JPH0353873B2 - - Google Patents
Info
- Publication number
- JPH0353873B2 JPH0353873B2 JP4145381A JP4145381A JPH0353873B2 JP H0353873 B2 JPH0353873 B2 JP H0353873B2 JP 4145381 A JP4145381 A JP 4145381A JP 4145381 A JP4145381 A JP 4145381A JP H0353873 B2 JPH0353873 B2 JP H0353873B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- main capacitor
- wavefront
- length
- impulse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000003990 capacitor Substances 0.000 claims description 19
- 238000012360 testing method Methods 0.000 description 49
- 238000010586 diagram Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 6
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000006698 induction Effects 0.000 description 2
- 238000004904 shortening Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/53—Generators characterised by the type of circuit or by the means used for producing pulses by the use of an energy-accumulating element discharged through the load by a switching device controlled by an external signal and not incorporating positive feedback
Landscapes
- Generation Of Surge Voltage And Current (AREA)
Description
【発明の詳細な説明】
この発明は、供試器例えば低インピーダンス試
料の雷インパルス試験におけるインパルス試験の
規格に適合した電圧波形を発生できるインパルス
電圧発生装置（以下IVGと称す）に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an impulse voltage generator (hereinafter referred to as IVG) that can generate a voltage waveform that complies with impulse test standards in lightning impulse tests of test equipment, such as low impedance samples.
従来、IVGを用いた低インピーダンス試料例え
ばJEC−0301「静止誘導機器のインパルス耐電圧
試験」に記述されている如き大容量変圧器の低圧
巻線のインパルス試験は、例えば第１図に示すよ
うな回路を用いて実施されていた。 Conventionally, impulse tests of low-voltage windings of large-capacity transformers, such as those described in JEC-0301 "Impulse withstand voltage test of static induction equipment", have been conducted using IVG as shown in Figure 1. It was implemented using a circuit.
図において、１は高電圧発生用の主コンデン
サ、２は主コンデンサ１に並列接続された放電抵
抗、３は放電抵抗２に接続された波頭調整用抵
抗、４は主コンデンサ１の電圧が所定電圧に達す
ると放電する放電ギヤツプであり、これら１〜４
はIVGを構成している。５は放電抵抗２及び波頭
調整用抵抗３に並列接続された供試器であり、互
いに並列接続された静電容量６と等価インダクタ
ンス７とを備えている。 In the figure, 1 is a main capacitor for high voltage generation, 2 is a discharge resistor connected in parallel to the main capacitor 1, 3 is a wavefront adjustment resistor connected to the discharge resistor 2, and 4 is a predetermined voltage of the main capacitor 1. It is a discharge gap that discharges when it reaches 1 to 4.
constitutes the IVG. A test device 5 is connected in parallel to the discharge resistor 2 and the wavefront adjustment resistor 3, and includes a capacitance 6 and an equivalent inductance 7 that are connected in parallel to each other.
この場合、図示した回路のインダクタンスは、
IVG内のリードのインダクタンス等で与えられ、
回路の静電容量は、主コンデンサ１の静電容量及
び供試器５内の静電容量６で与えられる。そし
て、IVGから供試器５に印加される電圧波形は、
回路のインダクタンス及び静電容量で決まる周波
数で振動するが、波頭調整用抵抗３はその振動を
抑制する制動抵抗として作用する。また、電圧波
形の波頭長は、波頭調整用抵抗３の値と供試器５
の静電容量６の値とで決まる。 In this case, the inductance of the circuit shown is
Given by the inductance of the leads inside the IVG,
The capacitance of the circuit is given by the capacitance of the main capacitor 1 and the capacitance 6 in the device under test 5. The voltage waveform applied from the IVG to the EUT 5 is
It vibrates at a frequency determined by the inductance and capacitance of the circuit, and the wavefront adjustment resistor 3 acts as a braking resistor to suppress the vibration. In addition, the wavefront length of the voltage waveform is determined by the value of the wavefront adjustment resistor 3 and the device under test 5.
It is determined by the value of capacitance 6 of .
すなわち、インパルス電圧発生装置で発生する
電圧波形の波頭長は、主コンデンサ１の両端に生
じた直流高電圧が、波頭調整用抵抗３を介して供
試器５の静電容量６を充電する充電時定数で決ま
る。これは、電圧の立ち上がり時間が急峻なため
静電容量６のインピーダンスがインダクタンス７
のインピーダンスに比べ極めて小さいことによ
る。 In other words, the wavefront length of the voltage waveform generated by the impulse voltage generator is determined by the DC high voltage generated across the main capacitor 1 charging the capacitance 6 of the test device 5 via the wavefront adjustment resistor 3. Determined by time constant. This is because the voltage rise time is steep, so the impedance of capacitance 6 becomes inductance 7.
This is because the impedance is extremely small compared to the impedance of
一方、波尾長は、主コンデンサ１と供試器５の
静電容量６と、放電抵抗２の値で決まるよりも、
むしろ供試器５の等価インダクタンス７と主コン
デンサ１とで決まる。 On the other hand, the wave tail length is determined by the capacitance 6 of the main capacitor 1 and the device under test 5, and the values of the discharge resistance 2.
Rather, it is determined by the equivalent inductance 7 of the device under test 5 and the main capacitor 1.
すなわち、供試器５が静電容量６のみであれ
ば、電圧波形は主コンデンサ１と放電抵抗２で決
まる放電時定数で減衰する。すなわち、波尾長
は、この両者で決まることになる。供試器５が低
インピーダンス（低インダクタンス）の場合、電
圧波形がピーク値近傍になると、供試器５のイン
ダクタンス７のインピーダンスが小さくなり、放
電抵抗２のインピーダンスよりも小さくなる。し
たがつて、電圧波形は、供試器５のインダクタン
ス７と主コンデンサ１とで決まる時定数で減衰
（正しくは振動）する。すなわち、波尾長は、こ
の両者で決まることになる。 That is, if the test device 5 has only the capacitance 6, the voltage waveform will attenuate with the discharge time constant determined by the main capacitor 1 and the discharge resistor 2. In other words, the wave tail length is determined by both. When the device under test 5 has a low impedance (low inductance), when the voltage waveform approaches the peak value, the impedance of the inductance 7 of the device under test 5 becomes smaller than the impedance of the discharge resistor 2. Therefore, the voltage waveform attenuates (or more accurately, oscillates) with a time constant determined by the inductance 7 of the device under test 5 and the main capacitor 1. In other words, the wave tail length is determined by both.
したがつて、低インピーダンスすなわち静電容
量が大きく、かつインダクタンスの値が小さい供
試器５の場合、規格JEC−212「インパルス電圧電
流一般」にて規定された波頭長1.0μs（裕度±30
％）、波尾長40μs（裕度±20％）に比べ波頭長が長
く、かつ波尾長の短い電圧波形が生じる。 Therefore, in the case of EUT 5 with low impedance, that is, large capacitance, and small inductance, the wavefront length of 1.0 μs (with tolerance ±30
%), a voltage waveform with a longer wavefront length and a shorter wavetail length is generated compared to a wavetail length of 40 μs (tolerance ±20%).
つまり、規格では、波頭長及び波尾長が規定さ
れているため、低インピーダンス巻線の接地試験
では、一般に回路のインダクタンスと供試器５の
静電容量６で生じる電圧波形の振動を抑制するた
めに、この回路に直列に入る波頭調整用抵抗３の
値を大きくとる。この結果、供試器５の静電容量
６と波頭調整用抵抗３とで決まる時定数が大きく
なり、波頭長は大きくなる。一方、供試器５のイ
ンダクタンス７が小さいために電圧波形のピーク
を過ぎると、供試器５のインダクタンス７と主コ
ンデンサ１の静電容量で決まる振動が生じる。こ
の振動の1/4周期の相当する時間は規格値の波尾
長がに比べて小さくなつてしまう。 In other words, since the standard specifies the wave front length and wave tail length, in grounding tests of low impedance windings, it is generally necessary to suppress the vibration of the voltage waveform caused by the circuit inductance and the capacitance 6 of the device under test 5. In addition, the value of the wavefront adjustment resistor 3 connected in series with this circuit is set to a large value. As a result, the time constant determined by the capacitance 6 of the test device 5 and the wavefront adjustment resistor 3 becomes large, and the wavefront length becomes large. On the other hand, since the inductance 7 of the test device 5 is small, when the peak of the voltage waveform is passed, vibration determined by the inductance 7 of the test device 5 and the capacitance of the main capacitor 1 occurs. During the time corresponding to 1/4 period of this vibration, the wave tail length of the standard value is smaller than the standard value.
このような状況に対処するために、最近第２図
に示すような回路が開発されている。この方法に
よれば、波頭調整用抵抗３に並列にインダクター
８を接続するとともに供試器５と並列に抵抗値の
低い抵抗体９を接続し、これらの値を変化するこ
とによつて所要電圧波形を発生することができ
る。 In order to deal with this situation, a circuit as shown in FIG. 2 has recently been developed. According to this method, an inductor 8 is connected in parallel to the wavefront adjustment resistor 3, and a resistor 9 with a low resistance value is connected in parallel to the device under test 5, and the required voltage is adjusted by changing these values. Waveforms can be generated.
第３図に示す曲線Ａのように、この回路におけ
るインダクター８は電圧波形がなだらかになつた
時に波頭調整用抵抗３を短絡状態にし、主コンデ
ンサ１から試料へのエネルギー供給を容易にする
役割を演じ、結果的に波頭長を短く、かつ波尾長
をT0からT1へ長くする効果をもつ。また、抵抗
体９は数値的には波頭調整用抵抗３の値に供試器
５のインダクタンス７とインダクター８との比を
掛けた値を選ぶことになるが、抵抗体のない場合
に供試器５のインダクタンス７と静電容量６との
間でやりとりされるエネルギーの一部が抵抗体９
で消費されることになり、結果的に供試器５に加
わる電圧波形は第３図に示す曲線Ｂのように波頭
部で低くなる。なお、第３図中曲線Ｃは第１図に
おける従来の回路における特性を示す。 As shown by curve A in FIG. 3, the inductor 8 in this circuit short-circuits the wavefront adjustment resistor 3 when the voltage waveform becomes gentle, thereby facilitating the supply of energy from the main capacitor 1 to the sample. As a result, it has the effect of shortening the wave front length and lengthening the wave tail length from T 0 to T 1 . In addition, the value of the resistor 9 is numerically selected by multiplying the value of the wavefront adjustment resistor 3 by the ratio of the inductance 7 of the device under test 5 to the inductor 8, but if there is no resistor, A part of the energy exchanged between the inductance 7 and the capacitance 6 of the resistor 5 is transferred to the resistor 9.
As a result, the voltage waveform applied to the device under test 5 becomes low at the top of the wave, as shown by curve B shown in FIG. Note that curve C in FIG. 3 shows the characteristics of the conventional circuit shown in FIG.
この結果、第３図のように波尾長はT0からT2
まで長くなることになり、波頭長もまた短くでき
ることになる。（JEC等で規定されている波尾長
は規約原点からT0，T2までの時間であるが、こ
こでは近似的にT0，T2としている。）
しかしながら、この方法では２種類の回路素子
を選択、変更することが必要であり、試行錯誤的
にまたは等価回路から計算機によつて回路素子の
値を求める必要があつた。また、インダクター８
のIVG側にはV2よりかなり高い電圧V1が加わる
のでインダクター８の絶縁が非常に重要となる。 As a result, the wave tail length changes from T 0 to T 2 as shown in Figure 3.
This means that the wavefront length can also be shortened. (The wave tail length specified by JEC etc. is the time from the standard origin to T 0 and T 2 , but here it is approximated as T 0 and T 2. ) However, in this method, two types of circuit elements It was necessary to select and change the values of the circuit elements, and it was necessary to find the values of the circuit elements by trial and error or by using a computer from an equivalent circuit. Also, inductor 8
Since a voltage V1 , which is much higher than V2 , is applied to the IVG side of the inductor 8, insulation of the inductor 8 is very important.
したがつて、実用上ではインダクター８の破壊
または両端の短絡時に供試器５を保護するため
に、第２図に示すような過電圧に対する保護素子
１０を取付けることが必要である。 Therefore, in practice, it is necessary to install a protection element 10 against overvoltage as shown in FIG. 2 in order to protect the test device 5 in the event of destruction of the inductor 8 or a short circuit between both ends.
この発明は上記した諸点に鑑みてなされたもの
であり、所定電圧値を越える波形に相当する電気
エネルギーを接地に流す特性を有する非線形抵抗
素子を供試器に並列接続することにより、低イン
ピーダンスの供試器に対して、所定波頭長及び所
定波尾長を有する規格内の波形を発生するととも
に、供試器の保護も可能なインパルス電圧発生装
置の提供を目的とするものである。 This invention was made in view of the above-mentioned points, and by connecting in parallel to the test device a nonlinear resistance element that has the characteristic of flowing electrical energy corresponding to a waveform exceeding a predetermined voltage value to the ground, it is possible to achieve a low impedance. The object of the present invention is to provide an impulse voltage generator that can generate a waveform having a predetermined wavefront length and a predetermined wave tail length within the standard for a device under test, and can also protect the device under test.
この非線形抵抗素子とは、例えば最近電力系統
の避雷器素子として使用されている酸化亜鉛素子
のように、その電圧−電流特性が第４図のような
形を示し、ある電圧値を越える波形に相当する電
気エネルギーを接地に流す特性を有しているもの
をいう。 This nonlinear resistance element, such as the zinc oxide element recently used as a lightning arrester element in power systems, has a voltage-current characteristic as shown in Figure 4, which corresponds to a waveform that exceeds a certain voltage value. A device that has the property of allowing electrical energy to flow through the ground.
以下第５図に示す本発明の一実施例について説
明する。図において、１〜７は第１図における従
来のものと同様である。１１は非線形抵抗素子で
ある。 An embodiment of the present invention shown in FIG. 5 will be described below. In the figure, numerals 1 to 7 are the same as the conventional one in FIG. 11 is a nonlinear resistance element.
この図はIVGの概略等価回路であるが、ここで
いうIVGとは、各種充電方式及び電圧発生の基本
回路構成の異なるIVGも含むものである。 This figure is a schematic equivalent circuit of an IVG, but the IVG here includes IVGs with various charging methods and different basic circuit configurations for voltage generation.
第５図のインパルス試験回路における発生電圧
波形を第６図を用いて以下説明する。第１図のよ
うな従来のインパルス試験回路において、所要試
験電圧V0を発生した場合、供試器５には第６図
に示す曲線Ｄのような電圧波形が印加されること
になり、この時の波尾長は0.5V0の電圧を示す時
間0となる。これに比べて、この発明の一実施例
における第５図の回路ではV0の電圧を越える電
圧を抑制可能な非線形抵抗素子１１を接続してい
るので、V0を越える電圧に相当するエネルギー
（第６図に示す斜線部）は非線形抵抗素子１１を
介して接地へ流れることになる。したがつて、波
高値V3の如き曲線Ｅで示す電圧を発生すると供
試器５には第６図の曲線Ｆで示すような抑制され
た電圧波形が印加されることになる。図から明ら
かなように、供試器５へ印加される電圧波形の波
高値はV0であり、その波尾長は0.5V0までの時間
T3となるので、供試器５への過電圧印加を保護
するとともに波尾長の長い電圧波形を発生できる
という効果が得られる。 The generated voltage waveform in the impulse test circuit of FIG. 5 will be explained below using FIG. 6. In the conventional impulse test circuit as shown in Fig. 1, when the required test voltage V 0 is generated, a voltage waveform as shown in curve D shown in Fig. 6 will be applied to the device under test 5. The wave tail length at time is 0.5V. Time 0 indicates a voltage of 0 . In contrast, in the circuit of FIG. 5 according to an embodiment of the present invention, a nonlinear resistance element 11 capable of suppressing a voltage exceeding the voltage V 0 is connected, so that the energy corresponding to the voltage exceeding the voltage V 0 ( 6) flows to ground via the nonlinear resistance element 11. Therefore, when a voltage shown by curve E having a peak value V3 is generated, a suppressed voltage waveform shown by curve F in FIG. 6 is applied to the test device 5. As is clear from the figure, the peak value of the voltage waveform applied to the device under test 5 is V 0 , and the wave length is 0.5 V 0 .
Since T 3 is obtained, it is possible to protect the device under test 5 from overvoltage application and to generate a voltage waveform with a long wave tail length.
また、IVGの発生電圧V3はV0よりも高いので、
電圧波形の立ち上がり時間も短くなることから、
結果的に波頭長も短くなるという効果も得られ
る。 Also, since the IVG generated voltage V 3 is higher than V 0 ,
Since the rise time of the voltage waveform is also shorter,
As a result, the effect of shortening the wavefront length can also be obtained.
すなわち、インパルス試験に関する規格JEC−
212−1981［インパルス電圧電流試験一般］にお
いても記述されているように、波頭長は、電圧波
形の波頭部における波高値の30％になる時間と90
％になる時間の差を0.6で除した時間で定義され
ている。機器のインパルス試験では供試器に印加
される電圧の波高値が決まつているため、本発明
のようにIVGの充電電圧を高くすると、波高値の
30％になる時間と90％になる時間も短くなる。し
たがつて、波頭長も相対的に短くなる。 In other words, the standard JEC-
212- 1981 As described in [Impulse Voltage and Current Tests in General], the wavefront length is the time at which the voltage waveform reaches 30% of the peak value at the wavefront, and 90% of the peak value.
% divided by 0.6. In the impulse test of equipment, the peak value of the voltage applied to the device under test is determined, so if the charging voltage of the IVG is increased as in the present invention, the peak value will be increased.
The time to reach 30% and the time to reach 90% will also be shorter. Therefore, the wavefront length also becomes relatively short.
以上、第５図を用いて、この発明の一実施例の
説明を行なつたが、第２図のようなインダクター
８を用いた回路においても、図中の抵抗体９の代
りに非線形抵抗素子を接続しても上記と同様な効
果が得られることはいうまでもない。 Although one embodiment of the present invention has been explained above using FIG. 5, even in a circuit using an inductor 8 as shown in FIG. It goes without saying that the same effect as above can be obtained even if the two are connected.
なお、第７図に示すように、波頭調整用抵抗
３、放電抵抗２を内蔵する形の多段構成のIVGに
おいて、構成要素の全段または一部の段に非線形
抵抗素子１１を設置することでも、上記と同様の
効果が得られる。 In addition, as shown in FIG. 7, in an IVG with a multi-stage configuration that incorporates a wavefront adjustment resistor 3 and a discharge resistor 2, nonlinear resistance elements 11 can be installed in all or some stages of the components. , the same effect as above can be obtained.
ところで、上記説明は雷インパルス試験につい
て述べてきたが、開閉インパルス試験においても
この発明により90％継続時間や波尾長を長くする
効果が得られることはいうまでもない。 Incidentally, although the above explanation has been made regarding the lightning impulse test, it goes without saying that the present invention can also provide the effect of increasing the 90% duration time and the wave tail length in the opening/closing impulse test.
すなわち、開閉インパルス試験電圧は、JEC−
0301-1989［静止誘導機器のインパルス耐電圧試
験］に規定されているように、波頭長100μs（裕度
±50％）、第一半波継続時間1000μs以上（裕度−
20％）波高値の90％継続時間200μs以上（裕度−
20％）となつている。供試器に印加される電圧の
波高値が決まつているため、本発明のようにIVG
の充電電圧を高くすると波高値の90％になる時間
は波頭では短く、波尾では長くなる。したがつて
波高値の90％継続時間も相対的に長くなる。 In other words, the switching impulse test voltage is JEC−
0301 -1989 As specified in [Impulse withstanding voltage test for static induction equipment], the wavefront length is 100 μs (tolerance ±50%), the first half wave duration is 1000 μs or more (tolerance -
20%) 90% duration of peak value 200μs or more (tolerance -
20%). Since the peak value of the voltage applied to the device under test is determined, IVG
When the charging voltage is increased, the time for the wave to reach 90% of the peak value becomes shorter at the wave crest and longer at the wave tail. Therefore, the duration time of 90% of the peak value also becomes relatively long.
以上のように、この発明によれば、低インピー
ダンスの供試器のインパルス試験において、所定
電圧値を越える波形に相当する電気エネルギーを
接地に流す特性を有する非線形抵抗素子を供試器
に並列接続することにより、簡単な構成で機器を
保護し、かつ規格に適合した電圧波形を発生でき
るインパルス電圧発生装置を提供することができ
るという効果がある。 As described above, according to the present invention, in an impulse test of a low-impedance device under test, a nonlinear resistance element having a characteristic of flowing electrical energy corresponding to a waveform exceeding a predetermined voltage value to the ground is connected in parallel to the device under test. By doing so, it is possible to provide an impulse voltage generator that protects equipment with a simple configuration and can generate a voltage waveform that conforms to standards.
第１図は従来のインパルス試験に用いられる回
路図、第２図は最近の電気回路素子を付加した電
圧波形改善の実例を示す回路図、第３図は第２図
に示した実例における電圧波形を示す曲線図、第
４図は酸化亜鉛素子の電圧−電流特性を示す曲線
図、第５図はこの発明の一実施例におけるインパ
ルス電圧発生装置を示す回路図、第６図はこの発
明の効果を示す電圧波形を示す特性曲線図、第７
図はこの発明の他の実施例におけるインパルス電
圧発生装置を示す回路図である。
図において、１はIVGの主コンデンサ、２は放
電抵抗、３は波頭調整用抵抗、４は放電ギヤツ
プ、５は供試器、６は供試器の等価静電容量、７
は供試器の等価インダクタンス、８はインダクタ
ー、９は抵抗体、１０は保護素子、１１は非線形
抵抗素子である。なお、各図中の同一符号は同一
または相当部分を示すものである。
Figure 1 is a circuit diagram used in conventional impulse testing, Figure 2 is a circuit diagram showing an example of voltage waveform improvement by adding recent electric circuit elements, and Figure 3 is a voltage waveform in the example shown in Figure 2. FIG. 4 is a curve diagram showing the voltage-current characteristics of a zinc oxide element, FIG. 5 is a circuit diagram showing an impulse voltage generator according to an embodiment of the present invention, and FIG. 6 is a curve diagram showing the effects of this invention. Characteristic curve diagram showing a voltage waveform showing , seventh
The figure is a circuit diagram showing an impulse voltage generator according to another embodiment of the present invention. In the figure, 1 is the main capacitor of the IVG, 2 is the discharge resistor, 3 is the wavefront adjustment resistor, 4 is the discharge gap, 5 is the device under test, 6 is the equivalent capacitance of the device under test, and 7
is the equivalent inductance of the device under test, 8 is an inductor, 9 is a resistor, 10 is a protection element, and 11 is a nonlinear resistance element. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
の電圧が一定の電圧に達すると放電する放電ギヤ
ツプ、この放電ギヤツプ、及び上記主コンデンサ
に対して並列接続された放電抵抗、上記放電ギヤ
ツプ、及び主コンデンサからなる直列回路に直列
接続され、放電ギヤツプを通して主コンデンサか
ら出力される電圧の振動を抑制する波頭調整用抵
抗とからなり、上記波頭調整用抵抗を介して主コ
ンデンサから出力される所定波頭長及び所定波尾
長の電圧を低インピーダンス供試器に印加するた
めにインパルス電圧発生装置において、所定電圧
を越える波形に相当する電気エネルギーを接地に
流す特性を有する非直線抵抗素子を上記低インピ
ーダンス供試器に並列接続すると共に、上記主コ
ンデンサからは上記所定電圧を越える波形の電圧
を出力することを特徴とするインパルス電圧発生
装置。1 A discharge gap that is connected in series with the main capacitor and discharges when the voltage of the main capacitor reaches a certain voltage, a discharge resistor that is connected in parallel to this discharge gap and the above main capacitor, the above discharge gap, and the main capacitor. A wavefront adjustment resistor is connected in series with a series circuit to suppress the vibration of the voltage output from the main capacitor through the discharge gap, and a predetermined wavefront length and a predetermined wavefront length output from the main capacitor via the wavefront adjustment resistor are connected in series. In order to apply a wave-length voltage to a low-impedance EUT, an impulse voltage generator is equipped with a non-linear resistance element that has a characteristic of causing electrical energy corresponding to a waveform exceeding a predetermined voltage to flow to the ground, to the low-impedance EUT. An impulse voltage generator characterized in that the main capacitor is connected in parallel and outputs a voltage having a waveform exceeding the predetermined voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4145381A JPS57156682A (en) | 1981-03-20 | 1981-03-20 | Impulse voltage generator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4145381A JPS57156682A (en) | 1981-03-20 | 1981-03-20 | Impulse voltage generator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57156682A JPS57156682A (en) | 1982-09-28 |
| JPH0353873B2 true JPH0353873B2 (en) | 1991-08-16 |
Family
ID=12608790
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4145381A Granted JPS57156682A (en) | 1981-03-20 | 1981-03-20 | Impulse voltage generator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57156682A (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62199930U (en) * | 1986-06-11 | 1987-12-19 | ||
| JPS63149514U (en) * | 1987-03-23 | 1988-10-03 | ||
| JP4809266B2 (en) * | 2007-02-26 | 2011-11-09 | 富士通株式会社 | Impulse generator using nonlinear transmission line |
| JP5057230B2 (en) * | 2008-01-18 | 2012-10-24 | 三菱電機株式会社 | Lightning impulse voltage test equipment |
| JP5413652B2 (en) * | 2009-05-08 | 2014-02-12 | 三菱電機株式会社 | Lightning impulse voltage test apparatus and lightning impulse voltage test method |
| JP5200053B2 (en) * | 2010-04-26 | 2013-05-15 | 幸治 越智 | Pulse generator and pulse shaping method |
-
1981
- 1981-03-20 JP JP4145381A patent/JPS57156682A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57156682A (en) | 1982-09-28 |
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