JPH0372273A - Measuring device for contact resistance - Google Patents

Measuring device for contact resistance

Info

Publication number
JPH0372273A
JPH0372273A JP20844789A JP20844789A JPH0372273A JP H0372273 A JPH0372273 A JP H0372273A JP 20844789 A JP20844789 A JP 20844789A JP 20844789 A JP20844789 A JP 20844789A JP H0372273 A JPH0372273 A JP H0372273A
Authority
JP
Japan
Prior art keywords
circuit
measurement
digital
contact
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20844789A
Other languages
Japanese (ja)
Inventor
Fumio Sanpei
三瓶 文雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP20844789A priority Critical patent/JPH0372273A/en
Publication of JPH0372273A publication Critical patent/JPH0372273A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE:To enable highly-precise measurement of a contact resistance value of a wide range at a prescribed current value by separating analog and digital circuits electrically by using a photocoupler, and by displaying the result digitally. CONSTITUTION:Being controlled by a digital drive circuit 1, a prescribed current is supplied from a constant current circuit 3 to a contact 10 to be measured and a measured voltage proportional to a resistance value of the contact 10 is amplified 4, subjected to A/D conversion 5 and displayed digitally in a display element 9, while determination of the quality in respect to a reference value is displayed in a determination display element 8. On the occasion, transmission of signals between an analog signal system of the circuit 3, a differential amplifier 4, etc. and a digital circuit such as the circuit and a comparator circuit 7 is executed optically by photocouplers 2 and 6. Thereby it is made possible to separate electrically the two circuit systems from each other and to separate a power source and the earth completely. Accordingly, the lowering of precision in measurement due to the superposition of a commercial frequency, switching noise, impulse noise or the like on an analog signal is eliminated and highly precise measurement can be executed with a prescribed measuring current.

Description

【発明の詳細な説明】 〔概 要〕 スイッチの接点抵抗等を高精度に測定する接触抵抗測定
装置に関し、 広範囲の接触抵抗値を規定の測定電流値で高精度に測定
できかつ低コストの接触抵抗測定装置を提供することを
目的とし、 測定電流の供給タイミングを制御する駆動回路と、前記
タイミングに対応して被測定物に一定の測定電流を供給
する定電流回路と、前記測定電流によって被測定物の両
端に生じた電圧を増幅する差動増幅器と、 前記差動増幅器の出力をアナログデジタル変換する二重
積分形のAD変換回路と、該AD変換回路のデジタル出
力を表示する表示部と、該デジタル出力を予め設定され
ている基準値と比較する比較回路と、該比較回路の比較
結果に基づき良否判定をランプ表示する判定表示部とを
有し、前記駆動回路による定電流回路の制御は第一のフ
ォトカップラを介して行われ、また前記定電流回路はト
ランジスタと該トランジスタのベースに接続されたツェ
ナーダイオードと温度補償用のダイオードとの直列回路
を有し、更に前記AD変換器から前記表示部および前記
比較回路へのデジタル出力の伝送は第二のフォトカップ
ラを介して行われる構成である。
[Detailed Description of the Invention] [Summary] This invention relates to a contact resistance measuring device that accurately measures the contact resistance, etc. of a switch, and is capable of measuring a wide range of contact resistance values with high accuracy at a specified measurement current value, and is a low-cost contact. The object of the present invention is to provide a resistance measuring device, which includes a drive circuit that controls the timing of supplying a measurement current, a constant current circuit that supplies a constant measurement current to an object to be measured in accordance with the timing, and a resistance measurement device that controls the measurement current by the measurement current. a differential amplifier that amplifies the voltage generated across the object to be measured; a double-integral AD conversion circuit that converts the output of the differential amplifier from analog to digital; and a display unit that displays the digital output of the AD conversion circuit. , a comparison circuit that compares the digital output with a preset reference value, and a judgment display unit that displays a pass/fail judgment with a lamp based on the comparison result of the comparison circuit, and the constant current circuit is controlled by the drive circuit. is carried out via a first photocoupler, and the constant current circuit has a series circuit of a transistor, a Zener diode connected to the base of the transistor, and a temperature compensation diode, and further includes a series circuit of a transistor, a Zener diode connected to the base of the transistor, and a temperature compensation diode. The digital output is transmitted to the display section and the comparison circuit through a second photocoupler.

〔産業上の利用分野〕[Industrial application field]

本発明は、例えばスイッチの接点抵抗等の広範囲に変動
する低抵抗値を一定電流値で測定する接触抵抗測定装置
に関する。
The present invention relates to a contact resistance measuring device that measures a low resistance value that fluctuates over a wide range, such as the contact resistance of a switch, using a constant current value.

〔従来の技術〕[Conventional technology]

キーボードに組込まれている押釦スイッチ等の電気接点
の接点抵抗はmΩオーダから数Ω以上の広い範囲にわた
って変化する。従来はこれらの接触抵抗の測定には、測
定レンジを切り替えることによって抵抗値測定範囲を広
げるごリオームメータを用いたり1.定電流電源装置と
電圧・電流・抵抗をデジタルに測定するデジタルマルチ
メータとを組み合わせて用いて測定していた。
The contact resistance of electrical contacts such as pushbutton switches built into keyboards varies over a wide range from the order of mΩ to several Ω or more. Conventionally, these contact resistances have been measured using a ohmmeter that can widen the resistance measurement range by switching the measurement range. Measurements were made using a combination of a constant current power supply and a digital multimeter that digitally measures voltage, current, and resistance.

[発明が解決しようとする課題] 接点の接触抵抗値は、接点表面の絶縁被膜の存在等によ
ってmΩオーダから数Ω以上の広い範囲にわたって変化
する。そこでこれらの接触抵抗の測定では、接触状態が
測定電流によって影響を受けないように、例えば1また
は5 mA程度の微小な一定電流を接点に流し、この時
の接点両端の電圧降下を検出して接点抵抗値を測定する
ように規定されている。
[Problems to be Solved by the Invention] The contact resistance value of a contact changes over a wide range from the order of mΩ to several Ω or more depending on the presence of an insulating film on the surface of the contact. Therefore, when measuring contact resistance, a small constant current of, for example, 1 or 5 mA is passed through the contact and the voltage drop across the contact is detected so that the contact state is not affected by the measurement current. It is specified to measure the contact resistance value.

ところが、上記ミリオームメータは電圧降下値が一定範
囲内に収まるように被測定試料の接触抵抗値の大小によ
り測定電流値を変化させて測定レンジを切り替えており
、一定電流値で測定することが出来なかった。またメー
タの指針の振れ量から測定値を読み取る構造であるため
、読取りに測定者の個人差があり測定誤差が生し易いと
いう問題点があった。
However, the milliohmmeter mentioned above changes the measurement range by changing the measurement current value depending on the contact resistance of the sample to be measured so that the voltage drop value stays within a certain range, so it is not possible to measure at a constant current value. There wasn't. Furthermore, since the measurement value is read from the amount of deflection of the meter pointer, there is a problem in that there are individual differences in readings between the measurers and measurement errors are likely to occur.

一方デジタルマルチメータは、抵抗値の他に電圧や電流
等の余分な測定機能が付加されているため設備が高価で
あり、接触抵抗の測定のみに用いるのは不経済であると
いう問題がある。
On the other hand, digital multimeters have the problem that the equipment is expensive because they have extra measurement functions such as voltage and current in addition to resistance values, and it is uneconomical to use them only for measuring contact resistance.

定電流源とデジタル電圧計を組み合わせて構成すること
が考えられるが、接点抵抗による通常の電圧降下はμV
オーダで極めて微小であり、安価な回路で微小直流電圧
をノイズの影響を受けずに高精度で測定することは困難
であった。
It is conceivable to configure it by combining a constant current source and a digital voltmeter, but the normal voltage drop due to contact resistance is μV.
It is extremely small on the order of magnitude, and it has been difficult to measure minute DC voltages with high precision without being affected by noise using an inexpensive circuit.

本発明は上記問題点に鑑み創出さたbので、広範囲の接
触抵抗値を規定の測定電流値で高精度に測定できかつコ
ストの低減した接触抵抗測定装置を提供することを目的
とする。
The present invention was created in view of the above-mentioned problems, and it is an object of the present invention to provide a contact resistance measuring device that can measure a wide range of contact resistance values with high precision using a specified measurement current value and that has reduced cost.

〔課題を解決するための手段] 上記問題点は、 測定電流の供給タイミングを制御する駆動回路と、 前記タイ短ングに対応して被測定物に一定の測定電流を
供給する定電流回路と、 前記測定電流によって被測定物の両端に生じた電圧を増
幅する差動増幅器と、 前記差動増幅器の出力をアナログデジタル変換する二重
積分形のAD変換回路と、 該AD変換回路のデジタル出力を表示する表示部と、 該デジタル出力を予め設定されている基準値と比較する
比較回路と、 該比較回路の比較結果に基づき良否判定をランプ表示す
る判定表示部とを有し、 前記駆動回路による定電流回路の制御は第一のフォトカ
ップラを介して行われ、また前記定電流回路はトランジ
スタと該トランジスタのベースに接続されたツェナーダ
イオードと温度補償用のダイオードとの直列回路を有し
、更に前記AD変換器から前記表示部および前記比較回
路へのデジタル出力の伝送は第二のフォトカップラを介
して行われることを特徴とする本発明の接触抵抗測定装
置により解決される。
[Means for Solving the Problems] The above problems include: a drive circuit that controls the supply timing of the measurement current; a constant current circuit that supplies a constant measurement current to the object under test in response to the tie shortening; a differential amplifier that amplifies the voltage generated across the object to be measured by the measurement current; a double-integral AD conversion circuit that converts the output of the differential amplifier from analog to digital; and a digital output of the AD conversion circuit. a display unit that displays a display, a comparison circuit that compares the digital output with a preset reference value, and a judgment display unit that displays a pass/fail judgment with a lamp based on the comparison result of the comparison circuit, Control of the constant current circuit is performed via a first photocoupler, and the constant current circuit has a series circuit of a transistor, a Zener diode connected to the base of the transistor, and a temperature compensation diode, and further This problem is solved by the contact resistance measuring device of the present invention, characterized in that the digital output is transmitted from the AD converter to the display section and the comparison circuit via a second photocoupler.

〔作 用〕[For production]

駆動回路に制御されて定電流回路から被測定物に一定電
流が供給され、被測定物の抵抗値に比例した測定電圧が
差動増幅器で増幅され、AD変換器でデジタル値に変換
され、表示部でデジタル表示が、また判定表示部で所定
の基準値に対する良否判定が表示される。
A constant current is supplied from the constant current circuit to the device under test under the control of the drive circuit, and the measurement voltage proportional to the resistance value of the device is amplified by a differential amplifier, converted to a digital value by an AD converter, and displayed. A digital display is displayed in the section, and a pass/fail judgment based on a predetermined reference value is displayed in the judgment display section.

微小直流電圧の発生および増幅を行う定電流回路および
差動増幅器等のアナログ信号系と、駆動回路や比較回路
等のその他のデジタル回路との間の信号の伝達は、フォ
トカップラにより光学的に行われ両回路系が電気的に分
離されているため、電源やアースを全く別にすることが
可能となる。
Signal transmission between analog signal systems such as constant current circuits and differential amplifiers that generate and amplify minute DC voltages and other digital circuits such as drive circuits and comparison circuits is performed optically using photocouplers. Since both circuit systems are electrically separated, it is possible to use completely separate power supplies and grounding.

このため商用周波数やスイッチングノイズ、インパルス
ノイズ等がアナログ信号に重畳して測定精度を低下させ
ることがなく、一定の測定電流で高精度の測定ができる
This prevents commercial frequencies, switching noise, impulse noise, etc. from being superimposed on the analog signal and reducing measurement accuracy, allowing highly accurate measurement with a constant measurement current.

〔実施例〕〔Example〕

以下添付図により本発明の詳細な説明する。 The present invention will be described in detail below with reference to the accompanying drawings.

図は本発明の接触抵抗測定装置のブロック図であり、各
部の構成と動作は以下の通りである。
The figure is a block diagram of the contact resistance measuring device of the present invention, and the configuration and operation of each part are as follows.

図において、1はデジタル駆動回路、2は第一のフォト
カップラ、3は定電流回路、4は差動増幅器、5はAD
変換器、6は第二のフォトカップラ、7は比較回路、8
は判定表示部、9は表示部、IOは被測定接点である。
In the figure, 1 is a digital drive circuit, 2 is a first photocoupler, 3 is a constant current circuit, 4 is a differential amplifier, and 5 is an AD
Converter, 6 is the second photocoupler, 7 is the comparison circuit, 8
9 is a judgment display section, 9 is a display section, and IO is a contact to be measured.

デジタル駆動回路1は、図示せぬ制御部からのゲート信
号により所定時間の間、ICIIをONにしてフォトカ
ップラ2の発光ダイオード21を発光させる。
The digital drive circuit 1 turns on the ICII for a predetermined period of time in response to a gate signal from a control section (not shown) to cause the light emitting diode 21 of the photocoupler 2 to emit light.

フォトカップラ2は、例えば発光ダイオード21とフォ
トトランジスタ22よりなり、発光ダイオード21から
の放射光によりフォトトランジスタ22がONとなるも
ので、光により接続されるため駆動側と被駆動側とが電
気的に完全に分離されたスイッチ素子として働く。
The photocoupler 2 is composed of, for example, a light emitting diode 21 and a phototransistor 22, and the phototransistor 22 is turned on by the light emitted from the light emitting diode 21. Since the photocoupler 2 is connected by light, the driving side and the driven side are electrically connected. It acts as a completely separated switching element.

定電流回路3は、トランジスタ33と3個の抵抗からな
り、トランジスタ33は、そのベースがツェナーダイオ
ード31とダイオード32との直列接続を介して電RV
sに、また固定抵抗R3とフォトカップラのフォトトラ
ンジスタ22の直列接続を介してアースに接続され、そ
のエミッタが可変抵抗R8と固定抵抗R2の直列接続を
介して電源V、に接続され、そのコレクタは被測定接点
10を介してアースに接続されている。この回路は、フ
ォトトランジスタ22がONすると、Io−((Vz 
+ VF) −VIIE) / (R1+R2)  (
ここで、Vz ;ツェナーダイオードのツェナー電圧、
VF ;ダイオードの順方向電圧、Vgti)ランジス
タのベースエミッタ電圧)で表されるコレクタ電流が流
れ、この値はコレクタに接続された被測定接点10の接
点抵抗値RXに無関係に一定となる。そこで可変抵抗R
1を調整することにより、所定の測定電流を被測定物1
0に供給することができる。この定電流回路はトランジ
スタ、ツェナーダイオード、ダイオードが各−個宛と3
個の抵抗で構成される簡単な回路であるため低コストで
ある。また定電流回路の出力電流が変動する要因として
基準電圧Vsの変動、回路部品(抵抗、トランジスタ)
の温度特性による変動が考えられる。本発明では基準電
圧Vsの変動を解決するため、ダイオード32とツェナ
ーダイオード31(温度係数10ppm )を使用して
いる。
The constant current circuit 3 consists of a transistor 33 and three resistors, and the base of the transistor 33 is connected to the voltage RV through a series connection of a Zener diode 31 and a diode 32.
s, and is connected to ground through a series connection of a fixed resistor R3 and a phototransistor 22 of a photocoupler, its emitter is connected to a power supply V through a series connection of a variable resistor R8 and a fixed resistor R2, and its collector is connected to ground via the contact 10 to be measured. In this circuit, when the phototransistor 22 is turned on, Io-((Vz
+VF) -VIIE) / (R1+R2) (
Here, Vz; Zener voltage of Zener diode,
A collector current expressed by VF (forward voltage of the diode, Vgti) base-emitter voltage of the transistor flows, and this value is constant regardless of the contact resistance value RX of the contact 10 to be measured connected to the collector. Therefore, variable resistance R
By adjusting 1, the predetermined measurement current can be set to
0 can be supplied. This constant current circuit has 3 transistors, zener diodes, and diodes each.
Since it is a simple circuit consisting of only one resistor, it is low cost. Also, factors that cause the output current of a constant current circuit to fluctuate include fluctuations in the reference voltage Vs and circuit components (resistance, transistor).
Fluctuations are considered to be due to the temperature characteristics of In the present invention, a diode 32 and a Zener diode 31 (temperature coefficient: 10 ppm) are used to resolve fluctuations in the reference voltage Vs.

そしてトランジスタ33のVIIEの温度係数を相殺す
るためにダイオード32をツェナーダイオード31とト
ランジスタ33のベースとの間に接続している。
In order to offset the temperature coefficient of VIIE of the transistor 33, a diode 32 is connected between the Zener diode 31 and the base of the transistor 33.

このようして温度補償されるので10ppm以下の高安
定度を得ることができる。
Since the temperature is compensated in this way, high stability of 10 ppm or less can be obtained.

差動増幅器4は、演算増幅器41と4個の抵抗R5+ 
R61R71Rsを用いて構成され、被測定接点10の
両端に生じるμVオーダーの微小電圧をAD変換可能な
値まで増幅するようになっている。この差動増幅器4は
、同相信号除去比(CMRR)が大きいので、+−の両
端子に共通のノイズとして重畳するアース電位の変動(
コモンモードノイズ)が除去され、被測定物の電圧降下
量のみが所定に増幅されて、AD変換器5へ入力される
。AD変換器5は、低価格で高精度かつ安定性のある二
重積分方式の例えば12ビツトの計数型AD変換器であ
り、変換速度が数100m5と比較的低速であるため、
周期20m5の商用周波数によるノイズは積分除去され
測定値に悪影響を与えない。そしてこのAD変換器5の
12ビツトのパラレル出力は、それぞれのビット線に接
続された第二のフォトカップラ6の発光ダイオードを駆
動する。そしてこのフォトカップラ6を介して、伝送さ
れたデジタルデータは、比較回路7と表示部9に人力さ
れる。
The differential amplifier 4 includes an operational amplifier 41 and four resistors R5+.
It is constructed using R61R71Rs, and is designed to amplify the microvoltage on the μV order that occurs across the contact 10 to be measured to a value that can be AD converted. Since this differential amplifier 4 has a large common mode rejection ratio (CMRR), ground potential fluctuations (which are superimposed as common noise on both + and - terminals) (
Common mode noise) is removed, and only the amount of voltage drop of the object to be measured is amplified to a predetermined value and input to the AD converter 5. The AD converter 5 is, for example, a 12-bit counting type AD converter using a double integration method that is inexpensive, highly accurate, and stable, and has a relatively slow conversion speed of several hundred m5.
Noise due to the commercial frequency with a period of 20 m5 is integrally removed and does not adversely affect the measured value. The 12-bit parallel output of this AD converter 5 drives a light emitting diode of a second photocoupler 6 connected to each bit line. The digital data transmitted via this photocoupler 6 is then manually input to a comparator circuit 7 and a display section 9.

表示部9は例えば10進4桁で被測定接点の電圧降下量
を表示する。ここで、測定電流を1mA  とし、差動
増幅器4の増幅度をlOの巾乗(例えば100倍)に設
定することにより、デジタル表示された数値で被測定接
点の抵抗値を直接表現することがてきる。比較回路9は
、入力された測定データと、予め設定されている被測定
接点の許容接点抵抗の上限値RUおよび下限値Rtとを
比較し、判定結果を良否表示部8に出力する。判定表示
部8は駆動用ICと抵抗と発光ダイオードとの直列回路
が、デジタル電源Vに接続さてなり、被測定接点の接点
抵抗値が許容範囲内に有れば判定表示部8の「良」ラン
プ81を、また許容範囲外であれば「不良」ランプ82
を点灯されるように接続されている。
The display unit 9 displays the amount of voltage drop at the contact to be measured in, for example, four decimal digits. Here, by setting the measurement current to 1 mA and setting the amplification degree of the differential amplifier 4 to a power of lO (for example, 100 times), it is possible to directly express the resistance value of the contact to be measured with a digitally displayed value. I'll come. The comparison circuit 9 compares the input measurement data with a preset upper limit value RU and lower limit value Rt of the allowable contact resistance of the contact to be measured, and outputs the determination result to the pass/fail display section 8 . The judgment display section 8 shows that the series circuit of the driving IC, the resistor, and the light emitting diode is connected to the digital power supply V, and if the contact resistance value of the contact to be measured is within the allowable range, the judgment display section 8 indicates "good". lamp 81, or “defective” lamp 82 if outside the tolerance range.
connected to be lit.

上記構成になる接触抵抗測定装置においては、微小直流
電圧の発生および増幅を行う定電流回路および差動増幅
器のアナログ信号系と、駆動回路や比較回路等のその他
のデジタル回路との間の信号の伝達は、フォトカップラ
により光学的に行われ両回路系が電気的に分離されてい
るため、電源やアースを全く別にすることが可能となる
。このため商用周波数やスイッチングノイズ、インパル
スノイズ等がアナログ信号に重畳して測定精度を低下さ
せることがなく高精度の測定ができる。
In the contact resistance measuring device configured as described above, signals are transmitted between the analog signal system of the constant current circuit and differential amplifier that generate and amplify minute DC voltages, and other digital circuits such as the drive circuit and comparison circuit. Transmission is carried out optically by a photocoupler, and both circuit systems are electrically separated, making it possible to use completely separate power supplies and grounding. Therefore, highly accurate measurement can be performed without deteriorating measurement accuracy due to commercial frequency, switching noise, impulse noise, etc. being superimposed on analog signals.

また測定値はデジタル表示であるため読取りの個人差が
無く測定誤差が低減する。さらに定電流回路が簡単な構
成なのでコストが安い。
Furthermore, since the measured values are digitally displayed, there are no individual differences in reading, and measurement errors are reduced. Furthermore, since the constant current circuit has a simple configuration, the cost is low.

〔発明の効果] 以上説明した如く、本発明の測定装置は、フォトカップ
ラを用いてアナログ回路とデジタル回路とを電気的に分
離し、かつ温度補償された定電流回路を内蔵し、測定結
果をデジタル表示するので、被測定接点に一定測定電流
を供給した状態での接点抵抗を高精度に測定することが
可能な接触抵抗測定装置を低コストで提供することがで
きる。
[Effects of the Invention] As explained above, the measuring device of the present invention uses a photocoupler to electrically separate an analog circuit and a digital circuit, and has a built-in temperature-compensated constant current circuit, and is capable of transmitting measurement results. Since the display is digital, it is possible to provide a contact resistance measuring device at a low cost that can measure the contact resistance with high precision while a constant measurement current is supplied to the contact to be measured.

【図面の簡単な説明】[Brief explanation of drawings]

図は、本発明の接触抵抗測定装置のブロック図である。 図において、 1−デジタル駆動回路、  2−・・第一のフォトカッ
プラ、         21−発光ダイオード、22
− フォトトランジスタ、3−・・・定電流回路、3■
・・・ツェナーダイオード、32−  ダイオード、3
3−1−ランジスタ、    4−差動増幅器、5−A
 D変換器、 ブラ、 8−判定表示部、 である。 6−第二のフォトカッ 7・・・比較回路、 9−表示部、
The figure is a block diagram of a contact resistance measuring device of the present invention. In the figure, 1 - digital drive circuit, 2 - first photocoupler, 21 - light emitting diode, 22
- Phototransistor, 3-...constant current circuit, 3■
... Zener diode, 32- Diode, 3
3-1-transistor, 4-differential amplifier, 5-A
D converter, bra, 8-judgment display section. 6-Second photocoupler 7...comparison circuit, 9-display section,

Claims (1)

【特許請求の範囲】 測定電流の供給タイミングを制御する駆動回路(1)と
、 前記タイミングに対応して被測定物(10)に一定の測
定電流を供給する定電流回路(3)と、前記測定電流に
よって被測定物(10)の両端に生じた電圧を増幅する
差動増幅器(4)と、 前記差動増幅器(4)の出力をアナログデジタル変換す
る二重積分形のAD変換器(5)と、該AD変換器(5
)のデジタル出力を表示する表示部(6)と、 該デジタル出力を予め設定されている基準値と比較する
比較回路(7)と、 該比較回路の比較結果に基づき良否判定をランプ表示す
る判定表示部(8)とを有し、 前記駆動回路(1)による定電流回路(3)の制御は第
一のフォトカップラ(2)を介して行われ、また前記定
電流回路(3)はトランジスタ(33)と該トランジス
タのベースに接続されたツェナーダイオード(31)と
温度補償用のダイオード(32)との直列回路を有し、
更に前記AD変換器(5)から前記表示部(9)および
前記比較回路(7)へのデジタル出力の伝送は第二のフ
ォトカップラ(6)を介して行われることを特徴とする
接触抵抗測定装置。
[Scope of Claims] A drive circuit (1) that controls the supply timing of the measurement current; a constant current circuit (3) that supplies a constant measurement current to the object to be measured (10) in accordance with the timing; A differential amplifier (4) that amplifies the voltage generated across the object to be measured (10) by the measurement current, and a double integral AD converter (5) that converts the output of the differential amplifier (4) from analog to digital. ) and the AD converter (5
), a comparison circuit (7) that compares the digital output with a preset reference value, and a judgment lamp that displays a pass/fail judgment based on the comparison result of the comparison circuit. The constant current circuit (3) is controlled by the drive circuit (1) via a first photocoupler (2), and the constant current circuit (3) is a transistor. (33), a series circuit of a Zener diode (31) connected to the base of the transistor, and a temperature compensation diode (32),
Furthermore, the contact resistance measurement is characterized in that digital output is transmitted from the AD converter (5) to the display section (9) and the comparison circuit (7) via a second photocoupler (6). Device.
JP20844789A 1989-08-11 1989-08-11 Measuring device for contact resistance Pending JPH0372273A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20844789A JPH0372273A (en) 1989-08-11 1989-08-11 Measuring device for contact resistance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20844789A JPH0372273A (en) 1989-08-11 1989-08-11 Measuring device for contact resistance

Publications (1)

Publication Number Publication Date
JPH0372273A true JPH0372273A (en) 1991-03-27

Family

ID=16556358

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20844789A Pending JPH0372273A (en) 1989-08-11 1989-08-11 Measuring device for contact resistance

Country Status (1)

Country Link
JP (1) JPH0372273A (en)

Similar Documents

Publication Publication Date Title
US4349777A (en) Variable current source
JP6850338B2 (en) Reduction of flicker noise in temperature sensor configuration
KR0138161B1 (en) Common mode error correction for differential amplifier
US3872386A (en) Test device
US3906796A (en) Electronic temperature measuring apparatus
JPH09105681A (en) Temperature measuring circuit
EP0135214B1 (en) Apparatus for measuring a temperature
GB944385A (en) Improvements in and relating to apparatus and methods for testing transistors
JPH0372273A (en) Measuring device for contact resistance
US3273060A (en) Expanded scale ammeter including a bridge biased transistor differential amplifier
US5096303A (en) Electronic circuit arrangement for temperature measurement based on a platinum resistor as a temperature sensing resistor
CN113702711A (en) Resistance test circuit and resistance test method
CN114812915B (en) Pressure scanning valve circuit
US3532983A (en) High input impedance solid state d.c. amplifier suitable for use in electrical measurement
US3478588A (en) Cardiac output meter
JPS626171B2 (en)
CN117031100A (en) Front-end circuit of universal meter and universal meter
US3832633A (en) Transistor beta measuring instrument
SU1606115A1 (en) Rheoplethysmograph
SU998975A1 (en) Resistance remote measuring device
JP2576235Y2 (en) Voltage or current measuring device
SU725029A1 (en) Bridge for remote measurement of resistances
CN2280917Y (en) Digital insulation resistance meter
SU1226344A1 (en) Adjustable electron load
RU2024831C1 (en) Device for measuring pressure