JPH0343735U - - Google Patents

Info

Publication number
JPH0343735U
JPH0343735U JP10512889U JP10512889U JPH0343735U JP H0343735 U JPH0343735 U JP H0343735U JP 10512889 U JP10512889 U JP 10512889U JP 10512889 U JP10512889 U JP 10512889U JP H0343735 U JPH0343735 U JP H0343735U
Authority
JP
Japan
Prior art keywords
lsi
mode
internal circuit
test
burn
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10512889U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10512889U priority Critical patent/JPH0343735U/ja
Publication of JPH0343735U publication Critical patent/JPH0343735U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10512889U 1989-09-06 1989-09-06 Pending JPH0343735U (US06633600-20031014-M00021.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10512889U JPH0343735U (US06633600-20031014-M00021.png) 1989-09-06 1989-09-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10512889U JPH0343735U (US06633600-20031014-M00021.png) 1989-09-06 1989-09-06

Publications (1)

Publication Number Publication Date
JPH0343735U true JPH0343735U (US06633600-20031014-M00021.png) 1991-04-24

Family

ID=31653901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10512889U Pending JPH0343735U (US06633600-20031014-M00021.png) 1989-09-06 1989-09-06

Country Status (1)

Country Link
JP (1) JPH0343735U (US06633600-20031014-M00021.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008004778A (ja) * 2006-06-22 2008-01-10 Sharp Corp 半導体装置、半導体装置の検査方法、プローブカード

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008004778A (ja) * 2006-06-22 2008-01-10 Sharp Corp 半導体装置、半導体装置の検査方法、プローブカード
JP4708269B2 (ja) * 2006-06-22 2011-06-22 シャープ株式会社 半導体装置、及び半導体装置の検査方法

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