JPH0367134A - Photoelectric converter - Google Patents

Photoelectric converter

Info

Publication number
JPH0367134A
JPH0367134A JP1202544A JP20254489A JPH0367134A JP H0367134 A JPH0367134 A JP H0367134A JP 1202544 A JP1202544 A JP 1202544A JP 20254489 A JP20254489 A JP 20254489A JP H0367134 A JPH0367134 A JP H0367134A
Authority
JP
Japan
Prior art keywords
photoelectric conversion
current
leakage current
light
photodiode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1202544A
Other languages
Japanese (ja)
Inventor
Akinaga Yamamoto
晃永 山本
Kenji Makino
健二 牧野
Akimasa Tanaka
章雅 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to JP1202544A priority Critical patent/JPH0367134A/en
Publication of JPH0367134A publication Critical patent/JPH0367134A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H04N25/621Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
    • H04N25/623Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming by evacuation via the output or reset lines

Abstract

PURPOSE:To obtain the device which has a high sensitivity and is easy to use by leaking the current equal to the leak current of a photoelectric converting element and supplying this current from a current compensating means at all times. CONSTITUTION:The photocurrent C3 corresponding to the quantity of the received light flows and the charge charged by initial setting in a capacity means 6 discharge when the photodetecting part of a photodiode 1 is irradiated with light 20 during the signal accumulation period. On the other hand, the leak current C1 flows at all times to the diode 1 regardless of the quantity of the received light but is offset by the leak current C2 flowing in a photodiode 2 and does not affect at all the charge accumulated in the means 6. The charge accumulated in the means 6 discharges only by the photocurrent C3 in this way and the potential at a point 17 is gradually lowered by this discharge. The potential at the point 17 just before resetting attains the value corresponding to the quantity of the light which the diode 1 receives during the single accumulation period.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は光電変換装置、特に、極めて微弱な光を抽らえ
て感度よく電気信号に変換する光電変換装置に関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a photoelectric conversion device, and particularly to a photoelectric conversion device that extracts extremely weak light and converts it into an electrical signal with high sensitivity.

〔従来の技術〕[Conventional technology]

従来から光電変換素子と電荷蓄積手段とを基本要素とす
る光電変換装置がある。この装置は、光電変換素子の光
電流によって電荷蓄積手段に電荷を蓄え、その蓄積電荷
の変化に1fう電圧変化を電気信号として取り出すもの
である。
2. Description of the Related Art Conventionally, there have been photoelectric conversion devices whose basic elements are a photoelectric conversion element and a charge storage means. This device stores electric charge in a charge storage means using a photocurrent of a photoelectric conversion element, and extracts a voltage change of 1f in response to a change in the accumulated electric charge as an electric signal.

〔発明が解決しようとする課題) ところで、微弱な光を電気信号に変換しようとする場合
には、光電流による電荷蓄積の時間を長くしてS/N比
を上げる必要がある。しかし、光電変換素子には必ず洩
れ電流が存在するため、光を全く受けなくとも電荷蓄積
手段に電荷が徐々に蓄積され、最後には蓄積不能状態に
至ってしまう。
[Problems to be Solved by the Invention] By the way, when attempting to convert weak light into an electrical signal, it is necessary to increase the S/N ratio by increasing the time for charge accumulation by photocurrent. However, since a leakage current always exists in a photoelectric conversion element, charge is gradually accumulated in the charge storage means even when no light is received, and eventually a state in which storage is impossible is reached.

そのために、蓄積時間を十分に長くとることができず、
したがって、感度の良い光電変換装置を得ることかでき
なかった。なお、光電変換素子を液体窒素温度程度まで
冷却すれば、洩れ電流を無視できる程度に小さくするこ
とができるが、冷却装置を含めると非常に大掛かりな装
置とならざるを得ない。
Therefore, the storage time cannot be kept long enough,
Therefore, it was not possible to obtain a photoelectric conversion device with good sensitivity. Note that if the photoelectric conversion element is cooled to about the temperature of liquid nitrogen, the leakage current can be reduced to a negligible level, but if a cooling device is included, the device must be very large-scale.

本発明の課題は、このような問題点を解消することにあ
る。
An object of the present invention is to solve these problems.

〔課題を解決するための手段〕[Means to solve the problem]

上記課題を解決するために、本発明の光電変換装置は、
光電変換素子の洩れ電流とほぼ等しい電流をその光電変
換素子に供給する洩れ電流補償手段を備えたものである
。なお、洩れ電流補償手段は、前記光電変換素子と同−
横這の光電変換素子であって受光部が遮蔽されたもので
あることが望ましい。
In order to solve the above problems, the photoelectric conversion device of the present invention includes:
This device includes leakage current compensating means for supplying a current approximately equal to the leakage current of the photoelectric conversion element to the photoelectric conversion element. Note that the leakage current compensation means is the same as the photoelectric conversion element.
It is preferable that the photoelectric conversion element be a horizontal photoelectric conversion element with a shielded light receiving part.

〔作用〕[Effect]

光電変換素子の洩れ電流と等しい電流が洩れ電流補償手
段から常時供給されているため、洩れ電流に基づいて電
荷蓄積手段に電荷が蓄積されることがない。したがって
、洩れ電流によって電荷蓄積手段が蓄積限界に達してし
まうことがない。
Since a current equal to the leakage current of the photoelectric conversion element is constantly supplied from the leakage current compensation means, charges are not accumulated in the charge storage means based on the leakage current. Therefore, the charge storage means does not reach its storage limit due to leakage current.

また、洩れ電流補償手段に光電変換素子と同−横這の光
電変換素子を用いれば、温度特性を初めとする種々の特
性が一致しているため、洩れ電流補償手段は過不足なく
光電変換素子の洩れ電流を補償することができる。
In addition, if the same photoelectric conversion element as the photoelectric conversion element is used as the leakage current compensation means, since various characteristics including temperature characteristics are the same, the leakage current compensation means can be used as a photoelectric conversion element without excess or deficiency. leakage current can be compensated for.

〔実施例〕〔Example〕

第1図は本発明の一実施例を示す回路図である。 FIG. 1 is a circuit diagram showing an embodiment of the present invention.

光電変換素子であるフォトダイオード1は微弱光検出用
のものであり、数11m角の広い受光面を持っている。
The photodiode 1, which is a photoelectric conversion element, is for detecting weak light and has a wide light-receiving surface of several 11 meters square.

フォトダイオード1のアノードは接地され、カソードは
別のフォトダイオード2のアノードに接続されている。
The anode of photodiode 1 is grounded, and the cathode is connected to the anode of another photodiode 2.

フォトダイオード2は、フォトダイオード1と形状およ
び大きさのいずれにおいても同じであり、遮光手段3と
共に洩れ電流補償手段4を構成している。フォトダイオ
ード2のカソードは5vの定電圧が印加される端子11
に接続されている。
The photodiode 2 has the same shape and size as the photodiode 1, and together with the light shielding means 3 constitutes a leakage current compensating means 4. The cathode of the photodiode 2 is a terminal 11 to which a constant voltage of 5V is applied.
It is connected to the.

電荷蓄積手段5は、容量手段6とスイッチング手段であ
るMOS電界電界効果フラノジスタフ構成されている。
The charge storage means 5 is composed of a capacitance means 6 and a MOS electric field effect flanozystaff which is a switching means.

トランジスタ7のドレインは2.5Vの定電圧が印加さ
れる端子12に接続され、ゲートは振幅電圧をOv〜5
vとする制御用電圧が印加される端子13に接続されて
いる。容量手段6は一端が接地され、他端はトランジス
タ7のソース、フォトダイオードlのカソードおよび後
述するソースホロワトランジスタ9のゲートにそれぞれ
接続されている。容量手段6は、その容量値がむしろ小
さいほうが望ましいので、コンデンサを積極的に付加す
る必要はない。すなわち、容量手段6は配線容量および
トランジスタ9のゲート容量だけで構成されている。
The drain of the transistor 7 is connected to the terminal 12 to which a constant voltage of 2.5V is applied, and the gate has an amplitude voltage of Ov~5.
It is connected to a terminal 13 to which a control voltage v is applied. One end of the capacitive means 6 is grounded, and the other end is connected to the source of the transistor 7, the cathode of the photodiode 1, and the gate of a source follower transistor 9, which will be described later. Since it is preferable for the capacitor means 6 to have a small capacitance value, there is no need to actively add a capacitor. That is, the capacitor means 6 is composed only of the wiring capacitor and the gate capacitor of the transistor 9.

インピーダンス変換手段8は、ソースホロワ電界効果ト
ランジスタつと定電流源としての電界効果トランジスタ
10による直列回路で構成さている。トランジスタ9の
ドレインは5vの定電圧が印加される端子14に接続さ
れ、ソースはトランジスタ10のドレインに接続されて
いる。トランジスタ10のソースは接地され、そのゲー
トはIVの定電圧が印加される端子15に接続されてい
る。トランジスタ9および10の接続点18は、この光
電変換装置の出力端子である。
The impedance conversion means 8 is constituted by a series circuit including a source follower field effect transistor and a field effect transistor 10 as a constant current source. The drain of the transistor 9 is connected to a terminal 14 to which a constant voltage of 5V is applied, and the source is connected to the drain of the transistor 10. The source of the transistor 10 is grounded, and the gate thereof is connected to a terminal 15 to which a constant voltage of IV is applied. A connection point 18 between transistors 9 and 10 is an output terminal of this photoelectric conversion device.

つぎに本実施例の動作を説明する。端子11.12.1
4.15にはそれぞれ上述した所定の定心圧が印加され
ており、端子13にはOVが印加されているものとする
。端子13に印加される制at=号は、ハイレベルを5
V、o−レベル0■とする2EIi信号であり、ローレ
ベルを基準状態とし、lJmsの幅をNjつハイレベル
のパルスをリセット信号とする。リセット信号の周明は
、例えば10分程度である。
Next, the operation of this embodiment will be explained. Terminal 11.12.1
It is assumed that the above-described predetermined constant pressure is applied to each terminal 4.15, and OV is applied to the terminal 13. The control at= signal applied to the terminal 13 has a high level of 5
It is a 2EIi signal with a V, o level of 0■, with a low level as a reference state and a high level pulse with a width of 1Jms of Nj as a reset signal. The period of time for the reset signal is, for example, about 10 minutes.

トランジスタ7は通常オフ状態となっており、そのゲー
トにリセット信号が与えられると導通ずる。トランジス
タ7が導通すると、端子12に2.5Vが印加されてい
るため、容量手段6の端子IHJ電圧は2.5■に初期
設定(リセット)される。リセット後は、つぎのりセッ
ト信号が与えられるまで、すなわち、信号蓄積期間中ト
ランジスタ7はオフ状態を維持する。
Transistor 7 is normally in an off state, and becomes conductive when a reset signal is applied to its gate. When the transistor 7 becomes conductive, since 2.5V is applied to the terminal 12, the terminal IHJ voltage of the capacitor means 6 is initialized (reset) to 2.5. After resetting, the transistor 7 remains off until the next set signal is applied, that is, during the signal accumulation period.

f1号蓄積期間中にフォトダイオード1の受光部に光2
0か照14されると、受光量に応じた充電流C3が流れ
、容量手段6に初期設定で充電された電f1:7が放電
する。一方、フォトダイオード1には、充電流C3とは
別に、受光量に無関係に洩れ電流Cが常時流れている。
During the f1 accumulation period, light 2 is applied to the light receiving part of photodiode 1.
When the light is illuminated 14, a charging current C3 flows according to the amount of light received, and the electric current f1:7 charged in the capacitive means 6 in the initial setting is discharged. On the other hand, in addition to the charging current C3, a leakage current C constantly flows through the photodiode 1, regardless of the amount of received light.

しかし、洩れ電流CIはフォトダイオード2に流れる洩
れ電流C2によって相殺されるため、容量手段6の蓄積
電Njに全く影響を与えない。
However, since the leakage current CI is canceled out by the leakage current C2 flowing through the photodiode 2, it does not affect the accumulated current Nj of the capacitor means 6 at all.

このように、容量手段6の蓄積電荷は充電流C3によっ
てのみ放電し、この放電によって点17の電位が徐々に
低下する。したがって、つぎにリセットされる直前の点
17の電位は、当該信号拮積期間中にフォトダイオード
1が受光した光量に対応した値となる。なお、本発明は
非常に微弱な光を検出しようするものであり、その電位
変化はたとえば数百mV程度である。点17の電位はト
ランジスタ9のゲートに与えられており、ソース・ゲー
ト間で一定の電圧だけレベルシフトされ、かつ、インピ
ーダンス変換されて接続点18から出力される。つぎの
りセット信号人力では、再び容量手段6の電圧は2.5
Vに初期設定され、以後同様の動作が繰り返される。
In this way, the accumulated charge in the capacitor means 6 is discharged only by the charging current C3, and the potential at point 17 gradually decreases due to this discharge. Therefore, the potential at point 17 immediately before being reset next has a value corresponding to the amount of light received by photodiode 1 during the signal accumulation period. Note that the present invention is intended to detect very weak light, and the potential change is, for example, about several hundred mV. The potential at point 17 is applied to the gate of transistor 9, level-shifted by a constant voltage between the source and gate, impedance converted, and output from connection point 18. In the next setting signal manually, the voltage of the capacitive means 6 is 2.5 again.
It is initialized to V, and the same operation is repeated thereafter.

なお、本大施列では洩れ電流補償手段として、フォトダ
イオード〕と同じ形で受光部が連蔽されているフォトダ
イオードが用いられているが、本発明はこれに限定され
るものではない。たとえば、光感応性のないダイオード
で洩れ電流特性かフォトダイオード1と類似しているし
のを用いれば遮光手段3は不要である。しかし、洩れ電
流補償手段を本実施例のように構成すれば、フォトダイ
オード1の洩れ電流C1を常に過不足なく補償すること
ができ、極めて正確な光電変換を行うことができる。
Note that in this large array, a photodiode whose light-receiving portions are connected in the same manner as the photodiode is used as the leakage current compensating means, but the present invention is not limited to this. For example, if a non-photosensitive diode having leakage current characteristics similar to the photodiode 1 is used, the light shielding means 3 is not necessary. However, if the leakage current compensating means is configured as in this embodiment, the leakage current C1 of the photodiode 1 can always be compensated for in excess or deficiency, and extremely accurate photoelectric conversion can be performed.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明の光電変換装置によれば、
洩れ電流によって重荷蓄積手段が蓄積眼光に達してしま
うことがない。そのため、微弱光を高いS/N比で検出
するために蓄枯1.17間を長くとることかできる。ま
た、洩れ電流の影響を全く受けていないので、受光量と
<lff1圧値の関係は蓄積時間の長駆にかかわらす同
じである。したがって、感度が高く、使い勝手のよい光
電変換装置としてfり川することができる。
As explained above, according to the photoelectric conversion device of the present invention,
The leakage current will not cause the heavy storage means to reach the storage eye. Therefore, in order to detect weak light with a high S/N ratio, it is possible to take a long period of 1.17 seconds. Furthermore, since there is no influence of leakage current, the relationship between the amount of received light and the <lff1 pressure value remains the same regardless of the length of the accumulation time. Therefore, it can be used as a photoelectric conversion device with high sensitivity and ease of use.

4 、 図ih+ ノi7h ’li す説明第1園は
本発明の一大施向を示す回路図である。
4. Figure Ih+Noi7h'li Explanation The first diagram is a circuit diagram showing a major feature of the present invention.

1.2・・・フォトダイオード、3・・・遮光手段1.
4・・・洩れ?Ji流抽償手段、5・・・電6:j蓄積
手段、6・・・容量手段、7・・・スイッチング用トラ
ンジスタ、8・・インピーダンス変換手段、9・・・ソ
ースホロワトランジスタ、10・・・定電流源用トラン
ジスタ。
1.2... Photodiode, 3... Light shielding means 1.
4...Leak? Ji current extraction means, 5... Electricity 6: j accumulation means, 6... Capacitance means, 7... Switching transistor, 8... Impedance conversion means, 9... Source follower transistor, 10. ...Transistor for constant current source.

5■ 2.5■ or5V V5■ 2.5 ■ or5V V

Claims (1)

【特許請求の範囲】 1、受光量に応じた光電流を流す光電変換素子と、前記
光電流による電荷を蓄積し蓄積電荷に応じた電圧を出力
する電荷蓄積手段とを備えた光電変換装置において、前
記光電変換素子の洩れ電流とほぼ等しい電流を当該光電
変換素子に供給する洩れ電流補償手段を備えたことを特
徴とする光電変換装置。 2、洩れ電流補償手段は、前記光電変換素子と同一構造
の光電変換素子であって受光部が遮蔽されたものである
ことを特徴とする請求項1記載の光電変換装置。
[Scope of Claims] 1. A photoelectric conversion device comprising a photoelectric conversion element that flows a photocurrent according to the amount of received light, and a charge storage means that stores the charge caused by the photocurrent and outputs a voltage according to the accumulated charge. . A photoelectric conversion device comprising leakage current compensating means for supplying a current substantially equal to the leakage current of the photoelectric conversion element to the photoelectric conversion element. 2. The photoelectric conversion device according to claim 1, wherein the leakage current compensating means is a photoelectric conversion element having the same structure as the photoelectric conversion element, and a light receiving part thereof is shielded.
JP1202544A 1989-08-04 1989-08-04 Photoelectric converter Pending JPH0367134A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1202544A JPH0367134A (en) 1989-08-04 1989-08-04 Photoelectric converter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1202544A JPH0367134A (en) 1989-08-04 1989-08-04 Photoelectric converter

Publications (1)

Publication Number Publication Date
JPH0367134A true JPH0367134A (en) 1991-03-22

Family

ID=16459264

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1202544A Pending JPH0367134A (en) 1989-08-04 1989-08-04 Photoelectric converter

Country Status (1)

Country Link
JP (1) JPH0367134A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100404389B1 (en) * 2001-04-07 2003-11-12 박규식 Home Hydro-Cultivater

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100404389B1 (en) * 2001-04-07 2003-11-12 박규식 Home Hydro-Cultivater

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