JPH0369076A - Foreign substance detector - Google Patents

Foreign substance detector

Info

Publication number
JPH0369076A
JPH0369076A JP20312189A JP20312189A JPH0369076A JP H0369076 A JPH0369076 A JP H0369076A JP 20312189 A JP20312189 A JP 20312189A JP 20312189 A JP20312189 A JP 20312189A JP H0369076 A JPH0369076 A JP H0369076A
Authority
JP
Japan
Prior art keywords
light
spot light
foreign object
foreign substance
recording medium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20312189A
Other languages
Japanese (ja)
Inventor
Toyofumi Tani
谷 豊文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP20312189A priority Critical patent/JPH0369076A/en
Publication of JPH0369076A publication Critical patent/JPH0369076A/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To detect a foreign substance with high accuracy by forming light from a light source to be spot light, irradiating an information recording medium with the light, converting the photodetection amount of the spot light from the information recording medium to an electric signal and discriminating the presence and absence of the foreign substance. CONSTITUTION:The spot light irradiates from a laser diode 10 through a collimator lens 11 and a slit 12. The spot light incident to an optical disk 1 is diffracted on the surface and reflected in a recording layer 2. Afterwards, the reflected light is incident to a condenser lens 13. The condensed spot light is converged on the photodetecting surface of a two-dimensional semiconductor position detector 14 as a photodetector and the quantity of light is detected. Output voltages X1 and X2 at both ends of the detector 14 are added by an adder 20 and a signal as an added result is compared with a reference voltage by a comparator 21. Then, a discriminating circuit 22 discriminates the presence and absence of the foreign substance.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、光ディスク、磁気ディスク等の記録媒体に
付着した埃、塵等の異物の検出装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a device for detecting foreign matter such as dirt and dust attached to a recording medium such as an optical disk or a magnetic disk.

〔従来の技術〕[Conventional technology]

光ディスクは大容量の記憶媒体として用いられており、
その表面には1.5〜1.6μm間隔で情報が記憶され
ている。光ディスクは磁気ディスクに比べ、媒体から離
すことができるので、空気中の塵埃等の異物の影響を受
けにくい。
Optical disks are used as large-capacity storage media.
Information is stored on its surface at intervals of 1.5 to 1.6 μm. Compared to magnetic disks, optical disks can be separated from the medium, so they are less susceptible to the effects of foreign substances such as dust in the air.

また光ディスクにおいては、情報を記録するピットの寸
法は約1μ憎程度であり、これを検出するスポット光の
光束は記録面では約1μm径であるが、光デイスク表面
では約1鴫径となっており、ビット面積の100万倍と
なっているので20μm程度の埃及び部分的な汚れの影
響を受けにくいものとなっている。
In addition, in an optical disk, the size of the pit in which information is recorded is approximately 1 μm, and the beam of the spot light used to detect this is approximately 1 μm in diameter on the recording surface, but is approximately 1 μm in diameter on the optical disk surface. Since the area is one million times larger than the bit area, it is less susceptible to dust and local dirt of about 20 μm.

さらに光デイスク駆動装置では、誤り検出及び訂正技術
が導入されており、記録面での数十μm程度の疵及び埃
などによる欠陥に対しても、それによる誤りを訂正する
ことができるようになっている。
Furthermore, error detection and correction technology has been introduced in optical disk drives, making it possible to correct errors caused by defects such as scratches and dust on the recording surface of several tens of micrometers. ing.

(発明が解決しようとする課題) しかしながら、光ディスクは高速回転しているので、空
気との摩擦により静電気が帯電し、それにより大径な異
物が付着する虞がある。そして大径な異物の付着又は傷
により、訂正能力以上の検出エラーが生した場合、それ
がそのまま再生され、誤ったデータが再生されることに
なる。
(Problems to be Solved by the Invention) However, since the optical disk rotates at high speed, static electricity may be generated due to friction with the air, which may cause large-diameter foreign matter to adhere to the optical disk. If a detection error that exceeds the correction ability occurs due to the attachment of large-diameter foreign matter or scratches, the error will be reproduced as is, and erroneous data will be reproduced.

従来の光デイスク駆動装置においては、検出エラーが生
した場合、異物の検出ができないので、その原因が媒体
欠陥によるものか、又は異物によるものかを判断できな
かった。
In conventional optical disk drive devices, when a detection error occurs, it is impossible to detect a foreign object, so it is not possible to determine whether the cause is a defect in the medium or a foreign object.

この発明は斯かる事情に鑑みなされたものであり、光源
から媒体を介して受光されたスポット光の受光量の変動
に基づき異物を高精度で検出できると共に、それにより
媒体駆動装置での検出エラーの発生を抑制できる異物検
出装置を提供することを目的とする。
This invention was made in view of the above circumstances, and it is possible to detect foreign objects with high precision based on fluctuations in the amount of spot light received from a light source through a medium, and it also prevents detection errors in the medium drive device. An object of the present invention is to provide a foreign object detection device that can suppress the occurrence of.

(課題を解決するための手段) この発明に係る異物検出装置は、光源と、光源から出射
された光をスポット光にして情報記録媒体に照射する光
学系と、前記情報記録媒体からのスポット光を受光し、
その受光量を電気信号に変換する受光素子とを設け、そ
の受光量の不連続的な変化に基づき、異物の有無を検出
するようにしたものである。
(Means for Solving the Problems) A foreign object detection device according to the present invention includes a light source, an optical system that converts light emitted from the light source into a spot light and irradiates an information recording medium, and a spot light from the information recording medium. receives light,
A light receiving element that converts the amount of received light into an electrical signal is provided, and the presence or absence of foreign matter is detected based on discontinuous changes in the amount of received light.

〔作用〕[Effect]

この発明においては、異物がある場合、情報記録媒体に
照射されたスポット光は異物により散乱させられ、その
受光量が不連続的に変化するので、このことを検出する
ことにより、異物を高精度で検出できる。
In this invention, when there is a foreign object, the spot light irradiated on the information recording medium is scattered by the foreign object, and the amount of received light changes discontinuously. By detecting this, the foreign object can be detected with high accuracy. It can be detected by

〔実施例] 以下、この発明をその一実施例を示す図面に基づいて説
明する。
[Example] Hereinafter, the present invention will be described based on drawings showing one example thereof.

第1図はこの発明に係る異物検出装置の構成を示すブロ
ック図である。図においてlは記録媒体たる光ディスク
であり、該光デイスク1は情報を記録する記録層2を有
している。
FIG. 1 is a block diagram showing the configuration of a foreign object detection device according to the present invention. In the figure, l denotes an optical disk as a recording medium, and the optical disk 1 has a recording layer 2 for recording information.

光デイスク1の図示しない光ヘッドを臨む面には光ヘッ
ドに取付られた光源たるレーザダイオード(以下LDと
いう)10からコリメータレンズ11゜スリット12を
介してスポット光が照射される。コリメータレンズ11
はLDIOからのレーザ光を平行光にするためのもので
あり、スリット12は平行光を所定形状のスポット光に
するものである。スポット光はその光軸を鉛直方向と角
度θiをなして光デイスク1に照射される。光ディスク
lに入射したスポット光はその表面で屈折し、記録層2
で反射した後、集光レンズ13に入射する。入射したス
ポット光は集光レンズ13で集光され、受光素子たる2
次元の半導体装置検出素子(Position Sen
singDevice以下PSDという)14上の受光
面で集束し、その光量が検出される。
A spot light is irradiated onto the surface of the optical disk 1 facing an optical head (not shown) from a laser diode (hereinafter referred to as LD) 10, which is a light source attached to the optical head, through a collimator lens 11 and a slit 12. Collimator lens 11
The slit 12 is for converting the laser beam from the LDIO into parallel light, and the slit 12 is for converting the parallel light into a spot light having a predetermined shape. The spot light is irradiated onto the optical disk 1 with its optical axis forming an angle θi with the vertical direction. The spot light incident on the optical disc l is refracted on its surface, and the recording layer 2
After being reflected, the light enters the condenser lens 13. The incident spot light is condensed by a condensing lens 13, and the light receiving element 2
Position Sen
The light is focused on the light receiving surface of the singDevice (hereinafter referred to as PSD) 14, and the amount of light is detected.

第2図はPSD 14の構成−例を示す平面図であり、
PSD 14により異物の検出と共にPSD 14の位
置検出機能を用いて図示しない傾斜角検出回路により、
光デイスク1の表面の周方向及び径方向の傾きの検出を
行っている。
FIG. 2 is a plan view showing an example of the configuration of the PSD 14,
The PSD 14 detects a foreign object and uses the position detection function of the PSD 14 to detect a tilt angle, which is not shown in the figure.
The inclination of the surface of the optical disk 1 in the circumferential direction and the radial direction is detected.

2次元検出用のPSD 14は受光面の縦横を夫々2L
とし、その縦横の両端の出力電圧を夫々Y + 、 Y
 Z及びx、、X、とすると受光面の中心を中心点とし
たときの受光した位置の座標(x、y)はXI  +x
t で表せる。
PSD 14 for two-dimensional detection has a light receiving surface of 2L each in the vertical and horizontal directions.
The output voltages at both vertical and horizontal ends are Y + and Y, respectively.
If Z and x, ,X, the coordinates (x, y) of the position where light is received when the center of the light receiving surface is the center point are
It can be expressed as t.

そしてこの受光位置の中心点からのずれを検出すること
により光デイスク1の傾きを知ることができる。
The tilt of the optical disk 1 can be determined by detecting the deviation of the light receiving position from the center point.

但し異物を検出する場合は、傾きを求める必要はなく、
例えばPSD 14の両端の出力電圧X+、Xzを加算
して異物を検出する。即ち加算器20で所定の検出タイ
ミング毎に出力された出力電圧X7.X2を加算し、加
算結果の信号を比較器21の一端に入力し、その他端に
人力された基準電圧との比較により、判定回路22で異
物の有無を判定する。
However, when detecting foreign objects, there is no need to calculate the slope.
For example, a foreign object is detected by adding the output voltages X+ and Xz at both ends of the PSD 14. That is, the output voltage X7. which is output by the adder 20 at each predetermined detection timing. X2 is added, the signal of the addition result is input to one end of the comparator 21, and by comparison with a reference voltage manually applied to the other end, the determination circuit 22 determines the presence or absence of foreign matter.

尚、出力電圧Y + 、 Y zについても同様に判定
を行うことにより、より確実な異物の検出ができる。
Note that by similarly determining the output voltages Y + and Y z , foreign matter can be detected more reliably.

また加算結果の信号はローパスフィルタ23に与えられ
平滑化され、検出タイミング毎の最大値が最大値ホール
ド回路24により保持される。保持された最大値はA/
D変換器25に与えられ、そこでディジタル値に変換さ
れる。ディジタル変換された最大値はレベル比検出回路
26に与えられ、そこで検出タイミング毎の最大値のレ
ベル比を演算し、異物形状判定回路27により、予め定
められた異物の大きさとレベル比との関係に基づき、異
物形状(大きさ)が判定される。尚、出力電圧Y + 
、 Y 2について同様の判定を行うことにより、XI
、Xzと直角方向の異物形状(大きさ)が判定され、よ
り高精度な判定ができる。
Further, the signal resulting from the addition is applied to a low-pass filter 23 and smoothed, and the maximum value at each detection timing is held by a maximum value hold circuit 24. The maximum value held is A/
The signal is applied to a D converter 25, where it is converted into a digital value. The digitally converted maximum value is given to the level ratio detection circuit 26, which calculates the level ratio of the maximum value at each detection timing, and the foreign object shape determination circuit 27 determines the relationship between the foreign object size and the level ratio determined in advance. Based on this, the shape (size) of the foreign object is determined. Furthermore, the output voltage Y +
, By making the same determination for Y 2, XI
, Xz, and the shape (size) of the foreign object in the direction perpendicular to Xz is determined, allowing for more accurate determination.

次に異物検出動作について説明する。Next, the foreign object detection operation will be explained.

第3図は異物である埃りが光デイスクl上に付着した場
合のスポット光の散乱状態を示す図であり、光軸Oxよ
り下方のスポット光は埃りにより散乱し、光ディスクl
の記録層2に到達しない。従って、PSD 14にて受
光されず、第4図に示す如く埃りによりスポット光の略
半分だけが受光される。
FIG. 3 is a diagram showing the scattering state of the spot light when dust, which is a foreign substance, adheres to the optical disc l. The spot light below the optical axis Ox is scattered by the dust, and the optical disc l
does not reach the recording layer 2. Therefore, the light is not received by the PSD 14, and only approximately half of the spot light is received due to dust as shown in FIG.

従って受光量が減少し、その出力電圧X1.Xzの和(
又はY、、Y2の和)が減少する。
Therefore, the amount of light received decreases, and the output voltage X1. The sum of Xz (
or the sum of Y, , Y2) decreases.

そして出力電圧XIと同X、(又はYlと同Y、)との
和が基準値と比較して小さくなっていることにより異物
の付着を判定する。
Then, the presence of foreign matter is determined based on the fact that the sum of the output voltages XI and X (or Yl and Y) is smaller than the reference value.

次に他の実施例について第5図を用いて説明する。Next, another embodiment will be described using FIG. 5.

第5図はこの発明の異物検出装置の他の実施例の構成を
示すブロック図である。前述の実施例でPSD 14の
出力をそのまま用いて異物を検出したが、この実施例で
は傾斜角検出回路30で傾斜角を検出し、それを用いて
異物を検出する。即ち出力電圧Xr、Xz  (又はY
、、Y、)によりスポット光の受光位置X (又はy)
を前述の式より求める。
FIG. 5 is a block diagram showing the configuration of another embodiment of the foreign object detection device of the present invention. In the embodiment described above, the output of the PSD 14 was used as is to detect a foreign object, but in this embodiment, the inclination angle is detected by the inclination angle detection circuit 30, and this is used to detect a foreign object. That is, the output voltages Xr, Xz (or Y
, , Y, ), the spot light receiving position X (or y)
is calculated from the above formula.

ここでPSD 14は光ディスクに(頃きかないときス
ポット光がその受光面の中心で受光できるように位置決
めされており、スポット光の受光位置によりX方向(又
はY方向)の傾斜角を知ることができる。即ちスポット
光の光ディスクでの反射位置からPSD 14の受光面
までの距離をhとすると光ディスクのX方向の傾斜角θ
X (又はY方向の傾斜角θ、)は下記式の如く となる。
Here, the PSD 14 is positioned so that the spot light can be received at the center of its light-receiving surface when the optical disc does not rotate, and the tilt angle in the X direction (or Y direction) can be determined from the light receiving position of the spot light. In other words, if the distance from the reflection position of the spot light on the optical disk to the light receiving surface of the PSD 14 is h, then the inclination angle θ of the optical disk in the X direction is
X (or inclination angle θ, in the Y direction) is expressed by the following formula.

傾斜角検出回路30で検出された傾斜角θX(又はθV
)はA/D変換器31にてA/D変換され、メモリ32
に格納される。格納された傾斜角θ8は高速フーリエ変
換器33でフーリエ変換され、次に逆フーリエ変換′P
134に与えられて逆フーリエ変換され、傾斜角θ8の
データを平均化する。これにより傾斜角θ8の高周波域
を取り除く。そしてメモリ32に格納された傾斜角θ8
と平均化したデータとを比較回路35で比較し、この比
較結果により異物の有無を判定回路36で判定する。
The tilt angle θX (or θV) detected by the tilt angle detection circuit 30
) is A/D converted by the A/D converter 31 and stored in the memory 32.
is stored in The stored tilt angle θ8 is Fourier-transformed by a fast Fourier transformer 33, and then inverse Fourier-transformed 'P'
134 and undergoes inverse Fourier transform, and the data at the tilt angle θ8 is averaged. This removes the high frequency range of the inclination angle θ8. And the tilt angle θ8 stored in the memory 32
A comparison circuit 35 compares the data and the averaged data, and a determination circuit 36 determines whether there is a foreign object based on the comparison result.

第6図〜第8図はX方向及びY方向の傾斜角の周方向及
び径方向位置での変動を示すグラフである。第6図はX
方向の傾斜角θ8の周方向位置での変動を、第7図はY
方向の傾斜角θ7の周方向位置での変動を夫々示してい
る。また第8図はX方向の傾斜角θ8の径方向位置での
変動を示している。また第6,7図では縦軸に傾斜角θ
8.θ7を、また横軸に周方向位置をとっており、第8
図では縦軸に傾斜角θ8を、また横軸に径方向位置をと
っている。
FIGS. 6 to 8 are graphs showing variations in inclination angles in the X and Y directions in circumferential and radial positions. Figure 6 is X
Figure 7 shows the variation in the circumferential position of the inclination angle θ8 of the Y
3A and 3B respectively show variations in the circumferential position of the inclination angle θ7. Further, FIG. 8 shows the variation of the inclination angle θ8 in the X direction with respect to the radial position. In addition, in Figures 6 and 7, the vertical axis shows the inclination angle θ.
8. θ7, and the circumferential position is taken on the horizontal axis, and the 8th
In the figure, the vertical axis represents the inclination angle θ8, and the horizontal axis represents the radial position.

周方向位置では第6,7図にA部で示す周方向位置の略
310°のところの傾斜角θ8.θ7が急激に変化して
おり、このときの変化がフーリエ変換−逆変換によりカ
ットされ、これとメモリ32に格納された同じ周方向位
置の傾斜角θ8.θ、との比較により急激な変化を検出
でき、これにより異物を検出することができる。
At the circumferential position, the inclination angle θ8 is approximately 310° at the circumferential position shown by section A in FIGS. θ7 is changing rapidly, and this change is cut by Fourier transform-inverse transformation, and this and the inclination angle θ8 at the same circumferential position stored in the memory 32. A sudden change can be detected by comparison with θ, and thus a foreign object can be detected.

また第8図に示す如く径方向位置では略50am付近に
傾斜角θ8の急変が生じており、同様に比較回路35で
異物を検出できる。即ち異物がないときは第8図に破線
で示す如く傾斜角θ8は緩やかに変動しており、異物が
あるときは急変する。この実施例では異物の位置が認識
できるので、例えば異物を吸着する手段を光デイスク駆
動装置に設け、これにより異物を除去するように構成す
れば、異物を確実に除去でき、検出エラーを抑制できる
Further, as shown in FIG. 8, there is a sudden change in the inclination angle θ8 at approximately 50 am in the radial position, and the comparator circuit 35 can similarly detect a foreign object. That is, when there is no foreign object, the inclination angle θ8 changes slowly as shown by the broken line in FIG. 8, and when there is a foreign object, it changes suddenly. In this embodiment, since the position of the foreign object can be recognized, for example, if the optical disk drive device is provided with a means for adsorbing the foreign object and configured to remove the foreign object, the foreign object can be reliably removed and detection errors can be suppressed. .

なお以上の実施例では受光素子としてPSDを用いたが
、この発明はこれに限るものではなく、受光素子として
は異物によるスポット光の散乱を検出できるものであれ
ばCCD、リニアIC等どのような素子でもよい。
In the above embodiments, a PSD was used as the light receiving element, but the present invention is not limited to this. Any type of light receiving element, such as a CCD or a linear IC, can be used as long as it can detect the scattering of spot light by foreign objects. It may be an element.

またこの実施例では2次元のPSDを用いたが、これは
第2図(b)に示す1次元のPSDでもよい。
Further, although a two-dimensional PSD is used in this embodiment, a one-dimensional PSD shown in FIG. 2(b) may be used instead.

また以上の実施例では光ディスクでの異物検出の場合を
例に説明したが、この発明はこれに限るものではなく、
磁気ディスク等の他の記憶媒体にも適用できることは言
うまでもない。
Furthermore, in the above embodiments, the case of detecting foreign matter on an optical disk was explained as an example, but the present invention is not limited to this.
It goes without saying that the present invention can also be applied to other storage media such as magnetic disks.

〔発明の効果〕〔Effect of the invention〕

以上説明したとおり、この発明においては光源より照射
された光をスポット化し、その反射光を受光素子にて受
光し、異物によるスポット光の散乱を検出することによ
り情報記録媒体上に付着した異物を精度よく検出できる
と共に、これを光デイスク駆動装置に用いた場合、検出
エラーの原因を確実に判別でき、検出エラーの発生を抑
制できる等優れた効果を奏する。
As explained above, in the present invention, the light emitted from the light source is turned into a spot, the reflected light is received by a light receiving element, and the scattering of the spot light by the foreign matter is detected, thereby detecting foreign matter attached to the information recording medium. In addition to being able to detect with high accuracy, when this is used in an optical disk drive device, it has excellent effects such as being able to reliably determine the cause of a detection error and suppressing the occurrence of a detection error.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明に係る異物検出装置の構成を示すブロ
ック図、第2図はPSDの構成の一例を示す図、第3.
4図は異物付着時の状態を示す図、第5図はこの発明の
異物検出装置の他の実施例の構成を示すブロック図、第
6〜8図は傾斜角の変動を示すグラフである。 1・・・光ディスク 10・・・LD  11・・・コ
リメータレンズ 12・・・スリット 13・・・集光
レンズ 14・・・PSD22・・・判定回路 なお、図中、同一符号は同一、又は相当部分を示す。
FIG. 1 is a block diagram showing the configuration of a foreign object detection device according to the present invention, FIG. 2 is a diagram showing an example of the configuration of a PSD, and FIG.
FIG. 4 is a diagram showing the state when foreign matter is attached, FIG. 5 is a block diagram showing the configuration of another embodiment of the foreign matter detection device of the present invention, and FIGS. 6 to 8 are graphs showing variations in the tilt angle. DESCRIPTION OF SYMBOLS 1... Optical disk 10... LD 11... Collimator lens 12... Slit 13... Condensing lens 14... PSD22... Judgment circuit Note that in the figures, the same symbols are the same or equivalent Show parts.

Claims (1)

【特許請求の範囲】[Claims] (1)情報記録媒体上に付着している異物を検出する装
置であって、 光源と、 該光源から照射された光を スポット光にして前記情報記録媒体に照射 する光学系と、 前記情報記録媒体からのスポット光を受光 し、その受光量を電気信号に変換する受光素子と、 該受光素子からの電気信号に基づき異物の 有無を判定する異物判定手段と を備えることを特徴とする異物検出装置。
(1) An apparatus for detecting foreign matter adhering to an information recording medium, comprising: a light source; an optical system that converts light emitted from the light source into a spot light and irradiates the information recording medium; and the information recording medium. A foreign object detection device comprising: a light receiving element that receives spot light from a medium and converts the amount of the received light into an electrical signal; and a foreign object determining means that determines the presence or absence of a foreign object based on the electrical signal from the light receiving element. Device.
JP20312189A 1989-08-05 1989-08-05 Foreign substance detector Pending JPH0369076A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20312189A JPH0369076A (en) 1989-08-05 1989-08-05 Foreign substance detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20312189A JPH0369076A (en) 1989-08-05 1989-08-05 Foreign substance detector

Publications (1)

Publication Number Publication Date
JPH0369076A true JPH0369076A (en) 1991-03-25

Family

ID=16468752

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20312189A Pending JPH0369076A (en) 1989-08-05 1989-08-05 Foreign substance detector

Country Status (1)

Country Link
JP (1) JPH0369076A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101832946A (en) * 2009-02-17 2010-09-15 西门子公司 Be used to check the method and apparatus of workmanship of the spinner blade of wind energy plant

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101832946A (en) * 2009-02-17 2010-09-15 西门子公司 Be used to check the method and apparatus of workmanship of the spinner blade of wind energy plant

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