 is operated manually by external ACLOOV or DC24V. However, the voltage is converted to DC5V and supplied to the control card 103 in the same unit.

Since the DC5V output voltage of the general power supply card 103 varies slightly depending on the load current, an externally adjustable volume is provided.

In FIG. 4, a power supply card 102 is supplied with AClooV from the outside as a human power source, is insulated by an insulating part 104, is converted to DC by a smoothing part 105, and is controlled by a voltage control part 106 and a voltage output part 107. The output voltage is controlled by feeding back the output voltage DC5V. Further, an output voltage adjustment volume 108 is provided so that the output voltage value can be finely adjusted from the outside.

In the above hardware configuration, the control card power supply voltage fluctuation test (e.g. 5V±5% 5.25V, 4.
75V), set the output voltage adjustment volume 1
+5% by adjusting 08.

Alternatively, set it to -5% and test.

(Problem to be Solved by the Invention) However, in the above conventional technology, the control card 1
When performing the power supply voltage fluctuation test of 03, the power supply card 102
Since the test was conducted by manually adjusting the output voltage adjustment volume 108, the number of man-hours for adjusting the volume was enormous, and the workability was extremely poor.

SUMMARY OF THE INVENTION An object of the present invention is to provide a power supply voltage fluctuation testing device for a control unit that can automatically perform a power supply voltage fluctuation test of a control device without requiring the conventional manual work.

[Structure of the Invention] (Means for Solving the Problems) In order to achieve the above object, the present invention provides a power supply device that converts an externally supplied voltage to a rated voltage, and an operating unit supplied with the rated voltage from the power supply device. In a control unit in which a plurality of control devices are housed together, an upper limit value of variation and a lower limit value of variation of the rated voltage are respectively set as test voltages in the power supply device, and each test voltage to the control device is set as a test voltage. It is characterized in that the supply switching is performed by an external command.

(Function) In the above configuration, in a normal operating state, a rated voltage (for example, DC5V) is supplied from the power supply device to each control device.

On the other hand, when conducting a power supply voltage fluctuation test of a control device, when the operator transmits an external command to the control unit, the upper limit of fluctuation (for example, DC5V + 5%) and lower limit of fluctuation of the constant r15 voltage set in the power supply are set. (For example, DC5V-
5%) is selected according to an external command and supplied to each control device as a test voltage.

(Embodiment) FIG. 1 is a block diagram showing an embodiment to which the present invention is applied.

Inside the control unit 1, a power supply card 2 constituting a power supply device and a plurality of control cards 3 constituting a control device are housed in one body.

The power supply card 2 includes an insulating section 4, a smoothing section 5, a voltage control section 6, and a voltage output section 7, and includes an AC supplied from the outside.
A DC5V voltage is generated from a 100V voltage or a DC24V voltage and is supplied to each control card 3.

In particular, the voltage control unit 6 has an upper limit value of 5.25, for example, in order to perform a power supply voltage fluctuation operation test of the control card 3.
V (5V+5%), lower limit 4.75V (5V-5%
) is set and can be supplied as a test voltage.

On the other hand, each control card 3 includes, in addition to the CPU, a transmission interface 8 and two NPN transistors 9 and 10 whose base sides are connected to the transmission interface 8, respectively.

Each transmission interface 8 is connected to a higher-level man-machine interface 11.
When an external command is supplied from the external command, either transistor 9 or 10 is turned on in response to this external command.

Further, the collector of the transistor 9 is connected to the transmission line 12, the collector of the transistor 10 is connected to the transmission line 13, and each transmission line 12.13 is connected to the voltage control section 6.

In the above configuration, in a normal operating state, a voltage of DC5V is supplied from the power supply card 1 to each control card 3.

On the other hand, when conducting a power supply voltage fluctuation test of the control card 3, the operator
A test voltage output command is transmitted to the transmission interface 8 as an external command.

If the test voltage output command is a command to output a variation upper limit value, the transmission interface 8 operates the transistor 9 to turn it on.

As a result, the power level of the transmission line 12 decreases, and the voltage control unit 6 detecting this level decrease generates a voltage of DC5.25V. This DC 5, 25V voltage is supplied to each control card 3 via the voltage output section 7.

Additionally, if there is a command to output the lower limit value of variation from the upper man-machine interface 11, the transmission interface 8 will:
The transistor 10 is operated and turned on.

As a result, the level of the transmission line 13 decreases, and the voltage control unit 6 detecting this level decrease generates a voltage of DC4.75V. This DC4.75V voltage is supplied to each control card 3 via the voltage output section 7.

As described above, according to this embodiment, when performing a power supply voltage fluctuation test, the operator
1, it is only necessary to issue an external command output, which improves the workability of this type of operation test.

In the above embodiment, external commands are output from the upper man-machine interface 11, but as shown in FIG. 2, two switches 14 and 15 are connected to the voltage control section 6, When turned on, DC
It may be configured such that a pressure of 5.25 Vi is generated, and a pressure of 4.75 V DC and 7 m is generated when the switch 15 is turned on.

[Effects of the Invention] As described above, according to the present invention, the power supply voltage fluctuation operation test of the control device can be performed without requiring the operator's intervention, and the workability is dramatically improved. Furthermore, this can be done without complicating the device configuration.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing one embodiment to which the present invention is applied, FIG. 2 is a block diagram showing another embodiment to which the present invention is applied, and FIG. 3 is a configuration diagram showing an example of a control unit. Fourth
The figure is a block diagram showing a conventional example. 1...Control unit 2...Power supply card 3...Control card 6...Voltage control unit 8...Transmission ink face 9.10...Transistor 11...Upper man-machine interface 12. 13・
...Transmission line 14.1.5...Switch

Claims (1)

[Scope of Claims] A control unit in which a power supply device that converts an externally supplied voltage to a rated voltage and one or more control devices that operate by being supplied with the rated voltage from this power supply device are housed integrally, comprising: A power supply voltage in a control unit, characterized in that an upper limit value of variation and a lower limit value of variation of the rated voltage are respectively set as test voltages within the control unit, and the supply of each test voltage to the control device is switched by an external command. Fluctuation test equipment.